WO2007114474A1 - 液体材料気化装置 - Google Patents
液体材料気化装置 Download PDFInfo
- Publication number
- WO2007114474A1 WO2007114474A1 PCT/JP2007/057593 JP2007057593W WO2007114474A1 WO 2007114474 A1 WO2007114474 A1 WO 2007114474A1 JP 2007057593 W JP2007057593 W JP 2007057593W WO 2007114474 A1 WO2007114474 A1 WO 2007114474A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gas
- cooling
- liquid
- liquid material
- section
- Prior art date
Links
- 239000011344 liquid material Substances 0.000 title claims abstract description 78
- 239000006200 vaporizer Substances 0.000 title claims abstract description 27
- 239000007788 liquid Substances 0.000 claims abstract description 96
- 238000001816 cooling Methods 0.000 claims abstract description 93
- 230000008016 vaporization Effects 0.000 claims abstract description 59
- 238000002156 mixing Methods 0.000 claims abstract description 58
- 239000000203 mixture Substances 0.000 claims abstract description 41
- 239000007789 gas Substances 0.000 claims abstract description 39
- 238000009834 vaporization Methods 0.000 claims abstract description 38
- 239000012159 carrier gas Substances 0.000 claims abstract description 29
- 239000000463 material Substances 0.000 claims abstract description 22
- 239000000112 cooling gas Substances 0.000 claims description 33
- 230000020169 heat generation Effects 0.000 claims description 4
- 238000009835 boiling Methods 0.000 abstract description 25
- 238000010438 heat treatment Methods 0.000 abstract description 2
- 239000002904 solvent Substances 0.000 description 13
- 230000000694 effects Effects 0.000 description 7
- 239000000945 filler Substances 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000002265 prevention Effects 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 2
- 238000005260 corrosion Methods 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 238000005979 thermal decomposition reaction Methods 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000006837 decompression Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000003595 mist Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
Definitions
- the present invention relates to a liquid material vaporizer for vaporizing various liquid materials used for semiconductor manufacturing.
- this type of liquid material vaporizer is supplied with a liquid material and a carrier gas, and is a gas comprising a control valve having a flow rate control function of mixing the liquid material with the carrier gas while controlling the flow rate of the liquid material.
- a liquid material is provided by discharging the gas-liquid mixture from the gas-liquid mixing unit and the gas-liquid mixing unit, which is provided independently of the gas-liquid mixing unit and introduced through a pipe line, and reducing the pressure.
- a vaporizing section that vaporizes the gas and that generates the gas generated by the vaporization by the carrier gas, and a pipe line that connects the gas-liquid mixing section and the vaporizing section are configured (for example, see Patent Document 1).
- Patent Document 1 Japanese Patent Laid-Open No. 2003-163168
- the present invention has been made paying attention to such problems, and the main object is to perform vaporization of a liquid material obtained by dissolving a high-boiling solute in a low-boiling-point material solvent. It is an object of the present invention to provide an excellent liquid material vaporizer that does not have a problem that only a low boiling point material solvent is vaporized and a high boiling point solute becomes a residue and clogs the pipeline. .
- the liquid material vaporizer mixes a liquid material and a carrier gas.
- a gas-liquid mixing unit that generates a gas-liquid mixture, and a heating-type vaporization unit that vaporizes the gas-liquid mixture from the gas-liquid mixing unit and leads the gas generated by the vaporization to the outside by the carrier gas;
- the gas-liquid mixing unit and the vaporizing unit are connected to each other, and a connection part having a flow path for the gas-liquid mixture therein and a connection part cooling part for cooling the connection part are provided.
- the “liquid material” that can particularly confirm the effect of the liquid material vaporization apparatus of the present invention includes a liquid material obtained by mixing a plurality of materials having different boiling points, for example, a low-boiling solute.
- a liquid material obtained by dissolving in a boiling point material solvent can be mentioned.
- the liquid material vaporizer can vaporize other liquid materials (for example, those having a single component force, or a mixture of a plurality of materials having the same boiling point).
- the method for producing the liquid material may be arbitrary, for example, a method in which a solid is dissolved in a liquid or a mixture of liquids.
- connection part cooling unit cools the connection part, whereby the heat of the vaporization part can be reduced from being transferred toward the gas-liquid mixing part, and the flow path in the connection part can be reduced. It is possible to reduce the influence of the heat energy on the gas-liquid mixture that passes through. Therefore, for example, even when a liquid material formed by dissolving a high-boiling solute in a low-boiling material solvent is vaporized, the low-boiling-point material solvent is used in the liquid flow rate control diaphragm in the pipeline. Only the gas is vaporized, and the high-boiling solute becomes a residue, which prevents the internal flow path of the connecting portion from blocking the diaphragm.
- an excellent liquid material vaporizer can be provided in which, even when a liquid material composed of a plurality of materials having different boiling points is vaporized, it can be suitably vaporized by preventing generation of residues.
- connection part cooling unit cools substantially the entire connection part.
- the gas-liquid mixing section can be about 60 degrees by the action of the connecting section cooling section. Generation of residues can be suitably prevented while ensuring the function of the vaporizing section.
- connection portion cooling portion is a cooling device. And those provided with one or more connection cooling fins that are supplied with gas and attached to the connection. By adopting such a configuration, a high cooling effect can be obtained even with a simple configuration, and when a residue is generated, any failure can be suitably prevented.
- connection portion cooling fin is arranged in a cooling case having an inlet for introducing the cooling gas into the interior and an outlet for extracting the cooling gas used for cooling to the outside. If this is the case, the cooling gas can be effectively supplied to the connection cooling fins, so that the connection cooling fins can be effectively cooled and the necessary cooling gas cools out of the cooling case. To help save energy.
- a cooling gas cooling unit that cools the cooling gas in advance If a cooling gas cooling unit that cools the cooling gas in advance is provided, a higher cooling effect in the connection part can be obtained, which is effective in preventing the above problems.
- the cooling gas cooling unit includes one or a plurality of cooling gas cooling fins and a cooling side attached to the cooling gas flow path, while the heat generation side And a cooling gas cooling Peltier element attached to the cooling gas cooling fin.
- connection portion cooling portion includes a connection portion cooling Peltier element having a cooling side attached to the connection portion, and the connection portion cooling Peltier. And one or more Peltier element cooling fins attached to the heat generating side of the element.
- connection part cooling unit cools the connection part, so that the heat of the vaporization part can be reduced from being transferred toward the gas-liquid mixing part,
- the gas-liquid mixture passing through the flow path in the connection can be less affected by the thermal energy. Therefore, for example, even when a liquid material formed by dissolving a high-boiling solute in a low-boiling-point material solvent is vaporized, the low-boiling-point material solvent is used in the diaphragm for controlling the liquid flow rate in the gas-liquid mixing section. Only the gas is vaporized, and the high-boiling solute becomes a residue, which prevents the internal flow path at the connection portion from blocking the diaphragm.
- FIG. 1 is a structural cross-sectional view schematically showing a structural cross section of a liquid material vaporizer according to an embodiment of the present invention.
- FIG. 2 is a perspective view of a main part in the same embodiment.
- FIG. 3 is a structural cross-sectional view of a gas-liquid mixing chamber portion in the same embodiment (when the volume of the gas-liquid mixing chamber is reduced).
- FIG. 4 is a structural cross-sectional view of a gas-liquid mixing chamber portion in the same embodiment (when the volume of the gas-liquid mixing chamber is normal).
- FIG. 5 is a structural cross-sectional view schematically showing a structural cross section of a liquid material vaporizer according to another embodiment of the present invention.
- FIG. 6 is a structural cross-sectional view schematically showing a structural cross section of a liquid material vaporizer according to another embodiment of the present invention.
- FIG. 7 is a structural cross-sectional view schematically showing a structural cross section of a liquid material vaporizer according to another embodiment of the present invention.
- the liquid material vaporizer A of the present embodiment is a gas-liquid mixing unit 1 that generates a gas-liquid mixture GL by mixing the liquid material LM and the carrier gas CG.
- a heating type vaporizing unit 2 that vaporizes the gas-liquid mixture GL from the gas-liquid mixing unit 1 and leads the vaporized gas to the outside by the carrier gas CG; and the gas-liquid mixing unit 1 And the vaporizing section 2 are connected to each other, and a connecting section 3 having a flow path such as the gas-liquid mixture GL and a connecting section cooling section 4 for cooling the connecting section 3 are provided.
- a connecting section 3 having a flow path such as the gas-liquid mixture GL and a connecting section cooling section 4 for cooling the connecting section 3 are provided.
- the gas-liquid mixing unit 1 includes a substantially rectangular parallelepiped main body block 11 having three different flow paths la to lc inside, a flow rate control unit 12 provided on the upper surface side of the main body block 11, and these main body blocks.
- a gas-liquid mixing chamber 13 formed in a space sandwiched between the lock 11 and the flow rate control unit 12 is provided.
- the main body block 11 is made of a metal material having high heat resistance and corrosion resistance, such as stainless steel, and is composed of a heater 11H provided on the lower end side of the three flow paths la to Lc. It is configured so that it can be heated.
- Lc is a liquid material introduction path la for introducing the liquid material LM into the gas-liquid mixing chamber 13, and a carrier gas introduction for introducing the carrier gas CG into the gas-liquid mixing chamber 13
- the path lb is composed of a gas-liquid mixture deriving path for deriving the gas-liquid mixture GL generated in the gas-liquid mixing chamber 13 and the like.
- the liquid material introduction path la has a liquid material introduction path horizontal part lal extending in the horizontal direction, and the gas-liquid mixing chamber 13 side of the liquid material introduction path horizontal part lal at a substantially right angle. It has a substantially L-shape in side view and includes an upright portion la2 of the liquid material introduction path that has been erected.
- the diameter of the liquid material introduction path horizontal portion lal and the diameter of the liquid material introduction path standing portion la2 are substantially matched.
- the carrier gas introduction path lb includes a carrier gas introduction path horizontal part lb 1 extending in the horizontal direction and a gas-liquid mixing chamber 13 side of the carrier gas introduction path horizontal part lb 1. It has a substantially L-shape in side view, and has a carrier gas introduction path standing part lb2 that is erected at a substantially right angle.
- the diameter of the horizontal portion lbl of the carrier gas introduction path is made larger than the diameter of the standing portion lb2 of the carrier gas introduction path.
- the gas-liquid mixture outlet channel lc includes a horizontal portion of the gas-liquid mixture outlet channel lcl extending in the horizontal direction, and a gas-liquid mixing chamber of the gas-liquid mixture outlet channel horizontal portion lcl. It has a substantially L-shape in a side view including a gas-liquid mixture lead-out path standing part lc2 that is erected at a substantially right angle on the 13 side.
- the diameter of the gas-liquid mixture outlet passage horizontal portion lcl and the diameter of the gas-liquid mixture outlet passage standing portion lc2 are substantially matched.
- the flow control unit 12 is provided with a thin disk-shaped diaphragm 121 disposed at a position covering the concave portion 131 of the main body block 11, and a central portion of the diaphragm 121.
- the substantially cylindrical shaft 120, the piezoelectric actuator 122 brought into contact with the upper end of the shaft 120 via a true sphere 12x, and the shaft 120 are always urged upward.
- These members are accommodated in the inside of the valve block 124a and the inside of a substantially cylindrical housing 124b erected on the top of the valve block 124a.
- the valve block 124a is attached to the main body block 11 via a spacer SP and an O-ring OR.
- the diaphragm 121 when the diaphragm 121 receives a downward pressing force (a pressing force that exceeds the biasing force of the biasing member 123) by the piezoelectric actuator 122 via the shaft portion 120, the diaphragm 121 is The volume of the gas-liquid mixing chamber 13 formed between the diaphragm 121 and the valve seat 132 is decreased by projecting downward, and the lower end surface 120x of the shaft portion 120 is provided with a liquid material introduction path standing portion.
- the opening of la2 is closed (see Fig. 3), but when no pressing force is applied, the diaphragm 121 and the lower end surface 120x of the shaft 120 are separated from the valve seat 132 (the thickness of the spacer SP). ) So that the volume in the gas-liquid mixing chamber 13 can be appropriately secured (see FIG. 4).
- the gas-liquid mixing chamber 13 has a concave portion 131 in which the upward surface of the main body block 11 is recessed in a substantially dish shape, and a flat surface provided at the center of the concave portion 131 and higher than the bottom position of the concave portion 131. It is formed in a space sandwiched between a substantially circular valve seat 132 and a lower end surface of a diaphragm 121 of the flow rate control unit 12 described later (see FIG. 4).
- the nove sheet 132 is provided with a mixing groove 132m having a substantially oval shape in plan view. Then, the carrier gas introduction path standing part lb2 is opened in the mixing groove 132m, and the gas-liquid mixture outlet path standing part lc2 is opened.
- the vaporization section 2 is provided in the preheating block 21, the vaporization block 22 provided on the side of the preheating block 21 opposite to the anti-air / liquid mixing section 1, and substantially at the center of the preheating block 21 and penetrates in the thickness direction thereof.
- the preheating block 21 is made of a metal material having a high thermal conductivity such as aluminum.
- the vaporization block 22 is formed of a metal material having high heat resistance and corrosion resistance, such as stainless steel.
- the vaporizing block 22 incorporates a heater (not shown). With this heater, the entire vaporization block 22 including the nozzle 25 The temperature and temperature of the main body block 11 are heated and kept at a temperature considerably higher (eg, about 300 degrees).
- the gas introduction path 23 is formed by using an internal flow path of the pipe member P described later.
- the gas outlet path 24 is a substantially straight pipe having a conical shape on the end side on the nozzle part 25 side.
- the outer diameter of the gas outlet path 24 is set larger than the outer diameter of the gas inlet path 23.
- the downstream side of the gas lead-out path 24 is connected to a pipe line to the semiconductor manufacturing apparatus ( ⁇ shown in the figure).
- the nozzle portion 25 is smaller in force than the diameter and length of the gas introduction path 23 and the gas lead-out path 24.
- the diameter is 1. Omm or less and the length is about 1. Omm.
- the force of the gas-liquid mixture GL introduced through the gas introduction path 23 flows.
- the liquid material LM contained in the gas-liquid mixture GL is vaporized by being decompressed,
- the gas generated by this vaporization is mixed with the carrier gas CG to become a mixed gas KG.
- the connecting part 3 introduces an internal flow path 31 for introducing the gas-liquid mixture GL and the carrier gas CG from the gas-liquid mixture lead-out path lc into the gas introduction path 23 of the vaporization part 2 It is what you have.
- the internal flow path 31 of the connection part 3, the gas / liquid mixture outlet horizontal part lcl of the gas / liquid mixing part 1, and the gas introduction path 23 of the vaporization part 2 are common pipe members. Make use of the internal flow path of P!
- connection portion cooling section 4 is a “forced air cooling method” that includes a plurality of connection portion cooling fins 41 that are supplied with the cooling gas CL from the outside and are attached to the connection section 3.
- Each connection portion cooling fin 41 has the same thin plate shape. Further, these connection portion cooling fins 41 are arranged side by side at a predetermined interval so as not to obstruct the flow of the cooling gas CL. Further, the plurality of connection portion cooling fins 41 are arranged in a cooling case 42 having an inlet 421 for introducing the cooling gas CL therein and an outlet 422 for leading the cooling gas CL used for cooling to the outside.
- the liquid material LM passing through the liquid material introduction path la has its flow rate into the mixing groove 132m controlled by the lower end surface 120x of the shaft portion 120 driven by the piezoelectric actuator 122.
- the carrier gas CG is introduced into the mixing groove 132m via the carrier gas introduction path lb.
- the liquid material LM and the carrier gas CG are mixed in the mixing groove 132m and then led out to the gas-liquid mixture outlet path lc as the gas-liquid mixture GL.
- This gas-liquid mixture GL further reaches the vaporization section 2 via the internal flow path 31 of the connection section 3.
- connection part 3 is cooled by the connection part cooling part 4.
- the heat of the vaporization section 2 can be reduced from being transferred toward the gas-liquid mixing section 1, and the gas-liquid mixture GL passing through the internal flow path 31 of the connection section 3 can be reduced in its thermal energy. Can be less affected.
- the temperature of the gas-liquid mixing section 1 is about 100 degrees, but the connection cooling section 4 is In some cases, it can be around 60 degrees.
- the gas-liquid mixture GL force thus introduced into the gas introduction path 23 of the vaporization section 2 is introduced into the gas-liquid mixture GL by the nozzle section 25 when it is introduced into the nozzle section 25.
- the contained liquid material LM is vaporized by decompression.
- the gas generated by this vaporization is mixed with the carrier gas CG to become a mixed gas KG, which is led out.
- connection portion cooling section 4 cools the connection section 3, whereby the heat of the vaporization section 2 is transferred toward the gas-liquid mixing section 1.
- the gas-liquid mixture that passes through the flow path in the connection part 3 GL force can be reduced from being affected by the thermal energy.
- connection portion cooling section 4 cools substantially the entire connection section 3, and the connection section cooling section 4 receives a supply of cooling gas CL and is attached to the connection section 3. Since the connection portion cooling fin 41 is provided, the gas-liquid mixing portion 1 is set to about 60 degrees by the action of the connection portion cooling portion 4 even if the vaporization portion 2 is heated and kept at about 300 degrees. be able to . Therefore, while having such a simple configuration, while ensuring the function of the high-temperature type vaporization unit 2, the connection cooling unit 4 can obtain a high cooling effect, and suitably prevents a malfunction when a residue is generated. be able to.
- the embodiment can be changed. Specifically, as shown in FIG. 5, the cooling gas cooling unit 43 is provided with a plurality of cooling gas cooling fins 431 and a cooling side attached to the flow path of the cooling gas CL, while the heat generation side is the cooling side. And a cooling gas cooling Peltier element 432 attached to the gas cooling fin 431.
- connection portion 3 By adopting such a configuration, a higher cooling effect can be obtained in the connection portion 3, and it is further effective in preventing the above-described failure.
- connection portion cooling section 4 includes a connection portion cooling Peltier element 47 with the cooling side attached to the connection section 3, and the heat generation side of the connection portion cooling Peltier element 47.
- a plurality of Peltier element cooling fins 48 attached to the can also be provided.
- the configuration of the liquid material vaporizer A is as follows. From the top, the gas-liquid mixing unit 1, the connection unit 3 with the connection unit cooling unit 4 attached, and the vaporization unit 2 are arranged in this order. It is also possible to adopt an embodiment in which the configuration is arranged in the direction. [0054] With such a configuration, even when the liquid material LM remains in the nozzle portion 25 of the vaporizing section 2, the liquid material LM hangs down due to gravity, so the nozzle portion 25 is blocked. It is possible to prevent malfunctions such as glaring.
- connection portion cooling unit is not limited to that of the present embodiment, and an appropriate cooling method is adopted depending on the embodiment, for example, a water cooling method using a liquid for cooling. be able to.
- a "backflow prevention nozzle" for preventing the liquid material supplied to the gas-liquid mixing chamber from flowing back to the carrier gas introduction path is further provided for the above embodiment. You can also. Specific examples of the backflow prevention nozzle include a backflow prevention nozzle portion described in JP-A 2003-273 025 (pages 3 to 4, FIG. 2).
- the gas outlet path 24 is hollow, if the pressure in the path is low, the gas density of the mixed gas KG decreases and the intermolecular distance increases. For this reason, since it is difficult for heat to be transmitted, the mixed gas KG cannot be suitably derived to the outside, that is, there may be a problem in vaporization. Therefore, by disposing a filler (not shown) in the gas outlet path 24, heat can be easily transmitted even when the pressure in the path is low, and vaporization can be suitably performed.
- a filler for example, a metal such as titanium having excellent thermal conductivity can be used.
- a plurality of granular (spherical) fillers can be arranged in the road, and one or more fillers (so-called static mixers) twisted in a flat shape by twisting a flat plate can be arranged in the road.
- Spiral-shaped fillers can be vaporized more suitably because they have less pressure loss when placed in the channel than granular fillers.
- a filter (not shown) may be provided at the subsequent stage of the nozzle portion 25. By installing a filter, even if a residue is generated, it can be captured. In addition, even if mist is generated from the gas-liquid mixture GL that remains as a liquid that can be completely vaporized, it can be removed.
- the gas-liquid mixing unit 1, the vaporization unit 2, the connection unit 3, and the connection unit cooling unit 4 can be configured to be disassembled. This makes it easy to maintain each part.
- each unit is not limited to the above embodiment. Various modifications can be made without departing from the spirit of the invention.
- the liquid material vaporization apparatus having such a configuration can prevent the generation of a residue and vaporize it appropriately even when vaporizing a liquid material composed of a plurality of material bottles having different boiling points.
- it can be suitably used as a liquid material vaporizer for vaporizing various liquid materials used in semiconductor manufacturing.
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- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Feeding, Discharge, Calcimining, Fusing, And Gas-Generation Devices (AREA)
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Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP07741029A EP2009137A4 (en) | 2006-04-05 | 2007-04-04 | DEVICE FOR EVAPORATING LIQUID MATERIAL |
KR1020087024259A KR101058976B1 (ko) | 2006-04-05 | 2007-04-04 | 액체재료 기화장치 |
JP2008508715A JP5090341B2 (ja) | 2006-04-05 | 2007-04-04 | 液体材料気化装置 |
US12/295,862 US8280235B2 (en) | 2006-04-05 | 2007-04-04 | Liquid material vaporizer |
US13/633,045 US8755679B2 (en) | 2006-04-05 | 2012-10-01 | Liquid material vaporizer |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006-103803 | 2006-04-05 | ||
JP2006103803 | 2006-04-05 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/295,862 A-371-Of-International US8280235B2 (en) | 2006-04-05 | 2007-04-04 | Liquid material vaporizer |
US13/633,045 Continuation-In-Part US8755679B2 (en) | 2006-04-05 | 2012-10-01 | Liquid material vaporizer |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2007114474A1 true WO2007114474A1 (ja) | 2007-10-11 |
Family
ID=38563735
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/057593 WO2007114474A1 (ja) | 2006-04-05 | 2007-04-04 | 液体材料気化装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8280235B2 (ja) |
EP (1) | EP2009137A4 (ja) |
JP (2) | JP5090341B2 (ja) |
KR (1) | KR101058976B1 (ja) |
CN (3) | CN102912319B (ja) |
WO (1) | WO2007114474A1 (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2010028000A (ja) * | 2008-07-24 | 2010-02-04 | Hitachi Kokusai Electric Inc | 気化器、基板処理装置及び半導体装置の製造方法 |
JP2014192258A (ja) * | 2013-03-26 | 2014-10-06 | Hitachi Kokusai Electric Inc | 基板処理装置及び半導体装置の製造方法 |
JP2019103986A (ja) * | 2017-12-14 | 2019-06-27 | 株式会社堀場エステック | 混合器及び気化装置 |
US10391417B2 (en) * | 2015-12-11 | 2019-08-27 | Horiba Stec, Co., Ltd. | Liquid material vaporizaton apparatus |
US10538843B2 (en) * | 2016-02-18 | 2020-01-21 | Samsung Electronics Co., Ltd. | Vaporizer and thin film deposition apparatus including the same |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8755679B2 (en) | 2006-04-05 | 2014-06-17 | Horiba Stec, Co., Ltd. | Liquid material vaporizer |
US9454158B2 (en) | 2013-03-15 | 2016-09-27 | Bhushan Somani | Real time diagnostics for flow controller systems and methods |
JP6186179B2 (ja) * | 2013-05-31 | 2017-08-23 | 株式会社堀場エステック | 攪拌器及び攪拌器の製造方法 |
KR102108802B1 (ko) | 2014-05-07 | 2020-05-11 | 현대자동차주식회사 | 연소실로 유입되는 흡기의 온도를 제어하기 위한 에어히터 및 그 작동방법 |
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JPWO2007114474A1 (ja) | 2009-08-20 |
CN101410548A (zh) | 2009-04-15 |
KR20080110603A (ko) | 2008-12-18 |
US20090097831A1 (en) | 2009-04-16 |
JP5475817B2 (ja) | 2014-04-16 |
CN102912319A (zh) | 2013-02-06 |
CN102912319B (zh) | 2014-12-10 |
KR101058976B1 (ko) | 2011-08-23 |
JP2012177193A (ja) | 2012-09-13 |
EP2009137A1 (en) | 2008-12-31 |
JP5090341B2 (ja) | 2012-12-05 |
EP2009137A4 (en) | 2010-03-24 |
CN105256288A (zh) | 2016-01-20 |
US8280235B2 (en) | 2012-10-02 |
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