JP6143690B2 - 出力回路 - Google Patents
出力回路 Download PDFInfo
- Publication number
- JP6143690B2 JP6143690B2 JP2014049051A JP2014049051A JP6143690B2 JP 6143690 B2 JP6143690 B2 JP 6143690B2 JP 2014049051 A JP2014049051 A JP 2014049051A JP 2014049051 A JP2014049051 A JP 2014049051A JP 6143690 B2 JP6143690 B2 JP 6143690B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- line
- signal
- output terminal
- floating line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000003990 capacitor Substances 0.000 claims description 6
- 101100042610 Arabidopsis thaliana SIGB gene Proteins 0.000 description 35
- 101100294408 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) MOT2 gene Proteins 0.000 description 22
- 101150117326 sigA gene Proteins 0.000 description 22
- 101100421503 Arabidopsis thaliana SIGA gene Proteins 0.000 description 13
- 230000003071 parasitic effect Effects 0.000 description 8
- 230000008054 signal transmission Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000001960 triggered effect Effects 0.000 description 3
- 230000005611 electricity Effects 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000005022 packaging material Substances 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
- H02H9/04—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
- H02H9/045—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere
- H02H9/046—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere responsive to excess voltage appearing at terminals of integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
- H02H3/20—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess voltage
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
Description
実施形態にかかる出力回路100について説明する前に、基本の形態にかかる出力回路1について図7を用いて説明する。図7は、基本の形態にかかる出力回路1の構成を示す図である。
Claims (6)
- 内部回路の信号を出力するオープンドレイン型の出力回路であって、
第1の信号出力端子と、
前記第1の信号出力端子と前記内部回路とを接続する第1の信号ラインと、
電位が固定されていない第1のフローティングラインと、
前記第1の信号出力端子と前記第1のフローティングラインとの間に接続された第1の整流素子と、
前記第1のフローティングラインとグランド電位との間に接続された第1のESD保護回路と、
を備え、
前記第1のESD保護回路は、
トリガー回路と、
前記トリガー回路に接続されたバッファー回路と、
前記バッファー回路、前記第1のフローティングライン、及びグランド電位の間に接続されたスイッチ回路と、
を有する
出力回路。 - 前記トリガー回路は、一端が前記第1のフローティングラインに接続され、他端がグランド電位に接続され、前記一端及び前記他端の間に抵抗とコンデンサとの直列回路を有し、前記抵抗及び前記コンデンサの共通接続ノードが出力端を構成する
請求項1に記載の出力回路。 - 前記第1の信号出力端子と差動対を構成する第2の信号出力端子と、
前記第2の信号出力端子と前記内部回路とを接続する第2の信号ラインと、
電位が固定されていない第2のフローティングラインと、
前記第2の信号出力端子と前記第2のフローティングラインとの間に接続された第2の整流素子と、
前記第2のフローティングラインとグランド電位との間に接続された第2のESD保護回路と、
をさらに備えた
請求項1又は2に記載の出力回路。 - 前記第1のフローティングライン及び前記第2のフローティングラインは、前記第1の信号出力端子及び前記第2の信号出力端子に対して共通化されている
請求項3に記載の出力回路。 - 前記第1のESD保護回路及び前記第2のESD保護回路は、前記第1の信号出力端子及び前記第2の信号出力端子に対して共通化されている
請求項3又は4に記載の出力回路。 - グランド端子と、
前記グランド端子に接続されたグランドラインと、
前記グランドラインと前記第1の信号出力端子との間に接続された第3の整流素子と、
をさらに備えた
請求項1から5のいずれか1項に記載の出力回路。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014049051A JP6143690B2 (ja) | 2014-03-12 | 2014-03-12 | 出力回路 |
US14/638,359 US9985433B2 (en) | 2014-03-12 | 2015-03-04 | Output circuit |
BR102015005304A BR102015005304A2 (pt) | 2014-03-12 | 2015-03-10 | circuito de saída |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014049051A JP6143690B2 (ja) | 2014-03-12 | 2014-03-12 | 出力回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015173214A JP2015173214A (ja) | 2015-10-01 |
JP6143690B2 true JP6143690B2 (ja) | 2017-06-07 |
Family
ID=54070013
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014049051A Active JP6143690B2 (ja) | 2014-03-12 | 2014-03-12 | 出力回路 |
Country Status (3)
Country | Link |
---|---|
US (1) | US9985433B2 (ja) |
JP (1) | JP6143690B2 (ja) |
BR (1) | BR102015005304A2 (ja) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10734806B2 (en) | 2016-07-21 | 2020-08-04 | Analog Devices, Inc. | High voltage clamps with transient activation and activation release control |
US10861845B2 (en) * | 2016-12-06 | 2020-12-08 | Analog Devices, Inc. | Active interface resistance modulation switch |
IT201600127322A1 (it) | 2016-12-16 | 2018-06-16 | St Microelectronics Int Nv | Circuito di protezione per dispositivi elettronici, dispositivo e procedimento corrispondenti |
US10826290B2 (en) * | 2016-12-23 | 2020-11-03 | Nxp B.V. | Electrostatic discharge (ESD) protection for use with an internal floating ESD rail |
US20190020194A1 (en) * | 2017-07-17 | 2019-01-17 | Nxp B.V. | Voltage clamp cirucit for surge protection |
TWI655818B (zh) * | 2018-07-27 | 2019-04-01 | 智原科技股份有限公司 | 積體電路的靜電放電防護裝置 |
US11387648B2 (en) | 2019-01-10 | 2022-07-12 | Analog Devices International Unlimited Company | Electrical overstress protection with low leakage current for high voltage tolerant high speed interfaces |
US11477881B2 (en) | 2019-06-26 | 2022-10-18 | Sandisk Technologies Llc | Spark gap electrostatic discharge (ESD) protection for memory cards |
US11251176B2 (en) | 2019-11-07 | 2022-02-15 | Nxp B.V. | Apparatus for suppressing parasitic leakage from I/O-pins to substrate in floating-rail ESD protection networks |
US11038346B1 (en) * | 2019-12-31 | 2021-06-15 | Nxp B.V. | ESD protection |
JP2022081070A (ja) | 2020-11-19 | 2022-05-31 | 住友電気工業株式会社 | 静電気保護回路および半導体集積回路 |
JP2022081067A (ja) | 2020-11-19 | 2022-05-31 | 住友電気工業株式会社 | 静電気保護回路および半導体集積回路 |
JP2022081068A (ja) | 2020-11-19 | 2022-05-31 | 住友電気工業株式会社 | 駆動回路および半導体集積回路 |
JP7408595B2 (ja) | 2021-03-30 | 2024-01-05 | 株式会社東芝 | 保護回路 |
JP2023062715A (ja) | 2021-10-22 | 2023-05-09 | 株式会社東芝 | 集積回路 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH021608A (ja) * | 1987-12-18 | 1990-01-05 | Oki Electric Ind Co Ltd | トランジスタ出力回路 |
US5311391A (en) | 1993-05-04 | 1994-05-10 | Hewlett-Packard Company | Electrostatic discharge protection circuit with dynamic triggering |
US6385021B1 (en) * | 2000-04-10 | 2002-05-07 | Motorola, Inc. | Electrostatic discharge (ESD) protection circuit |
CN1244986C (zh) | 2001-08-31 | 2006-03-08 | 松下电器产业株式会社 | 驱动电路 |
US6970336B2 (en) * | 2003-10-10 | 2005-11-29 | Freescale Semiconductor, Inc. | Electrostatic discharge protection circuit and method of operation |
TWI224391B (en) * | 2004-02-10 | 2004-11-21 | Univ Nat Chiao Tung | Electrostatic discharge protection circuit |
US7446990B2 (en) * | 2005-02-11 | 2008-11-04 | Freescale Semiconductor, Inc. | I/O cell ESD system |
KR100651579B1 (ko) | 2005-11-15 | 2006-11-29 | 매그나칩 반도체 유한회사 | 이에스디 보호회로 |
JP2007227697A (ja) | 2006-02-24 | 2007-09-06 | Toshiba Corp | 半導体装置および半導体集積装置 |
JP4857834B2 (ja) * | 2006-03-17 | 2012-01-18 | 株式会社デンソー | 入力保護回路 |
JP2008218825A (ja) * | 2007-03-06 | 2008-09-18 | Sanyo Electric Co Ltd | 集積回路 |
US8537512B2 (en) * | 2009-02-26 | 2013-09-17 | Freescale Semiconductor, Inc. | ESD protection using isolated diodes |
JP5564818B2 (ja) | 2009-03-31 | 2014-08-06 | 富士通セミコンダクター株式会社 | 電源クランプ回路 |
JP5431791B2 (ja) | 2009-05-27 | 2014-03-05 | ルネサスエレクトロニクス株式会社 | 静電気保護回路 |
JP2011228372A (ja) | 2010-04-16 | 2011-11-10 | Toshiba Corp | 半導体集積回路装置 |
JP2013055102A (ja) | 2011-09-01 | 2013-03-21 | Sony Corp | 半導体集積回路及び保護回路 |
JP2013120815A (ja) | 2011-12-07 | 2013-06-17 | Sony Corp | Esd保護回路およびこれを備えた半導体装置 |
US9166593B2 (en) * | 2012-05-28 | 2015-10-20 | Baysand Inc. | Flexible, space-efficient I/O circuitry for integrated circuits |
-
2014
- 2014-03-12 JP JP2014049051A patent/JP6143690B2/ja active Active
-
2015
- 2015-03-04 US US14/638,359 patent/US9985433B2/en active Active
- 2015-03-10 BR BR102015005304A patent/BR102015005304A2/pt not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US20150263505A1 (en) | 2015-09-17 |
BR102015005304A2 (pt) | 2015-12-01 |
US9985433B2 (en) | 2018-05-29 |
JP2015173214A (ja) | 2015-10-01 |
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