AU2001251308A1 - Electrostatic discharge (esd) protection circuit - Google Patents

Electrostatic discharge (esd) protection circuit

Info

Publication number
AU2001251308A1
AU2001251308A1 AU2001251308A AU5130801A AU2001251308A1 AU 2001251308 A1 AU2001251308 A1 AU 2001251308A1 AU 2001251308 A AU2001251308 A AU 2001251308A AU 5130801 A AU5130801 A AU 5130801A AU 2001251308 A1 AU2001251308 A1 AU 2001251308A1
Authority
AU
Australia
Prior art keywords
esd
protection circuit
electrostatic discharge
electrostatic
discharge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001251308A
Other languages
English (en)
Inventor
James W. Miller
Fujio Takeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of AU2001251308A1 publication Critical patent/AU2001251308A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0266—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using field effect transistors as protective elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
AU2001251308A 2000-04-10 2001-04-04 Electrostatic discharge (esd) protection circuit Abandoned AU2001251308A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09546601 2000-04-10
US09/546,601 US6385021B1 (en) 2000-04-10 2000-04-10 Electrostatic discharge (ESD) protection circuit

Publications (1)

Publication Number Publication Date
AU2001251308A1 true AU2001251308A1 (en) 2001-10-23

Family

ID=24181147

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001251308A Abandoned AU2001251308A1 (en) 2000-04-10 2001-04-04 Electrostatic discharge (esd) protection circuit

Country Status (7)

Country Link
US (1) US6385021B1 (de)
EP (1) EP1277236B1 (de)
JP (1) JP5162070B2 (de)
KR (1) KR100801863B1 (de)
CN (1) CN1242478C (de)
AU (1) AU2001251308A1 (de)
WO (1) WO2001078148A1 (de)

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Also Published As

Publication number Publication date
KR20020087966A (ko) 2002-11-23
JP2003530698A (ja) 2003-10-14
EP1277236A1 (de) 2003-01-22
WO2001078148A1 (en) 2001-10-18
CN1426601A (zh) 2003-06-25
CN1242478C (zh) 2006-02-15
KR100801863B1 (ko) 2008-02-12
JP5162070B2 (ja) 2013-03-13
US6385021B1 (en) 2002-05-07
EP1277236B1 (de) 2012-01-18

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