CN102651327B - 基板清洗装置及方法、显示装置的制造装置及其制造方法 - Google Patents
基板清洗装置及方法、显示装置的制造装置及其制造方法 Download PDFInfo
- Publication number
- CN102651327B CN102651327B CN201210044963.2A CN201210044963A CN102651327B CN 102651327 B CN102651327 B CN 102651327B CN 201210044963 A CN201210044963 A CN 201210044963A CN 102651327 B CN102651327 B CN 102651327B
- Authority
- CN
- China
- Prior art keywords
- substrate
- cleaning
- cleaned
- liquid
- conveying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/20—Cleaning during device manufacture
- H10P70/27—Cleaning during device manufacture during, before or after processing of conductive materials, e.g. polysilicon or amorphous silicon layers
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
- Liquid Crystal (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP040170/2011 | 2011-02-25 | ||
| JP2011040170A JP5690168B2 (ja) | 2011-02-25 | 2011-02-25 | 基板洗浄装置、基板洗浄方法、表示装置の製造装置及び表示装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102651327A CN102651327A (zh) | 2012-08-29 |
| CN102651327B true CN102651327B (zh) | 2014-11-12 |
Family
ID=46693302
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210044963.2A Expired - Fee Related CN102651327B (zh) | 2011-02-25 | 2012-02-24 | 基板清洗装置及方法、显示装置的制造装置及其制造方法 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP5690168B2 (enExample) |
| KR (1) | KR101373784B1 (enExample) |
| CN (1) | CN102651327B (enExample) |
| TW (1) | TWI469198B (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014065026A (ja) * | 2012-09-10 | 2014-04-17 | Panasonic Corp | 表面処理装置及び表面処理方法 |
| JP6329342B2 (ja) * | 2013-06-07 | 2018-05-23 | 株式会社ダルトン | 洗浄方法及び洗浄装置 |
| JP6268410B2 (ja) * | 2013-09-27 | 2018-01-31 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
| KR101607521B1 (ko) | 2014-07-08 | 2016-03-31 | 세메스 주식회사 | 기판 처리 장치 및 방법 |
| CN110544647A (zh) * | 2018-11-06 | 2019-12-06 | 北京北方华创微电子装备有限公司 | 金属互连清洗装置及清洗方法 |
| CN109616551B (zh) * | 2018-11-19 | 2021-02-09 | 横店集团东磁股份有限公司 | 一种多晶表面有机物不良电池片返工工艺 |
| CN110473773B (zh) * | 2019-08-22 | 2022-03-22 | 北京北方华创微电子装备有限公司 | 晶圆清洗方法及晶圆清洗设备 |
| KR102404528B1 (ko) | 2019-09-02 | 2022-06-02 | 세메스 주식회사 | 노즐, 이를 포함하는 기판 처리 장치 및 기판 처리 방법 |
| CN110676153A (zh) * | 2019-09-20 | 2020-01-10 | 常州捷佳创精密机械有限公司 | 太阳能电池、臭氧溶液施加装置及太阳能电池的制备方法 |
| JP2024134798A (ja) * | 2023-03-22 | 2024-10-04 | 株式会社Screenホールディングス | 基板処理方法及びその装置 |
| JP2024143699A (ja) * | 2023-03-30 | 2024-10-11 | 高周波熱錬株式会社 | キャリアフィルムの洗浄方法及び洗浄装置 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0845886A (ja) * | 1994-07-29 | 1996-02-16 | Sumitomo Sitix Corp | 半導体ウエーハの洗浄液及びこれを用いた半導体ウエーハの洗浄方法 |
| JPH1157636A (ja) * | 1997-06-13 | 1999-03-02 | Tadahiro Omi | 洗浄方法 |
| JP2000091291A (ja) * | 1998-09-11 | 2000-03-31 | Memc Kk | シリコンウエハの洗浄方法 |
| JP2001053050A (ja) * | 1999-06-01 | 2001-02-23 | Komatsu Electronic Metals Co Ltd | 半導体基板の洗浄方法 |
| JP2001284316A (ja) * | 2000-03-30 | 2001-10-12 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
| CN1693958A (zh) * | 2004-04-30 | 2005-11-09 | 精工爱普生株式会社 | 液晶显示装置的制造方法、制造装置、液晶显示装置及电子机器 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0226658A (ja) * | 1988-07-15 | 1990-01-29 | Matsushita Electric Works Ltd | 微細気泡発生ノズル |
| JP2820275B2 (ja) * | 1989-07-17 | 1998-11-05 | 富士通株式会社 | 洗浄装置 |
| JP3660391B2 (ja) * | 1994-05-27 | 2005-06-15 | 株式会社東芝 | 半導体装置の製造方法 |
| JP2000040682A (ja) * | 1998-07-23 | 2000-02-08 | Sumitomo Metal Ind Ltd | 半導体基板の洗浄方法及び洗浄装置 |
| JP2006289240A (ja) * | 2005-04-08 | 2006-10-26 | Shibaura Mechatronics Corp | 基板の処理装置及び処理方法 |
| JP2008098430A (ja) * | 2006-10-12 | 2008-04-24 | Dainippon Screen Mfg Co Ltd | 基板処理装置および基板処理方法 |
| JP2009000595A (ja) * | 2007-06-19 | 2009-01-08 | Dainippon Screen Mfg Co Ltd | ウエット洗浄装置および基板洗浄システム |
| CN101939826B (zh) * | 2008-02-07 | 2012-08-22 | 独立行政法人产业技术综合研究所 | 半导体晶片的清洗方法以及清洗装置 |
| JP5522028B2 (ja) * | 2010-03-09 | 2014-06-18 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法及び記憶媒体 |
| JP5361790B2 (ja) * | 2010-04-28 | 2013-12-04 | 株式会社東芝 | 半導体基板の表面処理方法 |
| JP5751895B2 (ja) * | 2010-06-08 | 2015-07-22 | 株式会社日立国際電気 | 半導体装置の製造方法、クリーニング方法および基板処理装置 |
-
2011
- 2011-02-25 JP JP2011040170A patent/JP5690168B2/ja not_active Expired - Fee Related
-
2012
- 2012-02-02 KR KR1020120010603A patent/KR101373784B1/ko not_active Expired - Fee Related
- 2012-02-14 TW TW101104712A patent/TWI469198B/zh not_active IP Right Cessation
- 2012-02-24 CN CN201210044963.2A patent/CN102651327B/zh not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0845886A (ja) * | 1994-07-29 | 1996-02-16 | Sumitomo Sitix Corp | 半導体ウエーハの洗浄液及びこれを用いた半導体ウエーハの洗浄方法 |
| JPH1157636A (ja) * | 1997-06-13 | 1999-03-02 | Tadahiro Omi | 洗浄方法 |
| JP2000091291A (ja) * | 1998-09-11 | 2000-03-31 | Memc Kk | シリコンウエハの洗浄方法 |
| JP2001053050A (ja) * | 1999-06-01 | 2001-02-23 | Komatsu Electronic Metals Co Ltd | 半導体基板の洗浄方法 |
| JP2001284316A (ja) * | 2000-03-30 | 2001-10-12 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
| CN1693958A (zh) * | 2004-04-30 | 2005-11-09 | 精工爱普生株式会社 | 液晶显示装置的制造方法、制造装置、液晶显示装置及电子机器 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI469198B (zh) | 2015-01-11 |
| JP2012176353A (ja) | 2012-09-13 |
| TW201239972A (en) | 2012-10-01 |
| KR101373784B1 (ko) | 2014-03-13 |
| CN102651327A (zh) | 2012-08-29 |
| KR20120098412A (ko) | 2012-09-05 |
| JP5690168B2 (ja) | 2015-03-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141112 |