CN106030782B - 具有无源器件的低剖型封装 - Google Patents
具有无源器件的低剖型封装 Download PDFInfo
- Publication number
- CN106030782B CN106030782B CN201580008888.6A CN201580008888A CN106030782B CN 106030782 B CN106030782 B CN 106030782B CN 201580008888 A CN201580008888 A CN 201580008888A CN 106030782 B CN106030782 B CN 106030782B
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- substrate
- vias
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- package
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/182—Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/13—Mountings, e.g. non-detachable insulating substrates characterised by the shape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/0006—Printed inductances
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4853—Connection or disconnection of other leads to or from a metallisation, e.g. pins, wires, bumps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/486—Via connections through the substrate with or without pins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49894—Materials of the insulating layers or coatings
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/115—Via connections; Lands around holes or via connections
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
- H05K1/165—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed inductors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4038—Through-connections; Vertical interconnect access [VIA] connections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/20—Inductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15158—Shape the die mounting substrate being other than a cuboid
- H01L2924/15159—Side view
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/157—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15788—Glasses, e.g. amorphous oxides, nitrides or fluorides
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10015—Non-printed capacitor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10242—Metallic cylinders
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10954—Other details of electrical connections
- H05K2201/10984—Component carrying a connection agent, e.g. solder, adhesive
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
- Y10T29/49165—Manufacturing circuit on or in base by forming conductive walled aperture in base
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Inorganic Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Coils Or Transformers For Communication (AREA)
- Semiconductor Integrated Circuits (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Structure Of Printed Boards (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201461941308P | 2014-02-18 | 2014-02-18 | |
| US61/941,308 | 2014-02-18 | ||
| US14/200,684 | 2014-03-07 | ||
| US14/200,684 US20150237732A1 (en) | 2014-02-18 | 2014-03-07 | Low-profile package with passive device |
| PCT/US2015/014895 WO2015126640A1 (en) | 2014-02-18 | 2015-02-06 | Low-profile package with passive device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106030782A CN106030782A (zh) | 2016-10-12 |
| CN106030782B true CN106030782B (zh) | 2020-01-14 |
Family
ID=53799402
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201580008888.6A Active CN106030782B (zh) | 2014-02-18 | 2015-02-06 | 具有无源器件的低剖型封装 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20150237732A1 (enExample) |
| EP (1) | EP3108502A1 (enExample) |
| JP (1) | JP2017515295A (enExample) |
| KR (1) | KR20160123322A (enExample) |
| CN (1) | CN106030782B (enExample) |
| WO (1) | WO2015126640A1 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI607539B (zh) * | 2015-02-16 | 2017-12-01 | 精材科技股份有限公司 | 晶片封裝體及其製造方法 |
| US10321575B2 (en) * | 2015-09-01 | 2019-06-11 | Qualcomm Incorporated | Integrated circuit (IC) module comprising an integrated circuit (IC) package and an interposer with embedded passive components |
| US10074625B2 (en) * | 2015-09-20 | 2018-09-11 | Qualcomm Incorporated | Wafer level package (WLP) ball support using cavity structure |
| US20170092594A1 (en) * | 2015-09-25 | 2017-03-30 | Qualcomm Incorporated | Low profile package with passive device |
| US10044390B2 (en) | 2016-07-21 | 2018-08-07 | Qualcomm Incorporated | Glass substrate including passive-on-glass device and semiconductor die |
| US20180061775A1 (en) * | 2016-08-31 | 2018-03-01 | Qualcomm Incorporated | LOW PROFILE PASSIVE ON GLASS (PoG) DEVICE COMPRISING A DIE |
| DE102016116499B4 (de) * | 2016-09-02 | 2022-06-15 | Infineon Technologies Ag | Verfahren zum Bilden von Halbleiterbauelementen und Halbleiterbauelemente |
| US10194529B2 (en) * | 2016-09-16 | 2019-01-29 | Qualcomm Incorporated | Partial metal fill for preventing extreme-low-k dielectric delamination |
| US10861840B2 (en) * | 2017-08-30 | 2020-12-08 | Advanced Semiconductor Engineering, Inc. | Integrated passive component and method for manufacturing the same |
| KR102513078B1 (ko) * | 2018-10-12 | 2023-03-23 | 삼성전자주식회사 | 반도체 패키지 |
| CN110312363B (zh) * | 2019-06-24 | 2020-10-16 | 维沃移动通信有限公司 | 一种印刷电路板组件及终端 |
| CN111834341B (zh) * | 2020-06-17 | 2021-09-21 | 珠海越亚半导体股份有限公司 | 电容电感嵌埋结构及其制作方法和基板 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1574349A (zh) * | 2003-05-22 | 2005-02-02 | 松下电器产业株式会社 | 大规模集成电路封装 |
| WO2011097089A2 (en) * | 2010-02-03 | 2011-08-11 | Marvell World Trade Ltd. | Recessed semiconductor substrates |
| CN102723306A (zh) * | 2012-06-28 | 2012-10-10 | 中国科学院上海微系统与信息技术研究所 | 一种利用穿硅通孔的微波多芯片封装结构及其制作方法 |
| US20130026609A1 (en) * | 2010-01-18 | 2013-01-31 | Marvell World Trade Ltd. | Package assembly including a semiconductor substrate with stress relief structure |
| US20130113448A1 (en) * | 2011-11-04 | 2013-05-09 | International Business Machines Corporation | Coil inductor for on-chip or on-chip stack |
| US20130292850A1 (en) * | 2010-05-14 | 2013-11-07 | Stats Chippac, Ltd. | Semiconductor Device and Method of Forming Interconnect Structure and Mounting Semiconductor Die in Recessed Encapsulant |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4074342A (en) * | 1974-12-20 | 1978-02-14 | International Business Machines Corporation | Electrical package for lsi devices and assembly process therefor |
| CA2034703A1 (en) * | 1990-01-23 | 1991-07-24 | Masanori Nishiguchi | Substrate for packaging a semiconductor device |
| JP2943788B2 (ja) * | 1997-04-10 | 1999-08-30 | 日立エーアイシー株式会社 | 電子部品搭載用配線基板 |
| JP2000068399A (ja) * | 1998-08-19 | 2000-03-03 | Hitachi Denshi Ltd | 半導体装置 |
| US6569604B1 (en) * | 1999-06-30 | 2003-05-27 | International Business Machines Corporation | Blind via formation in a photoimageable dielectric material |
| JP4513222B2 (ja) * | 2001-03-21 | 2010-07-28 | 富士通株式会社 | 配線基板とその製造方法並びにそれを用いた半導体装置 |
| US20030205799A1 (en) * | 2002-05-03 | 2003-11-06 | Mohammad Yunus | Method and device for assembly of ball grid array packages |
| US20040036170A1 (en) * | 2002-08-20 | 2004-02-26 | Lee Teck Kheng | Double bumping of flexible substrate for first and second level interconnects |
| JP2004207542A (ja) * | 2002-12-26 | 2004-07-22 | Kyocera Corp | 発光素子収納用パッケージおよび発光装置 |
| JP4082220B2 (ja) * | 2003-01-16 | 2008-04-30 | セイコーエプソン株式会社 | 配線基板、半導体モジュールおよび半導体モジュールの製造方法 |
| JP3926753B2 (ja) * | 2003-03-06 | 2007-06-06 | 富士通株式会社 | コネクタ基板の製造方法 |
| US7327554B2 (en) * | 2003-03-19 | 2008-02-05 | Ngk Spark Plug Co., Ltd. | Assembly of semiconductor device, interposer and substrate |
| US7843302B2 (en) * | 2006-05-08 | 2010-11-30 | Ibiden Co., Ltd. | Inductor and electric power supply using it |
| US8084854B2 (en) * | 2007-12-28 | 2011-12-27 | Micron Technology, Inc. | Pass-through 3D interconnect for microelectronic dies and associated systems and methods |
| US20110050334A1 (en) * | 2009-09-02 | 2011-03-03 | Qualcomm Incorporated | Integrated Voltage Regulator with Embedded Passive Device(s) |
| WO2012040063A1 (en) * | 2010-09-23 | 2012-03-29 | Qualcomm Mems Technologies, Inc. | Integrated passives and power amplifier |
| US9579738B2 (en) * | 2011-02-25 | 2017-02-28 | International Business Machines Corporation | Flux composition and techniques for use thereof |
| US9058973B2 (en) * | 2011-04-13 | 2015-06-16 | International Business Machines Corporation | Passive devices fabricated on glass substrates, methods of manufacture and design structures |
| US10312007B2 (en) * | 2012-12-11 | 2019-06-04 | Intel Corporation | Inductor formed in substrate |
| US9130016B2 (en) * | 2013-04-15 | 2015-09-08 | Schott Corporation | Method of manufacturing through-glass vias |
-
2014
- 2014-03-07 US US14/200,684 patent/US20150237732A1/en not_active Abandoned
-
2015
- 2015-02-06 JP JP2016552347A patent/JP2017515295A/ja active Pending
- 2015-02-06 EP EP15706104.5A patent/EP3108502A1/en not_active Withdrawn
- 2015-02-06 WO PCT/US2015/014895 patent/WO2015126640A1/en not_active Ceased
- 2015-02-06 CN CN201580008888.6A patent/CN106030782B/zh active Active
- 2015-02-06 KR KR1020167024477A patent/KR20160123322A/ko not_active Withdrawn
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1574349A (zh) * | 2003-05-22 | 2005-02-02 | 松下电器产业株式会社 | 大规模集成电路封装 |
| US20130026609A1 (en) * | 2010-01-18 | 2013-01-31 | Marvell World Trade Ltd. | Package assembly including a semiconductor substrate with stress relief structure |
| WO2011097089A2 (en) * | 2010-02-03 | 2011-08-11 | Marvell World Trade Ltd. | Recessed semiconductor substrates |
| US20130292850A1 (en) * | 2010-05-14 | 2013-11-07 | Stats Chippac, Ltd. | Semiconductor Device and Method of Forming Interconnect Structure and Mounting Semiconductor Die in Recessed Encapsulant |
| US20130113448A1 (en) * | 2011-11-04 | 2013-05-09 | International Business Machines Corporation | Coil inductor for on-chip or on-chip stack |
| CN102723306A (zh) * | 2012-06-28 | 2012-10-10 | 中国科学院上海微系统与信息技术研究所 | 一种利用穿硅通孔的微波多芯片封装结构及其制作方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20160123322A (ko) | 2016-10-25 |
| EP3108502A1 (en) | 2016-12-28 |
| WO2015126640A1 (en) | 2015-08-27 |
| JP2017515295A (ja) | 2017-06-08 |
| CN106030782A (zh) | 2016-10-12 |
| US20150237732A1 (en) | 2015-08-20 |
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