BR112017008617A2 - dispositivo de medida de tensão residual e método de medida de tensão residual - Google Patents

dispositivo de medida de tensão residual e método de medida de tensão residual

Info

Publication number
BR112017008617A2
BR112017008617A2 BR112017008617A BR112017008617A BR112017008617A2 BR 112017008617 A2 BR112017008617 A2 BR 112017008617A2 BR 112017008617 A BR112017008617 A BR 112017008617A BR 112017008617 A BR112017008617 A BR 112017008617A BR 112017008617 A2 BR112017008617 A2 BR 112017008617A2
Authority
BR
Brazil
Prior art keywords
detector element
residual voltage
voltage measuring
diffracted
movement mechanism
Prior art date
Application number
BR112017008617A
Other languages
English (en)
Other versions
BR112017008617B1 (pt
Inventor
Matsui Akinori
Kobayashi Yuji
Original Assignee
Sintokogio Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sintokogio Ltd filed Critical Sintokogio Ltd
Publication of BR112017008617A2 publication Critical patent/BR112017008617A2/pt
Publication of BR112017008617B1 publication Critical patent/BR112017008617B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

a presente invenção refere-se a um aparelho, que inclui: uma fonte geradora de raios x adaptada para irradiar raios x na direção de um objeto em medida; um primeiro elemento detector adaptado para detectar a intensidade de raios x difratados do objeto em medida, em uma primeira posição de detecção; um segundo elemento detector adaptado para detectar a intensidade de raios x difratados do objeto em medida, em uma segunda posição de detecção diferente da segunda posição de detecção; um mecanismo de movimentação adaptado para movimentar ambos o primeiro elemento detector e o segundo elemento detector ao longo de uma linha reta se estendendo em uma direção ortogonal a uma direção de incidência dos raios x; uma unidade de controle de movimento adaptada para controlar as respectivas posições de detecção do primeiro elemento detector e do segundo elemento detector por acionamento do mecanismo de movimentação; e uma unidade de cálculo de tensão adaptada para calcular a tensão residual do objeto em medida, com base nos picos de intensidade dos raios x difratados detectados, respectivamente, pelo primeiro elemento detector e pelo segundo elemento detector, ambos movimentados pelo mecanismo de movimentação.
BR112017008617-4A 2015-06-18 2015-11-30 aparelho de medida de tensão residual e método de medida de tensão residual BR112017008617B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015123248A JP6394513B2 (ja) 2015-06-18 2015-06-18 残留応力測定装置及び残留応力測定方法
JP2015-123248 2015-06-18
PCT/JP2015/083613 WO2016203672A1 (ja) 2015-06-18 2015-11-30 残留応力測定装置及び残留応力測定方法

Publications (2)

Publication Number Publication Date
BR112017008617A2 true BR112017008617A2 (pt) 2017-12-26
BR112017008617B1 BR112017008617B1 (pt) 2021-05-04

Family

ID=57545890

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112017008617-4A BR112017008617B1 (pt) 2015-06-18 2015-11-30 aparelho de medida de tensão residual e método de medida de tensão residual

Country Status (11)

Country Link
US (1) US10520455B2 (pt)
EP (1) EP3133388B1 (pt)
JP (1) JP6394513B2 (pt)
KR (1) KR102353547B1 (pt)
CN (1) CN107923857B (pt)
BR (1) BR112017008617B1 (pt)
CA (1) CA2962222C (pt)
MX (1) MX2017007480A (pt)
SG (1) SG11201702286WA (pt)
TW (1) TWI664405B (pt)
WO (1) WO2016203672A1 (pt)

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MX2018013681A (es) * 2016-05-16 2019-05-02 Sintokogio Ltd Metodo de proceso de tratamiento superficial y dispositivo de proceso de tratamiento superficial.
EP3593945B1 (en) 2017-06-30 2023-03-15 Sintokogio, Ltd. Shot treatment device
CN107764450B (zh) * 2017-09-06 2020-08-11 北京航空航天大学 一种同步跨尺度残余应力检测装置
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Also Published As

Publication number Publication date
MX2017007480A (es) 2018-03-28
CA2962222C (en) 2021-06-15
JP2017009356A (ja) 2017-01-12
CN107923857B (zh) 2020-05-08
TWI664405B (zh) 2019-07-01
JP6394513B2 (ja) 2018-09-26
EP3133388A4 (en) 2017-12-13
TW201700961A (zh) 2017-01-01
US20170167988A1 (en) 2017-06-15
KR102353547B1 (ko) 2022-01-21
SG11201702286WA (en) 2018-01-30
EP3133388B1 (en) 2019-10-23
WO2016203672A1 (ja) 2016-12-22
KR20180016968A (ko) 2018-02-20
CN107923857A (zh) 2018-04-17
US10520455B2 (en) 2019-12-31
EP3133388A1 (en) 2017-02-22
BR112017008617B1 (pt) 2021-05-04
CA2962222A1 (en) 2016-12-22

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Legal Events

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B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 30/11/2015, OBSERVADAS AS CONDICOES LEGAIS.