WO2010095809A3 - 엘이디 칩 테스트장치 - Google Patents

엘이디 칩 테스트장치 Download PDF

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Publication number
WO2010095809A3
WO2010095809A3 PCT/KR2009/007809 KR2009007809W WO2010095809A3 WO 2010095809 A3 WO2010095809 A3 WO 2010095809A3 KR 2009007809 W KR2009007809 W KR 2009007809W WO 2010095809 A3 WO2010095809 A3 WO 2010095809A3
Authority
WO
WIPO (PCT)
Prior art keywords
led chip
testing device
chip testing
led chips
led
Prior art date
Application number
PCT/KR2009/007809
Other languages
English (en)
French (fr)
Other versions
WO2010095809A2 (ko
Inventor
유병소
Original Assignee
(주)큐엠씨
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020090023030A external-priority patent/KR100931322B1/ko
Priority claimed from KR1020090058292A external-priority patent/KR100935706B1/ko
Priority claimed from KR1020090114028A external-priority patent/KR20110057568A/ko
Application filed by (주)큐엠씨 filed Critical (주)큐엠씨
Priority to JP2011550997A priority Critical patent/JP5327489B2/ja
Priority to US13/148,980 priority patent/US8952717B2/en
Priority to CN2009801571661A priority patent/CN102326090B/zh
Publication of WO2010095809A2 publication Critical patent/WO2010095809A2/ko
Publication of WO2010095809A3 publication Critical patent/WO2010095809A3/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Led Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

본 발명의 목적은 엘이디 칩이 가지는 성능을 정확하게 측정할 수 있는 엘이디 칩 테스트장치를 제공하는 것이다. 이를 위해 본 발명은, 엘이디 칩의 특성을 측정하는 엘이디 칩 테스트장치에 있어서, 상기 엘이디 칩을 지지하며, 상기 엘이디 칩의 특성을 측정하는 테스트위치로 상기 엘이디 칩을 회전시키는 회전부재; 및 상기 회전부재의 옆에 설치되며, 상기 테스트위치에서 상기 엘이디 칩의 특성을 측정하는 테스트부를 포함하는 것을 특징으로 하는 엘이디 칩 테스트장치를 제공한다.
PCT/KR2009/007809 2009-02-20 2009-12-24 엘이디 칩 테스트장치 WO2010095809A2 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011550997A JP5327489B2 (ja) 2009-02-20 2009-12-24 エルイーディーチップテスト装置
US13/148,980 US8952717B2 (en) 2009-02-20 2009-12-24 LED chip testing device
CN2009801571661A CN102326090B (zh) 2009-02-20 2009-12-24 Led芯片测试装置

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
KR10-2009-0014471 2009-02-20
KR20090014471 2009-02-20
KR10-2009-0023030 2009-03-18
KR1020090023030A KR100931322B1 (ko) 2009-02-20 2009-03-18 엘이디 칩 테스트장치 및 이를 이용한 테스트방법
KR10-2009-0058292 2009-06-29
KR1020090058292A KR100935706B1 (ko) 2009-06-29 2009-06-29 엘이디 칩 테스트장치 및 그 전달부재
KR1020090114028A KR20110057568A (ko) 2009-11-24 2009-11-24 엘이디 칩 테스트장치 및 엘이디 칩 분류장치
KR10-2009-0114028 2009-11-24

Publications (2)

Publication Number Publication Date
WO2010095809A2 WO2010095809A2 (ko) 2010-08-26
WO2010095809A3 true WO2010095809A3 (ko) 2010-10-14

Family

ID=42634289

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2009/007809 WO2010095809A2 (ko) 2009-02-20 2009-12-24 엘이디 칩 테스트장치

Country Status (5)

Country Link
US (1) US8952717B2 (ko)
JP (1) JP5327489B2 (ko)
CN (1) CN102326090B (ko)
TW (1) TWI449901B (ko)
WO (1) WO2010095809A2 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104089758A (zh) * 2014-07-03 2014-10-08 常州光电技术研究所 Led产品质量检测分类系统及其检测分类方法

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KR101724711B1 (ko) * 2010-10-28 2017-04-10 엘지이노텍 주식회사 발광 칩 측정 장치
KR101083346B1 (ko) * 2010-12-09 2011-11-15 주식회사 이노비즈 엘이디 칩 검사장치
TWI442603B (zh) * 2011-05-09 2014-06-21 Youngtek Electronics Corp 發光二極體封裝晶片分類系統
TWI431291B (zh) * 2011-07-14 2014-03-21 Chroma Ate Inc 發光二極體量測裝置
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CN106443505A (zh) * 2016-08-31 2017-02-22 苏州康贝尔电子设备有限公司 一种自动点亮测试机
CN107694838B (zh) * 2017-10-26 2023-02-17 福建省苍乐电子企业有限公司 一种led自动测试涂胶装置及其工作方法
CN109724779A (zh) * 2017-10-31 2019-05-07 深圳市炫硕智造技术有限公司 Cob-led灯检测系统及检测方法
CN108627762B (zh) * 2018-06-08 2024-03-26 深圳瑞波光电子有限公司 一种测试系统
KR102558296B1 (ko) 2018-07-10 2023-07-24 삼성전자주식회사 전자 장치, 마이크로 led 모듈 제조 방법 및 컴퓨터 판독가능 기록 매체
TWI693413B (zh) * 2018-07-27 2020-05-11 鴻勁精密股份有限公司 電子元件測試裝置及其應用之測試分類設備
CN109541439B (zh) * 2018-12-10 2020-11-13 通富微电子股份有限公司 一种芯片测试进料方向的调整方法、检测装置、调整系统
CN112059958B (zh) * 2018-12-29 2021-10-22 苏州市东挺河智能科技发展有限公司 一种二极管性能检测设备上的定位导轨结构
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CN114932089A (zh) * 2022-04-27 2022-08-23 泉州兰姆达仪器设备有限公司 一种激光芯片测试分选机的上料机构及其工作方法
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Also Published As

Publication number Publication date
WO2010095809A2 (ko) 2010-08-26
US8952717B2 (en) 2015-02-10
CN102326090B (zh) 2013-12-11
TWI449901B (zh) 2014-08-21
JP5327489B2 (ja) 2013-10-30
US20110316579A1 (en) 2011-12-29
CN102326090A (zh) 2012-01-18
TW201037296A (en) 2010-10-16
JP2012518182A (ja) 2012-08-09

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