CN1097849C - 半导体芯片及半导体芯片的制造方法 - Google Patents

半导体芯片及半导体芯片的制造方法 Download PDF

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Publication number
CN1097849C
CN1097849C CN97190479A CN97190479A CN1097849C CN 1097849 C CN1097849 C CN 1097849C CN 97190479 A CN97190479 A CN 97190479A CN 97190479 A CN97190479 A CN 97190479A CN 1097849 C CN1097849 C CN 1097849C
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CN
China
Prior art keywords
semiconductor chip
ditch
semiconductor
cut
way
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Expired - Lifetime
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CN97190479A
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English (en)
Chinese (zh)
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CN1190489A (zh
Inventor
北黑弘一
门西裕
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Rohm Co Ltd
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Rohm Co Ltd
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Publication of CN1190489A publication Critical patent/CN1190489A/zh
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Publication of CN1097849C publication Critical patent/CN1097849C/zh
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    • H10P54/00—
    • H10P95/00—
    • H10P52/00—

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  • Dicing (AREA)
CN97190479A 1996-06-07 1996-06-06 半导体芯片及半导体芯片的制造方法 Expired - Lifetime CN1097849C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8145415A JPH09330891A (ja) 1996-06-07 1996-06-07 半導体チップおよび半導体チップの製造方法
JP145415/96 1996-06-07

Publications (2)

Publication Number Publication Date
CN1190489A CN1190489A (zh) 1998-08-12
CN1097849C true CN1097849C (zh) 2003-01-01

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ID=15384734

Family Applications (1)

Application Number Title Priority Date Filing Date
CN97190479A Expired - Lifetime CN1097849C (zh) 1996-06-07 1996-06-06 半导体芯片及半导体芯片的制造方法

Country Status (5)

Country Link
EP (1) EP0844648A1 (OSRAM)
JP (1) JPH09330891A (OSRAM)
KR (1) KR19990022039A (OSRAM)
CN (1) CN1097849C (OSRAM)
WO (1) WO1997047029A1 (OSRAM)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001110755A (ja) * 1999-10-04 2001-04-20 Tokyo Seimitsu Co Ltd 半導体チップ製造方法
JP3368876B2 (ja) * 1999-11-05 2003-01-20 株式会社東京精密 半導体チップ製造方法
JP3992893B2 (ja) * 1999-12-02 2007-10-17 富士通株式会社 半導体装置のアンダーフィル方法
KR100359769B1 (ko) * 2000-02-29 2002-11-07 주식회사 하이닉스반도체 하프톤 위상반전 마스크 및 그 제조방법
DE10029035C1 (de) * 2000-06-13 2002-02-28 Infineon Technologies Ag Verfahren zur Bearbeitung eines Wafers
JP2003332270A (ja) 2002-05-15 2003-11-21 Renesas Technology Corp 半導体装置およびその製造方法
JP4185704B2 (ja) 2002-05-15 2008-11-26 株式会社ルネサステクノロジ 半導体装置の製造方法
JP4961617B2 (ja) * 2007-10-01 2012-06-27 新光電気工業株式会社 配線基板とその製造方法及び半導体装置
JP5080338B2 (ja) * 2008-04-07 2012-11-21 株式会社豊田中央研究所 半導体素子を金属層によって基板に接合したモジュール
JP5503113B2 (ja) 2008-05-08 2014-05-28 古河電気工業株式会社 半導体装置、ウエハ構造体および半導体装置の製造方法
CN101989018B (zh) * 2009-08-05 2012-09-05 群康科技(深圳)有限公司 薄膜晶体管基板
US10421275B2 (en) * 2014-10-30 2019-09-24 Hewlett-Packard Development Company, L.P. Fluid ejection device
JP6950484B2 (ja) * 2017-11-20 2021-10-13 沖電気工業株式会社 半導体素子、発光基板、光プリントヘッド、画像形成装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56103447A (en) * 1980-01-22 1981-08-18 Toshiba Corp Dicing method of semiconductor wafer
JPS6214440A (ja) * 1985-07-12 1987-01-23 Mitsubishi Electric Corp 半導体ウエハ及びその分割方法
JPS6226839A (ja) * 1985-07-29 1987-02-04 Oki Electric Ind Co Ltd 半導体基板
JPS62186569A (ja) * 1986-02-12 1987-08-14 Nec Corp 電界効果型トランジスタの製造方法
JPS6418733U (OSRAM) * 1987-07-22 1989-01-30
JPH0750700B2 (ja) * 1989-06-27 1995-05-31 三菱電機株式会社 半導体チップの製造方法
JPH05136261A (ja) * 1991-11-15 1993-06-01 Kawasaki Steel Corp 半導体チツプ及びウエハのダイシング方法
US5259925A (en) * 1992-06-05 1993-11-09 Mcdonnell Douglas Corporation Method of cleaning a plurality of semiconductor devices
EP0678904A1 (en) * 1994-04-12 1995-10-25 Lsi Logic Corporation Multicut wafer saw process
JPH08293476A (ja) * 1995-04-21 1996-11-05 Hitachi Ltd 半導体集積回路装置の製造方法および半導体ウエハならびにフォトマスク

Also Published As

Publication number Publication date
CN1190489A (zh) 1998-08-12
EP0844648A4 (OSRAM) 1998-06-17
JPH09330891A (ja) 1997-12-22
EP0844648A1 (en) 1998-05-27
KR19990022039A (ko) 1999-03-25
WO1997047029A1 (en) 1997-12-11

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