WO2008023806A1 - Procédé de correction de sensibilité et dispositif imageur - Google Patents
Procédé de correction de sensibilité et dispositif imageur Download PDFInfo
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- WO2008023806A1 WO2008023806A1 PCT/JP2007/066492 JP2007066492W WO2008023806A1 WO 2008023806 A1 WO2008023806 A1 WO 2008023806A1 JP 2007066492 W JP2007066492 W JP 2007066492W WO 2008023806 A1 WO2008023806 A1 WO 2008023806A1
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- 238000012937 correction Methods 0.000 title claims abstract description 103
- 238000003384 imaging method Methods 0.000 title claims abstract description 57
- 238000000034 method Methods 0.000 title claims abstract description 41
- 230000035945 sensitivity Effects 0.000 title claims abstract description 29
- 238000009825 accumulation Methods 0.000 claims abstract description 35
- 230000003287 optical effect Effects 0.000 claims description 9
- 238000009792 diffusion process Methods 0.000 claims description 7
- 230000000295 complement effect Effects 0.000 claims description 4
- 229910044991 metal oxide Inorganic materials 0.000 claims description 4
- 150000004706 metal oxides Chemical class 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 2
- 238000003705 background correction Methods 0.000 abstract description 16
- 239000003990 capacitor Substances 0.000 description 19
- 238000010586 diagram Methods 0.000 description 16
- 238000005286 illumination Methods 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
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- 238000003672 processing method Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14623—Optical shielding
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
Definitions
- the present invention relates to a sensitivity correction method and an imaging apparatus, and in particular, when a signal from a subject is simultaneously received by a plurality of imaging elements and an image of the subject is read, sensitivity for removing the influence of shading from the read image.
- the present invention relates to a correction method and an imaging apparatus.
- an image pickup apparatus including a plurality of image pickup devices that pick up an image of an object and an image pickup optical system that images light from the object onto the image pickup device has been used, for example, an X-ray CT, a copier, a facsimile machine, and the like.
- an X-ray CT X-ray CT
- copier copier
- facsimile machine and the like.
- Widely developed for applications such as scanners, camera modules such as digital cameras, surveillance cameras, and in-vehicle cameras.
- an image is read by detecting the intensity of light from the subject with the image sensor, but the light received by each image sensor due to a decrease in the amount of light around the lens and variations in sensitivity of the image sensor. The amount deviates from the actual signal! / ⁇ It is known that the output image will be uneven. Therefore, shading correction is performed to eliminate this image unevenness.
- Japanese Patent Application Laid-Open No. 10-97617 a shading correction data based on a white reference image signal obtained by imaging a white reference plate in advance and a black reference image signal obtained by imaging a black reference plate is created.
- a method for correcting data when an object is imaged based on the correction data is disclosed.
- Japanese Patent Laid-Open No. 11-69154 discloses a correction method in which a histogram maximum frequency calculation process is performed for each image sensor and shading correction is performed using the histogram maximum frequency value.
- Japanese Patent Laid-Open No. 2000-358142 discloses a correction method in which data obtained from light from a light source through a correction member is used as shading data at the same time when a subject is irradiated with light from the light source. ing.
- Japanese Patent Application Laid-Open No. 2005-80062 discloses a digital camera that performs shading correction by multiplying a shading correction coefficient in a first direction by a shading correction coefficient in a second direction perpendicular to the first direction. Is disclosed.
- Japanese Patent Application Laid-Open No. 2005-269339 also includes a first photosensitive portion and a second photosensitive portion having different sensitivities, and a color squeezing correction (chromatic aberration correction) in each image sensor based on the difference in the amount of light received by the two photosensitive portions. It is disclosed that color shading correction in each pixel (imaging device) having a wide dynamic range can be performed in a short time and with a small memory capacity.
- CMOS Complementary Metal Oxide Semiconductor Sensor
- multiple image sensors can be read simultaneously. Charge accumulation starts at the timing, then the charge accumulation ends at the same time, and at the same time, the charge accumulated in each image sensor is read in order, and all the images are exposed simultaneously, so the movement of the object is fast Even in this case, the image has a feature that it is not distorted.
- the time from the end of charge accumulation to the readout differs for each image sensor.
- the amount of charge accumulated in the image sensor varies depending on the amount of received light and the accumulation time. Therefore, the amount of charge accumulated in the image sensor increases until it is read out, and the image strength is also different because the amount of charge that increases for each image sensor differs.
- the amount of charge to be corrected fluctuates according to the amount of charge accumulated in this image sensor is not limited to the global shirter system using a CMOS sensor, but an image for one screen using a plurality of image sensors. This is a phenomenon that generally occurs in imaging devices that simultaneously read images. In either case, an accurate shading correction method has been demanded.
- the method of obtaining the difference in the amount of light received by the two photosensitive portions and performing the color shading correction in each pixel from the difference can correct the color shading in each pixel. Image unevenness due to the effect of leakage of charge accumulated in each image sensor could not be corrected.
- the present invention has been made to solve the above-described problems, and an object of the present invention is to provide a sensitivity correction method and an imaging apparatus capable of performing highly accurate shading correction with a simple configuration.
- the sensitivity correction method of the present invention is a sensitivity correction method for removing shading that occurs when an image of a subject is read by receiving light from the subject with a plurality of imaging elements
- the imaging device receives incident light and performs photoelectric conversion, a charge storage unit that transfers and temporarily accumulates charges accumulated in the photosensitive unit by the incident light, and leaks into the charge accumulation unit.
- a charge correction unit that estimates the charge to be received, and the light from the subject is received by the plurality of imaging elements and accumulated, and then the charge accumulated in the photosensitive unit is transferred to the charge accumulation unit.
- Charges for a plurality of image sensors are obtained by using the third charge amount corrected by the second charge amount leaking to the charge correction unit as the charge amount of each image sensor. Output the quantity sequentially. It is an butterfly.
- the sensitivity correction method of the present invention it is preferable that the light from the subject is received by the plurality of imaging elements and the charges are simultaneously accumulated, and then the charge amounts for the plurality of imaging elements are sequentially output.
- the charge accumulated in the photosensitive portion by incident light is transferred to the charge accumulating portion for temporarily accumulating the amount of charge leaked over time to each charge accumulating portion. Since the charge correction unit directly estimates and corrects each, it is possible to correct the influence of the leakage charge to each image sensor.
- the charge accumulation unit Even if the time from when charge is accumulated in the charge accumulation unit to the output by the data output method that sequentially outputs the charge amount for each image sensor varies depending on the amount of charge that leaks over time, the charge accumulation unit Even if the first charge amount accumulated in the image sensor differs for each image sensor, the third charge is corrected by the second charge amount leaked into the charge correction unit to eliminate the effect of charge leakage due to aging.
- the amount of each imaging element By outputting a charge amount, it is possible to perform accurate Shiwedin grayed correction with a simple configuration.
- the charge storage unit and the charge correction unit are formed of the same member disposed at the same distance from the photosensitive unit, and the charge storage unit and the charge correction unit are connected to the floating diffusion. It is desirable to use an amplifier.
- the charge storage unit and the charge correction unit are configured by the same member disposed at the same distance from the photosensitive unit, so that the member arrangement can be easily adjusted and the calculation can be easily performed. It is.
- the area occupied by the charge accumulating portion and the charge correcting portion is 1/10 or less than the area occupied by the photosensitive portion.
- the charge storage unit and the charge correction unit can be a floating diffusion amplifier.
- the shatter can be opened and closed, the timing for storing charges is easily adjusted, and a photosensitive unit such as a photodiode is formed. Since the size is smaller than that of the member, it is desirable in that a clearer image can be formed by increasing the number of pixels.
- the area occupied by the charge storage unit and the charge correction unit is set to be 1/10 or less of the area occupied by the photosensitive unit. This is desirable in that a clearer image can be formed.
- the plurality of image sensors are provided in a row, and are composed of two image sensors adjacent to each other.
- a charge correcting portion is provided between the two photosensitive portions included in the group, and one charge correcting portion is shared between two adjacent image sensors. desirable. Accordingly, the number of charge correction units can be reduced.
- the imaging apparatus of the present invention includes an imaging unit that captures the subject by receiving light from the subject with a plurality of imaging elements, and the subject.
- An imaging system that forms an image on the imaging unit, and receives light from the subject through the optical system by the plurality of imaging elements and outputs accumulated charges,
- a charge correction unit that estimates the amount, and transfers the charge accumulated in the photosensitive part in each of the image sensors to leak the first charge amount accumulated in the charge accumulation part to the charge correction unit.
- the charge accumulation and output method in the image pickup apparatus of the present invention is configured to receive the light from the subject by the plurality of image pickup elements and simultaneously accumulate the charge, and then charge the plurality of image pickup elements. It is desirable that the system output the quantities sequentially.
- the imaging apparatus of the present invention since the sensitivity correction method is provided, it is possible to perform accuracy correction and shading correction with the above-described simple configuration, and there is no image unevenness and a high-precision image. Can be stored, and when this stored image is played back, there will be no image blur! /, Accuracy, and image.
- the imaging unit is a complementary metal oxide semiconductor (CMOS) sensor.
- CMOS complementary metal oxide semiconductor
- CMOS complementary metal oxide semiconductor
- the plurality of image sensors are arranged in a row, and are two adjacent image sensors.
- the group only one charge correction unit is provided between the two photosensitive units included in the group, and the calculation unit is stored in the charge correction unit. It is desirable to correct the first charge amount accumulated in the plurality of charge accumulation units in the group including the charge correction unit with the second charge amount. As a result, the number of charge correction units can be reduced, and the imaging apparatus can be reduced in size.
- FIG. 1 is a schematic configuration diagram showing a schematic configuration of an in-vehicle camera module which is an example of a first embodiment of an imaging apparatus to which the sensitivity correction method of the present invention is applied.
- FIG. 2 is a conceptual diagram showing a schematic configuration of the image sensor 3 of the camera module 1 of FIG.
- FIG. 3 is a schematic diagram showing a detailed configuration of the image sensor 3 of FIG.
- FIG. 4 is a schematic diagram illustrating an example of the order in which the light reception signals are output from the imaging elements.
- FIG. 5 is a schematic configuration diagram showing a schematic configuration of a projector connection scanner which is an example of a second embodiment of an imaging apparatus to which the sensitivity correction method of the present invention is applied.
- FIG. 6A is a diagram schematically showing the arrangement of the photosensitive unit 15, the charge storage unit 18, and the charge correction unit 20 in the above-described embodiment.
- FIG. 6B is a diagram schematically showing the arrangement of the photosensitive section 15, the charge storage section 18, and the charge correction section 20 in the present embodiment.
- FIG. 7 is a diagram for explaining a reading operation in the camera module of the present embodiment.
- FIG. 8 is a diagram for explaining a reading operation in the camera module of the present embodiment.
- FIG. 9 is a diagram for explaining a reading operation in the camera module of the present embodiment.
- FIG. 10 is a diagram for explaining a reading operation in the camera module of the present embodiment.
- FIG. 1 shows a schematic configuration of an in-vehicle camera module that is a first embodiment of an imaging apparatus to which the sensitivity correction method of the present invention is applied.
- the camera module 1 includes an optical unit 2 configured to include a lens for imaging light from a subject, and a rear side of the optical unit 2 on the optical axis.
- a plurality of installed image sensors 3, an A / D converter 4 that converts an analog signal stored in each image sensor 3 and output from the image sensor 3 into a digital signal, a main memory 10, and a main control unit 12 and an output terminal 14 are provided.
- a plurality of image sensors 3 and an A / D converter 4 that converts analog read data output from each image sensor 3 into digital read data are included in the CMOS sensor 8. It is provided.
- the digital read data converted by the A / D converter 4 is stored in the main memory 10 and data such as ⁇ correction, white balance correction, etc., as required by the main control unit 12. After processing, it is output to the output terminal 14 as image data. Then, the data is transmitted from the output terminal 14 to a display unit (not shown) for displaying the read image installed in the vehicle, and the image is displayed.
- FIG. 2 shows a schematic configuration of the image sensor 3.
- each imaging device 3 includes a photosensitive unit 15 that photoelectrically converts incident light, and a sensor driving unit 16 that charges accumulated in the photosensitive unit 15 by the incident light.
- a charge accumulating unit 18 that is temporarily transferred and accumulated by a shirter 17 or the like controlled by an electric charge, and a charge correcting unit 20 that estimates an amount of charge that leaks into the charge accumulating unit 18.
- photosensitive part 15 is referred to as PD.
- the imaging device 3 has a configuration in which the charge storage unit 18 and the charge correction unit 20 are connected to the grounds 25 and 26 by resets 22 and 23, respectively, when the charge storage unit 18 and the charge correction unit 20 do not store charges. It has become. Furthermore, after the charges accumulated in the charge accumulating unit 18 and the charge correcting unit 20 are output, the first charge amount ⁇ accumulated in the charge accumulating unit 18 and the charge correcting unit 20 are accumulated by the calculation means 28. The second charge amount ⁇ to the third charge The quantity is calculated and output from the column switch 29 to the A / D converter 4.
- FIG. 1 a schematic diagram showing the detailed configuration of the image sensor 3 of FIG. 2 is shown in FIG.
- the first charge amount p accumulated in the charge accumulating unit 18 is only the amount of charge N transferred from the photosensitive unit 15.
- charge diffusion (M in FIG. 3: changes with time and depending on the light reception intensity) occurs or light reflected by the light-shielding aluminum plate 30 (see FIG. 3).
- charge diffusion (M in FIG. 3) from the lower portion of the photosensitive portion 15 such as a photodiode as shown in FIG. 3 and reflection from the light shielding aluminum plate 30 (FIG. 3).
- the amount of leakage charge generated by the M) factor is
- the third charge amount p calculated by correcting the first charge amount p stored in the charge storage unit 18 by the calculation means 28 with the second charge amount p stored in the charge correction unit 20 is calculated.
- the fluctuation amount of the charge over time and the fluctuation amount according to the received light intensity of each image sensor 3 can be corrected for each image sensor 3, so that the fluctuation of the charge amount due to the leakage charge of each image sensor 3
- the amount of charge can be adjusted to a charge accumulation amount that is proportional to the amount of received light received, regardless of the reading order of each image sensor 3.
- the second charge amount p is not necessarily the same as the charge amount that leaks into the charge storage unit 18.
- the second charge amount p is not necessary to be different from the charge amount leaking into the charge storage unit 18.
- the calculation unit 28 leaks the second charge amount p into the charge storage unit 18. Correction can be made by subtracting from the first charge amount Pi by increasing / decreasing the charge amount to be the same as the charge amount.
- the charge accumulating unit 18 and the charge correcting unit 20 are composed of the same member disposed at the same distance from the photosensitive unit 15! /, And the force is adjusted. Can be easily performed, and the calculation in the calculation means 28 can be performed by simple subtraction, so that the memory of the calculation means 28 can be small. Note that other shading corrections such as ⁇ correction and white balance correction can be performed by the calculation means 28 of each image sensor 3.
- the rate of increase of the leakage charge with respect to the wavelength is calculated in advance, so that the first charge amount ⁇ and the second charge amount are calculated. It is also possible to perform color shading correction from contrast with ⁇ .
- the charge storage unit 18 and the charge correction unit 20 are floating diffusion amplifiers (FD1, FD2).
- the photosensitive portion 15 is a member that occupies a large area on the light receiving surface of the image sensor 3 such as a photodiode.
- the floating diffusion amplifier has a small area, so that the light receiving area of each image sensor 3 can be reduced.
- the number of pixels corresponding to the number of image sensors of the CMOS sensor 8 can be increased and a clearer image can be formed. .
- the area occupied by the charge accumulating unit 18 and the charge correcting unit 20 is 1/10 or less of the area occupied by the photosensitive unit 15. This is desirable in that a clearer image can be formed.
- a CCD element charge coupled device
- the charge storage unit 18 and the charge can be easily configured in the CMOS sensor 8.
- the sensitivity correction method is particularly effective because the correction unit 20 can be formed and signal control can be easily performed.
- the data processing method in the present embodiment will be described more specifically.
- the plurality of image sensors 3 are arranged in an array of m rows and X n columns. Then, charge accumulation is started simultaneously for all the image pickup devices 3 for one screen and the charge accumulation is finished at the same time, and the accumulated charges are transferred to each charge accumulation unit 18 at the same time as the completion.
- each charge storage section 18 Based on the charge amount p stored in each charge storage section 18, it is output as read data of each image sensor 3 (a, a ... !!!).
- the first charge amount p stored in the charge storage unit 18 is corrected and corrected by the second charge amount p stored in the charge correction unit 20 in the calculation unit 28.
- the third charge amount p, and the signal sensed by each image sensor 3 is the IJ switch 29.
- each image sensor 3 is not limited to the above order, and may be read from the row direction or other order.
- the sensitivity correction method of the present invention can also be applied to a rolling shirt method in which charges are sequentially output after a plurality of image sensors sequentially accumulate charges.
- FIG. 5 shows a schematic configuration of a scanner for projector connection, which is an example of the second embodiment of the imaging apparatus to which the sensitivity correction method of the present invention is applied.
- the scanner 41 of the present embodiment includes an original document placing table 42 made of a transparent glass plate on which an original is placed, and an original force bar provided so as to be openable and closable so as to cover the upper surface of the document placing table 42. 43, an illumination lamp 44 for illuminating a document placed and fixed on the document table 42, a lens unit 47 having a lens 46, and a light reflected from the document by irradiating the illumination lamp 44 to the document and receiving the light.
- Output terminal 52 for outputting to an external device (not shown) such as a projector d * o
- the illumination lamp 44 is irradiated on the document placed and fixed on the document table 42, and the light reflected from the document passes through a plurality of optical members to form a lens 46 (two in FIG.
- the lens unit 47 forms an image of the reflected light from the document on the image sensor 45.
- the lens unit 47 is movable along the optical axis of incident light, and can be imaged on the image sensor 45 at a desired magnification.
- the image recorded on the document placed on the document placement table 42 is read by the image sensor 45.
- Read data is generated from the result of reading by the image sensor 45, and is output from the output terminal 52 to an external device (not shown) such as a projector.
- the light from the original is simultaneously exposed to all the image pickup elements 45 for one screen, and the exposure is simultaneously ended. Then, each imaging element 45 leaks into the photosensitive part that photoelectrically converts incident light, the charge storage part that transfers and temporarily stores the charge accumulated in the photosensitive part, and the charge storage part.
- a charge correction unit for estimating the amount of charge is calculated. Then, by calculating and outputting the third charge amount p obtained by sequentially correcting the first charge amount p accumulated in the charge accumulation unit with the second charge amount p accumulated in the charge correction unit,
- the amount of change in charge over time is corrected, and shading that occurs when a subject image is simultaneously accumulated and read by a plurality of image sensors 45 can be corrected with a simple configuration with high accuracy.
- each image pickup device has a configuration in which one photosensitive portion and a charge accumulation portion and a charge correction portion are separately provided on both sides thereof. Therefore, when there are two photosensitive sections, the force that requires two charge storage sections and two charge correction sections.
- adjacent imaging In the element a part of the configuration may be shared, and more specifically, the charge correction unit may be shared.
- FIG. 6A schematically shows the arrangement of the photosensitive unit 15, the charge storage unit 18 and the charge correction unit 20 in the above-described embodiment
- FIG. 6B shows the photosensitive unit 15 and the charge storage unit 18 in the present embodiment.
- 3 is a diagram schematically showing the arrangement of the charge correction unit 20.
- the grounds 25 and 26 are provided corresponding to the force charge accumulating unit 18 and the charge correcting unit 20 which are omitted to prevent the diagram from becoming complicated.
- FIG. 6A the configuration of the minimum photosensitive unit 15, charge accumulating unit 18 and charge correcting unit 20 necessary for the configuration including two photosensitive units 15 is defined as one group 60.
- the configuration of the minimum photosensitive portion 15, charge storage portion 18, and charge correction portion 20 necessary for the configuration including one photosensitive portion 15 is made into one group 61.
- the photosensitive portions 15 included in one gnolepe 60 and 61 are shown as PD1 and PD2.
- the charge correcting unit 20 corresponding to each of the adjacent photosensitive units 15 is shared by the image sensor 3 including the two photosensitive units 15 respectively. ing.
- the charge accumulation unit 18, the photosensitive unit 15, and the charge correction unit 20 include the charge accumulation unit 18, the photosensitive unit 15, the charge correction unit 20, and the charge accumulation unit. 18, photosensitive portion 15, charge correction portion 20, etc.
- a sample hold circuit 71 is provided as the arithmetic means 28 described above.
- the sample-and-hold circuit 71 is a comparator 74 that obtains and outputs the difference in charge amount between the first and second parts 72 and 73 capable of storing charges and the charge stored in the first and second parts 72 and 73, respectively. It is comprised including. Since the first and second portions 72 and 73 have the same configuration, only the first portion 72 will be described, and for the second portion 73, the same configuration as the first portion 72 is denoted by the same reference numeral. Therefore, the explanation is omitted.
- the first portion 72 includes two buffer amplifiers Al and A2, two switches Bl and B2, and one capacitor C.
- Buffer amplifier A1 The inverting input section is connected to the input section of the sample and hold circuit, and the inverting input section of the buffer amplifier A1 is connected to the output section of the buffer amplifier A1.
- the output section of the buffer amplifier A1 is connected to one end of the capacitor C via the switch B1.
- One end of the capacitor C is connected to the ground via the switch B2.
- the switches Bl and B2 are on / off switches and are realized by field effect transistors.
- Switch B1 is turned on when a voltage higher than the threshold is applied to the gate, electrically connects the output of buffer amplifier A1 and one end of capacitor C, and the voltage applied to the gate is less than the threshold.
- the output of the buffer amplifier A1 is electrically insulated from one end of the capacitor C.
- the other end of capacitor C is connected to ground.
- Switch B2 is turned on when a voltage equal to or higher than the threshold is applied to the gate and electrically connects one end of capacitor C to the ground.
- capacitor C Electrically insulates one end from the ground.
- the other end of the capacitor C is connected to the non-inverting input part of the buffer amplifier A2, and the inverting input part of the buffer amplifier A2 is connected to the output part of the buffer amplifier A2.
- the output of the buffer amplifier A2 is connected to the input of the comparator 74, and the output of the comparator is connected to the row switch 29.
- each photosensitive portion 15 receives light, and charges are accumulated in each photosensitive portion 15.
- the respective switches Bl and B2 of the first and second portions 71 and 72 are in the off state.
- the charge storage unit 18 and the charge correction unit 20 are electrically connected to the input unit of the sample hold circuit 71.
- the charge correction unit 20 (FD2) the first charge amount p acquired by the photosensitive unit 15 (PD1) is corrected.
- the charges accumulated in the charge accumulation unit 18 (FD1), the photosensitive unit 15 (PD1), and the charge correction unit 20 (FD2) arranged in the first to third order are moved in order from one side of the arrangement direction.
- the switch 17 causes the charge of the photosensitive portion 15 (PD1) to be transferred to one of the charge accumulating portions 18 (P D1) in the arrangement direction.
- FD1) Apply a voltage above the threshold to the gate of the switch Bl of the 2 part 73 to turn it on.
- the switch B1 of the second part 73 is energized, the charge moves as indicated by the arrow F2 in FIG. 7, and the charge of the charge correction unit 20 (FD2) is charged to the capacitor C of the second part 73.
- the switch 17 and the switch B1 of the second portion 73 are turned off, and a voltage higher than the threshold is applied to the gate of the switch B1 of the first portion 72 to turn it on.
- the switch B1 of the first part 72 is energized, the charge moves as indicated by the arrow F3 in FIG. 8, and the charge of the charge storage unit 18 (FD1) is C is charged.
- the switch B1 of the first portion 72 is turned off, and the reset operation is performed on the charge storage unit 18, the photosensitive unit 15, and the charge correction unit 20 in order from one side in the arrangement direction. That is, in order from one side in the arrangement direction, the switches 17, 25, and 26 corresponding to the three of the charge storage unit 18, the photosensitive unit 15, and the charge correction unit 20 are turned on and electrically connected to these grounds. .
- a voltage higher than the threshold value is applied to the gate of the switch B2 of the first portion 72 to turn it on.
- the switch B2 of the first portion 72 is energized, moves to the charge force ground stored in the capacitor C, and is stored in the capacitor C, as indicated by the arrow F4 in FIG. Charge amount becomes zero.
- the charge of the charge storage unit 18 (FD1) is changed to the first portion 72.
- Charcoal C is charged.
- Charge is already accumulated in the capacitor C of the second part 73, and the first and second parts 72 and 73 are thus Charges are accumulated in the respective capacitors C, and the comparator 74 uses the first charge amount p accumulated in the capacitor C of the first part 72 and the second charge accumulated in the capacitor C of the second part 73.
- the third charge amount p which is the difference from the charge amount p, is output from the sample hold circuit 71.
- the imaging element 3 can be downsized and the imaging apparatus can be downsized as compared with the above-described embodiments.
- the present invention can be implemented in various other forms without departing from the spirit or main features thereof. Therefore, the above-described embodiment is merely an example in all respects, and the scope of the present invention is shown in the claims, and is not restricted by the text of the specification. Further, all modifications and changes belonging to the scope of claims are within the scope of the present invention.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Studio Devices (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Facsimile Image Signal Circuits (AREA)
- Solid State Image Pick-Up Elements (AREA)
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008530974A JP4620780B2 (ja) | 2006-08-25 | 2007-08-24 | 感度補正方法および撮像装置 |
CN2007800316799A CN101507263B (zh) | 2006-08-25 | 2007-08-24 | 灵敏度修正方法和摄像装置 |
US12/438,715 US8049796B2 (en) | 2006-08-25 | 2007-08-24 | Method of correcting sensitivity and imaging apparatus |
EP07806078.7A EP2061235B1 (en) | 2006-08-25 | 2007-08-24 | Sensitivity correction method and imaging device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006-229229 | 2006-08-25 | ||
JP2006229229 | 2006-08-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008023806A1 true WO2008023806A1 (fr) | 2008-02-28 |
Family
ID=39106888
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/066492 WO2008023806A1 (fr) | 2006-08-25 | 2007-08-24 | Procédé de correction de sensibilité et dispositif imageur |
Country Status (5)
Country | Link |
---|---|
US (1) | US8049796B2 (ja) |
EP (1) | EP2061235B1 (ja) |
JP (1) | JP4620780B2 (ja) |
CN (1) | CN101507263B (ja) |
WO (1) | WO2008023806A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012175259A (ja) * | 2011-02-18 | 2012-09-10 | Olympus Corp | 固体撮像装置 |
US8932783B2 (en) | 2008-10-09 | 2015-01-13 | Ceramic Fuel Cells Limited | Solid oxide fuel cell or solid oxide fuel cell sub-component and methods of preparing same |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101507263B (zh) * | 2006-08-25 | 2011-04-20 | 京瓷株式会社 | 灵敏度修正方法和摄像装置 |
JP4290209B2 (ja) * | 2007-04-05 | 2009-07-01 | 三菱電機株式会社 | 画像表示装置および画像表示方法 |
Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08205034A (ja) * | 1995-01-20 | 1996-08-09 | Nissan Motor Co Ltd | イメージセンサ |
JPH1097617A (ja) | 1996-09-24 | 1998-04-14 | Security- Japan:Kk | 画像処理システム |
JPH1169154A (ja) | 1997-08-19 | 1999-03-09 | Canon Inc | シェーディング補正方法及び装置 |
JP2000023044A (ja) * | 1998-06-30 | 2000-01-21 | Toshiba Corp | 撮像装置 |
JP2000358142A (ja) | 1999-04-12 | 2000-12-26 | Fuji Photo Film Co Ltd | 感度補正方法及び画像読取装置 |
JP2005080062A (ja) | 2003-09-02 | 2005-03-24 | Fuji Photo Film Co Ltd | デジタルカメラ |
JP2005175682A (ja) * | 2003-12-09 | 2005-06-30 | Canon Inc | 撮像装置 |
JP2005269339A (ja) | 2004-03-19 | 2005-09-29 | Fuji Photo Film Co Ltd | 広ダイナミックレンジ固体撮像素子の色シェーディング補正方法および固体撮像装置 |
JP2005328420A (ja) * | 2004-05-17 | 2005-11-24 | Sony Corp | 撮像装置および撮像方法 |
JP2006197383A (ja) * | 2005-01-14 | 2006-07-27 | Canon Inc | 固体撮像装置、その制御方法及びカメラ |
JP2006217410A (ja) * | 2005-02-04 | 2006-08-17 | Tohoku Univ | 光センサおよび固体撮像装置 |
JP2006217548A (ja) * | 2005-02-07 | 2006-08-17 | Matsushita Electric Ind Co Ltd | 固体撮像装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6879730B1 (en) * | 1999-04-12 | 2005-04-12 | Fuji Photo Film Co., Ltd. | Sensitivity correction method and image reading device |
JP2003143489A (ja) | 2001-11-01 | 2003-05-16 | Victor Co Of Japan Ltd | 映像信号発生装置 |
JP2004056048A (ja) | 2002-07-24 | 2004-02-19 | Microsignal Kk | 固体撮像素子 |
JP2004304331A (ja) * | 2003-03-28 | 2004-10-28 | Matsushita Electric Ind Co Ltd | 固体撮像装置 |
JP4266726B2 (ja) * | 2003-05-30 | 2009-05-20 | キヤノン株式会社 | 撮像装置 |
CN101507263B (zh) * | 2006-08-25 | 2011-04-20 | 京瓷株式会社 | 灵敏度修正方法和摄像装置 |
-
2007
- 2007-08-24 CN CN2007800316799A patent/CN101507263B/zh not_active Expired - Fee Related
- 2007-08-24 US US12/438,715 patent/US8049796B2/en not_active Expired - Fee Related
- 2007-08-24 EP EP07806078.7A patent/EP2061235B1/en not_active Not-in-force
- 2007-08-24 JP JP2008530974A patent/JP4620780B2/ja not_active Expired - Fee Related
- 2007-08-24 WO PCT/JP2007/066492 patent/WO2008023806A1/ja active Application Filing
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08205034A (ja) * | 1995-01-20 | 1996-08-09 | Nissan Motor Co Ltd | イメージセンサ |
JPH1097617A (ja) | 1996-09-24 | 1998-04-14 | Security- Japan:Kk | 画像処理システム |
JPH1169154A (ja) | 1997-08-19 | 1999-03-09 | Canon Inc | シェーディング補正方法及び装置 |
JP2000023044A (ja) * | 1998-06-30 | 2000-01-21 | Toshiba Corp | 撮像装置 |
JP2000358142A (ja) | 1999-04-12 | 2000-12-26 | Fuji Photo Film Co Ltd | 感度補正方法及び画像読取装置 |
JP2005080062A (ja) | 2003-09-02 | 2005-03-24 | Fuji Photo Film Co Ltd | デジタルカメラ |
JP2005175682A (ja) * | 2003-12-09 | 2005-06-30 | Canon Inc | 撮像装置 |
JP2005269339A (ja) | 2004-03-19 | 2005-09-29 | Fuji Photo Film Co Ltd | 広ダイナミックレンジ固体撮像素子の色シェーディング補正方法および固体撮像装置 |
JP2005328420A (ja) * | 2004-05-17 | 2005-11-24 | Sony Corp | 撮像装置および撮像方法 |
JP2006197383A (ja) * | 2005-01-14 | 2006-07-27 | Canon Inc | 固体撮像装置、その制御方法及びカメラ |
JP2006217410A (ja) * | 2005-02-04 | 2006-08-17 | Tohoku Univ | 光センサおよび固体撮像装置 |
JP2006217548A (ja) * | 2005-02-07 | 2006-08-17 | Matsushita Electric Ind Co Ltd | 固体撮像装置 |
Non-Patent Citations (1)
Title |
---|
See also references of EP2061235A4 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8932783B2 (en) | 2008-10-09 | 2015-01-13 | Ceramic Fuel Cells Limited | Solid oxide fuel cell or solid oxide fuel cell sub-component and methods of preparing same |
JP2012175259A (ja) * | 2011-02-18 | 2012-09-10 | Olympus Corp | 固体撮像装置 |
Also Published As
Publication number | Publication date |
---|---|
US8049796B2 (en) | 2011-11-01 |
EP2061235A4 (en) | 2011-05-04 |
EP2061235B1 (en) | 2014-11-19 |
CN101507263A (zh) | 2009-08-12 |
JP4620780B2 (ja) | 2011-01-26 |
US20100253812A1 (en) | 2010-10-07 |
EP2061235A1 (en) | 2009-05-20 |
JPWO2008023806A1 (ja) | 2010-01-14 |
CN101507263B (zh) | 2011-04-20 |
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