CN103894347B - 分选机以及部件检查装置 - Google Patents

分选机以及部件检查装置 Download PDF

Info

Publication number
CN103894347B
CN103894347B CN201410112653.9A CN201410112653A CN103894347B CN 103894347 B CN103894347 B CN 103894347B CN 201410112653 A CN201410112653 A CN 201410112653A CN 103894347 B CN103894347 B CN 103894347B
Authority
CN
China
Prior art keywords
mentioned
press section
pressure
motor
arm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201410112653.9A
Other languages
English (en)
Chinese (zh)
Other versions
CN103894347A (zh
Inventor
下岛聪兴
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of CN103894347A publication Critical patent/CN103894347A/zh
Application granted granted Critical
Publication of CN103894347B publication Critical patent/CN103894347B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
CN201410112653.9A 2011-08-25 2012-07-27 分选机以及部件检查装置 Expired - Fee Related CN103894347B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011-184058 2011-08-25
JP2011184058A JP2013044684A (ja) 2011-08-25 2011-08-25 ハンドラー、及び部品検査装置
CN201210265172.2A CN102950114B (zh) 2011-08-25 2012-07-27 分选机以及部件检查装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201210265172.2A Division CN102950114B (zh) 2011-08-25 2012-07-27 分选机以及部件检查装置

Publications (2)

Publication Number Publication Date
CN103894347A CN103894347A (zh) 2014-07-02
CN103894347B true CN103894347B (zh) 2016-06-22

Family

ID=47759835

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201410112653.9A Expired - Fee Related CN103894347B (zh) 2011-08-25 2012-07-27 分选机以及部件检查装置
CN201210265172.2A Expired - Fee Related CN102950114B (zh) 2011-08-25 2012-07-27 分选机以及部件检查装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201210265172.2A Expired - Fee Related CN102950114B (zh) 2011-08-25 2012-07-27 分选机以及部件检查装置

Country Status (4)

Country Link
JP (1) JP2013044684A (ko)
KR (2) KR101384928B1 (ko)
CN (2) CN103894347B (ko)
TW (3) TWI623475B (ko)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5796104B1 (ja) * 2014-05-07 2015-10-21 株式会社 Ｓｙｎａｘ 電子部品測定用のコンタクトモジュール
TWI668174B (zh) * 2015-05-27 2019-08-11 日商精工愛普生股份有限公司 電子零件搬送裝置及電子零件檢查裝置
JP2017116369A (ja) * 2015-12-24 2017-06-29 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP2017151011A (ja) * 2016-02-26 2017-08-31 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
CN107176450A (zh) * 2016-03-09 2017-09-19 精工爱普生株式会社 电子部件运送装置、以及电子部件检查装置
JP2017173075A (ja) * 2016-03-23 2017-09-28 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
CN106583275B (zh) * 2016-10-17 2019-06-07 珠海格力电器股份有限公司 一种被测板流向控制装置、方法及视觉检测设备
KR200488182Y1 (ko) * 2017-07-24 2018-12-24 주식회사 아이에스시 검사용 가압장치
CN109709463A (zh) * 2017-10-25 2019-05-03 泰克元有限公司 机械手
CN107953338B (zh) * 2017-12-29 2023-04-11 深圳市越疆科技有限公司 一种机器人分拣物品的方法、装置及机械臂
CN110244141B (zh) * 2018-03-09 2021-10-08 泰克元有限公司 电子部件测试用分选机
JP6976892B2 (ja) * 2018-03-29 2021-12-08 日本電産コパル電子株式会社 トルクセンサ

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1208258A (zh) * 1996-11-18 1999-02-17 株式会社鼎新 水平传送检验处理器
CN1249863A (zh) * 1997-02-05 2000-04-05 Smc株式会社 致动器及其控制装置
CN101126768A (zh) * 2001-11-30 2008-02-20 东京毅力科创株式会社 挤压件
CN101849190A (zh) * 2007-11-26 2010-09-29 株式会社爱德万测试 插入件、托盘及电子元件测试装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000193716A (ja) * 1998-12-25 2000-07-14 Shinano Electronics:Kk Ｉｃテストハンドラ
JP2001133515A (ja) * 1999-11-09 2001-05-18 Nec Corp 半導体装置のテスト治具
JP4327335B2 (ja) * 2000-06-23 2009-09-09 株式会社アドバンテスト コンタクトアームおよびこれを用いた電子部品試験装置
WO2008041334A1 (en) * 2006-10-04 2008-04-10 Advantest Corporation Electronic component testing apparatus
JP4803006B2 (ja) * 2006-11-29 2011-10-26 セイコーエプソン株式会社 Ｉｃハンドラ
KR20070121022A (ko) * 2007-10-26 2007-12-26 가부시키가이샤 아드반테스트 전자부품의 픽 ＆ 플레이스 기구, 전자부품 핸들링 장치 및전자부품의 흡착방법

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1208258A (zh) * 1996-11-18 1999-02-17 株式会社鼎新 水平传送检验处理器
CN1249863A (zh) * 1997-02-05 2000-04-05 Smc株式会社 致动器及其控制装置
CN101126768A (zh) * 2001-11-30 2008-02-20 东京毅力科创株式会社 挤压件
CN101849190A (zh) * 2007-11-26 2010-09-29 株式会社爱德万测试 插入件、托盘及电子元件测试装置

Also Published As

Publication number Publication date
JP2013044684A (ja) 2013-03-04
KR101384928B1 (ko) 2014-04-14
KR20130139814A (ko) 2013-12-23
TWI623475B (zh) 2018-05-11
KR101776360B1 (ko) 2017-09-07
TW201512065A (zh) 2015-04-01
KR20130023152A (ko) 2013-03-07
TWI592673B (zh) 2017-07-21
CN102950114B (zh) 2015-09-09
TW201309575A (zh) 2013-03-01
CN102950114A (zh) 2013-03-06
TW201627216A (zh) 2016-08-01
TWI470244B (zh) 2015-01-21
CN103894347A (zh) 2014-07-02

Similar Documents

Publication Publication Date Title
CN103894347B (zh) 分选机以及部件检查装置
CN1201159C (zh) 接触臂及采用该接触臂的电子零件试验装置
CN104353943B (zh) 一种制冷压缩机壳体的生产设备
CN103359463B (zh) 输送单元及输送装置
CN204277245U (zh) 一种制冷压缩机壳体的生产设备
US20140311856A1 (en) Operation apparatus and control method
KR20060033397A (ko) 반도체 소자 테스트 핸들러의 소자 접속장치
CN105383911A (zh) 一种可升降输送装置
CN115188683A (zh) 芯片自动测试控制装置及方法
CN107096731B (zh) 用于测试电子部件的分选机的加压装置
KR20230060187A (ko) 전자부품 핸들러용 거치기
KR20000067570A (ko) 번인 테스터용 소팅 핸들러의 포킹 및 언포킹 픽커
CN106392532A (zh) 开关自动组装检测设备及其使用方法
KR101510337B1 (ko) 연료전지 스택 자동 언로딩 장치
CN116276047A (zh) 轴承入前支架自动组装设备及马达自动组装线
JP5527463B2 (ja) 電子部品搬送装置
CN100410660C (zh) 双排梳齿形电极开合线圈轮对磁粉探伤机
CN114261758A (zh) 一种滚筒式电池输送系统的物料转移系统
CN111468432A (zh) 一种灯具检测系统
JP2013044683A (ja) ハンドラー、及び部品検査装置
CN220137186U (zh) 电池测试装置及电池生产系统
CN219966986U (zh) 夹取装置及具有其的组装系统
CN210605023U (zh) 一种检测装置
CN212082557U (zh) 一种静态称重设备
CN114104683B (zh) 适用于物联网智能制造的机电阀阀芯载具回送装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160622

Termination date: 20190727

CF01 Termination of patent right due to non-payment of annual fee