WO2009037878A1 - 半導体装置及びワイヤボンディング方法 - Google Patents

半導体装置及びワイヤボンディング方法 Download PDF

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Publication number
WO2009037878A1
WO2009037878A1 PCT/JP2008/055484 JP2008055484W WO2009037878A1 WO 2009037878 A1 WO2009037878 A1 WO 2009037878A1 JP 2008055484 W JP2008055484 W JP 2008055484W WO 2009037878 A1 WO2009037878 A1 WO 2009037878A1
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Prior art keywords
layer
pressing portion
semiconductor device
wire
wire bonding
Prior art date
Application number
PCT/JP2008/055484
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English (en)
French (fr)
Inventor
Tatsunari Mii
Hayato Kiuchi
Original Assignee
Shinkawa Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinkawa Ltd. filed Critical Shinkawa Ltd.
Priority to CN2008801082514A priority Critical patent/CN101802993B/zh
Publication of WO2009037878A1 publication Critical patent/WO2009037878A1/ja
Priority to US12/727,812 priority patent/US7821140B2/en

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Abstract

 半導体装置において、イニシャルボールを第一層半導体ダイ(11)の第一層パッド(14)にボンディングして形成されるボールネックを押し潰し、押し潰したボールネック上に折り返したワイヤの側面を押し付けて形成される第一層押し付け部(100)と、第一層押し付け部(100)からリード(16)の方向に向かって伸びる第1ワイヤ(25)と、第二層半導体ダイ(12)の第二層パッド(15)から第一層押し付け部(100)に向かってルーピングされ、第一層押し付け部(100)の第二層パッド(15)側に接合される第2ワイヤ(25)とを有する。これにより、半導体ダイに与えるダメージを低減しつつ少ないボンディング回数でワイヤの接続を行う。
PCT/JP2008/055484 2007-09-21 2008-03-25 半導体装置及びワイヤボンディング方法 WO2009037878A1 (ja)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101877337A (zh) * 2009-04-30 2010-11-03 日亚化学工业株式会社 半导体装置及其制造方法
CN102290391A (zh) * 2010-06-18 2011-12-21 株式会社东芝 半导体器件及其制造方法和制造装置
US8759987B2 (en) 2009-10-09 2014-06-24 Nichia Corporation Semiconductor device and method of manufacturing the semiconductor device
WO2014171160A1 (ja) * 2013-04-15 2014-10-23 株式会社新川 半導体装置および半導体装置の製造方法

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5481769B2 (ja) * 2006-11-22 2014-04-23 日亜化学工業株式会社 半導体装置及びその製造方法
JP4787374B2 (ja) * 2010-01-27 2011-10-05 株式会社新川 半導体装置の製造方法並びにワイヤボンディング装置
TWI409933B (zh) * 2010-06-15 2013-09-21 Powertech Technology Inc 晶片堆疊封裝結構及其製法
US8609525B2 (en) * 2011-03-21 2013-12-17 Stats Chippac Ltd. Integrated circuit packaging system with interconnects and method of manufacture thereof
KR20130042210A (ko) 2011-10-18 2013-04-26 삼성전자주식회사 멀티-칩 패키지 및 그의 제조 방법
JP5899907B2 (ja) * 2011-12-26 2016-04-06 富士電機株式会社 ワイヤボンディング用のウェッジツール、ボンディング装置、ワイヤボンディング方法、および半導体装置の製造方法
KR101917331B1 (ko) 2012-02-08 2018-11-13 삼성전자주식회사 반도체 패키지 및 이를 제조하는 방법
JP2013191738A (ja) * 2012-03-14 2013-09-26 Toshiba Corp 半導体装置およびその製造方法
KR101963314B1 (ko) 2012-07-09 2019-03-28 삼성전자 주식회사 반도체 패키지 및 이의 제조 방법
CN103579063B (zh) * 2012-08-07 2016-05-11 无锡华润安盛科技有限公司 引线键合线夹及其设备和方法
KR20140135319A (ko) * 2013-05-15 2014-11-26 삼성전자주식회사 와이어 본딩 방법 및 이를 이용하여 제조된 반도체 패키지
JP2015173235A (ja) * 2014-03-12 2015-10-01 株式会社東芝 半導体装置及びその製造方法
JP2014140074A (ja) * 2014-04-17 2014-07-31 Toshiba Corp 半導体装置
CN110100314B (zh) * 2017-06-09 2022-08-09 富士电机株式会社 半导体装置及半导体装置的制造方法
KR102460014B1 (ko) * 2018-08-24 2022-10-26 삼성전자주식회사 반도체 패키지
US11581285B2 (en) * 2019-06-04 2023-02-14 Kulicke And Soffa Industries, Inc. Methods of detecting bonding between a bonding wire and a bonding location on a wire bonding machine

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004071983A (ja) * 2002-08-08 2004-03-04 Kaijo Corp バンプの形成方法及びバンプ
JP2005116961A (ja) * 2003-10-10 2005-04-28 Denso Corp 半導体装置
JP2005340777A (ja) * 2004-04-26 2005-12-08 Kaijo Corp ボンディングワイヤのループ形状及びそのループ形状を備えた半導体装置並びにワイヤボンディング方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5172851A (en) * 1990-09-20 1992-12-22 Matsushita Electronics Corporation Method of forming a bump electrode and manufacturing a resin-encapsulated semiconductor device
JP3178567B2 (ja) * 1993-07-16 2001-06-18 株式会社カイジョー ワイヤボンディング装置及びその方法
US6835898B2 (en) * 1993-11-16 2004-12-28 Formfactor, Inc. Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures
JP3869562B2 (ja) 1998-10-16 2007-01-17 三洋電機株式会社 半導体装置の製造方法
JP2001127246A (ja) 1999-10-29 2001-05-11 Fujitsu Ltd 半導体装置
JP3573133B2 (ja) * 2002-02-19 2004-10-06 セイコーエプソン株式会社 半導体装置及びその製造方法、回路基板並びに電子機器
JP3584930B2 (ja) * 2002-02-19 2004-11-04 セイコーエプソン株式会社 半導体装置及びその製造方法、回路基板並びに電子機器
JP3935370B2 (ja) * 2002-02-19 2007-06-20 セイコーエプソン株式会社 バンプ付き半導体素子の製造方法、半導体装置及びその製造方法、回路基板並びに電子機器
US7229906B2 (en) * 2002-09-19 2007-06-12 Kulicke And Soffa Industries, Inc. Method and apparatus for forming bumps for semiconductor interconnections using a wire bonding machine
JP4298665B2 (ja) * 2005-02-08 2009-07-22 株式会社新川 ワイヤボンディング方法
JP4881620B2 (ja) * 2006-01-06 2012-02-22 ルネサスエレクトロニクス株式会社 半導体装置及びその製造方法
JP2008066331A (ja) * 2006-09-04 2008-03-21 Renesas Technology Corp 半導体装置の製造方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004071983A (ja) * 2002-08-08 2004-03-04 Kaijo Corp バンプの形成方法及びバンプ
JP2005116961A (ja) * 2003-10-10 2005-04-28 Denso Corp 半導体装置
JP2005340777A (ja) * 2004-04-26 2005-12-08 Kaijo Corp ボンディングワイヤのループ形状及びそのループ形状を備えた半導体装置並びにワイヤボンディング方法

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101877337A (zh) * 2009-04-30 2010-11-03 日亚化学工业株式会社 半导体装置及其制造方法
US8759987B2 (en) 2009-10-09 2014-06-24 Nichia Corporation Semiconductor device and method of manufacturing the semiconductor device
CN102290391A (zh) * 2010-06-18 2011-12-21 株式会社东芝 半导体器件及其制造方法和制造装置
CN102290391B (zh) * 2010-06-18 2014-11-12 株式会社东芝 半导体器件及其制造方法和制造装置
WO2014171160A1 (ja) * 2013-04-15 2014-10-23 株式会社新川 半導体装置および半導体装置の製造方法
KR20150046161A (ko) * 2013-04-15 2015-04-29 가부시키가이샤 신가와 반도체 장치의 제조 방법
US9379086B2 (en) 2013-04-15 2016-06-28 Shinkawa Ltd. Method of manufacturing semiconductor device
KR101643240B1 (ko) 2013-04-15 2016-07-27 가부시키가이샤 신가와 반도체 장치의 제조 방법

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