ATE204035T1 - Verfahren zur elektrolytischen abscheidung von kupferschichten - Google Patents
Verfahren zur elektrolytischen abscheidung von kupferschichtenInfo
- Publication number
- ATE204035T1 ATE204035T1 AT97952879T AT97952879T ATE204035T1 AT E204035 T1 ATE204035 T1 AT E204035T1 AT 97952879 T AT97952879 T AT 97952879T AT 97952879 T AT97952879 T AT 97952879T AT E204035 T1 ATE204035 T1 AT E204035T1
- Authority
- AT
- Austria
- Prior art keywords
- pct
- copper layers
- substrate
- deposition
- date jun
- Prior art date
Links
- 230000008021 deposition Effects 0.000 title abstract 5
- 238000000034 method Methods 0.000 title abstract 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract 3
- 229910052802 copper Inorganic materials 0.000 abstract 3
- 239000010949 copper Substances 0.000 abstract 3
- 239000000758 substrate Substances 0.000 abstract 3
- 150000001875 compounds Chemical class 0.000 abstract 2
- 239000000463 material Substances 0.000 abstract 2
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 abstract 1
- 239000000654 additive Substances 0.000 abstract 1
- 239000003788 bath preparation Substances 0.000 abstract 1
- 229910001431 copper ion Inorganic materials 0.000 abstract 1
- 230000002349 favourable effect Effects 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 229910052751 metal Inorganic materials 0.000 abstract 1
- 230000002441 reversible effect Effects 0.000 abstract 1
- 239000002904 solvent Substances 0.000 abstract 1
- 239000011877 solvent mixture Substances 0.000 abstract 1
- 230000000007 visual effect Effects 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/38—Electroplating: Baths therefor from solutions of copper
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/58—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of copper
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/18—Electroplating using modulated, pulsed or reversing current
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/605—Surface topography of the layers, e.g. rough, dendritic or nodular layers
- C25D5/611—Smooth layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/627—Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/241—Reinforcing the conductive pattern characterised by the electroplating method; means therefor, e.g. baths or apparatus
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/423—Plated through-holes or plated via connections characterised by electroplating method
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electroplating Methods And Accessories (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Electroplating And Plating Baths Therefor (AREA)
- Electrolytic Production Of Metals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19653681A DE19653681C2 (de) | 1996-12-13 | 1996-12-13 | Verfahren zur elektrolytischen Abscheidung von Kupferschichten mit gleichmäßiger Schichtdicke und guten optischen und metallphysikalischen Eigenschaften und Anwendung des Verfahrens |
| PCT/EP1997/006786 WO1998026114A1 (de) | 1996-12-13 | 1997-12-04 | Verfahren zur elektrolytischen abscheidung von kupferschichten |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE204035T1 true ATE204035T1 (de) | 2001-08-15 |
Family
ID=7815786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT97952879T ATE204035T1 (de) | 1996-12-13 | 1997-12-04 | Verfahren zur elektrolytischen abscheidung von kupferschichten |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US6129830A (enExample) |
| EP (1) | EP0944749B1 (enExample) |
| JP (1) | JP4221064B2 (enExample) |
| KR (1) | KR100546989B1 (enExample) |
| AT (1) | ATE204035T1 (enExample) |
| CA (1) | CA2275214C (enExample) |
| DE (2) | DE19653681C2 (enExample) |
| WO (1) | WO1998026114A1 (enExample) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19915146C1 (de) * | 1999-01-21 | 2000-07-06 | Atotech Deutschland Gmbh | Verfahren zum galvanischen Bilden von Leiterstrukturen aus hochreinem Kupfer bei der Herstellung von integrierten Schaltungen |
| JP4394234B2 (ja) * | 2000-01-20 | 2010-01-06 | 日鉱金属株式会社 | 銅電気めっき液及び銅電気めっき方法 |
| US6503375B1 (en) * | 2000-02-11 | 2003-01-07 | Applied Materials, Inc | Electroplating apparatus using a perforated phosphorus doped consumable anode |
| JP2001267726A (ja) * | 2000-03-22 | 2001-09-28 | Toyota Autom Loom Works Ltd | 配線基板の電解メッキ方法及び配線基板の電解メッキ装置 |
| US6491806B1 (en) * | 2000-04-27 | 2002-12-10 | Intel Corporation | Electroplating bath composition |
| US6776893B1 (en) * | 2000-11-20 | 2004-08-17 | Enthone Inc. | Electroplating chemistry for the CU filling of submicron features of VLSI/ULSI interconnect |
| JP4806498B2 (ja) * | 2001-08-01 | 2011-11-02 | 凸版印刷株式会社 | プリント配線基板の製造装置および製造方法 |
| EP1310582A1 (en) * | 2001-11-07 | 2003-05-14 | Shipley Company LLC | Process for electrolytic copper plating |
| US7316772B2 (en) * | 2002-03-05 | 2008-01-08 | Enthone Inc. | Defect reduction in electrodeposited copper for semiconductor applications |
| US8002962B2 (en) | 2002-03-05 | 2011-08-23 | Enthone Inc. | Copper electrodeposition in microelectronics |
| DE10259362A1 (de) * | 2002-12-18 | 2004-07-08 | Siemens Ag | Verfahren zum Abscheiden einer Legierung auf ein Substrat |
| EP1477588A1 (en) * | 2003-02-19 | 2004-11-17 | Rohm and Haas Electronic Materials, L.L.C. | Copper Electroplating composition for wafers |
| EP1598449B1 (en) * | 2004-04-26 | 2010-08-04 | Rohm and Haas Electronic Materials, L.L.C. | Improved plating method |
| TWI400365B (zh) * | 2004-11-12 | 2013-07-01 | Enthone | 微電子裝置上的銅電沈積 |
| EP1717351A1 (de) * | 2005-04-27 | 2006-11-02 | Enthone Inc. | Galvanikbad |
| US20070158199A1 (en) * | 2005-12-30 | 2007-07-12 | Haight Scott M | Method to modulate the surface roughness of a plated deposit and create fine-grained flat bumps |
| US20070178697A1 (en) * | 2006-02-02 | 2007-08-02 | Enthone Inc. | Copper electrodeposition in microelectronics |
| ATE484943T1 (de) * | 2006-03-30 | 2010-10-15 | Atotech Deutschland Gmbh | Elektrolytisches verfahren zum füllen von löchern und vertiefungen mit metallen |
| US7887693B2 (en) * | 2007-06-22 | 2011-02-15 | Maria Nikolova | Acid copper electroplating bath composition |
| US7905994B2 (en) | 2007-10-03 | 2011-03-15 | Moses Lake Industries, Inc. | Substrate holder and electroplating system |
| JP2009167506A (ja) * | 2008-01-21 | 2009-07-30 | Ebara Udylite Kk | 酸性電解銅めっき液およびこれを用いる微細配線回路の作製方法 |
| DE102008031003B4 (de) | 2008-06-30 | 2010-04-15 | Siemens Aktiengesellschaft | Verfahren zum Erzeugen einer CNT enthaltenen Schicht aus einer ionischen Flüssigkeit |
| US20100206737A1 (en) * | 2009-02-17 | 2010-08-19 | Preisser Robert F | Process for electrodeposition of copper chip to chip, chip to wafer and wafer to wafer interconnects in through-silicon vias (tsv) |
| US8262894B2 (en) | 2009-04-30 | 2012-09-11 | Moses Lake Industries, Inc. | High speed copper plating bath |
| EP2392694A1 (en) * | 2010-06-02 | 2011-12-07 | ATOTECH Deutschland GmbH | Method for etching of copper and copper alloys |
| EP2518187A1 (en) * | 2011-04-26 | 2012-10-31 | Atotech Deutschland GmbH | Aqueous acidic bath for electrolytic deposition of copper |
| EP2620529B1 (en) * | 2012-01-25 | 2014-04-30 | Atotech Deutschland GmbH | Method for producing matt copper deposits |
| JP6216522B2 (ja) * | 2013-03-14 | 2017-10-18 | 大日本印刷株式会社 | インターポーザー基板の製造方法。 |
| PH12018502416B1 (en) * | 2016-05-19 | 2023-02-10 | Atotech Deutschland Gmbh | Method for monitoring the total amount of brighteners in an acidic copper/copper alloy plating bath and controlled process for plating |
| JP6909582B2 (ja) * | 2017-01-18 | 2021-07-28 | 株式会社Jcu | 着色用めっき液および着色方法 |
| KR20210062369A (ko) * | 2019-11-21 | 2021-05-31 | 에스케이넥실리스 주식회사 | 찢김 또는 주름 불량을 방지할 수 있는 전해동박, 그것을 포함하는 전극, 그것을 포함하는 이차전지, 및 그것의 제조방법 |
| TW202342827A (zh) * | 2022-03-31 | 2023-11-01 | 日商奧野製藥工業股份有限公司 | Pr脈衝電解用銅鍍敷液、及利用pr脈衝電解法之銅鍍敷方法 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB662217A (en) * | 1948-10-13 | 1951-12-05 | Westinghouse Electric Int Co | Improvements in or relating to the electrodeposition of copper |
| DD215589B5 (de) * | 1983-05-11 | 1994-06-01 | Heinz Dr Rer Nat Liebscher | Verfahren zur elektrolytischen Metallabscheidung bei erzwungener Konvektion |
| DD261613A1 (de) * | 1987-06-05 | 1988-11-02 | Leipzig Galvanotechnik | Verfahren zur elektrolytischen kupferabscheidung aus sauren elektrolyten mit dimensionsstabiler anode |
| GB8801827D0 (en) * | 1988-01-27 | 1988-02-24 | Jct Controls Ltd | Improvements in electrochemical processes |
| CN1045770A (zh) * | 1989-03-18 | 1990-10-03 | 王英 | 用膜法蒸馏技术分离浓缩醋酸铵与氢氧化铵的系统 |
| GB8913561D0 (en) * | 1989-06-13 | 1989-08-02 | Learonal Uk Plc | Method of stabilising an organic additive in an electroplating solution |
| DE4344387C2 (de) * | 1993-12-24 | 1996-09-05 | Atotech Deutschland Gmbh | Verfahren zur elektrolytischen Abscheidung von Kupfer und Anordnung zur Durchführung des Verfahrens |
| JP2866300B2 (ja) * | 1994-03-07 | 1999-03-08 | 生物系特定産業技術研究推進機構 | 運搬作業車 |
| JPH0967693A (ja) * | 1995-08-29 | 1997-03-11 | Nikko Gould Foil Kk | 電解銅箔の製造方法 |
-
1996
- 1996-12-13 DE DE19653681A patent/DE19653681C2/de not_active Expired - Fee Related
-
1997
- 1997-12-04 EP EP97952879A patent/EP0944749B1/de not_active Expired - Lifetime
- 1997-12-04 KR KR1019997004258A patent/KR100546989B1/ko not_active Expired - Lifetime
- 1997-12-04 AT AT97952879T patent/ATE204035T1/de active
- 1997-12-04 JP JP52618198A patent/JP4221064B2/ja not_active Expired - Lifetime
- 1997-12-04 WO PCT/EP1997/006786 patent/WO1998026114A1/de not_active Ceased
- 1997-12-04 DE DE59704260T patent/DE59704260D1/de not_active Expired - Lifetime
- 1997-12-04 US US09/319,423 patent/US6129830A/en not_active Expired - Lifetime
- 1997-12-04 CA CA002275214A patent/CA2275214C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR20000053278A (ko) | 2000-08-25 |
| JP4221064B2 (ja) | 2009-02-12 |
| EP0944749A1 (de) | 1999-09-29 |
| DE59704260D1 (de) | 2001-09-13 |
| KR100546989B1 (ko) | 2006-01-26 |
| US6129830A (en) | 2000-10-10 |
| WO1998026114A1 (de) | 1998-06-18 |
| DE19653681C2 (de) | 2000-04-06 |
| EP0944749B1 (de) | 2001-08-08 |
| DE19653681A1 (de) | 1998-06-18 |
| JP2001505955A (ja) | 2001-05-08 |
| CA2275214A1 (en) | 1998-06-18 |
| CA2275214C (en) | 2007-10-02 |
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