CA2657243A1 - Signal integrity measurement systems and methods using a predominantly digital time-base generator - Google Patents
Signal integrity measurement systems and methods using a predominantly digital time-base generator Download PDFInfo
- Publication number
- CA2657243A1 CA2657243A1 CA002657243A CA2657243A CA2657243A1 CA 2657243 A1 CA2657243 A1 CA 2657243A1 CA 002657243 A CA002657243 A CA 002657243A CA 2657243 A CA2657243 A CA 2657243A CA 2657243 A1 CA2657243 A1 CA 2657243A1
- Authority
- CA
- Canada
- Prior art keywords
- signal
- tester
- under test
- sigma
- digital
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000000034 method Methods 0.000 title claims abstract description 67
- 238000005259 measurement Methods 0.000 title abstract description 83
- 238000012360 testing method Methods 0.000 claims abstract description 98
- 238000005070 sampling Methods 0.000 claims abstract description 79
- 230000006870 function Effects 0.000 claims description 27
- 230000004044 response Effects 0.000 claims description 18
- 239000000523 sample Substances 0.000 claims description 15
- 238000001914 filtration Methods 0.000 claims description 12
- 238000004088 simulation Methods 0.000 claims description 6
- 238000010408 sweeping Methods 0.000 claims description 6
- 238000004891 communication Methods 0.000 claims description 5
- 238000004458 analytical method Methods 0.000 claims description 4
- 230000004936 stimulating effect Effects 0.000 claims description 3
- 230000001360 synchronised effect Effects 0.000 claims description 3
- 238000010998 test method Methods 0.000 claims description 3
- 230000001351 cycling effect Effects 0.000 claims 1
- 238000013481 data capture Methods 0.000 claims 1
- 238000005516 engineering process Methods 0.000 description 25
- 238000010586 diagram Methods 0.000 description 22
- 238000013461 design Methods 0.000 description 15
- 239000004065 semiconductor Substances 0.000 description 11
- 230000003111 delayed effect Effects 0.000 description 10
- 230000001934 delay Effects 0.000 description 9
- 230000008901 benefit Effects 0.000 description 7
- 230000003252 repetitive effect Effects 0.000 description 7
- 230000007704 transition Effects 0.000 description 7
- 238000001228 spectrum Methods 0.000 description 6
- 230000006399 behavior Effects 0.000 description 5
- 238000004422 calculation algorithm Methods 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 238000013139 quantization Methods 0.000 description 5
- 230000001186 cumulative effect Effects 0.000 description 4
- 238000005315 distribution function Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 3
- 239000000872 buffer Substances 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000001427 coherent effect Effects 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 206010035148 Plague Diseases 0.000 description 1
- 241000607479 Yersinia pestis Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000739 chaotic effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
- G01R31/31709—Jitter measurements; Jitter generators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Nonlinear Science (AREA)
- Analogue/Digital Conversion (AREA)
- Tests Of Electronic Circuits (AREA)
- Manipulation Of Pulses (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
- Compression, Expansion, Code Conversion, And Decoders (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US83079706P | 2006-07-14 | 2006-07-14 | |
| US60/830,797 | 2006-07-14 | ||
| US11/776,825 US7681091B2 (en) | 2006-07-14 | 2007-07-12 | Signal integrity measurement systems and methods using a predominantly digital time-base generator |
| US11/776,825 | 2007-07-12 | ||
| PCT/US2007/073454 WO2008008949A2 (en) | 2006-07-14 | 2007-07-13 | Signal integrity measurement systems and methods using a predominantly digital time-base generator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2657243A1 true CA2657243A1 (en) | 2008-01-17 |
Family
ID=38924222
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002657243A Abandoned CA2657243A1 (en) | 2006-07-14 | 2007-07-13 | Signal integrity measurement systems and methods using a predominantly digital time-base generator |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US7681091B2 (enExample) |
| EP (1) | EP2041542A4 (enExample) |
| JP (1) | JP2009544242A (enExample) |
| CA (1) | CA2657243A1 (enExample) |
| WO (1) | WO2008008949A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109859788A (zh) * | 2019-02-23 | 2019-06-07 | 浙江大学 | 阻式存储器的误码率测试方法 |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8327204B2 (en) | 2005-10-27 | 2012-12-04 | Dft Microsystems, Inc. | High-speed transceiver tester incorporating jitter injection |
| US7813297B2 (en) * | 2006-07-14 | 2010-10-12 | Dft Microsystems, Inc. | High-speed signal testing system having oscilloscope functionality |
| US7681091B2 (en) * | 2006-07-14 | 2010-03-16 | Dft Microsystems, Inc. | Signal integrity measurement systems and methods using a predominantly digital time-base generator |
| JP4150049B2 (ja) * | 2006-08-03 | 2008-09-17 | 株式会社東芝 | 集積回路、その自己診断方法、およびその集積回路を具備する光ディスク装置 |
| WO2008098202A2 (en) * | 2007-02-09 | 2008-08-14 | Dft Microsystems, Inc. | Physical-layer testing of high-speed serial links in their mission environments |
| KR20080105512A (ko) * | 2007-05-31 | 2008-12-04 | 삼성전자주식회사 | 반도체 장치의 테스트 시스템 및 테스트 방법 |
| US7526395B2 (en) * | 2007-09-05 | 2009-04-28 | Tektronix, Inc. | Logic analyzer using a digital filter |
| US7917319B2 (en) * | 2008-02-06 | 2011-03-29 | Dft Microsystems Inc. | Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits |
| JP5314491B2 (ja) * | 2009-05-08 | 2013-10-16 | 株式会社アドバンテスト | 試験装置、試験方法、および、デバイス |
| US8139700B2 (en) * | 2009-06-26 | 2012-03-20 | International Business Machines Corporation | Dynamic quadrature clock correction for a phase rotator system |
| US20110054827A1 (en) * | 2009-08-26 | 2011-03-03 | Advantest Corporation, a Japanese Corporation | Test apparatus and method for modulated signal |
| CN101788579B (zh) * | 2010-02-09 | 2013-06-05 | 中兴通讯股份有限公司 | 一种示波器及其信号波形采集及显示的方法及系统 |
| TWI444636B (zh) | 2011-02-18 | 2014-07-11 | Realtek Semiconductor Corp | 內建抖動測試功能之時脈與資料回復電路及其方法 |
| US8451969B2 (en) * | 2011-03-15 | 2013-05-28 | Intel Corporation | Apparatus, system, and method for timing recovery |
| US8890589B2 (en) * | 2012-04-23 | 2014-11-18 | Samsung Electronics Co., Ltd. | Apparatuses for measuring high speed signals and methods thereof |
| US9442136B2 (en) * | 2013-09-01 | 2016-09-13 | Keysight Technologies, Inc. | Real-time oscilloscope for generating a fast real-time eye diagram |
| US9519015B2 (en) * | 2014-01-29 | 2016-12-13 | Taiwan Semiconductor Manufacturing Company Limited | Rise time and fall time measurement |
| WO2017054073A1 (en) | 2015-09-29 | 2017-04-06 | Microsemi Semiconductor Ulc | Noise reduction in non-linear signal processing |
| US9996786B1 (en) * | 2017-06-22 | 2018-06-12 | Nxp B.V. | Method and apparatus for using non-uniform under sampling to achieve a software defined radio for NFC applications |
| US10546647B2 (en) * | 2017-06-26 | 2020-01-28 | Sandisk Technologies Llc | Wide range zero temperature coefficient oscillators and related devices and methods |
| KR102787575B1 (ko) * | 2018-11-14 | 2025-03-31 | 11093568 캐나다 리미티드 | 고해상도 멀티플렉싱 시스템 |
| US11474141B1 (en) | 2019-02-06 | 2022-10-18 | University Of Rhode Island Board Of Trustees | Methods and apparatuses for identifying transmission lines via impedance inhomogeneity patterns |
| WO2021024343A1 (ja) * | 2019-08-05 | 2021-02-11 | 日本電信電話株式会社 | サンプリング回路 |
| US10917326B1 (en) * | 2019-08-23 | 2021-02-09 | Keysight Technologies, Inc. | Methods, systems, and computer readable media for debugging test traffic generation |
| CN110749865B (zh) * | 2019-09-28 | 2022-07-05 | 西南电子技术研究所（中国电子科技集团公司第十研究所） | 降低相干测量设备零秒延时波动的方法 |
| WO2021155176A1 (en) * | 2020-01-30 | 2021-08-05 | University Of Rhode Island Board Of Trustees | Bus authentication and anti-probing architecture |
| US12306944B1 (en) | 2020-12-29 | 2025-05-20 | University Of Rhode Island Board Of Trustees | Method and apparatus for runtime detection of bus probing/tampering in computer systems |
| CN113009201B (zh) * | 2021-02-24 | 2022-08-23 | 普源精电科技股份有限公司 | 一种电信号采样装置 |
| JP7364616B2 (ja) * | 2021-04-14 | 2023-10-18 | アンリツ株式会社 | ジッタ耐力測定装置及びジッタ耐力測定方法 |
Family Cites Families (88)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3931610A (en) | 1973-11-29 | 1976-01-06 | Teletype Corporation | Capacitive keyswitch sensor and method |
| US3976940A (en) | 1975-02-25 | 1976-08-24 | Fairchild Camera And Instrument Corporation | Testing circuit |
| US7663502B2 (en) * | 1992-05-05 | 2010-02-16 | Intelligent Technologies International, Inc. | Asset system control arrangement and method |
| US4807147A (en) | 1983-10-20 | 1989-02-21 | Burr-Brown Corporation | Sampling wave-form digitizer for dynamic testing of high speed data conversion components |
| DE3481472D1 (de) * | 1984-12-21 | 1990-04-05 | Ibm | Digitale phasenregelschleife. |
| US5349587A (en) * | 1992-03-26 | 1994-09-20 | Northern Telecom Limited | Multiple clock rate test apparatus for testing digital systems |
| JPH0614065A (ja) | 1992-06-26 | 1994-01-21 | Nec Corp | 多値ｆｓｋ変調器 |
| JP3030598B2 (ja) * | 1994-06-24 | 2000-04-10 | アンリツ株式会社 | ジッタ検出装置 |
| US5606567A (en) * | 1994-10-21 | 1997-02-25 | Lucent Technologies Inc. | Delay testing of high-performance digital components by a slow-speed tester |
| US5517147A (en) * | 1994-11-17 | 1996-05-14 | Unisys Corporation | Multiple-phase clock signal generator for integrated circuits, comprising PLL, counter, and logic circuits |
| US5835501A (en) * | 1996-03-04 | 1998-11-10 | Pmc-Sierra Ltd. | Built-in test scheme for a jitter tolerance test of a clock and data recovery unit |
| US5781137A (en) * | 1996-12-23 | 1998-07-14 | National Instruments Corporation | System and method for reducing errors in a delta-sigma converter |
| US6008703A (en) * | 1997-01-31 | 1999-12-28 | Massachusetts Institute Of Technology | Digital compensation for wideband modulation of a phase locked loop frequency synthesizer |
| US6076175A (en) * | 1997-03-31 | 2000-06-13 | Sun Microsystems, Inc. | Controlled phase noise generation method for enhanced testability of clock and data generator and recovery circuits |
| US5883523A (en) | 1997-04-29 | 1999-03-16 | Credence Systems Corporation | Coherent switching power for an analog circuit tester |
| JPH1138100A (ja) * | 1997-07-18 | 1999-02-12 | Advantest Corp | 半導体試験装置 |
| JP2002502041A (ja) * | 1998-01-30 | 2002-01-22 | ウェイブクレスト・コーポレイション | ジッタ解析方法及び装置 |
| US5948115A (en) | 1998-01-30 | 1999-09-07 | Credence Systems Corporation | Event phase modulator for integrated circuit tester |
| US6057679A (en) * | 1998-06-12 | 2000-05-02 | Credence Systems Corporation | Integrated circuit tester having amorphous logic for real-time data analysis |
| US6181267B1 (en) * | 1998-09-30 | 2001-01-30 | Agilent Technologies Inc. | Internally triggered equivalent-time sampling system for signals having a predetermined data rate |
| EP1001533B1 (en) * | 1998-11-14 | 2001-09-26 | Agilent Technologies Inc. a Delaware Corporation | Timing generator |
| JP2000244309A (ja) * | 1999-02-18 | 2000-09-08 | Mitsubishi Electric Corp | クロック生成回路および半導体装置 |
| JP4146965B2 (ja) * | 1999-05-17 | 2008-09-10 | 株式会社アドバンテスト | 遅延信号生成装置および半導体試験装置 |
| US6583741B1 (en) * | 1999-07-12 | 2003-06-24 | National Instruments Corporation | System and method for self-calibrating a multi-bit delta-sigma analog to digital (A/D) converter during operation of the A/D converter |
| US6091671A (en) * | 1999-07-14 | 2000-07-18 | Guide Technology, Inc. | Time interval analyzer having interpolator with constant current capacitor control |
| US6374388B1 (en) * | 1999-09-10 | 2002-04-16 | Agilent Technologies, Inc. | Equivalent time capture scheme for bit patterns within high data rate signals |
| US6865222B1 (en) | 1999-09-23 | 2005-03-08 | Texas Instruments Incorporated | Method and apparatus for testing a serial transmitter circuit |
| US6731667B1 (en) | 1999-11-18 | 2004-05-04 | Anapass Inc. | Zero-delay buffer circuit for a spread spectrum clock system and method therefor |
| US6640193B2 (en) * | 1999-12-15 | 2003-10-28 | Texas Instruments Incorporated | Method and system for measuring jitter |
| US6629274B1 (en) * | 1999-12-21 | 2003-09-30 | Intel Corporation | Method and apparatus to structurally detect random defects that impact AC I/O timings in an input/output buffer |
| US6834367B2 (en) * | 1999-12-22 | 2004-12-21 | International Business Machines Corporation | Built-in self test system and method for high speed clock and data recovery circuit |
| US6329850B1 (en) * | 1999-12-27 | 2001-12-11 | Texas Instruments Incorporated | Precision frequency and phase synthesis |
| US7102892B2 (en) | 2000-03-13 | 2006-09-05 | Legacy Electronics, Inc. | Modular integrated circuit chip carrier |
| US6326993B1 (en) | 2000-03-15 | 2001-12-04 | Toshiba Tec Kabushiki Kaisha | Pulse width modulation system and image forming apparatus having the pulse width modulation system |
| US6816987B1 (en) * | 2000-03-25 | 2004-11-09 | Broadcom Corporation | Apparatus and method for built-in self-test of a data communications system |
| JP4291494B2 (ja) | 2000-04-04 | 2009-07-08 | 株式会社アドバンテスト | Ｉｃ試験装置のタイミング校正装置 |
| US6931579B2 (en) * | 2000-04-28 | 2005-08-16 | Mcgill University | Integrated excitation/extraction system for test and measurement |
| JP2001339282A (ja) * | 2000-05-30 | 2001-12-07 | Advantest Corp | 可変遅延回路及び半導体回路試験装置 |
| JP2002076855A (ja) * | 2000-08-29 | 2002-03-15 | Advantest Corp | 遅延回路、試験装置、コンデンサ |
| JP4310036B2 (ja) * | 2000-09-07 | 2009-08-05 | 株式会社アドバンテスト | タイミング信号発生回路、及び、それを備えた半導体検査装置 |
| GB0026614D0 (en) * | 2000-10-31 | 2000-12-13 | Lsi Logic Europ Ltd | A method and apparatus for estimation of error in data recovery schemes |
| GB2369940B (en) * | 2000-12-09 | 2004-10-20 | Mitel Corp | Multiple input phase lock loop with hitless reference switching |
| US6658363B2 (en) * | 2001-01-18 | 2003-12-02 | Hewlett-Packard Development Company, L.P. | Digital data pattern detection methods and arrangements |
| US6763489B2 (en) * | 2001-02-02 | 2004-07-13 | Logicvision, Inc. | Method for scan testing of digital circuit, digital circuit for use therewith and program product for incorporating test methodology into circuit description |
| KR20030072407A (ko) * | 2001-02-14 | 2003-09-13 | 쟈인 에레쿠토로닉스 가부시키가이샤 | 반도체 집적회로 |
| EP1162739B1 (en) * | 2001-04-03 | 2003-03-05 | Agilent Technologies, Inc. (a Delaware corporation) | Filter injecting data dependent jitter and level noise |
| KR100374648B1 (ko) * | 2001-06-28 | 2003-03-03 | 삼성전자주식회사 | 전자파를 감소시키기 위한 위상동기루프회로 및 그의제어방법 |
| US7016445B2 (en) * | 2001-08-02 | 2006-03-21 | Texas Instruments Incorporated | Apparatus for and method of clock recovery from a serial data stream |
| US6816988B2 (en) * | 2001-08-31 | 2004-11-09 | Agilent Technologies, Inc. | Method and system for minimal-time bit-error-rate testing |
| US7116851B2 (en) * | 2001-10-09 | 2006-10-03 | Infinera Corporation | Optical signal receiver, an associated photonic integrated circuit (RxPIC), and method improving performance |
| US7283694B2 (en) * | 2001-10-09 | 2007-10-16 | Infinera Corporation | Transmitter photonic integrated circuits (TxPIC) and optical transport networks employing TxPICs |
| JP3869699B2 (ja) * | 2001-10-24 | 2007-01-17 | 株式会社アドバンテスト | タイミング発生器、半導体試験装置、及びタイミング発生方法 |
| US6785622B2 (en) * | 2001-10-29 | 2004-08-31 | Agilent Technologies, Inc. | Method and apparatus for performing eye diagram measurements |
| US6865496B2 (en) * | 2001-11-01 | 2005-03-08 | Agilent Technologies, Inc. | Zero-crossing direction and time interval jitter measurement apparatus using offset sampling |
| JP4320139B2 (ja) * | 2001-11-13 | 2009-08-26 | 株式会社アドバンテスト | タイミング発生装置、及び試験装置 |
| DE10164966B4 (de) | 2001-11-23 | 2010-04-29 | Infineon Technologies Ag | Schaltungsanordnung zur Takt- und Datenrückgewinnung aus einem Empfangssignal |
| US6868047B2 (en) * | 2001-12-12 | 2005-03-15 | Teradyne, Inc. | Compact ATE with time stamp system |
| US6934896B2 (en) * | 2001-12-31 | 2005-08-23 | Advantest Corp. | Time shift circuit for functional and AC parametric test |
| US7426220B2 (en) * | 2002-01-09 | 2008-09-16 | L-3 Communications Corporation | Method and apparatus for aligning the clock signals of transceivers in a multiple access communication system utilizing programmable, multi-tap phase-locked loops |
| ITMI20020459A1 (it) * | 2002-03-06 | 2003-09-08 | St Microelectronics Srl | Randomizzatore per convertirore di tipo sigms delta |
| US6775809B1 (en) * | 2002-03-14 | 2004-08-10 | Rambus Inc. | Technique for determining performance characteristics of electronic systems |
| KR100459709B1 (ko) * | 2002-04-03 | 2004-12-04 | 삼성전자주식회사 | 여유 있는 셋업 앤드 홀드 타임 마진을 가지는 병렬-직렬송신 회로 |
| US6650101B2 (en) * | 2002-04-08 | 2003-11-18 | Agilent Technologies, Inc. | Timebase for sampling an input signal having a synchronous trigger |
| US6918073B2 (en) * | 2002-04-12 | 2005-07-12 | Agilent Technologies, Inc. | Differential self-test of input/output circuits |
| US20030198311A1 (en) * | 2002-04-19 | 2003-10-23 | Wireless Interface Technologies, Inc. | Fractional-N frequency synthesizer and method |
| JP3559785B2 (ja) * | 2002-06-17 | 2004-09-02 | Ｎｅｃエレクトロニクス株式会社 | Ｐｌｌ回路及び位相差検出回路 |
| US7136772B2 (en) * | 2002-11-08 | 2006-11-14 | Avago Technologies Fiber Ip (Singapore) Pte. Ltd. | Monitoring system for a communications network |
| US6909316B2 (en) * | 2003-02-21 | 2005-06-21 | Agilent Technologies, Inc. | Variable delay circuit with high resolution |
| US6909980B2 (en) * | 2003-03-13 | 2005-06-21 | Agilent Technologies, Inc. | Auto skew alignment of high-speed differential eye diagrams |
| US6768390B1 (en) * | 2003-04-02 | 2004-07-27 | Agilent Technologies, Inc. | System and method for generating balanced modulated signals with arbitrary amplitude and phase control using modulation |
| US7092472B2 (en) | 2003-09-16 | 2006-08-15 | Rambus Inc. | Data-level clock recovery |
| JP3982461B2 (ja) | 2003-06-12 | 2007-09-26 | 横河電機株式会社 | アナログディジタル変換器 |
| US7627790B2 (en) * | 2003-08-21 | 2009-12-01 | Credence Systems Corporation | Apparatus for jitter testing an IC |
| US7158899B2 (en) * | 2003-09-25 | 2007-01-02 | Logicvision, Inc. | Circuit and method for measuring jitter of high speed signals |
| US7403486B2 (en) * | 2003-10-31 | 2008-07-22 | Acterna | Signal level measurement and data connection quality analysis apparatus and methods |
| JP3902185B2 (ja) * | 2004-03-01 | 2007-04-04 | 日本電気株式会社 | 電源ノイズ測定装置 |
| US20060139387A1 (en) * | 2004-05-27 | 2006-06-29 | Silverbrook Research Pty Ltd | Printer controller for providing data and command via communication output |
| GB0413146D0 (en) | 2004-06-12 | 2004-07-14 | Texas Instruments Ltd | Comparator for circuit testing |
| JP4425735B2 (ja) * | 2004-07-22 | 2010-03-03 | 株式会社アドバンテスト | ジッタ印加回路、及び試験装置 |
| DE602004008080T2 (de) * | 2004-10-27 | 2008-04-17 | Agilent Technologies, Inc. (n.d.Ges.d. Staates Delaware), Santa Clara | Mit einer Quelle synchrone Abtastung |
| US7526033B2 (en) * | 2005-02-04 | 2009-04-28 | Agere Systems Inc. | Serializer deserializer (SERDES) testing |
| US7545396B2 (en) * | 2005-06-16 | 2009-06-09 | Aurora Systems, Inc. | Asynchronous display driving scheme and display |
| US7627003B1 (en) * | 2005-09-30 | 2009-12-01 | The United States Of America As Represented By The Secretary Of The Navy | Automatic clock synchronization and distribution circuit for counter clock flow pipelined systems |
| US8327204B2 (en) | 2005-10-27 | 2012-12-04 | Dft Microsystems, Inc. | High-speed transceiver tester incorporating jitter injection |
| US7813297B2 (en) | 2006-07-14 | 2010-10-12 | Dft Microsystems, Inc. | High-speed signal testing system having oscilloscope functionality |
| US7681091B2 (en) * | 2006-07-14 | 2010-03-16 | Dft Microsystems, Inc. | Signal integrity measurement systems and methods using a predominantly digital time-base generator |
| WO2008098202A2 (en) | 2007-02-09 | 2008-08-14 | Dft Microsystems, Inc. | Physical-layer testing of high-speed serial links in their mission environments |
| US7917319B2 (en) * | 2008-02-06 | 2011-03-29 | Dft Microsystems Inc. | Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits |
-
2007
- 2007-07-12 US US11/776,825 patent/US7681091B2/en not_active Expired - Fee Related
- 2007-07-13 EP EP07799564A patent/EP2041542A4/en not_active Withdrawn
- 2007-07-13 CA CA002657243A patent/CA2657243A1/en not_active Abandoned
- 2007-07-13 JP JP2009520919A patent/JP2009544242A/ja active Pending
- 2007-07-13 WO PCT/US2007/073454 patent/WO2008008949A2/en not_active Ceased
-
2010
- 2010-02-05 US US12/701,282 patent/US20100138695A1/en not_active Abandoned
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109859788A (zh) * | 2019-02-23 | 2019-06-07 | 浙江大学 | 阻式存储器的误码率测试方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US7681091B2 (en) | 2010-03-16 |
| WO2008008949A2 (en) | 2008-01-17 |
| US20100138695A1 (en) | 2010-06-03 |
| WO2008008949A9 (en) | 2008-12-18 |
| EP2041542A4 (en) | 2011-04-27 |
| JP2009544242A (ja) | 2009-12-10 |
| US20080048726A1 (en) | 2008-02-28 |
| EP2041542A2 (en) | 2009-04-01 |
| WO2008008949A3 (en) | 2008-10-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7681091B2 (en) | Signal integrity measurement systems and methods using a predominantly digital time-base generator | |
| CN101548167B (zh) | 使用主要为数字的时基发生器的信号完整性测量系统和方法 | |
| US7158899B2 (en) | Circuit and method for measuring jitter of high speed signals | |
| Sunter et al. | On-chip digital jitter measurement, from megahertz to gigahertz | |
| Tabatabaei et al. | Embedded timing analysis: A SoC infrastructure | |
| US6931579B2 (en) | Integrated excitation/extraction system for test and measurement | |
| US7085668B2 (en) | Time measurement method using quadrature sine waves | |
| Nadeau-Dostie | Design for at-speed test, diagnosis and measurement | |
| EP2041584B1 (en) | High-speed signal testing system having oscilloscope functionality | |
| Hafed et al. | A stand-alone integrated test core for time and frequency domain measurements | |
| EP2044692A1 (en) | Undersampling of a repetitive signal for measuring transistion times to reconstruct an analog waveform | |
| US20090213918A1 (en) | Separating jitter components in a data stream | |
| Biereigel et al. | Methods for clock signal characterization using FPGA resources | |
| US20120102353A1 (en) | Data processing apparatus, data processing system, measurement system, data processing method, measurement method, electronic device and recording medium | |
| Hafed et al. | Massively parallel validation of high-speed serial interfaces using compact instrument modules | |
| Ong et al. | A scalable on-chip jitter extraction technique | |
| Kaminska et al. | Mixed signal DFT: a concise overview | |
| Cazeaux et al. | Low-area on-chip circuit for jitter measurement in a phase-locked loop | |
| JP2006098402A (ja) | デジタル・レシーバの入力周波数応答を測定するための方法並びに装置 | |
| Xia et al. | Timing jitter characterization for mixed-signal production test using the interpolation algorithm | |
| Chowdhury et al. | A probabilistic test instrument using a ΣΔ-encoded amplitude/phase-signal generation technique | |
| Choi et al. | Digital bit stream jitter testing using jitter expansion | |
| WO2008022653A1 (en) | Converting non-equidistant signals into equidistant signals | |
| Huang et al. | An On-Chip Short-Time Interval Measurement Technique for Testing |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FZDE | Discontinued | ||
| FZDE | Discontinued |
Effective date: 20120713 |