ATE332575T1 - Herstellungsverfahren einer photoelektrischen dünnschicht-umwandlungsanordnung aus amorphem silizium - Google Patents

Herstellungsverfahren einer photoelektrischen dünnschicht-umwandlungsanordnung aus amorphem silizium

Info

Publication number
ATE332575T1
ATE332575T1 AT99307040T AT99307040T ATE332575T1 AT E332575 T1 ATE332575 T1 AT E332575T1 AT 99307040 T AT99307040 T AT 99307040T AT 99307040 T AT99307040 T AT 99307040T AT E332575 T1 ATE332575 T1 AT E332575T1
Authority
AT
Austria
Prior art keywords
gas
photoelectric conversion
amorphous silicon
thin film
type
Prior art date
Application number
AT99307040T
Other languages
English (en)
Inventor
Masashi Yoshimi
Kenji Yamamoto
Original Assignee
Kaneka Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=12851221&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE332575(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Kaneka Corp filed Critical Kaneka Corp
Application granted granted Critical
Publication of ATE332575T1 publication Critical patent/ATE332575T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/20Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
    • H01L31/202Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic Table
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
    • H01L31/075Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PIN type, e.g. amorphous silicon PIN solar cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/548Amorphous silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Photovoltaic Devices (AREA)
  • Chemical Vapour Deposition (AREA)
  • Light Receiving Elements (AREA)
AT99307040T 1999-02-26 1999-09-03 Herstellungsverfahren einer photoelektrischen dünnschicht-umwandlungsanordnung aus amorphem silizium ATE332575T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11050152A JP3046965B1 (ja) 1999-02-26 1999-02-26 非晶質シリコン系薄膜光電変換装置の製造方法

Publications (1)

Publication Number Publication Date
ATE332575T1 true ATE332575T1 (de) 2006-07-15

Family

ID=12851221

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99307040T ATE332575T1 (de) 1999-02-26 1999-09-03 Herstellungsverfahren einer photoelektrischen dünnschicht-umwandlungsanordnung aus amorphem silizium

Country Status (6)

Country Link
US (1) US6326304B1 (de)
EP (1) EP1032054B1 (de)
JP (1) JP3046965B1 (de)
AT (1) ATE332575T1 (de)
AU (1) AU761280B2 (de)
DE (1) DE69932227T2 (de)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001345273A (ja) 2000-05-31 2001-12-14 Canon Inc シリコン系薄膜の形成方法、シリコン系薄膜及び光起電力素子
JP4510242B2 (ja) * 2000-07-11 2010-07-21 キヤノン株式会社 薄膜形成方法
JP3862615B2 (ja) 2002-06-10 2006-12-27 キヤノン株式会社 シリコン系薄膜形成装置およびシリコン系薄膜形成方法
JP2004095953A (ja) * 2002-09-02 2004-03-25 Canon Inc 窒化シリコンの堆積膜形成方法
JP2007208093A (ja) 2006-02-03 2007-08-16 Canon Inc 堆積膜の形成方法及び光起電力素子の形成方法
UA81965C2 (en) * 2006-02-14 2008-02-25 Александра Николаевна Шмирева Integral thin-film module
US7655542B2 (en) * 2006-06-23 2010-02-02 Applied Materials, Inc. Methods and apparatus for depositing a microcrystalline silicon film for photovoltaic device
JP2008115460A (ja) * 2006-10-12 2008-05-22 Canon Inc 半導体素子の形成方法及び光起電力素子の形成方法
US7501305B2 (en) 2006-10-23 2009-03-10 Canon Kabushiki Kaisha Method for forming deposited film and photovoltaic element
US8203071B2 (en) * 2007-01-18 2012-06-19 Applied Materials, Inc. Multi-junction solar cells and methods and apparatuses for forming the same
US7582515B2 (en) * 2007-01-18 2009-09-01 Applied Materials, Inc. Multi-junction solar cells and methods and apparatuses for forming the same
US20080173350A1 (en) * 2007-01-18 2008-07-24 Applied Materials, Inc. Multi-junction solar cells and methods and apparatuses for forming the same
US20080245414A1 (en) * 2007-04-09 2008-10-09 Shuran Sheng Methods for forming a photovoltaic device with low contact resistance
US7875486B2 (en) 2007-07-10 2011-01-25 Applied Materials, Inc. Solar cells and methods and apparatuses for forming the same including I-layer and N-layer chamber cleaning
US20090104733A1 (en) * 2007-10-22 2009-04-23 Yong Kee Chae Microcrystalline silicon deposition for thin film solar applications
KR20100095426A (ko) 2007-11-02 2010-08-30 어플라이드 머티어리얼스, 인코포레이티드 증착 공정들 간의 플라즈마 처리
US7833885B2 (en) 2008-02-11 2010-11-16 Applied Materials, Inc. Microcrystalline silicon thin film transistor
US8076222B2 (en) * 2008-02-11 2011-12-13 Applied Materials, Inc. Microcrystalline silicon thin film transistor
US7888167B2 (en) * 2008-04-25 2011-02-15 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and method for manufacturing the same
JP5377061B2 (ja) * 2008-05-09 2013-12-25 株式会社半導体エネルギー研究所 光電変換装置
US7955890B2 (en) * 2008-06-24 2011-06-07 Applied Materials, Inc. Methods for forming an amorphous silicon film in display devices
US8895842B2 (en) * 2008-08-29 2014-11-25 Applied Materials, Inc. High quality TCO-silicon interface contact structure for high efficiency thin film silicon solar cells
KR101531700B1 (ko) * 2008-12-01 2015-06-25 주성엔지니어링(주) 박막형 태양전지의 제조방법
WO2010101030A1 (ja) * 2009-03-02 2010-09-10 株式会社カネカ 薄膜太陽電池モジュール
EP2450958A1 (de) * 2009-06-30 2012-05-09 Sanyo Electric Co., Ltd. Herstellungsverfahren und vorrichtung zur herstellung einer solarbatterie
WO2011011301A2 (en) * 2009-07-23 2011-01-27 Applied Materials, Inc. A mixed silicon phase film for high efficiency thin film silicon solar cells
WO2011046664A2 (en) * 2009-10-15 2011-04-21 Applied Materials, Inc. A barrier layer disposed between a substrate and a transparent conductive oxide layer for thin film silicon solar cells
US20110126875A1 (en) * 2009-12-01 2011-06-02 Hien-Minh Huu Le Conductive contact layer formed on a transparent conductive layer by a reactive sputter deposition
US20110232753A1 (en) * 2010-03-23 2011-09-29 Applied Materials, Inc. Methods of forming a thin-film solar energy device
CN105887040A (zh) * 2010-04-16 2016-08-24 瑞士艾发科技 用于在光伏应用中沉积微晶材料的方法和设备
US8927857B2 (en) 2011-02-28 2015-01-06 International Business Machines Corporation Silicon: hydrogen photovoltaic devices, such as solar cells, having reduced light induced degradation and method of making such devices
JP6078063B2 (ja) 2011-07-13 2017-02-08 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated 薄膜トランジスタデバイスの製造方法
KR20140074352A (ko) 2011-10-07 2014-06-17 어플라이드 머티어리얼스, 인코포레이티드 아르곤 가스 희석으로 실리콘 함유 층을 증착하기 위한 방법들
CN113755816B (zh) * 2021-09-09 2023-12-19 理想万里晖真空装备(泰兴)有限公司 用于改善反应腔粉尘的预镀膜方法及所形成的预镀膜

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5262262A (en) * 1985-05-31 1993-11-16 Fuji Xerox Co., Ltd. Electrophotographic photoreceptor having conductive layer and amorphous carbon overlayer
JPS62271418A (ja) 1986-05-20 1987-11-25 Matsushita Electric Ind Co Ltd 非晶質シリコン半導体素子の製造方法
CH668145A5 (fr) * 1986-09-26 1988-11-30 Inst Microtechnique De L Unive Procede et installation de depot de silicium amorphe hydrogene sur un substrat dans une enceinte a plasma.
US5242505A (en) * 1991-12-03 1993-09-07 Electric Power Research Institute Amorphous silicon-based photovoltaic semiconductor materials free from Staebler-Wronski effects
US5582880A (en) * 1992-03-27 1996-12-10 Canon Kabushiki Kaisha Method of manufacturing non-single crystal film and non-single crystal semiconductor device
JP3201492B2 (ja) 1992-03-27 2001-08-20 キヤノン株式会社 非晶質シリコン膜の製造方法、非晶質窒化シリコン膜の製造方法、微結晶シリコン膜の製造方法、及び非単結晶半導体装置
JPH065522A (ja) 1992-06-17 1994-01-14 Mitsubishi Heavy Ind Ltd 高周波プラズマcvd装置
JP2761156B2 (ja) * 1992-06-30 1998-06-04 キヤノン株式会社 光起電力素子及びその製造方法、並びにそれを用いた発電装置
JP2564753B2 (ja) 1993-05-13 1996-12-18 株式会社 半導体エネルギー研究所 プラズマ気相反応方法
JP3163875B2 (ja) 1993-09-30 2001-05-08 株式会社島津製作所 医用画像処理装置
CN1135635C (zh) 1994-03-25 2004-01-21 阿莫科/恩龙太阳公司 增强光电器件和电子器件的光和电特性的等离子淀积工艺
US5677236A (en) * 1995-02-24 1997-10-14 Mitsui Toatsu Chemicals, Inc. Process for forming a thin microcrystalline silicon semiconductor film
JP3241234B2 (ja) 1995-04-28 2001-12-25 シャープ株式会社 薄膜太陽電池およびその製造方法
US5902650A (en) * 1995-07-11 1999-05-11 Applied Komatsu Technology, Inc. Method of depositing amorphous silicon based films having controlled conductivity

Also Published As

Publication number Publication date
AU4473399A (en) 2000-08-31
AU761280B2 (en) 2003-05-29
EP1032054A2 (de) 2000-08-30
JP3046965B1 (ja) 2000-05-29
DE69932227T2 (de) 2007-06-06
EP1032054A3 (de) 2002-01-30
DE69932227D1 (de) 2006-08-17
JP2000252484A (ja) 2000-09-14
EP1032054B1 (de) 2006-07-05
US6326304B1 (en) 2001-12-04

Similar Documents

Publication Publication Date Title
ATE332575T1 (de) Herstellungsverfahren einer photoelektrischen dünnschicht-umwandlungsanordnung aus amorphem silizium
Könenkamp et al. Thin film semiconductor deposition on free-standing ZnO columns
KR20090130219A (ko) 다수―정크션 태양 전지 그리고 그 제조 방법 및 장치
MY149217A (en) Nitride semiconductor component layer structure on a group iv substrate surface and fabrication method
WO2004032196A2 (en) Method of fabricating semiconductor by nitrogen doping of silicon film
KR20070102764A (ko) Pecvd 법에 기반한 다층 박막 구조의 제조방법
US7615492B2 (en) Preparing method of CNT-based semiconductor sensitized solar cell
TW200501243A (en) Coated semiconductor wafer, and process and device for producing the semiconductor wafer
TW202246175A (zh) 用於製造經改善的石墨烯基板的方法及其應用
Schropp Frontiers in HWCVD
Futagi et al. Highly conductive and wide optical band gap n‐type μc‐SiC prepared by electron cyclotron resonance plasma‐enhanced chemical vapor deposition
JP5053595B2 (ja) Dlc膜の形成方法及びdlc膜の製造装置
US7399654B2 (en) Method for fabricating optical sensitive layer of solar cell having silicon quantum dots
JP2692964B2 (ja) 太陽電池
US8450140B2 (en) Method for large-scale manufacturing of photovoltaic cells for a converter panel and photovoltaic converter panel
TWI499068B (zh) 光電轉換裝置
CN112687758A (zh) 一种碳化硅-硅异质结结构的光电探测器及其制备方法
KR101108931B1 (ko) μC-규소층을 포함하는 규소 태양 전지의 제조 방법
RU2395867C2 (ru) ПОЛУПРОВОДНИКОВАЯ СЭНДВИЧ-СТРУКТУРА 3С-SiC/Si, СПОСОБ ЕЕ ПОЛУЧЕНИЯ И ЧУВСТВИТЕЛЬНЫЙ ЭЛЕМЕНТ МЕМБРАННОГО ТИПА С ЕЕ ИСПОЛЬЗОВАНИЕМ
JPH10190031A (ja) 太陽電池およびその製造方法
JPH06112524A (ja) 薄膜発光ダイオードの製造方法
CN116724688A (zh) 生产石墨烯电子器件前体的方法
KR20230118683A (ko) 그래핀 전자 디바이스 프리커서를 제조하는 방법
Aiyer et al. Effect of mixing oxygen or diborane on the formation of amorphous carbon films from methane by rf plasma chemical vapour deposition
JPH0258876A (ja) 太陽電池用基板の製造方法、ならびに太陽電池

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties