MX2019001124A - Metodo para determinar por radiografia parametros geometricos y/o estado material de un objeto bajo estudio. - Google Patents
Metodo para determinar por radiografia parametros geometricos y/o estado material de un objeto bajo estudio.Info
- Publication number
- MX2019001124A MX2019001124A MX2019001124A MX2019001124A MX2019001124A MX 2019001124 A MX2019001124 A MX 2019001124A MX 2019001124 A MX2019001124 A MX 2019001124A MX 2019001124 A MX2019001124 A MX 2019001124A MX 2019001124 A MX2019001124 A MX 2019001124A
- Authority
- MX
- Mexico
- Prior art keywords
- under study
- object under
- geometrical parameters
- determine geometrical
- radiographic image
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 3
- 239000000126 substance Substances 0.000 title 1
- 230000005855 radiation Effects 0.000 abstract 1
- 238000002601 radiography Methods 0.000 abstract 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/12—Edge-based segmentation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/174—Segmentation; Edge detection involving the use of two or more images
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/628—Specific applications or type of materials tubes, pipes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/629—Specific applications or type of materials welds, bonds, sealing compounds
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/633—Specific applications or type of materials thickness, density, surface weight (unit area)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/646—Specific applications or type of materials flaws, defects
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10116—X-ray image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30172—Centreline of tubular or elongated structure
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Electromagnetism (AREA)
- Quality & Reliability (AREA)
- Geometry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
La presente invención se refiere a un método para determinar parámetros geométricos de un objeto bajo estudio por medio de radiografía, el objeto puede describirse geométricamente, en donde las intercepciones que atraviesan el material del objeto bajo estudio pueden determinarse a partir de una proyección del objeto - por ejemplo, un tubo - fotografiado por una fuente de radiación X o gamma si los datos de exposición de la imagen radiográfica se encuentran disponibles. Estas intercepciones que atraviesan el material del objeto - es decir, las curvas de intercepción - permiten que el objeto bajo estudio, por ejemplo, el tubo - tenga una dimensión que es mayor que la dimensión del dispositivo (película/detector) utilizado para tomar la imagen radiográfica. Durante el transcurso de tal método, la fuente de radiación, el objeto bajo estudio y el dispositivo (película/detector) utilizado para tomar la imagen radiográfica se encuentran en una posición fija.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
HU1600469A HUP1600469A2 (en) | 2016-07-27 | 2016-07-27 | Method for determining the geometric parameters and/or material state of a specimen based on in-situ radiographic imaging |
PCT/HU2017/050030 WO2018100404A2 (en) | 2016-07-27 | 2017-07-27 | Method to radiographically determine geometrical parameters and/or substance state of an object under study |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2019001124A true MX2019001124A (es) | 2019-08-14 |
Family
ID=89992233
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2019001124A MX2019001124A (es) | 2016-07-27 | 2017-07-27 | Metodo para determinar por radiografia parametros geometricos y/o estado material de un objeto bajo estudio. |
Country Status (14)
Country | Link |
---|---|
US (1) | US11085886B2 (es) |
EP (1) | EP3491368B1 (es) |
JP (1) | JP2019523418A (es) |
KR (1) | KR102255336B1 (es) |
CN (1) | CN109791114B (es) |
AU (1) | AU2017369865A1 (es) |
BR (1) | BR112019001624B1 (es) |
CA (1) | CA3031891A1 (es) |
EA (1) | EA035017B1 (es) |
HU (2) | HUP1600469A2 (es) |
IL (1) | IL264448A (es) |
MX (1) | MX2019001124A (es) |
WO (1) | WO2018100404A2 (es) |
ZA (1) | ZA201901158B (es) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
HUP1600469A2 (en) | 2016-07-27 | 2018-01-29 | Peter Teleki | Method for determining the geometric parameters and/or material state of a specimen based on in-situ radiographic imaging |
FR3073044B1 (fr) * | 2017-10-27 | 2020-10-02 | Tiama | Procede et dispositif de mesure de dimensions par rayons x, sur des recipients en verre vide defilant en ligne |
EP3764089A1 (en) * | 2019-07-11 | 2021-01-13 | Direct Conversion AB | X-ray weld inspection |
US11959739B2 (en) * | 2019-08-22 | 2024-04-16 | Baker Hughes Oilfield Operations Llc | Assisted corrosion and erosion recognition |
US11668660B2 (en) * | 2020-09-29 | 2023-06-06 | Varex Imaging Corporation | Radiographic inspection system for pipes and other structures and material loss estimation |
CN114279373A (zh) * | 2021-12-15 | 2022-04-05 | 哈尔滨工业大学 | 一种测量碳氢燃料在冷却通道内产生结焦层厚度的系统、方法和设备 |
JP7410606B1 (ja) | 2023-06-20 | 2024-01-10 | 株式会社ウィズソル | 非破壊検査方法及び非破壊検査装置 |
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US3521059A (en) * | 1967-03-15 | 1970-07-21 | Arabian American Oil Co | Apparatus for radiographing pipes having a film marker means associated therewith |
HU187820B (en) | 1982-12-16 | 1986-02-28 | Teleki,Peter,Hu | Method and device /modification body/ for generating radiology image, preferably for applying at material testing |
KR900004689B1 (ko) * | 1984-03-31 | 1990-07-02 | 트록슬러 일렉트로닉 래보래토리스, 인코포레이티드 | 핵 방사선 장치 및 방사방법 |
HU195335B (en) * | 1984-11-05 | 1988-04-28 | Peter Teleki | Method and modifying body for influencing effect on a target sensitive to radiation exerted by x-ray or gamma radiation |
US4725963A (en) | 1985-05-09 | 1988-02-16 | Scientific Measurement Systems I, Ltd. | Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects |
US5648996A (en) * | 1995-08-04 | 1997-07-15 | Omega International Technology, Inc. | Tangential computerized tomography scanner |
US5864601A (en) * | 1996-06-13 | 1999-01-26 | Dba Systems, Inc. | Method and apparatus for inspecting pipes using a digitized radiograph |
US6289235B1 (en) * | 1998-03-05 | 2001-09-11 | Wake Forest University | Method and system for creating three-dimensional images using tomosynthetic computed tomography |
EP1072861B1 (en) * | 1999-05-10 | 2006-05-10 | GE Inspection Technologies GmbH | Method for measuring the wall thickness of a tubular object |
US6600806B1 (en) | 1999-06-02 | 2003-07-29 | Rochester Gasand Electric Corporation | System for radiographic determination of pipe wall thickness |
US6373917B1 (en) * | 2000-08-30 | 2002-04-16 | Agilent Technologies, Inc. | Z-axis elimination in an X-ray laminography system using image magnification for Z plane adjustment |
CN1376909A (zh) * | 2001-03-23 | 2002-10-30 | 何凤歧 | γ射线在役管网检测方法和装置 |
US6665433B2 (en) * | 2001-07-31 | 2003-12-16 | Agilent Technologies, Inc. | Automatic X-ray determination of solder joint and view Delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography |
DE10149254B4 (de) * | 2001-10-05 | 2006-04-20 | Smiths Heimann Gmbh | Verfahren und Vorrichtung zur Detektion eines bestimmten Materials in einem Objekt mittels elektromagnetischer Strahlen |
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KR20070005767A (ko) * | 2005-07-06 | 2007-01-10 | 조선대학교산학협력단 | 레이저를 이용한 스파이럴 용접 파이프의 용접결함 탐상 |
WO2008039056A1 (en) * | 2006-09-25 | 2008-04-03 | Röntgen Technische Dienst | Arrangement and method for non destructive measurement of wall thickness and surface shapes of objects with inner surface |
US8064072B2 (en) * | 2006-12-15 | 2011-11-22 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Method and apparatus for thickness measurement |
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JP5613501B2 (ja) * | 2010-08-26 | 2014-10-22 | 富士フイルム株式会社 | パイプ厚み計測装置及び方法 |
KR101200464B1 (ko) * | 2010-11-03 | 2012-11-12 | 동양검사기술주식회사 | 송전 케이블 접속부위의 방사선투과검사를 이용한 결함 평가 방법 |
US20110299653A1 (en) * | 2010-12-15 | 2011-12-08 | General Electric Company | Method and apparatus for laminography inspection |
CN202562454U (zh) * | 2012-05-18 | 2012-11-28 | 浙江众成包装材料股份有限公司 | 薄膜厚度测厚装置 |
JP6031339B2 (ja) * | 2012-11-21 | 2016-11-24 | 富士フイルム株式会社 | 透視画像濃度補正方法、非破壊検査方法、及び画像処理装置 |
KR101443898B1 (ko) | 2013-02-07 | 2014-09-23 | 주식회사 레이언스 | 방사성 동위원소를 이용한 방사선 투과 검사 시스템 및 방법 |
CN105571538B (zh) * | 2015-12-25 | 2018-01-09 | 中海油能源发展股份有限公司 | γ射线程控分区扫描检测LNG保温包覆管壁厚的方法 |
HUP1600469A2 (en) | 2016-07-27 | 2018-01-29 | Peter Teleki | Method for determining the geometric parameters and/or material state of a specimen based on in-situ radiographic imaging |
-
2016
- 2016-07-27 HU HU1600469A patent/HUP1600469A2/hu unknown
-
2017
- 2017-07-27 KR KR1020197004975A patent/KR102255336B1/ko active IP Right Grant
- 2017-07-27 AU AU2017369865A patent/AU2017369865A1/en not_active Abandoned
- 2017-07-27 CN CN201780059890.5A patent/CN109791114B/zh active Active
- 2017-07-27 EP EP17861190.1A patent/EP3491368B1/en active Active
- 2017-07-27 WO PCT/HU2017/050030 patent/WO2018100404A2/en active Search and Examination
- 2017-07-27 MX MX2019001124A patent/MX2019001124A/es unknown
- 2017-07-27 US US16/320,675 patent/US11085886B2/en active Active
- 2017-07-27 CA CA3031891A patent/CA3031891A1/en active Pending
- 2017-07-27 HU HUE17861190A patent/HUE051804T2/hu unknown
- 2017-07-27 BR BR112019001624-4A patent/BR112019001624B1/pt active IP Right Grant
- 2017-07-27 EA EA201990310A patent/EA035017B1/ru not_active IP Right Cessation
- 2017-07-27 JP JP2019504140A patent/JP2019523418A/ja active Pending
-
2019
- 2019-01-24 IL IL264448A patent/IL264448A/en unknown
- 2019-02-22 ZA ZA2019/01158A patent/ZA201901158B/en unknown
Also Published As
Publication number | Publication date |
---|---|
EP3491368B1 (en) | 2020-09-02 |
CN109791114B (zh) | 2022-08-02 |
EA035017B1 (ru) | 2020-04-17 |
KR102255336B1 (ko) | 2021-05-26 |
KR20190031524A (ko) | 2019-03-26 |
AU2017369865A1 (en) | 2019-03-07 |
IL264448A (en) | 2019-02-28 |
ZA201901158B (en) | 2020-12-23 |
EP3491368A2 (en) | 2019-06-05 |
US20190154596A1 (en) | 2019-05-23 |
EA201990310A1 (ru) | 2019-06-28 |
WO2018100404A3 (en) | 2018-08-16 |
HUE051804T2 (hu) | 2021-03-29 |
WO2018100404A2 (en) | 2018-06-07 |
JP2019523418A (ja) | 2019-08-22 |
HUP1600469A2 (en) | 2018-01-29 |
US11085886B2 (en) | 2021-08-10 |
BR112019001624B1 (pt) | 2023-02-23 |
BR112019001624A2 (pt) | 2019-05-07 |
CN109791114A (zh) | 2019-05-21 |
CA3031891A1 (en) | 2018-06-07 |
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