ATE220478T1 - Verfahren zur herstellung einer struktur unter verwendung von wiederablagerung - Google Patents

Verfahren zur herstellung einer struktur unter verwendung von wiederablagerung

Info

Publication number
ATE220478T1
ATE220478T1 AT96905568T AT96905568T ATE220478T1 AT E220478 T1 ATE220478 T1 AT E220478T1 AT 96905568 T AT96905568 T AT 96905568T AT 96905568 T AT96905568 T AT 96905568T AT E220478 T1 ATE220478 T1 AT E220478T1
Authority
AT
Austria
Prior art keywords
redeposition
producing
image
conductive layer
redepositing
Prior art date
Application number
AT96905568T
Other languages
English (en)
Inventor
Brent A Mcclure
Daryl C New
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE220478T1 publication Critical patent/ATE220478T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B99/00—Subject matter not provided for in other groups of this subclass
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321—After treatment
    • H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
    • H01L21/32131—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by physical means only
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/60—Electrodes
    • H01L28/82—Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/90—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions
    • H01L28/91—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions made by depositing layers, e.g. by depositing alternating conductive and insulating layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Compounds Of Unknown Constitution (AREA)
  • Steroid Compounds (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Electrophotography Using Other Than Carlson'S Method (AREA)
AT96905568T 1995-02-28 1996-02-21 Verfahren zur herstellung einer struktur unter verwendung von wiederablagerung ATE220478T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US39594195A 1995-02-28 1995-02-28
PCT/US1996/002413 WO1996027208A1 (en) 1995-02-28 1996-02-21 Method for forming a structure using redeposition

Publications (1)

Publication Number Publication Date
ATE220478T1 true ATE220478T1 (de) 2002-07-15

Family

ID=23565182

Family Applications (1)

Application Number Title Priority Date Filing Date
AT96905568T ATE220478T1 (de) 1995-02-28 1996-02-21 Verfahren zur herstellung einer struktur unter verwendung von wiederablagerung

Country Status (7)

Country Link
US (1) US5792593A (de)
EP (2) EP0812472B1 (de)
JP (1) JP3101685B2 (de)
KR (1) KR100271111B1 (de)
AT (1) ATE220478T1 (de)
DE (1) DE69622261T2 (de)
WO (1) WO1996027208A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0865079A3 (de) * 1997-03-13 1999-10-20 Applied Materials, Inc. Verfahren zur Beseitigung von auf geätzten Platinflächen abgelagerten Verunreinigungen
US6027860A (en) 1997-08-13 2000-02-22 Micron Technology, Inc. Method for forming a structure using redeposition of etchable layer
TW430900B (en) * 1997-09-08 2001-04-21 Siemens Ag Method for producing structures having a high aspect ratio
EP1048064A1 (de) 1998-01-13 2000-11-02 Applied Materials, Inc. Ätzmethoden für anisotropes platin-ätzprofil
US6323132B1 (en) 1998-01-13 2001-11-27 Applied Materials, Inc. Etching methods for anisotropic platinum profile
US6919168B2 (en) 1998-01-13 2005-07-19 Applied Materials, Inc. Masking methods and etching sequences for patterning electrodes of high density RAM capacitors
US6265318B1 (en) * 1998-01-13 2001-07-24 Applied Materials, Inc. Iridium etchant methods for anisotropic profile
TW434907B (en) * 1998-12-09 2001-05-16 Matsushita Electronics Corp Semiconductor memory apparatus and its manufacturing method
US6294836B1 (en) * 1998-12-22 2001-09-25 Cvc Products Inc. Semiconductor chip interconnect barrier material and fabrication method
DE19911150C1 (de) * 1999-03-12 2000-04-20 Siemens Ag Verfahren zur Herstellung einer mikroelektronischen Struktur
US6358857B1 (en) * 1999-07-23 2002-03-19 Micron Technology, Inc. Methods of etching insulative materials, of forming electrical devices, and of forming capacitors
EP1228528B1 (de) 1999-09-10 2014-08-13 Oerlikon USA Inc. Prozess und anordnung zur herstellung magnetischer pole
US6547975B1 (en) 1999-10-29 2003-04-15 Unaxis Usa Inc. Magnetic pole fabrication process and device
US6627995B2 (en) 2000-03-03 2003-09-30 Cvc Products, Inc. Microelectronic interconnect material with adhesion promotion layer and fabrication method
US6444263B1 (en) 2000-09-15 2002-09-03 Cvc Products, Inc. Method of chemical-vapor deposition of a material
US6533408B1 (en) 2001-06-21 2003-03-18 Eastman Kodak Company Ink jet printing method
DE10147929C1 (de) 2001-09-28 2003-04-17 Infineon Technologies Ag Verfahren zum Herstellen einer Halbleiterstruktur und Verwendung des Verfahrens
KR100438781B1 (ko) * 2001-12-05 2004-07-05 삼성전자주식회사 금속-절연체-금속 캐패시터 및 그 제조방법
KR101934037B1 (ko) * 2012-11-21 2018-12-31 삼성전자주식회사 서포터를 갖는 반도체 소자 및 그 형성 방법
CN113745402B (zh) * 2020-05-29 2023-10-17 中芯国际集成电路制造(上海)有限公司 半导体结构及其形成方法、存储器

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4432132A (en) * 1981-12-07 1984-02-21 Bell Telephone Laboratories, Incorporated Formation of sidewall oxide layers by reactive oxygen ion etching to define submicron features
US4400257A (en) * 1982-12-21 1983-08-23 Rca Corporation Method of forming metal lines
JPS63211740A (ja) * 1987-02-27 1988-09-02 Oki Electric Ind Co Ltd 半導体素子の配線パタ−ン形成方法
US5185058A (en) * 1991-01-29 1993-02-09 Micron Technology, Inc. Process for etching semiconductor devices
TW243541B (de) * 1991-08-31 1995-03-21 Samsung Electronics Co Ltd
JP2953220B2 (ja) * 1992-10-30 1999-09-27 日本電気株式会社 半導体装置の製造方法
KR960006822B1 (ko) * 1993-04-15 1996-05-23 삼성전자주식회사 반도체장치의 미세패턴 형성방법
US5320981A (en) * 1993-08-10 1994-06-14 Micron Semiconductor, Inc. High accuracy via formation for semiconductor devices
US5451543A (en) * 1994-04-25 1995-09-19 Motorola, Inc. Straight sidewall profile contact opening to underlying interconnect and method for making the same

Also Published As

Publication number Publication date
EP1202331A2 (de) 2002-05-02
KR100271111B1 (ko) 2000-12-01
KR19980702594A (ko) 1998-07-15
JPH10507037A (ja) 1998-07-07
WO1996027208A1 (en) 1996-09-06
DE69622261D1 (de) 2002-08-14
EP0812472A1 (de) 1997-12-17
EP0812472B1 (de) 2002-07-10
US5792593A (en) 1998-08-11
EP1202331A3 (de) 2002-07-31
JP3101685B2 (ja) 2000-10-23
DE69622261T2 (de) 2003-03-27

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Legal Events

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