KR100951221B1 - 렌즈에 있어서의 표리면의 광축 편심량의 측정 방법 - Google Patents
렌즈에 있어서의 표리면의 광축 편심량의 측정 방법 Download PDFInfo
- Publication number
- KR100951221B1 KR100951221B1 KR1020087005324A KR20087005324A KR100951221B1 KR 100951221 B1 KR100951221 B1 KR 100951221B1 KR 1020087005324 A KR1020087005324 A KR 1020087005324A KR 20087005324 A KR20087005324 A KR 20087005324A KR 100951221 B1 KR100951221 B1 KR 100951221B1
- Authority
- KR
- South Korea
- Prior art keywords
- measuring
- reference point
- aspherical lens
- vertex
- holder
- Prior art date
Links
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
- G02B19/0052—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source the light source comprising a laser diode
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B3/00—Simple or compound lenses
- G02B3/02—Simple or compound lenses with non-spherical faces
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Geometry (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2005-00228760 | 2005-08-05 | ||
JP2005228760 | 2005-08-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20080031509A KR20080031509A (ko) | 2008-04-08 |
KR100951221B1 true KR100951221B1 (ko) | 2010-04-05 |
Family
ID=37727303
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020087005324A KR100951221B1 (ko) | 2005-08-05 | 2006-08-03 | 렌즈에 있어서의 표리면의 광축 편심량의 측정 방법 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4767255B2 (zh) |
KR (1) | KR100951221B1 (zh) |
CN (1) | CN101233386B (zh) |
WO (1) | WO2007018118A1 (zh) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090144999A1 (en) * | 2006-11-30 | 2009-06-11 | Lau Kam C | Interior contour measurement probe |
JP5236962B2 (ja) | 2008-02-18 | 2013-07-17 | 株式会社ミツトヨ | 被測定物の表裏面測定方法 |
CN101576641B (zh) * | 2008-05-07 | 2011-12-28 | 亚洲光学股份有限公司 | 光学系统中的嵌合式镜片组及其嵌合精度补正方法 |
JP2010237189A (ja) * | 2009-03-11 | 2010-10-21 | Fujifilm Corp | 3次元形状測定方法および装置 |
JP5337955B2 (ja) * | 2009-05-19 | 2013-11-06 | 株式会社ミツトヨ | 形状測定装置、形状測定方法、及びプログラム |
JP2010281792A (ja) * | 2009-06-08 | 2010-12-16 | Fujifilm Corp | 非球面体測定方法および装置 |
US8184301B2 (en) * | 2009-08-19 | 2012-05-22 | Benz Research And Development Corporation | Surface alignment and positioning method and apparatus |
WO2011129068A1 (ja) * | 2010-04-13 | 2011-10-20 | コニカミノルタオプト株式会社 | 偏心量測定方法 |
WO2012001929A1 (ja) * | 2010-07-01 | 2012-01-05 | パナソニック株式会社 | 波面収差測定装置及び波面収差測定方法 |
US20120133957A1 (en) * | 2010-11-30 | 2012-05-31 | Widman Michael F | Laser confocal sensor metrology system |
WO2013119775A1 (en) | 2012-02-10 | 2013-08-15 | Johnson & Johnson Vision Care, Inc. | Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements |
WO2014177632A1 (de) * | 2013-05-02 | 2014-11-06 | Carl Zeiss Vision International Gmbh | Verfahren und system für das ermitteln der räumlichen struktur eines gegenstands |
DE102013219838B4 (de) * | 2013-09-30 | 2015-11-26 | Carl Zeiss Ag | Verfahren und System für das Ermitteln der räumlichen Struktur eines Gegenstands |
JP6361729B2 (ja) * | 2014-03-28 | 2018-07-25 | コニカミノルタ株式会社 | 非球面の偏心量測定方法及び形状解析方法 |
DE102014007203A1 (de) | 2014-05-19 | 2015-11-19 | Luphos Gmbh | Vorrichtung und Verfahren zur geometrischen Vermessung eines Objekts |
JP6542355B2 (ja) * | 2014-08-15 | 2019-07-10 | ザイゴ コーポレーションZygo Corporation | レンズ及びレンズ金型の光学評価 |
JP6302864B2 (ja) * | 2015-03-31 | 2018-03-28 | 富士フイルム株式会社 | レンズの形状測定方法及び形状測定装置 |
US10295754B2 (en) * | 2017-05-11 | 2019-05-21 | Nalux Co., Ltd. | Position determination method and element |
JP7201312B2 (ja) | 2017-07-26 | 2023-01-10 | 株式会社ダイセル | 光学部品、及びその製造方法 |
DE102018201481A1 (de) | 2018-01-31 | 2019-08-01 | Carl Zeiss Vision Gmbh | Vorrichtung und Verfahren zur Bestimmung der dreidimensionalen Oberflächengeometrie von Objekten |
KR102028699B1 (ko) * | 2018-02-21 | 2019-11-04 | 지메스소프트 주식회사 | 렌즈의 3차원 형상 측정 방법 및 이를 위한 시스템 |
JP7034803B2 (ja) * | 2018-03-30 | 2022-03-14 | 浜松ホトニクス株式会社 | 測距ユニット及び光照射装置 |
CN109764817A (zh) * | 2019-01-14 | 2019-05-17 | 南京信息工程大学 | 非接触式透镜中心厚测量系统及方法 |
CN113310455B (zh) * | 2021-04-08 | 2023-07-11 | 超丰微纳科技(宁波)有限公司 | 一种检测模压成型加工双面镜偏心量的方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001324309A (ja) | 2000-05-15 | 2001-11-22 | Canon Inc | 三次元形状測定装置 |
JP2003083739A (ja) | 2001-09-14 | 2003-03-19 | Minolta Co Ltd | 三次元形状計測装置 |
JP2004028672A (ja) | 2002-06-24 | 2004-01-29 | Olympus Corp | 非球面偏心測定装置及び非球面偏心測定方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3725817B2 (ja) * | 2001-11-20 | 2005-12-14 | オリンパス株式会社 | 非球面レンズの偏心測定方法及び偏心測定装置 |
-
2006
- 2006-08-03 KR KR1020087005324A patent/KR100951221B1/ko not_active IP Right Cessation
- 2006-08-03 JP JP2007529527A patent/JP4767255B2/ja active Active
- 2006-08-03 WO PCT/JP2006/315396 patent/WO2007018118A1/ja active Application Filing
- 2006-08-03 CN CN2006800281259A patent/CN101233386B/zh not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001324309A (ja) | 2000-05-15 | 2001-11-22 | Canon Inc | 三次元形状測定装置 |
JP2003083739A (ja) | 2001-09-14 | 2003-03-19 | Minolta Co Ltd | 三次元形状計測装置 |
JP2004028672A (ja) | 2002-06-24 | 2004-01-29 | Olympus Corp | 非球面偏心測定装置及び非球面偏心測定方法 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2007018118A1 (ja) | 2009-02-19 |
WO2007018118A1 (ja) | 2007-02-15 |
JP4767255B2 (ja) | 2011-09-07 |
CN101233386B (zh) | 2010-09-29 |
KR20080031509A (ko) | 2008-04-08 |
CN101233386A (zh) | 2008-07-30 |
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