CN103443898A - 用于热辅助解吸电离系统的装置和方法 - Google Patents

用于热辅助解吸电离系统的装置和方法 Download PDF

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Publication number
CN103443898A
CN103443898A CN2012800031013A CN201280003101A CN103443898A CN 103443898 A CN103443898 A CN 103443898A CN 2012800031013 A CN2012800031013 A CN 2012800031013A CN 201280003101 A CN201280003101 A CN 201280003101A CN 103443898 A CN103443898 A CN 103443898A
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China
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mesh
analyte
spectrometer
sample
source
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Chinese (zh)
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J·克雷奇曼
B·D·马斯莱曼
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IonSense Inc
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IonSense Inc
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/626—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H01J27/26—Ion sources; Ion guns using surface ionisation, e.g. field effect ion sources, thermionic ion sources
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/12—Ion sources; Ion guns using an arc discharge, e.g. of the duoplasmatron type
    • H01J49/126—Other arc discharge ion sources using an applied magnetic field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/24—Nuclear magnetic resonance, electron spin resonance or other spin effects or mass spectrometry

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electrochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Combustion & Propulsion (AREA)
  • Toxicology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electron Tubes For Measurement (AREA)
CN2012800031013A 2011-02-05 2012-02-06 用于热辅助解吸电离系统的装置和方法 Pending CN103443898A (zh)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US201161439866P 2011-02-05 2011-02-05
US61/439,866 2011-02-05
US201161582204P 2011-12-30 2011-12-30
US61/582,204 2011-12-30
US13/364,322 2012-01-02
US201261587218P 2012-01-17 2012-01-17
US61/587,218 2012-01-17
US13/364,322 US8822949B2 (en) 2011-02-05 2012-02-02 Apparatus and method for thermal assisted desorption ionization systems
PCT/US2012/000061 WO2012106054A2 (en) 2011-02-05 2012-02-06 Apparatus and method for thermal assisted desorption ionization systems

Publications (1)

Publication Number Publication Date
CN103443898A true CN103443898A (zh) 2013-12-11

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CN2012800031013A Pending CN103443898A (zh) 2011-02-05 2012-02-06 用于热辅助解吸电离系统的装置和方法

Country Status (6)

Country Link
US (10) US8822949B2 (enExample)
EP (1) EP2671244B1 (enExample)
JP (1) JP2014508927A (enExample)
KR (1) KR101979035B1 (enExample)
CN (1) CN103443898A (enExample)
WO (1) WO2012106054A2 (enExample)

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CN105021718A (zh) * 2014-04-28 2015-11-04 南京工业大学 一种液相色谱与敞开式离子化质谱在线联用接口和检测方法
CN106483186A (zh) * 2016-10-11 2017-03-08 清华大学 一种离子化质谱检测装置及其应用
CN106601586A (zh) * 2016-12-02 2017-04-26 上海裕达实业有限公司 基于电喷雾电离源去溶剂化的加热电离装置
CN106796866A (zh) * 2014-04-11 2017-05-31 香港大学 大气压兆伏静电场电离解吸（apme‑fid）的方法和系统
CN106960777A (zh) * 2016-12-31 2017-07-18 宁波华仪宁创智能科技有限公司 质谱分析系统及其工作方法
CN108364848A (zh) * 2017-12-31 2018-08-03 宁波大学 便携式离子源及其工作方法
CN110058494A (zh) * 2014-03-18 2019-07-26 Asml荷兰有限公司 利用rf等离子场对euv光学器件的主动净化的装置和方法
CN110391129A (zh) * 2018-04-20 2019-10-29 岛津分析技术研发（上海）有限公司 离子化装置、质谱仪、离子迁移谱仪及离子化方法
CN111684271A (zh) * 2018-02-09 2020-09-18 浜松光子学株式会社 试样支承体及试样支承体的制造方法
CN118019572A (zh) * 2021-10-01 2024-05-10 阳光技术有限责任公司 具有用于离子收集的纤维晶格的离子产生系统
CN119170482A (zh) * 2024-08-20 2024-12-20 湖南大学 一种用于微塑料质谱分析的大气压激光解离-二次电喷雾离子源

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JP6803400B2 (ja) 2016-05-10 2020-12-23 ジェイ・ピィ・サイエンティフィック・リミテッドＪｐ Ｓｃｉｅｎｔｉｆｉｃ Ｌｉｍｉｔｅｄ 固相マイクロ抽出装置上に吸着された分析物を脱着および検出するためのシステムおよび方法
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