JP4767255B2 - レンズにおける表裏面の光軸偏芯量の測定方法 - Google Patents

レンズにおける表裏面の光軸偏芯量の測定方法 Download PDF

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JP4767255B2
JP4767255B2 JP2007529527A JP2007529527A JP4767255B2 JP 4767255 B2 JP4767255 B2 JP 4767255B2 JP 2007529527 A JP2007529527 A JP 2007529527A JP 2007529527 A JP2007529527 A JP 2007529527A JP 4767255 B2 JP4767255 B2 JP 4767255B2
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measuring
reference point
lens
holder
vertex
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JPWO2007018118A1 (ja
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勝重 中村
勝弘 三浦
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Mitaka Kohki Co Ltd
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Mitaka Kohki Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
    • G02B19/0052—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source the light source comprising a laser diode
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/02—Simple or compound lenses with non-spherical faces

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2007529527A 2005-08-05 2006-08-03 レンズにおける表裏面の光軸偏芯量の測定方法 Active JP4767255B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007529527A JP4767255B2 (ja) 2005-08-05 2006-08-03 レンズにおける表裏面の光軸偏芯量の測定方法

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2005228760 2005-08-05
JP2005228760 2005-08-05
JP2007529527A JP4767255B2 (ja) 2005-08-05 2006-08-03 レンズにおける表裏面の光軸偏芯量の測定方法
PCT/JP2006/315396 WO2007018118A1 (ja) 2005-08-05 2006-08-03 レンズにおける表裏面の光軸偏芯量の測定方法

Publications (2)

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JPWO2007018118A1 JPWO2007018118A1 (ja) 2009-02-19
JP4767255B2 true JP4767255B2 (ja) 2011-09-07

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JP2007529527A Active JP4767255B2 (ja) 2005-08-05 2006-08-03 レンズにおける表裏面の光軸偏芯量の測定方法

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JP (1) JP4767255B2 (zh)
KR (1) KR100951221B1 (zh)
CN (1) CN101233386B (zh)
WO (1) WO2007018118A1 (zh)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090144999A1 (en) * 2006-11-30 2009-06-11 Lau Kam C Interior contour measurement probe
JP5236962B2 (ja) 2008-02-18 2013-07-17 株式会社ミツトヨ 被測定物の表裏面測定方法
CN101576641B (zh) * 2008-05-07 2011-12-28 亚洲光学股份有限公司 光学系统中的嵌合式镜片组及其嵌合精度补正方法
JP2010237189A (ja) * 2009-03-11 2010-10-21 Fujifilm Corp ３次元形状測定方法および装置
JP5337955B2 (ja) * 2009-05-19 2013-11-06 株式会社ミツトヨ 形状測定装置、形状測定方法、及びプログラム
JP2010281792A (ja) * 2009-06-08 2010-12-16 Fujifilm Corp 非球面体測定方法および装置
US8184301B2 (en) * 2009-08-19 2012-05-22 Benz Research And Development Corporation Surface alignment and positioning method and apparatus
WO2011129068A1 (ja) * 2010-04-13 2011-10-20 コニカミノルタオプト株式会社 偏心量測定方法
WO2012001929A1 (ja) * 2010-07-01 2012-01-05 パナソニック株式会社 波面収差測定装置及び波面収差測定方法
US20120133957A1 (en) * 2010-11-30 2012-05-31 Widman Michael F Laser confocal sensor metrology system
WO2013119775A1 (en) 2012-02-10 2013-08-15 Johnson & Johnson Vision Care, Inc. Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements
WO2014177632A1 (de) * 2013-05-02 2014-11-06 Carl Zeiss Vision International Gmbh Verfahren und system für das ermitteln der räumlichen struktur eines gegenstands
DE102013219838B4 (de) * 2013-09-30 2015-11-26 Carl Zeiss Ag Verfahren und System für das Ermitteln der räumlichen Struktur eines Gegenstands
JP6361729B2 (ja) * 2014-03-28 2018-07-25 コニカミノルタ株式会社 非球面の偏心量測定方法及び形状解析方法
DE102014007203A1 (de) 2014-05-19 2015-11-19 Luphos Gmbh Vorrichtung und Verfahren zur geometrischen Vermessung eines Objekts
JP6542355B2 (ja) * 2014-08-15 2019-07-10 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ レンズ及びレンズ金型の光学評価
JP6302864B2 (ja) * 2015-03-31 2018-03-28 富士フイルム株式会社 レンズの形状測定方法及び形状測定装置
US10295754B2 (en) * 2017-05-11 2019-05-21 Nalux Co., Ltd. Position determination method and element
JP7201312B2 (ja) 2017-07-26 2023-01-10 株式会社ダイセル 光学部品、及びその製造方法
DE102018201481A1 (de) 2018-01-31 2019-08-01 Carl Zeiss Vision Gmbh Vorrichtung und Verfahren zur Bestimmung der dreidimensionalen Oberflächengeometrie von Objekten
KR102028699B1 (ko) * 2018-02-21 2019-11-04 지메스소프트 주식회사 렌즈의 3차원 형상 측정 방법 및 이를 위한 시스템
JP7034803B2 (ja) * 2018-03-30 2022-03-14 浜松ホトニクス株式会社 測距ユニット及び光照射装置
CN109764817A (zh) * 2019-01-14 2019-05-17 南京信息工程大学 非接触式透镜中心厚测量系统及方法
CN113310455B (zh) * 2021-04-08 2023-07-11 超丰微纳科技(宁波)有限公司 一种检测模压成型加工双面镜偏心量的方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001324309A (ja) * 2000-05-15 2001-11-22 Canon Inc 三次元形状測定装置
JP2003083739A (ja) * 2001-09-14 2003-03-19 Minolta Co Ltd 三次元形状計測装置
JP2004028672A (ja) * 2002-06-24 2004-01-29 Olympus Corp 非球面偏心測定装置及び非球面偏心測定方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3725817B2 (ja) * 2001-11-20 2005-12-14 オリンパス株式会社 非球面レンズの偏心測定方法及び偏心測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001324309A (ja) * 2000-05-15 2001-11-22 Canon Inc 三次元形状測定装置
JP2003083739A (ja) * 2001-09-14 2003-03-19 Minolta Co Ltd 三次元形状計測装置
JP2004028672A (ja) * 2002-06-24 2004-01-29 Olympus Corp 非球面偏心測定装置及び非球面偏心測定方法

Also Published As

Publication number Publication date
JPWO2007018118A1 (ja) 2009-02-19
WO2007018118A1 (ja) 2007-02-15
CN101233386B (zh) 2010-09-29
KR100951221B1 (ko) 2010-04-05
KR20080031509A (ko) 2008-04-08
CN101233386A (zh) 2008-07-30

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