CN1091950C - 半导体器件及其装配方法 - Google Patents

半导体器件及其装配方法 Download PDF

Info

Publication number
CN1091950C
CN1091950C CN97111651A CN97111651A CN1091950C CN 1091950 C CN1091950 C CN 1091950C CN 97111651 A CN97111651 A CN 97111651A CN 97111651 A CN97111651 A CN 97111651A CN 1091950 C CN1091950 C CN 1091950C
Authority
CN
China
Prior art keywords
lead
semiconductor chip
adhesive
semiconductor device
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN97111651A
Other languages
English (en)
Chinese (zh)
Other versions
CN1165400A (zh
Inventor
大内伸仁
山田悦夫
白石靖
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Publication of CN1165400A publication Critical patent/CN1165400A/zh
Application granted granted Critical
Publication of CN1091950C publication Critical patent/CN1091950C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • H10W74/01
    • H10W70/415
    • H10W72/0113
    • H10W72/07352
    • H10W72/321
    • H10W72/536
    • H10W72/5363
    • H10W72/865
    • H10W74/00
    • H10W90/736
    • H10W90/756

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Die Bonding (AREA)
CN97111651A 1996-04-10 1997-04-10 半导体器件及其装配方法 Expired - Fee Related CN1091950C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP86968/96 1996-04-10
JP8086968A JPH09283545A (ja) 1996-04-10 1996-04-10 樹脂封止型半導体装置及びその製造方法

Publications (2)

Publication Number Publication Date
CN1165400A CN1165400A (zh) 1997-11-19
CN1091950C true CN1091950C (zh) 2002-10-02

Family

ID=13901682

Family Applications (1)

Application Number Title Priority Date Filing Date
CN97111651A Expired - Fee Related CN1091950C (zh) 1996-04-10 1997-04-10 半导体器件及其装配方法

Country Status (7)

Country Link
US (1) US6097083A (enExample)
EP (1) EP0801424B1 (enExample)
JP (1) JPH09283545A (enExample)
KR (1) KR100366110B1 (enExample)
CN (1) CN1091950C (enExample)
DE (1) DE69735032T2 (enExample)
TW (1) TW494507B (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5969410A (en) * 1996-05-09 1999-10-19 Oki Electric Industry Co., Ltd. Semiconductor IC device having chip support element and electrodes on the same surface
JP2001320007A (ja) * 2000-05-09 2001-11-16 Dainippon Printing Co Ltd 樹脂封止型半導体装置用フレーム
JP2005277415A (ja) * 2004-03-23 2005-10-06 Samsung Electronics Co Ltd リードチップ直接付着型半導体パッケージ、その製造方法及び装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06105721B2 (ja) * 1985-03-25 1994-12-21 日立超エル・エス・アイエンジニアリング株式会社 半導体装置
US4974057A (en) * 1986-10-31 1990-11-27 Texas Instruments Incorporated Semiconductor device package with circuit board and resin
JPS6437132U (enExample) * 1987-08-31 1989-03-06
JPH02125454A (ja) * 1988-11-02 1990-05-14 Nec Corp 樹脂封止型半導体装置
US5403785A (en) * 1991-03-03 1995-04-04 Matsushita Electric Works, Ltd. Process of fabrication IC chip package from an IC chip carrier substrate and a leadframe and the IC chip package fabricated thereby
SG44840A1 (en) * 1992-09-09 1997-12-19 Texas Instruments Inc Reduced capacitance lead frame for lead on chip package
JP3137518B2 (ja) * 1993-10-29 2001-02-26 株式会社巴川製紙所 電子部品用液状接着剤およびそれを用いる絶縁接着層の形成方法
TW270213B (enExample) * 1993-12-08 1996-02-11 Matsushita Electric Industrial Co Ltd
US5545921A (en) * 1994-11-04 1996-08-13 International Business Machines, Corporation Personalized area leadframe coining or half etching for reduced mechanical stress at device edge
JP3127195B2 (ja) * 1994-12-06 2001-01-22 シャープ株式会社 発光デバイスおよびその製造方法
TW314650B (enExample) * 1995-06-21 1997-09-01 Oki Electric Ind Co Ltd

Also Published As

Publication number Publication date
US6097083A (en) 2000-08-01
JPH09283545A (ja) 1997-10-31
KR970072220A (ko) 1997-11-07
EP0801424B1 (en) 2006-01-04
DE69735032D1 (de) 2006-03-30
TW494507B (en) 2002-07-11
CN1165400A (zh) 1997-11-19
DE69735032T2 (de) 2006-08-31
EP0801424A3 (enExample) 1997-10-22
KR100366110B1 (ko) 2003-02-19
EP0801424A2 (en) 1997-10-15

Similar Documents

Publication Publication Date Title
CN1099711C (zh) 半导体器件及其制造方法
CN1144276C (zh) 树脂封装型半导体装置的制造方法
CN1176489A (zh) 带有粘接层的芯片上引线封装及其制造方法
CN1199927A (zh) 封装集成电路元件及其制造方法
CN1692501A (zh) 光传感器封装
CN1215501A (zh) 半导体器件及其制作方法
CN1527371A (zh) 光电子元件与用于制造的方法
CN1396657A (zh) 减小尺寸的堆叠式芯片大小的组件型半导体器件
JP2009135353A (ja) 半導体装置及びその製造に使用する樹脂接着材
CN1172345A (zh) 抗裂半导体封装,其制造方法以及所用制造设备
CN1186807C (zh) 电路装置的制造方法
CN100336217C (zh) 树脂密封型半导体器件及其制造方法
CN1231971C (zh) 表面安装型片式半导体器件和制造方法
CN100539091C (zh) 晶片封装结构
CN1091950C (zh) 半导体器件及其装配方法
JPH1050918A (ja) リードフレームに液状の接着剤を塗布して形成された不連続的な接着層を有するリードオンチップ半導体パッケージ及びその製造方法
KR100506035B1 (ko) 반도체 패키지 및 그 제조방법
CN1670952A (zh) 具有增层结构的晶圆级半导体封装件及其制法
CN1945805A (zh) 半导体封装方法以及用于半导体封装的载体
CN1956178A (zh) 光电芯片封装构造、制造方法及其芯片承载件
US6183589B1 (en) Method for manufacturing lead-on-chip (LOC) semiconductor packages using liquid adhesive applied under the leads
CN1702846A (zh) 新型集成电路或分立元件超薄无脚封装工艺及其封装结构
CN1167121C (zh) 具溢胶防止结构的半导体封装件及其制法
CN1173399C (zh) 具溢胶防止装置的半导体封装件
CN1135609C (zh) 半导体器件及其制造方法

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee