CN103339713B - 用于降低soi结构的器件层中的金属含量的方法以及通过该方法制造的soi结构 - Google Patents
用于降低soi结构的器件层中的金属含量的方法以及通过该方法制造的soi结构 Download PDFInfo
- Publication number
- CN103339713B CN103339713B CN201280007174.XA CN201280007174A CN103339713B CN 103339713 B CN103339713 B CN 103339713B CN 201280007174 A CN201280007174 A CN 201280007174A CN 103339713 B CN103339713 B CN 103339713B
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- Prior art keywords
- silicon
- device layer
- layer
- silicon device
- metal
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/113—Isolations within a component, i.e. internal isolations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P36/00—Gettering within semiconductor bodies
- H10P36/03—Gettering within semiconductor bodies within silicon bodies
- H10P36/07—Gettering within semiconductor bodies within silicon bodies of silicon-on-insulator structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/19—Preparing inhomogeneous wafers
- H10P90/1904—Preparing vertically inhomogeneous wafers
- H10P90/1906—Preparing SOI wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/19—Preparing inhomogeneous wafers
- H10P90/1904—Preparing vertically inhomogeneous wafers
- H10P90/1906—Preparing SOI wafers
- H10P90/1914—Preparing SOI wafers using bonding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/10—Isolation regions comprising dielectric materials
- H10W10/181—Semiconductor-on-insulator [SOI] isolation regions, e.g. buried oxide regions of SOI wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P36/00—Gettering within semiconductor bodies
- H10P36/03—Gettering within semiconductor bodies within silicon bodies
Landscapes
- Element Separation (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Formation Of Insulating Films (AREA)
- Weting (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161437993P | 2011-01-31 | 2011-01-31 | |
| US61/437,993 | 2011-01-31 | ||
| US13/354,788 US8796116B2 (en) | 2011-01-31 | 2012-01-20 | Methods for reducing the metal content in the device layer of SOI structures and SOI structures produced by such methods |
| US13/354,788 | 2012-01-20 | ||
| PCT/US2012/022970 WO2012106210A2 (en) | 2011-01-31 | 2012-01-27 | Methods for reducing the metal content in the device layer of soi structures and soi structures produced by such methods |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103339713A CN103339713A (zh) | 2013-10-02 |
| CN103339713B true CN103339713B (zh) | 2016-06-15 |
Family
ID=46576658
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280007174.XA Active CN103339713B (zh) | 2011-01-31 | 2012-01-27 | 用于降低soi结构的器件层中的金属含量的方法以及通过该方法制造的soi结构 |
Country Status (9)
| Country | Link |
|---|---|
| US (3) | US8796116B2 (enExample) |
| EP (1) | EP2671247B1 (enExample) |
| JP (1) | JP5976013B2 (enExample) |
| KR (1) | KR101871534B1 (enExample) |
| CN (1) | CN103339713B (enExample) |
| MY (1) | MY166803A (enExample) |
| SG (1) | SG191966A1 (enExample) |
| TW (1) | TW201250838A (enExample) |
| WO (1) | WO2012106210A2 (enExample) |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9064789B2 (en) * | 2013-08-12 | 2015-06-23 | International Business Machines Corporation | Bonded epitaxial oxide structures for compound semiconductor on silicon substrates |
| WO2015112308A1 (en) | 2014-01-23 | 2015-07-30 | Sunedison Semiconductor Limited | High resistivity soi wafers and a method of manufacturing thereof |
| US9899499B2 (en) | 2014-09-04 | 2018-02-20 | Sunedison Semiconductor Limited (Uen201334164H) | High resistivity silicon-on-insulator wafer manufacturing method for reducing substrate loss |
| US9853133B2 (en) * | 2014-09-04 | 2017-12-26 | Sunedison Semiconductor Limited (Uen201334164H) | Method of manufacturing high resistivity silicon-on-insulator substrate |
| WO2016081367A1 (en) | 2014-11-18 | 2016-05-26 | Sunedison Semiconductor Limited | HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE TRAPPING LAYER FORMED BY He-N2 CO-IMPLANTATION |
| WO2016081313A1 (en) | 2014-11-18 | 2016-05-26 | Sunedison Semiconductor Limited | A method of manufacturing high resistivity semiconductor-on-insulator wafers with charge trapping layers |
| US10483152B2 (en) | 2014-11-18 | 2019-11-19 | Globalwafers Co., Ltd. | High resistivity semiconductor-on-insulator wafer and a method of manufacturing |
| EP3367424B1 (en) | 2015-03-03 | 2022-10-19 | GlobalWafers Co., Ltd. | Charge trapping polycrystalline silicon films on silicon substrates with controllable film stress |
| WO2016149113A1 (en) | 2015-03-17 | 2016-09-22 | Sunedison Semiconductor Limited | Thermally stable charge trapping layer for use in manufacture of semiconductor-on-insulator structures |
| US9881832B2 (en) | 2015-03-17 | 2018-01-30 | Sunedison Semiconductor Limited (Uen201334164H) | Handle substrate for use in manufacture of semiconductor-on-insulator structure and method of manufacturing thereof |
| CN107667416B (zh) | 2015-06-01 | 2021-08-31 | 环球晶圆股份有限公司 | 制造绝缘体上半导体的方法 |
| EP3739620B1 (en) | 2015-06-01 | 2022-02-16 | GlobalWafers Co., Ltd. | A silicon germanium-on-insulator structure |
| SG11201804271QA (en) | 2015-11-20 | 2018-06-28 | Sunedison Semiconductor Ltd | Manufacturing method of smoothing a semiconductor surface |
| US9806025B2 (en) * | 2015-12-29 | 2017-10-31 | Globalfoundries Inc. | SOI wafers with buried dielectric layers to prevent Cu diffusion |
| US10622247B2 (en) | 2016-02-19 | 2020-04-14 | Globalwafers Co., Ltd. | Semiconductor on insulator structure comprising a buried high resistivity layer |
| US10468294B2 (en) | 2016-02-19 | 2019-11-05 | Globalwafers Co., Ltd. | High resistivity silicon-on-insulator substrate comprising a charge trapping layer formed on a substrate with a rough surface |
| US9831115B2 (en) | 2016-02-19 | 2017-11-28 | Sunedison Semiconductor Limited (Uen201334164H) | Process flow for manufacturing semiconductor on insulator structures in parallel |
| US11114332B2 (en) | 2016-03-07 | 2021-09-07 | Globalwafers Co., Ltd. | Semiconductor on insulator structure comprising a plasma nitride layer and method of manufacture thereof |
| WO2017155804A1 (en) | 2016-03-07 | 2017-09-14 | Sunedison Semiconductor Limited | Method of manufacturing a semiconductor on insulator structure by a pressurized bond treatment |
| JP7002456B2 (ja) | 2016-03-07 | 2022-01-20 | グローバルウェーハズ カンパニー リミテッド | 低温流動性酸化物層を含む半導体オンインシュレータ構造およびその製造方法 |
| US10573550B2 (en) | 2016-03-07 | 2020-02-25 | Globalwafers Co., Ltd. | Semiconductor on insulator structure comprising a plasma oxide layer and method of manufacture thereof |
| SG10202106913TA (en) | 2016-06-08 | 2021-08-30 | Globalwafers Co Ltd | High resistivity single crystal silicon ingot and wafer having improved mechanical strength |
| US10269617B2 (en) | 2016-06-22 | 2019-04-23 | Globalwafers Co., Ltd. | High resistivity silicon-on-insulator substrate comprising an isolation region |
| FR3057705B1 (fr) * | 2016-10-13 | 2019-04-12 | Soitec | Procede de dissolution d'un oxyde enterre dans une plaquette de silicium sur isolant |
| US10546771B2 (en) | 2016-10-26 | 2020-01-28 | Globalwafers Co., Ltd. | High resistivity silicon-on-insulator substrate having enhanced charge trapping efficiency |
| WO2018106535A1 (en) | 2016-12-05 | 2018-06-14 | Sunedison Semiconductor Limited | High resistivity silicon-on-insulator structure and method of manufacture thereof |
| EP3562978B1 (en) | 2016-12-28 | 2021-03-10 | Sunedison Semiconductor Limited | Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield |
| WO2018125673A2 (en) * | 2016-12-28 | 2018-07-05 | Invensas Bonding Technologies, Inc | Processing stacked substrates |
| EP3989272A1 (en) | 2017-07-14 | 2022-04-27 | Sunedison Semiconductor Limited | Method of manufacture of a semiconductor on insulator structure |
| CN107946231B (zh) * | 2017-11-22 | 2020-06-16 | 上海华力微电子有限公司 | 一种FDSOI器件SOI和bulk区域浅槽形貌优化方法 |
| US10964664B2 (en) | 2018-04-20 | 2021-03-30 | Invensas Bonding Technologies, Inc. | DBI to Si bonding for simplified handle wafer |
| WO2019209492A1 (en) | 2018-04-27 | 2019-10-31 | Globalwafers Co., Ltd. | Light assisted platelet formation facilitating layer transfer from a semiconductor donor substrate |
| CN112262467B (zh) | 2018-06-08 | 2024-08-09 | 环球晶圆股份有限公司 | 将硅薄层移转的方法 |
| US10943813B2 (en) * | 2018-07-13 | 2021-03-09 | Globalwafers Co., Ltd. | Radio frequency silicon on insulator wafer platform with superior performance, stability, and manufacturability |
| JP2024515033A (ja) | 2021-03-31 | 2024-04-04 | アデイア セミコンダクター ボンディング テクノロジーズ インコーポレイテッド | 担体の直接ボンディング及び剥離 |
| US11798802B2 (en) * | 2022-02-11 | 2023-10-24 | Globalwafers Co., Ltd. | Methods for stripping and cleaning semiconductor structures |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6548382B1 (en) * | 1997-07-18 | 2003-04-15 | Silicon Genesis Corporation | Gettering technique for wafers made using a controlled cleaving process |
| CN1630024A (zh) * | 1996-01-19 | 2005-06-22 | 株式会社半导体能源研究所 | 半导体器件及其制造方法 |
| CN1981369A (zh) * | 2004-05-07 | 2007-06-13 | Memc电子材料有限公司 | 减少硅晶片中的金属杂质的方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4824698A (en) * | 1987-12-23 | 1989-04-25 | General Electric Company | High temperature annealing to improve SIMOX characteristics |
| JP2617798B2 (ja) | 1989-09-22 | 1997-06-04 | 三菱電機株式会社 | 積層型半導体装置およびその製造方法 |
| JPH07106512A (ja) | 1993-10-04 | 1995-04-21 | Sharp Corp | 分子イオン注入を用いたｓｉｍｏｘ処理方法 |
| US5478758A (en) | 1994-06-03 | 1995-12-26 | At&T Corp. | Method of making a getterer for multi-layer wafers |
| JPH09260288A (ja) * | 1996-01-19 | 1997-10-03 | Semiconductor Energy Lab Co Ltd | 半導体装置及びその作製方法 |
| US5888858A (en) | 1996-01-20 | 1999-03-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and fabrication method thereof |
| US6033974A (en) | 1997-05-12 | 2000-03-07 | Silicon Genesis Corporation | Method for controlled cleaving process |
| JPH1167778A (ja) * | 1997-08-19 | 1999-03-09 | Sumitomo Metal Ind Ltd | Ｓｏｉ半導体ウエーハの製造方法 |
| US7256104B2 (en) | 2003-05-21 | 2007-08-14 | Canon Kabushiki Kaisha | Substrate manufacturing method and substrate processing apparatus |
| US7294561B2 (en) | 2003-08-14 | 2007-11-13 | Ibis Technology Corporation | Internal gettering in SIMOX SOI silicon substrates |
| WO2008053042A1 (en) * | 2006-11-02 | 2008-05-08 | Interuniversitair Microelektronica Centrum | Removal of impurities from semiconductor device layers |
-
2012
- 2012-01-20 US US13/354,788 patent/US8796116B2/en active Active
- 2012-01-27 CN CN201280007174.XA patent/CN103339713B/zh active Active
- 2012-01-27 WO PCT/US2012/022970 patent/WO2012106210A2/en not_active Ceased
- 2012-01-27 JP JP2013551383A patent/JP5976013B2/ja active Active
- 2012-01-27 MY MYPI2013002736A patent/MY166803A/en unknown
- 2012-01-27 SG SG2013053798A patent/SG191966A1/en unknown
- 2012-01-27 EP EP12706356.8A patent/EP2671247B1/en active Active
- 2012-01-27 KR KR1020137020296A patent/KR101871534B1/ko active Active
- 2012-01-31 TW TW101103124A patent/TW201250838A/zh unknown
-
2013
- 2013-02-08 US US13/762,974 patent/US20130168802A1/en not_active Abandoned
- 2013-02-08 US US13/762,967 patent/US20130168836A1/en not_active Abandoned
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1630024A (zh) * | 1996-01-19 | 2005-06-22 | 株式会社半导体能源研究所 | 半导体器件及其制造方法 |
| US6548382B1 (en) * | 1997-07-18 | 2003-04-15 | Silicon Genesis Corporation | Gettering technique for wafers made using a controlled cleaving process |
| CN1981369A (zh) * | 2004-05-07 | 2007-06-13 | Memc电子材料有限公司 | 减少硅晶片中的金属杂质的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012106210A3 (en) | 2012-11-01 |
| JP2014508405A (ja) | 2014-04-03 |
| US20130168802A1 (en) | 2013-07-04 |
| WO2012106210A2 (en) | 2012-08-09 |
| TW201250838A (en) | 2012-12-16 |
| CN103339713A (zh) | 2013-10-02 |
| JP5976013B2 (ja) | 2016-08-23 |
| US20130168836A1 (en) | 2013-07-04 |
| US20120193753A1 (en) | 2012-08-02 |
| EP2671247B1 (en) | 2015-07-22 |
| SG191966A1 (en) | 2013-08-30 |
| KR20140018872A (ko) | 2014-02-13 |
| EP2671247A2 (en) | 2013-12-11 |
| US8796116B2 (en) | 2014-08-05 |
| MY166803A (en) | 2018-07-23 |
| KR101871534B1 (ko) | 2018-06-26 |
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Legal Events
| Date | Code | Title | Description |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20190925 Address after: Taiwan, China Hsinchu Science Park industrial two East Road, No. 8 Patentee after: GlobalWafers Co.,Ltd. Address before: Singapore City Patentee before: SunEdison Semiconductor Limited (UEN201334164H) Effective date of registration: 20190925 Address after: Singapore City Patentee after: SunEdison Semiconductor Limited (UEN201334164H) Address before: Missouri, USA Patentee before: MEMC Electronic Materials, Inc. |
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| TR01 | Transfer of patent right |