JP7270039B2 - 自動分析装置、および異常検知方法 - Google Patents

自動分析装置、および異常検知方法 Download PDF

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Publication number
JP7270039B2
JP7270039B2 JP2021525913A JP2021525913A JP7270039B2 JP 7270039 B2 JP7270039 B2 JP 7270039B2 JP 2021525913 A JP2021525913 A JP 2021525913A JP 2021525913 A JP2021525913 A JP 2021525913A JP 7270039 B2 JP7270039 B2 JP 7270039B2
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reagent
concentration
measured
reagent container
container
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Japanese (ja)
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JPWO2020250507A5 (https=
JPWO2020250507A1 (https=
Inventor
博文 塩畑
雄一郎 大田
孝明 萩原
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Hitachi High Tech Corp
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Hitachi High Tech Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1002—Reagent dispensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G01N2035/00673—Quality control of consumables of reagents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0474—Details of actuating means for conveyors or pipettes
    • G01N2035/0491—Position sensing, encoding; closed-loop control
    • G01N2035/0494—Detecting or compensating piositioning errors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009—Characterised by arrangements for controlling the aspiration or dispense of liquids
    • G01N35/1016—Control of the volume dispensed or introduced
    • G01N2035/1018—Detecting inhomogeneities, e.g. foam, bubbles, clots

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2021525913A 2019-06-11 2020-03-03 自動分析装置、および異常検知方法 Active JP7270039B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019109032 2019-06-11
JP2019109032 2019-06-11
PCT/JP2020/008937 WO2020250507A1 (ja) 2019-06-11 2020-03-03 自動分析装置、および異常検知方法

Publications (3)

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JPWO2020250507A1 JPWO2020250507A1 (https=) 2020-12-17
JPWO2020250507A5 JPWO2020250507A5 (https=) 2022-02-22
JP7270039B2 true JP7270039B2 (ja) 2023-05-09

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JP2021525913A Active JP7270039B2 (ja) 2019-06-11 2020-03-03 自動分析装置、および異常検知方法

Country Status (5)

Country Link
US (1) US12163972B2 (https=)
EP (1) EP3985398B1 (https=)
JP (1) JP7270039B2 (https=)
CN (1) CN113950626B (https=)
WO (1) WO2020250507A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117501096A (zh) * 2021-12-31 2024-02-02 深圳迈瑞动物医疗科技股份有限公司 一种样本分析装置和样本分析方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010249661A (ja) 2009-04-16 2010-11-04 Hitachi High-Technologies Corp 分析装置
JP2013217741A (ja) 2012-04-06 2013-10-24 Hitachi High-Technologies Corp 自動分析装置
JP2016057228A (ja) 2014-09-11 2016-04-21 日本電子株式会社 自動分析装置及び異常判定方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0815265A (ja) * 1994-06-30 1996-01-19 Shimadzu Corp 自動化学分析装置
JP3866446B2 (ja) * 1999-05-07 2007-01-10 株式会社東芝 自動分析装置
JP2001124788A (ja) * 1999-10-25 2001-05-11 Hitachi Ltd 自動分析装置
JP4117181B2 (ja) 2002-11-21 2008-07-16 株式会社日立ハイテクノロジーズ 自動分析装置
JP2007303937A (ja) 2006-05-10 2007-11-22 Olympus Corp 自動分析装置
JP4991586B2 (ja) * 2008-01-31 2012-08-01 株式会社日立ハイテクノロジーズ 自動分析装置
GB0806771D0 (en) * 2008-04-12 2008-05-14 Spd Swiss Prec Diagnostics Gmb Assay devices comprising bubble-forming means
JP5618489B2 (ja) * 2009-02-17 2014-11-05 シスメックス株式会社 分析装置、分析方法及びコンピュータプログラム
JP5274436B2 (ja) * 2009-11-26 2013-08-28 ベックマン コールター， インコーポレイテッド 自動分析装置
JP5216051B2 (ja) * 2010-06-23 2013-06-19 株式会社日立ハイテクノロジーズ 自動分析装置および自動分析方法
JP5562421B2 (ja) * 2010-07-14 2014-07-30 株式会社日立ハイテクノロジーズ 自動分析装置、分析方法及び情報処理装置
JP5897323B2 (ja) * 2011-12-26 2016-03-30 株式会社日立ハイテクノロジーズ 自動分析装置および測定値異常検出方法
JP6013796B2 (ja) * 2012-06-25 2016-10-25 株式会社日立ハイテクノロジーズ 自動分析装置及び試料測定方法
US10768189B2 (en) * 2014-01-27 2020-09-08 Hitachi High-Tech Corporation Automatic analysis apparatus
EP3252476B1 (en) * 2015-01-28 2024-10-30 Hitachi High-Tech Corporation Liquid surface inspection device, automated analysis device, and processing device
JP6649942B2 (ja) * 2015-02-23 2020-02-19 株式会社日立ハイテクノロジーズ 自動分析装置
JP6466752B2 (ja) * 2015-03-19 2019-02-06 株式会社日立ハイテクノロジーズ 自動分析装置及び自動分析方法並びに自動分析システム
CN108780102B (zh) * 2016-03-25 2022-05-17 株式会社日立高新技术 自动分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010249661A (ja) 2009-04-16 2010-11-04 Hitachi High-Technologies Corp 分析装置
JP2013217741A (ja) 2012-04-06 2013-10-24 Hitachi High-Technologies Corp 自動分析装置
JP2016057228A (ja) 2014-09-11 2016-04-21 日本電子株式会社 自動分析装置及び異常判定方法

Also Published As

Publication number Publication date
EP3985398A4 (en) 2023-05-10
EP3985398A1 (en) 2022-04-20
US20220221477A1 (en) 2022-07-14
EP3985398B1 (en) 2024-07-10
JPWO2020250507A1 (https=) 2020-12-17
US12163972B2 (en) 2024-12-10
WO2020250507A1 (ja) 2020-12-17
CN113950626A (zh) 2022-01-18
CN113950626B (zh) 2025-06-13

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