WO2010106979A1 - 基板用塗布装置 - Google Patents
基板用塗布装置 Download PDFInfo
- Publication number
- WO2010106979A1 WO2010106979A1 PCT/JP2010/054219 JP2010054219W WO2010106979A1 WO 2010106979 A1 WO2010106979 A1 WO 2010106979A1 JP 2010054219 W JP2010054219 W JP 2010054219W WO 2010106979 A1 WO2010106979 A1 WO 2010106979A1
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- WIPO (PCT)
- Prior art keywords
- substrate
- nozzle
- shape
- coating
- coating liquid
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/10—Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
- B05C11/1002—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves
- B05C11/1007—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves responsive to condition of liquid or other fluent material
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
- B05B12/00—Arrangements for controlling delivery; Arrangements for controlling the spray area
- B05B12/08—Arrangements for controlling delivery; Arrangements for controlling the spray area responsive to condition of liquid or other fluent material to be discharged, of ambient medium or of target ; responsive to condition of spray devices or of supply means, e.g. pipes, pumps or their drive means
- B05B12/082—Arrangements for controlling delivery; Arrangements for controlling the spray area responsive to condition of liquid or other fluent material to be discharged, of ambient medium or of target ; responsive to condition of spray devices or of supply means, e.g. pipes, pumps or their drive means responsive to a condition of the discharged jet or spray, e.g. to jet shape, spray pattern or droplet size
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/10—Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
- B05C11/1002—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves
- B05C11/1005—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves responsive to condition of liquid or other fluent material already applied to the surface, e.g. coating thickness, weight or pattern
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C5/00—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
- B05C5/02—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
- B05C5/0254—Coating heads with slot-shaped outlet
- B05C5/0258—Coating heads with slot-shaped outlet flow controlled, e.g. by a valve
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
Definitions
- the present invention is for a substrate in which a nozzle is scanned in one direction relative to a plate-like substrate such as a glass substrate, and a coating solution such as a resist solution is ejected from the nozzle to apply the coating solution on the coating surface of the substrate.
- the present invention relates to a coating apparatus.
- the substrate When applying a coating solution to the surface of a plate-like substrate such as a glass substrate, the substrate is placed along a predetermined scanning direction perpendicular to the slit in a state where a gap is provided between the slit-like nozzle and the surface of the substrate.
- a substrate coating apparatus that scans relative to the surface of the substrate is used.
- the pressure of the pump that supplies the coating liquid to the nozzle and the mechanical vibration applied to the substrate are measured, and the beat shape of the coating liquid is estimated based on this measurement result, so that an appropriate beat shape is obtained.
- there is one that controls the discharge pressure of the pump and the distance between the tip of the nozzle and the surface of the substrate for example, see Patent Document 1).
- Patent Document 1 does not directly measure the bead shape, but estimates the bead shape from the measurement results of physical quantities that may affect the bead shape.
- the actual bead shape cannot be accurately grasped due to the effects of errors and noise. For this reason, there exists a problem which cannot adjust the application quantity of the coating liquid in the surface of a board
- non-uniform film thickness area (non-uniform area) at the start of coating and at the end of coating increases. This non-uniform region is generated when the discharge amount of the coating liquid from the nozzle becomes unstable.
- the purpose of this invention is to control the parameters that affect the bead shape based on the results of direct measurement of the bead shape, so that the coating amount of the coating liquid on the surface of the substrate can be adjusted instantaneously with high accuracy
- An object of the present invention is to provide a substrate coating apparatus capable of reducing non-uniform areas at the start of coating and at the end of coating.
- the substrate coating apparatus includes a nozzle, a shape measuring means, a shape deforming means, and a control means.
- the nozzle should move relative to the surface of the substrate along a predetermined scanning direction at a position where a predetermined gap is provided between the surface and the surface of the plate-shaped substrate, and should be applied to the surface of the plate-shaped substrate.
- the coating liquid is discharged.
- the shape measuring means optically measures the bead shape of the coating liquid discharged from the nozzle onto the substrate.
- the shape deforming means deforms the bead shape of the coating liquid discharged from the nozzle.
- the control means creates control data for controlling the operation of the shape deforming means based on the bead shape measured by the shape measuring means.
- the bead shape of the coating liquid discharged from the nozzle is adjusted based on the result of optical measurement of the bead shape of the coating liquid discharged from the nozzle to the substrate. Therefore, based on the result of directly measuring the bead shape, the coating amount of the coating liquid on the surface of the substrate is adjusted instantaneously with high accuracy.
- the shape measuring unit preferably includes a first imaging unit that images a bead shape between the nozzle and the surface of the substrate from a plane orthogonal to the scanning direction and from a plane orthogonal to the substrate surface. .
- the bead shape of the coating liquid between the nozzle and the surface of the substrate can be directly measured by the first imaging means.
- a stage on which the substrate is placed on the upper surface further comprising a stage having a through-hole penetrating from the upper surface to the bottom surface, and the shape measuring means is disposed on the stage and placed on the stage. It is preferable to include a second imaging unit that images the surface.
- the second imaging means can directly measure the range of the non-uniform area at the start of application and at the end of application.
- the control means measures the distance from the center of the nozzle in the scanning direction to the boundary between the application area and the non-application area of the coating liquid on the surface of the substrate from the image captured by the second imaging means, and based on the measurement result It is preferable to create control data. It is possible to easily calculate a parameter for minimizing a non-uniform area at the start of coating and at the end of coating.
- the shape deforming unit is a pressure control unit that is disposed in the vicinity of the nozzle on the upstream side in the scanning direction and controls the atmospheric pressure between the nozzle and the surface of the substrate.
- the beat shape can be easily controlled by adjusting the air pressure between the nozzle and the surface of the substrate.
- the shape deformation means is preferably supply amount control means for controlling the supply amount of the coating liquid to the nozzle.
- the bead shape can be easily controlled by adjusting the supply amount of the coating liquid to the nozzle.
- the application amount of the coating liquid on the surface of the substrate can be adjusted instantaneously with high accuracy, and the application is started.
- the non-uniform area at the time and at the end of coating can be reduced.
- a substrate coating apparatus 10 includes a slit nozzle 1, a table 2, a first camera 3, a second camera 4, a control unit 5, a motor driver 6, a valve driver 7, A pump 8 and a pressure regulating chamber 9 are provided.
- the slit nozzle 1 is a nozzle of the present invention, and discharges the coating liquid from a slit parallel to the arrow X direction provided on the bottom surface.
- the table 2 has a plate-like translucent substrate 100 placed on the upper surface.
- the slit nozzle 1 moves relative to the substrate 100 along the arrow Y direction orthogonal to the arrow X direction.
- the arrow Y direction is the scanning direction of the present invention.
- the table 2 moves in the arrow Y direction via a drive mechanism (not shown).
- the first camera 3 captures an image between the slit nozzle 1 and the surface of the substrate 100 from the direction of the arrow X in parallel with the surface of the substrate 100 placed on the table 2.
- the bead shape of the coating liquid discharged from the slit nozzle 1 onto the surface of the substrate 100 is directly imaged by the first camera 3.
- the second camera 4 is disposed opposite to the center in the arrow Y direction on the bottom surface of the slit nozzle 1 with the table 2 interposed therebetween.
- a through hole 21 is formed in the table 2 at a position facing the second camera 4. The second camera 4 images the surface of the substrate 100 via the through hole 21.
- the pump 8 corresponds to the shape deforming means of the present invention, and supplies the coating liquid in the tank (not shown) into the chamber provided in the slit nozzle 1 by rotation of the motor.
- the coating liquid is supplied to the nozzle after filling the chamber with the slit nozzle 1.
- the discharge amount of the coating liquid from the slit nozzle 1 is controlled by the supply amount of the coating liquid from the pump 8.
- the pump 8 is a plunger-type or syringe-type metering pump that can strictly control the discharge amount of the coating liquid.
- the pressure regulating chamber 9 is the pressure control means of the present invention, and is disposed close to the upstream side in the arrow Y direction, which is the direction of relative movement of the slit nozzle 1 with the substrate 100, and the slit nozzle 1 and the surface of the substrate 100 Control the air pressure between.
- the pressure adjusting chamber 9 adjusts the air pressure between the slit nozzle 1 and the surface of the substrate 100 on the downstream side in the arrow Y direction by the operation of the pressurizing valve and the pressure reducing valve.
- the control unit 5 corresponds to the control means of the present invention, and is connected to the first camera 3, the second camera 4, the motor driver 6, and the valve driver 7.
- the control unit 5 creates drive data corrected based on the image data captured by the first camera 3 and the second camera 4 and outputs the drive data to the motor driver 6 and the valve driver 7.
- the motor driver 6 drives the motor of the pump 8 with electric power according to the drive data.
- the valve driver 7 opens and closes the pressurization valve or the decompression valve of the pressure regulating chamber 9 according to the drive data.
- the control unit 5 of the substrate coating apparatus 10 reads image data captured by the first camera 3 (S2).
- the control unit 5 extracts the bead shape of the coating liquid from the image captured by the first camera 3 (S3), compares the extracted bead shape with the reference shape stored in advance in the storage unit 51, and sends it to the motor driver 6.
- Drive data to be supplied is created (S4).
- control unit 5 reads the image data captured by the second camera 4 (S5).
- the control unit 5 extracts the application boundary between the coated region and the uncoated region on the surface of the substrate 100 from the image captured by the second camera 4 by edge extraction processing (S6), and the extracted coating boundary and the slit nozzle 1 are extracted.
- the distance in the arrow Y direction from the center is measured (S7).
- the control unit 5 compares the measured distance with the reference distance stored in advance in the storage unit 51 and creates drive data to be supplied to the valve driver 7 (S8).
- the control unit 5 outputs the drive data created in S4 and S8 to the motor driver 6 and the valve driver 7 (S9).
- the control unit 5 continues at least the processes of S2 to S4 until the relative movement amount of the slit nozzle 1 with respect to the substrate 100 reaches a predetermined value and the coating operation of the coating liquid on the substrate 100 is completed (S10). ).
- the reference shape stored in the storage unit 51 is, for example, the application of the coating liquid on the surface of the substrate 100 when the supply amount of the coating liquid from the pump 8 is changed variously while the bead shape is imaged by the first camera 3. It is obtained experimentally by observing the state.
- the bead shape when the coating state on the surface of the substrate 100 becomes good is stored in the storage unit 51 as a reference shape.
- the reference distance stored in the storage unit 51 is, for example, the center of the slit nozzle 1 and the application when the supply amount of the application liquid from the pump 8 is changed variously while imaging the surface of the substrate 100 by the second camera 4. It is obtained experimentally by measuring the distance to the boundary. The distance when the application state on the surface of the substrate 100 at the start of application and at the end of application becomes good is stored in the storage unit 51 as a reference distance.
- a bead-shaped image 31A or an image 31B captured by the first camera 3 during the coating operation on the surface of the substrate 100 by the processes of S2 to S4, and The reference shape 32 is compared.
- the drive data for the motor of the pump 8 is changed so as to reduce the supply amount of the coating liquid to the slit nozzle 1.
- the drive data for the motor of the pump 8 is changed so as to increase the supply amount of the coating liquid to the slit nozzle 1.
- the supply amount of the coating liquid to the slit nozzle 1 is controlled so that the coating liquid having a desired thickness is uniformly applied to the surface of the substrate 100, and the coating state of the coating liquid on the surface of the substrate 100 is improved. Maintained.
- the distance 41A or the distance measured from the image captured by the second camera 4 during the coating operation on the surface of the substrate 100 by the processing of S5 to S8. 41B and the reference distance 42 are compared.
- drive data is output to the pressure valve of the pressure adjustment chamber 9.
- drive data is output to the pressure reducing valve of the pressure adjusting chamber 9.
- the distance from the center distance of the nozzle 1 in the arrow Y direction to the coated region on the surface of the substrate 100 is measured with the upstream side being positive and the downstream side being negative.
- the distance 41B is a negative value.
- the non-uniform film thickness region at the coating start position and the coating end position of the coating liquid on the surface of the substrate 100 is reduced between the slit nozzle 1 on the upstream side in the arrow Y direction and the surface of the substrate 100.
- the atmospheric pressure is adjusted.
- the coating liquid is applied at intervals in a plurality of regions in the scanning direction on the surface of the single substrate 100, there are a plurality of coating start positions and coating end positions on the single substrate 100.
- the film thickness nonuniformity region can be reduced at the coating start position and the coating end position.
- drive data for the motor of the pump 8 and the valve of the pressure regulating chamber 9 may be created based on an image captured by only one of the first camera 3 and the second camera 4.
- the coating state of the coating liquid on the surface of the substrate 100 can be maintained well, and the film at the start of coating and at the end of coating.
- the other control may be omitted.
- the surface of the substrate 100 cannot be imaged by the second camera 4.
- the distance between the center of the upstream slit nozzle 1 and the coating boundary in the arrow Y direction is imaged using a translucent test sheet. May be.
- the target controlled by the control unit 5 is not limited to the motor of the pump 8 and the valve of the pressure adjusting chamber 9. Instead of these, or together with these, for example, the substrate such as the relative movement speed between the slit nozzle 1 and the substrate 100. Other parameters that affect the application state of the application liquid on the surface of 100 may be used.
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- Coating Apparatus (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
2-テーブル
3-第1カメラ
4-第2カメラ
5-制御部
6-モータドライバ
7-バルブドライバ
8-ポンプ
9-調圧チャンバ
10-基板用塗布装置
21-貫通孔
32-基準形状
42-基準距離
100-基板
Claims (6)
- 板状の基板の表面に塗布すべき塗布液を吐出するノズルであって基板の表面との間に所定の間隙を設けた位置で基板の表面に対して所定の走査方向に沿って相対的に移動するノズルと、
前記ノズルから基板に吐出された塗布液のビード形状を光学的に測定する形状測定手段と、
前記ノズルから吐出される塗布液のビード形状を変形させる形状変形手段と、
前記形状測定手段が測定したビード形状に基づいて前記形状変形手段の動作を制御する制御データを作成する制御手段と、
を備えた基板用塗布装置。 - 前記形状測定手段は、前記走査方向に直交する面であって基板の表面に直交する面内から前記ノズルと基板の表面との間における前記ノズルから吐出された塗布液のビード形状を撮像する第1の撮像手段を含む請求項1に記載の基板用塗布装置。
- 基板が上面に載置されるステージであって前記上面から底面に貫通した貫通孔を有するステージをさらに備え、
前記形状測定手段は、前記貫通孔に配置されて前記ステージに載置された透光性の基板の表面に前記ノズルから吐出された塗布液の形状を撮像する第2の撮像手段を含む請求項1に記載の基板用塗布装置。 - 前記制御手段は、前記形状測定手段が測定したビード形状と、前記ノズルから基板の表面までの距離と、に基づいて前記制御データを作成する請求項1に記載の基板用塗布装置。
- 前記形状変形手段は、走査方向の上流側でノズルに近接して配置され、ノズルと基板の表面との間の気圧を制御する圧力制御手段である請求項1に記載の基板用塗布装置。
- 前記形状変形手段は、前記ノズルに対する塗布液の供給量を制御する供給量制御手段である請求項1に記載の基板用塗布装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011504828A JP5470371B2 (ja) | 2009-03-19 | 2010-03-12 | 基板用塗布装置 |
CN201080012714.4A CN102387868B (zh) | 2009-03-19 | 2010-03-12 | 基板用涂敷装置 |
US13/256,562 US9016235B2 (en) | 2009-03-19 | 2010-03-12 | Substrate coating device that controls coating amount based on optical measurement of bead shape |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009-067839 | 2009-03-19 | ||
JP2009067839 | 2009-03-19 |
Publications (1)
Publication Number | Publication Date |
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WO2010106979A1 true WO2010106979A1 (ja) | 2010-09-23 |
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ID=42739639
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/JP2010/054219 WO2010106979A1 (ja) | 2009-03-19 | 2010-03-12 | 基板用塗布装置 |
Country Status (6)
Country | Link |
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US (1) | US9016235B2 (ja) |
JP (1) | JP5470371B2 (ja) |
KR (1) | KR20120004441A (ja) |
CN (1) | CN102387868B (ja) |
TW (1) | TWI482664B (ja) |
WO (1) | WO2010106979A1 (ja) |
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JP2013077799A (ja) * | 2011-09-14 | 2013-04-25 | Denso Corp | 有機半導体装置の製造方法 |
CN103472693A (zh) * | 2013-08-28 | 2013-12-25 | 清华大学深圳研究生院 | 一种用于芯片显影工艺的工艺喷嘴 |
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Also Published As
Publication number | Publication date |
---|---|
US9016235B2 (en) | 2015-04-28 |
TWI482664B (zh) | 2015-05-01 |
TW201039929A (en) | 2010-11-16 |
US20120000420A1 (en) | 2012-01-05 |
KR20120004441A (ko) | 2012-01-12 |
CN102387868B (zh) | 2015-04-29 |
JP5470371B2 (ja) | 2014-04-16 |
CN102387868A (zh) | 2012-03-21 |
JPWO2010106979A1 (ja) | 2012-09-20 |
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