WO2007018118A1 - レンズにおける表裏面の光軸偏芯量の測定方法 - Google Patents

レンズにおける表裏面の光軸偏芯量の測定方法 Download PDF

Info

Publication number
WO2007018118A1
WO2007018118A1 PCT/JP2006/315396 JP2006315396W WO2007018118A1 WO 2007018118 A1 WO2007018118 A1 WO 2007018118A1 JP 2006315396 W JP2006315396 W JP 2006315396W WO 2007018118 A1 WO2007018118 A1 WO 2007018118A1
Authority
WO
WIPO (PCT)
Prior art keywords
measuring
reference point
lens
holder
vertex
Prior art date
Application number
PCT/JP2006/315396
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Katsushige Nakamura
Katsuhiro Miura
Original Assignee
Mitaka Kohki Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitaka Kohki Co., Ltd. filed Critical Mitaka Kohki Co., Ltd.
Priority to CN2006800281259A priority Critical patent/CN101233386B/zh
Priority to JP2007529527A priority patent/JP4767255B2/ja
Publication of WO2007018118A1 publication Critical patent/WO2007018118A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
    • G02B19/0052—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source the light source comprising a laser diode
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/02—Simple or compound lenses with non-spherical faces

Definitions

  • the laser beam L is applied to the surface la including the apex Pa of the aspherical lens 1 in the Y-Z plane. Irradiated and reflected.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
PCT/JP2006/315396 2005-08-05 2006-08-03 レンズにおける表裏面の光軸偏芯量の測定方法 WO2007018118A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN2006800281259A CN101233386B (zh) 2005-08-05 2006-08-03 透镜表背面的光轴偏心量的测定方法
JP2007529527A JP4767255B2 (ja) 2005-08-05 2006-08-03 レンズにおける表裏面の光軸偏芯量の測定方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005228760 2005-08-05
JP2005-228760 2005-08-05

Publications (1)

Publication Number Publication Date
WO2007018118A1 true WO2007018118A1 (ja) 2007-02-15

Family

ID=37727303

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2006/315396 WO2007018118A1 (ja) 2005-08-05 2006-08-03 レンズにおける表裏面の光軸偏芯量の測定方法

Country Status (4)

Country Link
JP (1) JP4767255B2 (zh)
KR (1) KR100951221B1 (zh)
CN (1) CN101233386B (zh)
WO (1) WO2007018118A1 (zh)

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008067561A2 (en) * 2006-11-30 2008-06-05 Lau Kam C Interior contour measurement probe
EP2090861A1 (en) * 2008-02-18 2009-08-19 Mitutoyo Corporation Method of measuring front and back surfaces of target object
EP2253931A1 (en) * 2009-05-19 2010-11-24 Mitutoyo Corporation Form measuring instrument, form measuring method, and program
WO2011129068A1 (ja) * 2010-04-13 2011-10-20 コニカミノルタオプト株式会社 偏心量測定方法
CN101576641B (zh) * 2008-05-07 2011-12-28 亚洲光学股份有限公司 光学系统中的嵌合式镜片组及其嵌合精度补正方法
WO2012001929A1 (ja) * 2010-07-01 2012-01-05 パナソニック株式会社 波面収差測定装置及び波面収差測定方法
WO2012075013A1 (en) 2010-11-30 2012-06-07 Johnson & Johnson Vision Care, Inc. Laser confocal sensor metrology system
US8810784B2 (en) 2012-02-10 2014-08-19 Johnson & Johnson Vision Care Inc. Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements
WO2014177632A1 (de) * 2013-05-02 2014-11-06 Carl Zeiss Vision International Gmbh Verfahren und system für das ermitteln der räumlichen struktur eines gegenstands
WO2015146634A1 (ja) * 2014-03-28 2015-10-01 コニカミノルタ株式会社 非球面の偏心量測定方法及び形状解析方法
DE102013219838B4 (de) * 2013-09-30 2015-11-26 Carl Zeiss Ag Verfahren und System für das Ermitteln der räumlichen Struktur eines Gegenstands
JP2016194435A (ja) * 2015-03-31 2016-11-17 富士フイルム株式会社 レンズの形状測定方法及び形状測定装置
JP2017529524A (ja) * 2014-08-15 2017-10-05 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ レンズ及びレンズ金型の光学評価
EP2467672A4 (en) * 2009-08-19 2017-11-15 Benz Research And Development Corporation Surface alignment and positioning method and apparatus
CN108896276A (zh) * 2017-05-11 2018-11-27 纳卢克斯株式会社 位置测定方法以及部件
WO2019021931A1 (ja) 2017-07-26 2019-01-31 株式会社ダイセル 光学部品、及びその製造方法
US10352817B2 (en) 2014-05-19 2019-07-16 Taylor Hobson Ltd. Device and method for geometrically measuring an object
DE102018201481A1 (de) 2018-01-31 2019-08-01 Carl Zeiss Vision Gmbh Vorrichtung und Verfahren zur Bestimmung der dreidimensionalen Oberflächengeometrie von Objekten
WO2019187422A1 (ja) * 2018-03-30 2019-10-03 浜松ホトニクス株式会社 測距ユニット及び光照射装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010237189A (ja) * 2009-03-11 2010-10-21 Fujifilm Corp ３次元形状測定方法および装置
JP2010281792A (ja) * 2009-06-08 2010-12-16 Fujifilm Corp 非球面体測定方法および装置
KR102028699B1 (ko) * 2018-02-21 2019-11-04 지메스소프트 주식회사 렌즈의 3차원 형상 측정 방법 및 이를 위한 시스템
CN109764817A (zh) * 2019-01-14 2019-05-17 南京信息工程大学 非接触式透镜中心厚测量系统及方法
CN113310455B (zh) * 2021-04-08 2023-07-11 超丰微纳科技(宁波)有限公司 一种检测模压成型加工双面镜偏心量的方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001324309A (ja) * 2000-05-15 2001-11-22 Canon Inc 三次元形状測定装置
JP2003083739A (ja) * 2001-09-14 2003-03-19 Minolta Co Ltd 三次元形状計測装置
JP2004028672A (ja) * 2002-06-24 2004-01-29 Olympus Corp 非球面偏心測定装置及び非球面偏心測定方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3725817B2 (ja) * 2001-11-20 2005-12-14 オリンパス株式会社 非球面レンズの偏心測定方法及び偏心測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001324309A (ja) * 2000-05-15 2001-11-22 Canon Inc 三次元形状測定装置
JP2003083739A (ja) * 2001-09-14 2003-03-19 Minolta Co Ltd 三次元形状計測装置
JP2004028672A (ja) * 2002-06-24 2004-01-29 Olympus Corp 非球面偏心測定装置及び非球面偏心測定方法

Cited By (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008067561A3 (en) * 2006-11-30 2008-07-17 Kam C Lau Interior contour measurement probe
WO2008067561A2 (en) * 2006-11-30 2008-06-05 Lau Kam C Interior contour measurement probe
EP2090861A1 (en) * 2008-02-18 2009-08-19 Mitutoyo Corporation Method of measuring front and back surfaces of target object
US7701562B2 (en) 2008-02-18 2010-04-20 Mitutoyo Corporation Method of measuring front and back surfaces of target object
CN101576641B (zh) * 2008-05-07 2011-12-28 亚洲光学股份有限公司 光学系统中的嵌合式镜片组及其嵌合精度补正方法
EP2253931A1 (en) * 2009-05-19 2010-11-24 Mitutoyo Corporation Form measuring instrument, form measuring method, and program
US8290740B2 (en) 2009-05-19 2012-10-16 Mitutoyo Corporation Form measuring instrument, form measuring method, and program
EP2467672A4 (en) * 2009-08-19 2017-11-15 Benz Research And Development Corporation Surface alignment and positioning method and apparatus
JP5582188B2 (ja) * 2010-04-13 2014-09-03 コニカミノルタ株式会社 偏心量測定方法
WO2011129068A1 (ja) * 2010-04-13 2011-10-20 コニカミノルタオプト株式会社 偏心量測定方法
US8665425B2 (en) 2010-04-13 2014-03-04 Konica Minolta Advanced Layers, Inc. Eccentricity measuring method
WO2012001929A1 (ja) * 2010-07-01 2012-01-05 パナソニック株式会社 波面収差測定装置及び波面収差測定方法
CN103229035A (zh) * 2010-11-30 2013-07-31 庄臣及庄臣视力保护公司 激光共焦传感器计量系统
US8953176B2 (en) 2010-11-30 2015-02-10 Johnson & Johnson Vision Care, Inc. Laser confocal sensor metrology system
AU2011336778B2 (en) * 2010-11-30 2015-07-09 Johnson & Johnson Vision Care, Inc. Laser confocal sensor metrology system
WO2012075013A1 (en) 2010-11-30 2012-06-07 Johnson & Johnson Vision Care, Inc. Laser confocal sensor metrology system
RU2584070C2 (ru) * 2010-11-30 2016-05-20 Джонсон Энд Джонсон Вижн Кэа, Инк. Измерительная система с лазерным конфокальным датчиком
US8810784B2 (en) 2012-02-10 2014-08-19 Johnson & Johnson Vision Care Inc. Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements
WO2014177632A1 (de) * 2013-05-02 2014-11-06 Carl Zeiss Vision International Gmbh Verfahren und system für das ermitteln der räumlichen struktur eines gegenstands
AU2014261378B2 (en) * 2013-05-02 2017-02-16 Carl Zeiss Ag Method and system for determining the spatial structure of an object
US9797804B2 (en) 2013-05-02 2017-10-24 Carl Zeiss Vision International Gmbh Method and system for determining the spatial structure of an object
DE102013219838B4 (de) * 2013-09-30 2015-11-26 Carl Zeiss Ag Verfahren und System für das Ermitteln der räumlichen Struktur eines Gegenstands
WO2015146634A1 (ja) * 2014-03-28 2015-10-01 コニカミノルタ株式会社 非球面の偏心量測定方法及び形状解析方法
JPWO2015146634A1 (ja) * 2014-03-28 2017-04-13 コニカミノルタ株式会社 非球面の偏心量測定方法及び形状解析方法
US10352817B2 (en) 2014-05-19 2019-07-16 Taylor Hobson Ltd. Device and method for geometrically measuring an object
JP2017529524A (ja) * 2014-08-15 2017-10-05 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ レンズ及びレンズ金型の光学評価
JP2017530341A (ja) * 2014-08-15 2017-10-12 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ レンズ及びレンズ金型の光学評価
JP2016194435A (ja) * 2015-03-31 2016-11-17 富士フイルム株式会社 レンズの形状測定方法及び形状測定装置
CN108896276A (zh) * 2017-05-11 2018-11-27 纳卢克斯株式会社 位置测定方法以及部件
CN108896276B (zh) * 2017-05-11 2022-02-25 纳卢克斯株式会社 位置测定方法以及部件
KR20200032164A (ko) 2017-07-26 2020-03-25 주식회사 다이셀 광학 부품, 및 그의 제조 방법
WO2019021931A1 (ja) 2017-07-26 2019-01-31 株式会社ダイセル 光学部品、及びその製造方法
DE102018201481A1 (de) 2018-01-31 2019-08-01 Carl Zeiss Vision Gmbh Vorrichtung und Verfahren zur Bestimmung der dreidimensionalen Oberflächengeometrie von Objekten
JP2019178923A (ja) * 2018-03-30 2019-10-17 浜松ホトニクス株式会社 測距ユニット及び光照射装置
CN111936817A (zh) * 2018-03-30 2020-11-13 浜松光子学株式会社 测距单元及光照射装置
WO2019187422A1 (ja) * 2018-03-30 2019-10-03 浜松ホトニクス株式会社 測距ユニット及び光照射装置
JP7034803B2 (ja) 2018-03-30 2022-03-14 浜松ホトニクス株式会社 測距ユニット及び光照射装置
US11428520B2 (en) 2018-03-30 2022-08-30 Hamamatsu Photonics K.K. Distance measurement unit and light irradiation device
CN111936817B (zh) * 2018-03-30 2023-07-18 浜松光子学株式会社 测距单元及光照射装置

Also Published As

Publication number Publication date
JPWO2007018118A1 (ja) 2009-02-19
JP4767255B2 (ja) 2011-09-07
CN101233386B (zh) 2010-09-29
KR100951221B1 (ko) 2010-04-05
KR20080031509A (ko) 2008-04-08
CN101233386A (zh) 2008-07-30

Similar Documents

Publication Publication Date Title
JP4767255B2 (ja) レンズにおける表裏面の光軸偏芯量の測定方法
US7209242B2 (en) Non-contact surface configuration measuring apparatus and method thereof
JP3511450B2 (ja) 光学式測定装置の位置校正方法
JP6193218B2 (ja) 表面を非接触にて測定するための方法および装置
JP4791118B2 (ja) 画像測定機のオフセット算出方法
KR20110106823A (ko) 비구면체 측정 방법 및 장치
JP4846295B2 (ja) ３次元座標測定装置及び方法
EP1985968B1 (en) Noncontact measuring apparatus for interior surfaces of cylindrical objects based on using the autofocus function that comprises means for directing the probing light beam towards the inspected surface
JP2002250622A (ja) 光学素子及びその型の形状測定方法及び装置
TW201009287A (en) Optical multi-axis linear displacement measurement system and a method thereof
JP5098174B2 (ja) ３次元形状測定装置
JP2007085914A (ja) 非球面レンズの測定方法、非球面レンズの測定装置、非球面レンズの測定プログラム、非球面レンズの製造方法及び非球面レンズ
JP2005140673A (ja) 非球面偏心測定装置及び非球面偏心測定方法
JP2005201703A (ja) 干渉測定方法及び干渉測定システム
JP2012002548A (ja) 光波干渉測定装置
JP4311952B2 (ja) ３次元座標測定方法
JP2007178309A (ja) 非接触変位計測装置、並びにそのエッジ検出方法及びエッジ検出プログラム
JP2002250621A (ja) 光学素子及びその型の形状測定方法及び装置
JP2016153786A (ja) 形状計測方法、形状計測装置、プログラム、記録媒体及び光学素子の製造方法
JP2007218931A (ja) 光学面の形状測定方法および装置および記録媒体
JP6980304B2 (ja) 非接触内面形状測定装置
JP2005331497A (ja) 非球面レンズの評価装置及び評価方法
JP2017072447A (ja) 位置算出方法、形状計測方法、形状計測装置、プログラム、記録媒体及び部品の製造方法
JP5430473B2 (ja) 面形状計測装置
JPH11211611A (ja) 偏心測定装置

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200680028125.9

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 2007529527

Country of ref document: JP

NENP Non-entry into the national phase

Ref country code: DE

WWE Wipo information: entry into national phase

Ref document number: 1020087005324

Country of ref document: KR

122 Ep: pct application non-entry in european phase

Ref document number: 06782256

Country of ref document: EP

Kind code of ref document: A1