WO2012124438A1 - 感光性導電ペーストおよび導電パターンの製造方法 - Google Patents
感光性導電ペーストおよび導電パターンの製造方法 Download PDFInfo
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- WO2012124438A1 WO2012124438A1 PCT/JP2012/054104 JP2012054104W WO2012124438A1 WO 2012124438 A1 WO2012124438 A1 WO 2012124438A1 JP 2012054104 W JP2012054104 W JP 2012054104W WO 2012124438 A1 WO2012124438 A1 WO 2012124438A1
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0047—Photosensitive materials characterised by additives for obtaining a metallic or ceramic pattern, e.g. by firing
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0388—Macromolecular compounds which are rendered insoluble or differentially wettable with ethylenic or acetylenic bands in the side chains of the photopolymer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
- H05K1/095—Dispersed materials, e.g. conductive pastes or inks for polymer thick films, i.e. having a permanent organic polymeric binder
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/05—Patterning and lithography; Masks; Details of resist
- H05K2203/0502—Patterning and lithography
- H05K2203/0514—Photodevelopable thick film, e.g. conductive or insulating paste
Definitions
- the present invention relates to a photosensitive conductive paste and a method for producing a conductive pattern using the photosensitive conductive paste.
- the conductive pattern in the present invention refers to a conductive pattern containing both an organic component including a resin and an inorganic component including a conductive filler.
- Patent Document 3 a conductive paste capable of acid etching (see, for example, Patent Document 3) and a photosensitive curable conductive paste have been disclosed (see, for example, Patent Documents 4 and 5).
- Patent Documents 4 and 5 Japanese Patent Laid-Open No. 02-206675 JP 2007-207567 A JP-A-10-64333 JP 2004-361352 A International Publication WO2004 / 61006 Pamphlet
- the conductive paste described in Patent Document 3 as a conventional technique has a problem that a resist layer needs to be formed on the coating film in order to perform patterning by a photolithography method, and the number of steps is increased.
- a fine pattern can be easily obtained by imparting photosensitivity, but in Patent Document 4, the conductivity is low, and in the method described in Patent Document 5, acrylic (methacrylic) is used for the expression of conductivity.
- acrylic (methacrylic) is used for the expression of conductivity.
- it is necessary to reduce the equivalent and the conductive pattern obtained by this method is fragile and difficult to apply on a flexible substrate.
- An object of the present invention is to solve the above-mentioned problems, enable fine patterning, develop conductivity at a relatively low temperature, and in some cases, a photosensitive conductive paste and a conductive pattern capable of producing a flexible conductive pattern. It is to obtain a manufacturing method.
- the photosensitive conductive paste of the present invention has the following configuration. That is, Dicarboxylic acid or acid anhydride (A) thereof, photosensitive component (B) having an unsaturated double bond and an acid value in the range of 40 to 200 mg KOH / g, photopolymerization initiator (C), and conductive Photosensitive conductive paste containing a conductive filler (D).
- the manufacturing method of the conductive pattern of this invention has the following structure. That is, A method for producing a conductive pattern, wherein the photosensitive conductive paste is applied onto a substrate, dried, exposed and developed, and then cured at a temperature of 100 ° C. or higher and 300 ° C. or lower.
- the dicarboxylic acid or its acid anhydride (A) is preferably a dicarboxylic acid represented by the following structural formula (1) or its anhydride.
- the glass transition temperature of the photosensitive component (B) having the unsaturated double bond and the acid value in the range of 40 to 200 mg KOH / g is in the range of ⁇ 10 to 50 ° C. It is preferable to be within.
- the photosensitive component (B) having an unsaturated double bond and having an acid value in the range of 40 to 200 mgKOH / g is preferably epoxy acrylate.
- the photosensitive component (B) having the unsaturated double bond and having an acid value in the range of 40 to 200 mg KOH / g is a bisphenol A skeleton, a bisphenol F skeleton, a biphenyl skeleton, Alternatively, it preferably has a novolak skeleton.
- the photosensitive conductive paste of the present invention has the unsaturated double bond, the acid value is in the range of 40 to 200 mg KOH / g, and the photosensitive component (B) has a molecular weight of 3,000 to 20,000. It is preferable to be within the range.
- a conductive pattern having a low specific resistivity can be obtained even under low temperature curing conditions, and fine patterning is possible due to high photosensitive characteristics.
- a fine bump, wiring, etc. can be easily formed not only on a rigid board
- the photosensitive conductive paste of the present invention comprises a dicarboxylic acid or its acid anhydride (A), a photosensitive component (B) having an unsaturated double bond and an acid value in the range of 40 to 200 mg KOH / g, photopolymerization
- a conductive filler (D) is dispersed in a photosensitive resin composition comprising an initiator (C).
- the paste is applied onto the substrate, dried as necessary to remove the solvent, and then subjected to exposure, development, and a curing step at a temperature of 100 ° C. to 300 ° C. to obtain a desired conductive pattern on the substrate.
- It is a photosensitive conductive paste that can be used.
- the conductive pattern obtained by using the paste of the present invention is a composite of an organic component and an inorganic component, and the conductivity is developed when the conductive fillers are brought into contact with each other by curing shrinkage during curing.
- the dicarboxylic acid or dicarboxylic acid compound (A) thereof contained in the photosensitive conductive paste of the present invention is oxalic acid, malonic acid, succinic acid, glutaric acid, adipic acid, pimelic acid, suberic acid, azelaic acid , Sebacic acid, phthalic acid, isophthalic acid, terephthalic acid, and compounds corresponding to the structural formula (1) include 2-methylmalonic acid, 2-ethylmalonic acid, 2-propylmalonic acid, 2-butylmalonic acid 2- (3-methoxypropyl) malonic acid, 2- (3-propoxypropyl) malonic acid, 2- (3-propoxybutyl) malonic acid, (E) -2- (hex-4-ethyl) malonic acid, 2-methylsuccinic acid, 2-ethylsuccinic acid, 2-propylsuccinic acid, 2-butylsuccinic acid, 2- (3-methoxypropyl) 3-succinic
- (E) -2- (hex-4-ethyl) succinic acid, 2-propylsuccinic acid, 3-hexylpentanedioic acid, 2-hexylmalonic acid, 2- (3-ethoxypropyl) succinic acid, 2- (3-Ethoxybutyl) succinic acid and (E) -2 (hex-1-enyl) succinic acid are particularly preferred.
- the acid anhydride means a compound obtained by dehydration condensation of two molecules of the carboxylic acid of the above compound.
- the amount of dicarboxylic acid or acid anhydride (A) added is preferably 100 parts by weight of photosensitive component (B) having an unsaturated double bond and an acid value in the range of 40 to 200 mg KOH / g. Is added in the range of 0.5 to 30 parts by weight, more preferably 1 to 20 parts by weight.
- the photosensitive component (B) having an unsaturated double bond contained in the photosensitive conductive paste of the present invention and having an acid value in the range of 40 to 200 mg KOH / g includes an unsaturated double bond in the molecule. It means a monomer, oligomer or polymer having at least one or more, and one or more can be used.
- a specific example of the photosensitive component (B) is an acrylic copolymer.
- the acrylic copolymer is a copolymer containing at least an acrylic monomer as a copolymerization component, and as a specific example of the acrylic monomer, all compounds having a carbon-carbon double bond can be used.
- methyl acrylate acrylic acid, 2-ethylhexyl acrylate, ethyl methacrylate, n-butyl acrylate, iso-butyl acrylate, iso-propane acrylate, glycidyl acrylate, N-methoxymethyl acrylamide, N-ethoxymethyl acrylamide, N- n-butoxymethylacrylamide, N-isobutoxymethylacrylamide, butoxytriethylene glycol acrylate, dicyclopentanyl acrylate, dicyclopentenyl acrylate, 2-hydroxyethyl acrylate, isobonyl Chryrate, 2-hydroxypropyl acrylate, isodexyl acrylate, isooctyl acrylate, lauryl acrylate, 2-methoxyethyl acrylate, methoxyethylene glycol acrylate, methoxydiethylene glycol acrylate, octafluoropentyl acrylate, phenoxye
- an unsaturated acid such as an unsaturated carboxylic acid
- an unsaturated acid include acrylic acid, methacrylic acid, itaconic acid, crotonic acid, maleic acid, fumaric acid, vinyl acetate, and acid anhydrides thereof.
- an alkali-soluble polymer having a reactive unsaturated double bond in the side chain, which is obtained by reacting a compound having both groups having a double bond can be prepared.
- the acid value of the photosensitive component (B) contained in the photosensitive conductive paste of the present invention needs to be 40 to 200 mg KOH / g from the viewpoint of alkali solubility. If the acid value is less than 40 mgKOH / g, there is a problem that the solubility of the soluble part in the developer is lowered. On the other hand, if the acid value exceeds 200 mgKOH / g, the allowable development width cannot be increased. The acid value is measured according to JIS K 0070 (1992).
- the glass transition temperature of the photosensitive component (B) contained in the photosensitive conductive paste of the present invention is preferably ⁇ 10 to 50 ° C., more preferably 10 to 40.
- Tg is ⁇ 10 ° C. or higher
- the tackiness of the dried film can be suppressed, and when it is 10 ° C. or higher, the shape stability particularly with respect to temperature change is increased.
- Tg is 50 ° C. or lower
- flexibility is exhibited at room temperature, and when it is 50 ° C. or lower, internal stress at the time of bending can be relaxed, and generation of cracks can be particularly suppressed.
- the glass transition temperature of the photosensitive component (B) contained in the photosensitive conductive paste of the present invention can be determined by differential scanning calorimetry (DSC) measurement of the photosensitive component, but the copolymerization of the monomer as a copolymerization component Using the ratio and the glass transition temperature of the homopolymer of each monomer, it can be calculated by the following formula (1), and this value was used in the present invention.
- DSC differential scanning calorimetry
- Tg represents the glass transition temperature (unit: K) of the polymer
- T1, T2, T3 Represent the glass transition temperature (unit: K) of the homopolymer of monomer 1, monomer 2, monomer 3,.
- W1, W2, W3 Indicate the copolymerization ratio of monomer 1, monomer 2, monomer 3,.
- the photopolymerization initiator (C) contained in the photosensitive conductive paste of the present invention is a compound that absorbs light of a short wavelength such as ultraviolet rays and decomposes to generate a radical or a compound that generates a radical by causing a hydrogen abstraction reaction.
- 1,2-octanedione 1- [4- (phenylthio) -2- (O-benzoyloxime)], 2,4,6-trimethylbenzoyl-diphenyl-phosphine oxide, bis (2, 4,6-trimethylbenzoyl) -phenylphosphine oxide, ethanone, 1- [9-ethyl-6-2 (2-methylbenzoyl) -9H-carbazol-3-yl] -1- (O-acetyloxime), Benzophenone, methyl o-benzoylbenzoate, 4,4'-bis (dimethylamino) benzophenone, 4,4'-bis (diethylamino) benzophenone, 4,4'-dichlorobenzophenone, 4-benzoyl-4'-methyldiphenyl ketone , Dibenzyl ketone, fluorenone, 2,2'-diethoxyacetophenone, 2,2- Methoxy-2-phenylacetophenone
- the addition amount of the photopolymerization initiator (C) is not particularly limited, and the addition amount of the photopolymerization initiator (C) has an unsaturated double bond and the acid value is within the range of 40 to 200 mgKOH / g. It is preferably added in the range of 0.05 to 30 parts by weight, more preferably 5 to 20 parts by weight with respect to 100 parts by weight of a certain photosensitive component (B).
- the addition amount of the photopolymerization initiator (C) is set to 5 parts by weight or more with respect to 100 parts by weight of the photosensitive component (B), the cured density in the exposed part is increased and the remaining film ratio after development is increased. Can do.
- the amount of addition of the photopolymerization initiator (C) to 100 parts by weight of the photosensitive component (B) is 20 parts by weight or less, so that excessive photoabsorption particularly on the upper part of the coating film by the photopolymerization initiator (C). It is possible to prevent the conductive pattern from having a reverse taper shape and the adhesiveness to the base material from being lowered.
- the photosensitive conductive paste of the present invention can be improved in sensitivity by adding a sensitizer together with the photopolymerization initiator (C), or can expand the wavelength range effective for the reaction.
- the sensitizer examples include 2,4-diethylthioxanthone, isopropylthioxanthone, 2,3-bis (4-diethylaminobenzal) cyclopentanone, 2,6-bis (4-dimethylaminobenzal) cyclohexanone, 2,6-bis (4-dimethylaminobenzal) -4-methylcyclohexanone, Michler's ketone, 4,4-bis (diethylamino) benzophenone, 4,4-bis (dimethylamino) chalcone, 4,4-bis (diethylamino) Chalcone, p-dimethylaminocinnamylidene indanone, p-dimethylaminobenzylidene indanone, 2- (p-dimethylaminophenylvinylene) isonaphthothiazole, 1,3-bis (4-dimethylaminophenylvinylene) isonaphthothiazo
- the addition amount thereof is 100 parts by weight of the photosensitive component (B) having an unsaturated double bond and an acid value in the range of 40 to 200 mg KOH / g. Usually, it is preferably in the range of 0.05 to 10 parts by weight, more preferably 0.1 to 10 parts by weight with respect to parts.
- the addition amount with respect to 100 parts by weight of the photosensitive component (B) 0.1 parts by weight or more, the effect of improving the photosensitivity is sufficiently exhibited, and the addition amount with respect to 100 parts by weight of the photosensitive component (B) is 10%.
- the amount By setting the amount to be equal to or less than parts by weight, it is possible to suppress excessive light absorption particularly at the upper part of the coating film, the conductive pattern to have an inversely tapered shape, and a decrease in adhesiveness with the substrate.
- the conductive filler (D) contained in the photosensitive conductive paste of the present invention is at least one of Ag, Au, Cu, Pt, Pb, Sn, Ni, Al, W, Mo, ruthenium oxide, Cr, Ti, and indium.
- These conductive fillers can be used alone, as an alloy, or as a mixed powder.
- covered the surface of the insulating particle or electroconductive particle with the above-mentioned component can be used similarly.
- Ag, Cu and Au are preferable from the viewpoint of conductivity, and Ag is more preferable from the viewpoint of cost and stability.
- the volume average particle diameter of the conductive filler (D) is preferably 0.1 to 10 ⁇ m, more preferably 0.5 to 6 ⁇ m.
- the volume average particle diameter is preferably 0.1 to 10 ⁇ m, more preferably 0.5 to 6 ⁇ m.
- the contact probability between the conductive fillers is improved, the specific resistance value of the conductive pattern to be produced, and the disconnection probability can be lowered, and ultraviolet rays at the time of exposure are film The inside can be smoothly transmitted, and fine patterning becomes easy.
- the volume average particle size is 10 ⁇ m or less, the surface smoothness, pattern accuracy, and dimensional accuracy of the printed circuit pattern are improved.
- the volume average particle diameter can be determined by a Coulter counter method, a photon correlation method, a laser diffraction method, or the like.
- the amount of the conductive filler (D) added is preferably in the range of 70 to 95% by weight, more preferably 80 to 90% by weight, based on the total solid content in the photosensitive conductive paste.
- the amount of the conductive filler (D) added is preferably in the range of 70 to 95% by weight, more preferably 80 to 90% by weight, based on the total solid content in the photosensitive conductive paste.
- the photosensitive conductive paste of the present invention may contain a solvent.
- the solvent include N, N-dimethylacetamide, N, N-dimethylformamide, N-methyl-2-pyrrolidone, dimethylimidazolidinone, dimethyl sulfoxide, ⁇ -butyrolactone, ethyl lactate, 1-methoxy-2-propanol, 1 -Ethoxy-2-propanol, ethylene glycol mono-n-propyl ether, diacetone alcohol, tetrahydrofurfuryl alcohol, propylene glycol monomethyl ether acetate and the like.
- a solvent can be used individually by 1 type, or 2 or more types can be mixed and used for it. The solvent may be added later for the purpose of adjusting the viscosity after preparing the paste.
- the photosensitive conductive paste of the present invention is a non-photosensitive polymer, plasticizer, leveling agent, surfactant, silane coupling agent that does not have an unsaturated double bond in the molecule as long as the desired properties are not impaired. Additives such as antifoaming agents and pigments can also be blended.
- the non-photosensitive polymer include epoxy resin, novolac resin, phenol resin, polyimide precursor, and closed ring polyimide.
- plasticizer examples include dibutyl phthalate, dioctyl phthalate, polyethylene glycol, glycerin and the like.
- leveling agent examples include a special vinyl polymer and a special acrylic polymer.
- silane coupling agents methyltrimethoxysilane, dimethyldiethoxysilane, phenyltriethoxysilane, hexamethyldisilazane, 3-methacryloxypropyltrimethoxysilane, 3-glycidoxypropyltrimethoxysilane, vinyltrimethoxysilane Etc.
- the photosensitive conductive paste of the present invention is produced using a disperser, a kneader or the like. Specific examples of these include, but are not limited to, a three-roller, a ball mill, and a planetary ball mill.
- the paste of the present invention is applied on a substrate, heated to volatilize the solvent and dried. Thereafter, exposure is performed through a pattern formation mask, and a desired pattern is formed on the substrate through a development process. And it cures at the temperature of 100 degreeC or more and 300 degrees C or less, and produces a conductive pattern.
- the curing temperature is preferably 120 to 180 ° C. If the heating temperature is less than 100 ° C., the volume shrinkage of the resin cannot be increased, and the specific resistivity cannot be decreased. On the other hand, when the heating temperature exceeds 300 ° C., it cannot be used on a substrate having low heat resistance, and cannot be used in combination with a material having low heat resistance.
- the substrate used in the present invention is, for example, a polyethylene terephthalate film (hereinafter referred to as PET film), a polyimide film, a polyester film, an aramid film, an epoxy resin substrate, a polyetherimide resin substrate, a polyetherketone resin substrate, a polysulfone resin substrate, or glass.
- PET film polyethylene terephthalate film
- polyimide film a polyimide film
- polyester film an aramid film
- an epoxy resin substrate a polyetherimide resin substrate
- a polyetherketone resin substrate a polysulfone resin substrate
- glass glass
- examples include, but are not limited to, a substrate, a silicon wafer, an alumina substrate, an aluminum nitride substrate, and a silicon carbide substrate.
- Examples of the method for applying the photosensitive conductive paste of the present invention to a substrate include spin coating using a spinner, spray coating, roll coating, screen printing, blade coater, die coater, calendar coater, meniscus coater, bar coater and the like.
- the coating film thickness varies depending on the coating method, the solid content concentration of the composition, the viscosity, and the like, but is usually applied so that the film thickness after drying is in the range of 0.1 to 50 ⁇ m.
- the solvent is removed from the coating film applied on the substrate.
- the method for removing the solvent include heat drying using an oven, a hot plate, infrared rays, and vacuum drying. Heat drying is preferably performed in the range of 50 ° C. to 180 ° C. for 1 minute to several hours.
- the pattern is processed by photolithography on the coating film after removing the solvent.
- a light source used for exposure it is preferable to use i-line (365 nm), h-line (405 nm), and g-line (436 nm) of a mercury lamp.
- Developer solutions for alkali development include tetramethylammonium hydroxide, diethanolamine, diethylaminoethanol, sodium hydroxide, potassium hydroxide, sodium carbonate, potassium carbonate, triethylamine, diethylamine, methylamine, dimethylamine, dimethylaminoethyl acetate
- An aqueous solution of a compound such as dimethylaminoethanol, dimethylaminoethyl methacrylate, cyclohexylamine, ethylenediamine or hexamethylenediamine is preferred.
- these aqueous solutions may contain polar solvents such as N-methyl-2-pyrrolidone, N, N-dimethylformamide, N, N-dimethylacetamide, dimethyl sulfoxide and ⁇ -butyrolactone, alcohols such as methanol, ethanol and isopropanol.
- polar solvents such as N-methyl-2-pyrrolidone, N, N-dimethylformamide, N, N-dimethylacetamide, dimethyl sulfoxide and ⁇ -butyrolactone
- alcohols such as methanol, ethanol and isopropanol.
- Esters such as ethyl lactate and propylene glycol monomethyl ether acetate
- ketones such as cyclopentanone, cyclohexanone, isobutyl ketone, and methyl isobutyl ketone may be used alone or as a developer.
- what added surfactant to these alkaline aqueous solution can also be
- Developers for organic development include N-methyl-2-pyrrolidone, N-acetyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, dimethyl sulfoxide, hexamethyl phosphortriamide, etc. Can be used alone or in combination with methanol, ethanol, isopropyl alcohol, xylene, water, methyl carbitol, ethyl carbitol and the like.
- the development can be performed by spraying the developer on the coating film surface while the substrate is allowed to stand or rotate, immersing the substrate in the developer, or applying ultrasonic waves while immersing.
- a rinsing treatment with water may be performed.
- alcohols such as ethanol and isopropyl alcohol
- esters such as ethyl lactate and propylene glycol monomethyl ether acetate may be added to water for rinsing treatment.
- the paste composition film is cured to develop conductivity.
- the curing method include oven drying, inert oven, hot plate, heat drying using infrared rays, vacuum drying, and the like.
- a conductive pattern can be produced through a curing process.
- One unit is a group of straight lines in which a photosensitive conductive paste is applied on a PET film so that the dry thickness is 12 ⁇ m, dried in a drying oven at 80 ° C. for 5 minutes, and arranged in a constant line and space (L / S). And exposure and development through a photomask having a light-transmitting pattern having nine types of units having different L / S values, and then curing in a drying oven at 140 ° C. for 1 hour to obtain a conductive pattern .
- the L / S values of each unit were 500/500, 250/250, 100/100, 50/50, 40/40, 30/30, 25/25, 20/20, and 15/15 (respective line widths).
- Specific resistivity surface resistance value ⁇ film thickness ⁇ line width / line length
- the film thickness was measured using a stylus step meter “Surfcom” (registered trademark) 1400 (manufactured by Tokyo Seimitsu Co., Ltd.). The film thickness was measured at three positions at random, and the average value of the three points was taken as the film thickness. The length measurement was 1 mm, and the scanning speed was 0.3 mm / sec.
- the line width was determined by observing three positions at random with an optical microscope and analyzing the image data to obtain the average value of the three points as the line width.
- FIG. 2 is a diagram schematically showing a sample used in the flexibility test.
- a photosensitive conductive paste is applied on a rectangular PET film (thickness 40 ⁇ m) having a length of 10 mm and a width of 100 mm so as to have a dry thickness of 10 ⁇ m, followed by drying in a drying oven at 80 ° C. for 10 minutes.
- a photomask having a translucent part A is placed, exposed and developed so that the translucent part is in the center of the sample, and then cured in a drying oven at 140 ° C. for 1 hour to form a conductive pattern.
- the conductive pattern was bent so that the inner side and the outer side were alternately bent, the sample short side B and the sample short side C were brought into contact, and the bending operation to return to the original was repeated 100 times, and then the resistance value was measured again with a tester.
- the change amount of the resistance value was 20% or less and the conductive pattern was not cracked, peeled off, disconnected or the like, and the poor one was defined as poor.
- the obtained reaction solution was purified with methanol to remove unreacted impurities, and further dried under vacuum for 24 hours to obtain a photosensitive component (B-1).
- the obtained photosensitive component (B-1) had an acid value of 103 mgKOH / g and a glass transition temperature obtained from the formula (1) of 21.7 ° C.
- a mixture of 50 g of ethylene oxide-modified bisphenol A diacrylate: FA-324A, 20 g of EA, 15 g of AA, 0.8 g of 2,2′-azobisisobutyronitrile and 10 g of diethylene glycol monoethyl ether acetate was added over 1 hour. It was dripped. After completion of the dropping, a polymerization reaction was further performed for 6 hours. Thereafter, 1 g of hydroquinone monomethyl ether was added to terminate the polymerization reaction.
- the average particle size of the conductive filler (D) was measured by a dynamic light scattering particle size distribution meter manufactured by Horiba, Ltd. [monomer] Light acrylate BP-4EA (manufactured by Kyoeisha Chemical Co., Ltd.) [solvent] Diethylene glycol monoethyl ether acetate (manufactured by Tokyo Chemical Industry Co., Ltd.)
- Example 1 In a 100 mL clean bottle, 0.50 g of adipic acid, 10.0 g of compound (B-1), 0.50 g of photoinitiator “IRGACURE” (registered trademark) 369 (manufactured by Ciba Japan), diethylene glycol monoethyl 5.0 g of ether acetate was added and mixed with “Awatori Rentaro” (registered trademark) ARE-310 (manufactured by Shinky Co., Ltd.) to obtain 16.0 g of photosensitive resin solution (solid content
- the obtained paste was applied on a PET film having a film thickness of 30 ⁇ m by screen printing and dried in a drying oven at 80 ° C. for 10 minutes. Thereafter, full line exposure is performed using an exposure apparatus PEM-6M (manufactured by Union Optical Co., Ltd.) at an exposure amount of 50 mJ / cm 2 (wavelength 365 nm equivalent), and immersion development is performed with a 0.25% Na 2 CO 3 solution for 50 seconds. After rinsing with ultrapure water, curing was performed in a drying oven at 140 ° C. for 1 hour. The film thickness of the patterned conductive pattern was 10 ⁇ m.
- Examples 1 to 13 that satisfy the requirements of the present invention, a high-resolution pattern could be formed and a low-resistance conductive pattern could be obtained by curing at 140 ° C., but Comparative Example 1 using no compound (A) In No. 2, a low resistance conductive pattern could not be obtained.
- a conductive pattern having a low specific resistivity can be obtained even under low temperature curing conditions, and fine patterning is possible due to high photosensitivity.
- a fine bump, wiring, etc. can be easily formed not only on a rigid board
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Abstract
Description
ジカルボン酸またはその酸無水物(A)、不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B)、光重合開始剤(C)、および導電性フィラー(D)を含む感光性導電ペースト、である。
上記感光性導電ペーストを基板上に塗布し、乾燥し、露光し、現像した後に100℃以上300℃以下の温度でキュアする導電パターンの製造方法、である。
本発明の感光性導電ペーストは、前記不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B)のガラス転移温度が-10~50℃の範囲内であることが好ましい。
光重合開始剤(C)の添加量としては、不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B)100重量部に対し、好ましくは0.05~30重量部の範囲で添加され、より好ましくは、5~20重量部である。感光性成分(B)100重量部に対する光重合開始剤(C)の添加量を5重量部以上とすることにより、特に露光部の硬化密度が増加し、現像後の残膜率を高くすることができる。また、感光性成分(B)100重量部に対する光重合開始剤(C)の添加量を20重量部以下とすることで、特に光重合開始剤(C)による塗布膜上部での過剰な光吸収を抑制し、導電パターンが逆テーパー形状となり基材との接着性が低下することを抑制することができる。
PETフィルム上に感光性導電ペーストを乾燥厚みが12μmになるように塗布、80℃の乾燥オーブン内で5分間乾燥し、一定のラインアンドスペース(L/S)で配列する直線群を1つのユニットとし、L/Sの値が異なる9種類のユニットを有する透光パターンを有するフォトマスクを介して露光、現像し、その後、140℃で1時間乾燥オーブン内でキュアすることによって導電パターンを得た。各ユニットのL/Sの値は500/500、250/250、100/100、50/50、40/40、30/30、25/25、20/20、15/15とした(それぞれライン幅(μm)/間隔(μm)を表す)。パターンを光学顕微鏡により観察し、パターン間に残渣がなく、かつパターン剥がれのない最小のL/Sの値を持つパターンを確認し、この最小のL/Sの値を現像可能なL/Sとした。
80℃の乾燥オーブン内で10分間乾燥し、図1に示すパターンの透光部Aを有するフォトマスクを介して露光し、現像し、その後、140℃で1時間乾燥オーブン内でキュアすることによって比抵抗率測定用導電性パターンを得た。導電性パターンのライン幅は0.400mm、ライン長さは80mmである。得られたパターンの端部を表面抵抗計でつなぎ、表面抵抗値を測定し、次の計算式に当てはめて比抵抗率を算出した。
なお膜厚の測定は触針式段差計“サーフコム”(登録商標)1400((株)東京精密製)を用いて行った。膜厚の測定はランダムに3箇所の位置にて測り、その3点の平均値を膜厚とした。測長は1mm、走査速度は0.3mm/secとした。線幅はパターンを光学顕微鏡でランダムに3箇所の位置を観察し、画像データを解析して得られた3点の平均値を線幅とした。
図2は屈曲性試験に用いたサンプルを模式的に示した図である。縦10mm、横100mmの長方形のPETフィルム(厚み40μm)上に感光性導電ペーストを乾燥厚みが10μmになるように塗布し、80℃の乾燥オーブン内で10分間乾燥し、図1に示すパターンの透光部Aを有するフォトマスクを、透光部がサンプル中央になるように配置して露光し、現像し、その後、140℃で1時間乾燥オーブン内でキュアして導電パターンを形成し、テスターを用いて抵抗値を測定した。その後導電パターンが内側、外側と交互になるように曲げてサンプル短辺Bとサンプル短辺Cを接触させ、元に戻す屈曲動作を100回繰り返した後、再度テスターで抵抗値を測定した。その結果、抵抗値の変化量が20%以下であり、且つ導電パターンにクラック、剥がれ、断線などがないものをgoodとし、そうでないものをpoorとした。
[ジカルボン酸またはその酸無水物(A)]
アジピン酸
2‐プロピルサクシン酸
3‐ヘキシルペンタンジオイック酸
(E)-2-(ヘキサ‐4-エチル) サクシン酸
2-ヘキシルペンタンジオイック酸
2-ヘキシルマロン酸
2-(3-エトキシプロピル)サクシン酸
2-(3-エトキシブチル)サクシン酸
(E)-2-(ヘキサ-1-エニル)サクシン酸
[不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B)]
合成例1:不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B-1)
共重合比率(重量基準):エチルアクリレート(以下、EA)/メタクリル酸2-エチルヘキシル(以下、2-EHMA)/スチレン(以下、St)/グリシジルメタクリレート(以下、GMA)/アクリル酸(以下、AA)=20/40/20/5/15
窒素雰囲気の反応容器中にジエチレングリコールモノエチルエーテルアセテート150gを仕込みオイルバスを用いて80℃まで昇温した。これに、EA20g、2-EHMA40g、St20g、AA15g、2,2’-アゾビスイソブチロニトリル0.8gおよびジエチレングリコールモノエチルエーテルアセテート10gからなる混合物を1時間かけて滴下した。滴下終了後、さらに6時間重合反応を行った。その後、ハイドロキノンモノメチルエーテル1gを添加して重合反応を停止した。引き続きGMA5g、トリエチルベンジルアンモニウムクロライド1gおよびジエチレングリコールモノエチルエーテルアセテート10gからなる混合物を0.5時間かけて滴下した。滴下終了後、さらに2時間付加反応を行った。得られた反応溶液をメタノールで精製することで未反応不純物を除去し、さらに24時間真空乾燥することで感光性成分(B-1)を得た。得られた感光性成分(B-1)の酸価は103mgKOH/g、数式(1)より求めたガラス転移温度は21.7℃であった。
共重合比率(重量基準):エチレンオキサイド変性ビスフェノールAジアクリレート(製品名:FA-324A、日立化成工業(株)製)/EA/GMA/AA=50/10/5/15
窒素雰囲気の反応容器中にジエチレングリコールモノエチルエーテルアセテート150gを仕込みオイルバスを用いて80℃まで昇温した。これに、エチレンオキサイド変性ビスフェノールAジアクリレート:FA-324Aを50g、EA20g、AA15g、2,2’-アゾビスイソブチロニトリル0.8gおよびジエチレングリコールモノエチルエーテルアセテート10gからなる混合物を1時間かけて滴下した。滴下終了後、さらに6時間重合反応を行った。その後、ハイドロキノンモノメチルエーテル1gを添加して重合反応を停止した。引き続きGMA5g、トリエチルベンジルアンモニウムクロライド1gおよびジエチレングリコールモノエチルエーテルアセテート10gからなる混合物を0.5時間かけて滴下した。滴下終了後、さらに2時間付加反応を行った。得られた反応溶液をメタノールで精製することで未反応不純物を除去し、さらに24時間真空乾燥することで感光性成分(B-2)を得た。得られた感光性成分(B-2)の酸価は96mgKOH/g、数式(1)より求めたガラス転移温度は19.9℃であった。
[光重合開始剤(C)]
“IRGACURE”(登録商標)369(チバジャパン(株)製)
“カヤキュア”(登録商標)DETX-S(日本化薬(株)製)
[導電性フィラー(D)]
表1に記載の材料、平均粒子径のものを用いた。なお、平均粒子径は以下の方法により求めた。
導電性フィラー(D)の平均粒子径は、(株)堀場製作所製動的光散乱式粒度分布計により体積平均粒子径を測定した。
[モノマー]
ライトアクリレートBP-4EA(共栄社化学(株)製)
[溶剤]
ジエチレングリコールモノエチルエーテルアセテート(東京化成工業(株)製)
(実施例1)
100mLクリーンボトルにアジピン酸を0.50g、化合物(B-1)を10.0g、光重合開始剤“IRGACURE”(登録商標)369(チバジャパン(株)製)を0.50g、ジエチレングリコールモノエチルエーテルアセテートを5.0g入れ、“あわとり錬太郎”(登録商標)ARE-310((株)シンキー製)で混合し、感光性樹脂溶液16.0g(固形分68.8重量%)を得た。
(実施例2~13)
表1に示す組成の感光性導電ペーストを実施例1と同様の方法で製造し、評価結果を表2に示した。
(比較例1~2)
表1に示す組成の感光性導電ペーストを実施例1と同様の方法で製造し、評価結果を表2に示した。
B、C:サンプル短辺
D:導電パターン
E:PETフィルム
Claims (7)
- ジカルボン酸またはその酸無水物(A)、不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B)、光重合開始剤(C)、および導電性フィラー(D)を含む感光性導電ペースト。
- 前記不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B)のガラス転移温度が-10~50℃の範囲内である請求項1または2記載の感光性導電ペースト。
- 前記不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B)がエポキシアクリレートである請求項1~3のいずれかに記載の感光性導電ペースト。
- 前記不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B)がビスフェノールA骨格、ビスフェノールF骨格、ビフェニル骨格、またはノボラック骨格を有する請求項1~4のいずれかに記載の感光性導電ペースト。
- 前記前記不飽和二重結合を有し、酸価が40~200mgKOH/gの範囲内である感光性成分(B)の分子量が3,000~20,000の範囲内である請求項1~5のいずれかに記載の感光性導電ペースト。
- 請求項1~6のいずれかに記載の感光性導電ペーストを基板上に塗布し、乾燥し、露光し、現像した後に100℃以上300℃以下の温度でキュアする導電パターンの製造方法。
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WO2013141009A1 (ja) * | 2012-03-22 | 2013-09-26 | 東レ株式会社 | 感光性導電ペーストおよび導電パターンの製造方法 |
US9081278B2 (en) | 2012-03-22 | 2015-07-14 | Toray Industries, Inc. | Photosensitive conductive paste and method of producing conductive pattern |
WO2014069436A1 (ja) * | 2012-10-31 | 2014-05-08 | 東レ株式会社 | 感光性導電ペースト及び導電パターンの製造方法 |
JP2014126609A (ja) * | 2012-12-25 | 2014-07-07 | Taiyo Ink Mfg Ltd | 導電性樹脂組成物及び導電回路 |
US10015887B2 (en) | 2013-02-18 | 2018-07-03 | Orbotech Ltd. | Two-step, direct-write laser metallization |
US10622244B2 (en) | 2013-02-18 | 2020-04-14 | Orbotech Ltd. | Pulsed-mode direct-write laser metallization |
JP2014163987A (ja) * | 2013-02-21 | 2014-09-08 | Taiyo Ink Mfg Ltd | 導電性樹脂組成物及び導電回路 |
WO2014156677A1 (ja) * | 2013-03-29 | 2014-10-02 | 東レ株式会社 | 導電ペースト及び導電パターンの製造方法 |
US9846362B2 (en) | 2013-03-29 | 2017-12-19 | Toray Industries, Inc. | Conductive paste and method of producing conductive pattern |
US10537027B2 (en) | 2013-08-02 | 2020-01-14 | Orbotech Ltd. | Method producing a conductive path on a substrate |
JP2015184626A (ja) * | 2014-03-26 | 2015-10-22 | 東レ株式会社 | 感光性樹脂組成物、それからなる感光性樹脂ペーストならびにそれらを硬化させて得られる硬化膜およびそれを有する電極回路 |
JP2018072475A (ja) * | 2016-10-26 | 2018-05-10 | キヤノン株式会社 | 電子写真感光体保護層用塗布液 |
Also Published As
Publication number | Publication date |
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TWI456348B (zh) | 2014-10-11 |
JPWO2012124438A1 (ja) | 2014-07-17 |
JP5278632B2 (ja) | 2013-09-04 |
CN103430097A (zh) | 2013-12-04 |
KR101774307B1 (ko) | 2017-09-05 |
CN103430097B (zh) | 2016-05-25 |
KR20140006883A (ko) | 2014-01-16 |
TW201245858A (en) | 2012-11-16 |
CN105867067A (zh) | 2016-08-17 |
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