ATE306712T1 - Lesevorrichtung für einen passiver matrixspeicher und dazugehöriges leseverfahren - Google Patents

Lesevorrichtung für einen passiver matrixspeicher und dazugehöriges leseverfahren

Info

Publication number
ATE306712T1
ATE306712T1 AT01984547T AT01984547T ATE306712T1 AT E306712 T1 ATE306712 T1 AT E306712T1 AT 01984547 T AT01984547 T AT 01984547T AT 01984547 T AT01984547 T AT 01984547T AT E306712 T1 ATE306712 T1 AT E306712T1
Authority
AT
Austria
Prior art keywords
sensing
passive matrix
sensing device
matrix memory
memory cell
Prior art date
Application number
AT01984547T
Other languages
English (en)
Inventor
Michael Thompson
Richard Womack
Original Assignee
Thin Film Electronics Asa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thin Film Electronics Asa filed Critical Thin Film Electronics Asa
Application granted granted Critical
Publication of ATE306712T1 publication Critical patent/ATE306712T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
    • G11C27/026—Sample-and-hold arrangements using a capacitive memory element associated with an amplifier
AT01984547T 2000-08-24 2001-08-24 Lesevorrichtung für einen passiver matrixspeicher und dazugehöriges leseverfahren ATE306712T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NO20004237A NO20004237L (no) 2000-08-24 2000-08-24 Integrert deteksjonsforsterker
PCT/NO2001/000347 WO2002017322A2 (en) 2000-08-24 2001-08-24 Sensing device for a passive matrix memory and a read method for use therewith

Publications (1)

Publication Number Publication Date
ATE306712T1 true ATE306712T1 (de) 2005-10-15

Family

ID=19911500

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01984547T ATE306712T1 (de) 2000-08-24 2001-08-24 Lesevorrichtung für einen passiver matrixspeicher und dazugehöriges leseverfahren

Country Status (13)

Country Link
US (1) US6788563B2 (de)
EP (1) EP1356470B1 (de)
JP (1) JP3808828B2 (de)
KR (1) KR100520696B1 (de)
CN (1) CN100345215C (de)
AT (1) ATE306712T1 (de)
AU (2) AU2315802A (de)
DE (1) DE60114049T2 (de)
DK (1) DK1356470T3 (de)
ES (1) ES2251519T3 (de)
HK (1) HK1062222A1 (de)
NO (1) NO20004237L (de)
WO (1) WO2002017322A2 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6504750B1 (en) * 2001-08-27 2003-01-07 Micron Technology, Inc. Resistive memory element sensing using averaging
EP1304701A1 (de) * 2001-10-18 2003-04-23 STMicroelectronics S.r.l. Leseschaltung für nichtflüchtige ferroelektrische Speicher
US6826102B2 (en) * 2002-05-16 2004-11-30 Micron Technology, Inc. Noise resistant small signal sensing circuit for a memory device
GB2390201A (en) * 2002-06-27 2003-12-31 Seiko Epson Corp Charge integrating sense amplifier
US6920060B2 (en) * 2002-08-14 2005-07-19 Intel Corporation Memory device, circuits and methods for operating a memory device
JP2004178734A (ja) * 2002-11-28 2004-06-24 Sanyo Electric Co Ltd メモリ装置
NO320017B1 (no) * 2003-03-26 2005-10-10 Thin Film Electronics Asa Deteksjonsforsterkersystemer og matriseadresserbar minneinnretning med ±n av disse
US7173558B2 (en) * 2004-07-06 2007-02-06 Kenet, Inc. Charge comparator with low input offset
NO324029B1 (no) 2004-09-23 2007-07-30 Thin Film Electronics Asa Lesemetode og deteksjonsanordning
US20060227639A1 (en) * 2005-03-30 2006-10-12 Rico Srowik Current sensing circuit and method of operation
US8116159B2 (en) * 2005-03-30 2012-02-14 Ovonyx, Inc. Using a bit specific reference level to read a resistive memory
JP2007141399A (ja) * 2005-11-21 2007-06-07 Renesas Technology Corp 半導体装置
JP4374549B2 (ja) * 2005-12-20 2009-12-02 セイコーエプソン株式会社 強誘電体メモリ装置、電子機器および強誘電体メモリ装置の駆動方法
CN101814313B (zh) * 2010-04-02 2013-07-03 清华大学 单管单电容型铁电存储器
FR3005195B1 (fr) * 2013-04-24 2016-09-02 Soitec Silicon On Insulator Dispositif de memoire avec circuits de reference exploites dynamiquement.
CA2988789A1 (en) * 2015-06-09 2016-12-15 The Governing Council Of The University Of Toronto Systems, methods and apparatuses for in situ electrochemical imaging
WO2017059540A1 (en) 2015-10-07 2017-04-13 The Governing Council Of The University Of Toronto Wireless power and data transmission system for wearable and implantable devices
US9886571B2 (en) 2016-02-16 2018-02-06 Xerox Corporation Security enhancement of customer replaceable unit monitor (CRUM)
US10953230B2 (en) 2016-07-20 2021-03-23 The Governing Council Of The University Of Toronto Neurostimulator and method for delivering a stimulation in response to a predicted or detected neurophysiological condition
US10978169B2 (en) 2017-03-17 2021-04-13 Xerox Corporation Pad detection through pattern analysis
US10446232B2 (en) * 2017-12-19 2019-10-15 Micron Technology, Inc. Charge separation for memory sensing
US10497521B1 (en) 2018-10-29 2019-12-03 Xerox Corporation Roller electric contact

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3579208A (en) 1969-02-28 1971-05-18 Gulf & Western Industries Ceramic memory amplifier
JPS62273694A (ja) 1986-05-22 1987-11-27 Sony Corp センスアンプ
LU86788A1 (de) * 1986-06-19 1987-07-24 Siemens Ag Breitbandsignal-koppeleinrichtung
US5086412A (en) * 1990-11-21 1992-02-04 National Semiconductor Corporation Sense amplifier and method for ferroelectric memory
US5262982A (en) * 1991-07-18 1993-11-16 National Semiconductor Corporation Nondestructive reading of a ferroelectric capacitor
US5218566A (en) * 1991-08-15 1993-06-08 National Semiconductor Corporation Dynamic adjusting reference voltage for ferroelectric circuits
US5274583A (en) * 1992-01-02 1993-12-28 National Semiconductor Corporation Charge-integrating preamplifier for ferroelectric memory
JPH0991970A (ja) * 1995-09-26 1997-04-04 Olympus Optical Co Ltd 非破壊型強誘電体メモリ及びその駆動方法
US5721699A (en) * 1996-03-18 1998-02-24 Symetrix Corporation Ferroelectric memory with feedback circuit
US5929800A (en) * 1996-08-05 1999-07-27 California Institute Of Technology Charge integration successive approximation analog-to-digital converter for focal plane applications using a single amplifier
KR100264075B1 (ko) 1997-06-20 2000-08-16 김영환 전하 증폭 비트 라인 센스 앰프
US6219273B1 (en) * 1998-03-02 2001-04-17 California Institute Of Technology Integrated semiconductor-magnetic random access memory system
US6044019A (en) * 1998-10-23 2000-03-28 Sandisk Corporation Non-volatile memory with improved sensing and method therefor
US6288934B1 (en) * 2000-09-06 2001-09-11 Oki Electric Industry Co., Ltd. Analog memory device and method for reading data stored therein
US6522568B1 (en) * 2001-07-24 2003-02-18 Intel Corporation Ferroelectric memory and method for reading the same
US6529398B1 (en) * 2001-09-27 2003-03-04 Intel Corporation Ferroelectric memory and method for reading the same

Also Published As

Publication number Publication date
WO2002017322A2 (en) 2002-02-28
US20020172069A1 (en) 2002-11-21
AU2002223158B2 (en) 2005-03-03
JP2004515020A (ja) 2004-05-20
CN100345215C (zh) 2007-10-24
NO20004237D0 (no) 2000-08-24
DK1356470T3 (da) 2005-12-19
WO2002017322A9 (en) 2002-11-28
JP3808828B2 (ja) 2006-08-16
US6788563B2 (en) 2004-09-07
HK1062222A1 (en) 2004-10-21
KR20040005817A (ko) 2004-01-16
NO20004237L (no) 2002-02-25
CN1471711A (zh) 2004-01-28
KR100520696B1 (ko) 2005-10-12
WO2002017322A3 (en) 2003-08-28
DE60114049T2 (de) 2006-06-22
AU2315802A (en) 2002-03-04
ES2251519T3 (es) 2006-05-01
EP1356470A2 (de) 2003-10-29
DE60114049D1 (de) 2006-02-23
EP1356470B1 (de) 2005-10-12

Similar Documents

Publication Publication Date Title
ATE306712T1 (de) Lesevorrichtung für einen passiver matrixspeicher und dazugehöriges leseverfahren
CN101253516B (zh) 集成电路管芯、交换信息的方法、提高使用效率的方法
ATE396482T1 (de) Direktzugriffsspeicher mit programmierbaren leitern und verfahren zu seinem lesen
NO20003507D0 (no) FremgangsmÕte til dynamisk lesing/skriving i et ferroelektrisk minne samt kretsløsninger for utførelse av fremgangsmÕten
CN110415744B (zh) 基于铁电晶体管的非易失存储器
ATE557399T1 (de) Lese- und löschverifikationsverfahren und schaltungen mit eignung für nichtflüchtige niederspannungsspeicher
ATE314721T1 (de) Ferro-elektrischer speicher und sein betriebsverfahren
KR920010657A (ko) 반전 기록 용량을 갖는 반도체 메모리 및 반전 기록을 사용하는 메모리 테스팅 방법
WO2002019341A3 (en) Semiconductor memory having dual port cell supporting hidden refresh
KR20170130402A (ko) 저장 엘리먼트들을 리프레시하는 시스템들 및 방법들
DK1316090T3 (da) Ikke-flygtig passiv matrix og fremgangsmåde til udlæsning af denne
ATE223614T1 (de) Einseitiges lesen unter verwendung von bitleitungen für dram
KR960012004A (ko) 강유전체메모리장치
WO2005043589A3 (en) Method and system for enhancing the endurance of memory cells
US9236107B1 (en) FRAM cell with cross point access
TW200410255A (en) A memory device with power-saving mode and an electrics device with the memory device
KR970059911A (ko) 리프레쉬 기능이 없는 dram 구성의 캐쉬 메모리 장치
JP2004530243A5 (de)
JP2005310316A (ja) 異常検出回路
EP1333447A3 (de) Halbleiterspeicheranordnung und elektronisches Informationsgerät mit dessen Verwendung
CN1996495B (zh) 有机存储器之位单元
TW200632739A (en) Method and device for burst reading/writing memory data
JPS5896260A (ja) Ｉｃメモリ試験方式
TW200514090A (en) Non-volatile memory element
JPH0785661A (ja) 半導体記憶装置

Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification

Ref document number: 1356470

Country of ref document: EP

REN Ceased due to non-payment of the annual fee