Classifications

• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
  • H10D30/00—Field-effect transistors [FET]
  • H10D30/80—FETs having rectifying junction gate electrodes
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
  • H10D30/00—Field-effect transistors [FET]
  • H10D30/80—FETs having rectifying junction gate electrodes
  • H10D30/87—FETs having Schottky gate electrodes, e.g. metal-semiconductor FETs [MESFET]
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
  • H10D8/00—Diodes
  • H10D8/01—Manufacture or treatment
  • H10D8/051—Manufacture or treatment of Schottky diodes
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
  • H10D8/00—Diodes
  • H10D8/60—Schottky-barrier diodes 

Definitions

• the present disclosure relates generally to a semiconductor device and process, and more particularly to a semiconductor device having a Schottky device and process of disposing the Schottky device at a semiconductor substrate.
• FIG. 1 illustrates a cross-sectional view of a Schottky device in accordance with the present disclosure
• FIGs. 2-9 illustrate the Schottky device of FIG. 1 at various stages of a manufacturing process in accordance with the present disclosure
• FIGs. 10 and 11 illustrate three-dimensional views of the Schottky device of FIG. 1 in accordance with specific embodiments of the present disclosure.
• FIGs. 12-14 illustrate cross-sectional views of Schottky devices in accordance with alternate embodiments of the present disclosure. DETAILED DESCRIPTION
• FIG. 1 illustrates a cross sectional view of a Schottky device disposed at a location 5 of a bulk substrate 10 in accordance with a specific embodiment of the present disclosure.
• FIGs. 2-12 herein disclose specific processing flows for forming the Schottky device of FIG. 1.
• FIG. 2 illustrates a bulk substrate 10 that includes an upper layer 21.
• the bulk substrate 10 is a P-doped mono-crystalline substrate semiconductor substrate, such as silicon.
• the bulk substrate 10 can include other embodiments, i e.g., silicon-on-insulator, silicon on sapphire, gallium arsenide, and the like.
• a bulk substrate 10 of silicon having a P-type doping concentration in the range of approximately lel5-lel9/cm ⁇ 3 is used, while the layer 21 is a doped portion of the substrate having a conductivity-type opposite that of the bulk material.
• layer 21 can be an N-doped layer having a doping concentration in the range of approximately Iel8- 3el9/cm ⁇ 3, with a typical range of l-2xlel9/cm ⁇ 3.
• the layer 21 is to create an N-type buried layer (NBL) in the final device, and can be formed by implanting an N-type species, such as antimony, using known dopant implantation techniques.
• NBL N-type buried layer
• no separate layer 21 is needed.
• a bulk substrate having an N-type dopant concentration in the range of lel8-3el9/cm ⁇ 3 or 1- 2xlel9/cm ⁇ 3 can be used without a uniquely doped upper layer 21. Therefore, in an alternate embodiment, layer 21 merely represents an upper portion of the bulk substrate 10.
• FIG. 3 illustrates location 5 subsequent to the formation of an epitaxial layer 12.
• the epitaxial layer 12 will comprise a semiconductor material similar to that of the bulk substrate 10.
• the epitaxial layer 12 is presumed to be an epitaxial silicon layer, overlying layer 21.
• the epitaxial layer 12 as formed has a conductivity-type opposite the layer 21, i.e. a P-doped epitaxial layer is described in the current description.
• layer 12 has a thickness in a range of 2-4 microns, 2.5-3.5 microns, or 3.25 microns-3.75 microns.
• a typical P-type dopant concentration of layer 12 is in the range of approximately 2-5el5/cm ⁇ 3.
• implanting the dopant species subsequent to epitaxial formation forms the doped epitaxial layer 12.
• the dopant species is provided during epitaxial formation.
• FIGs. 2 and 3 disclose an epitaxial layer overlying a bulk substrate, it will be appreciated that the use of an epitaxial layer is not needed to create the Schottky device the present disclosure.
• layer 10 can be an unprocessed bulk substrate, while layers 21 and 12 can be doped portions of the bulk substrate.
• FIG. 4 illustrates location 5 subsequent to the formation of a mask layer 101.
• Mask layer 101 has an opening 121 (partially illustrated) that defines the location of one or more well regions to be formed having a conductivity-type opposite that of the epitaxial layer 12.
• Region 11 is a doped region of the same conductivity-type as epitaxial layer 12, though more heavily doped.
• region 11 can have a doping concentration in the range of 1- 5el6/cm ⁇ 3 or a range of 2-3el6/cm ⁇ 3. As illustrated in FIG. 1, only the lower portion of region 11 will remain in the final Schottky device.
• layer 11 is formed by implanting a P-type species, such as Boron.
• FIG. 5 illustrates location 5 subsequent to the formation of N-type region 22, which includes the drift region for the Schottky device of FTG. 1.
• the region 22 is typically formed using the same mask layer 101 as the region.
• Region 22 is formed within a region having an opposite conductivity type. For example, when region 22 is an N-type region, it is formed within and adjacent to a P-type region that is the combination of regions 11 and 12.
• the dopant concentration of N-well 22 is approximately 2-4el6 /cm ⁇ 3, and can be formed by implanting phosphorous subsequent to formation of region 11. It will be appreciated that multiple well regions can be formed simultaneously on the same semiconductor device using the process described. In a particular embodiment, wells similar to region 22, will contain logic devices.
• the Schottky region is disposed of at region 22 to provide voltage blocking capability during reverse bias conditions and good on-resistance characteristics when forward biased as will be discussed in great detail herein.
• FIG. 6 illustrates location 5 subsequent to the formation of dielectric regions 31 and 32 within regions 12 and 22 respectively.
• the dielectric regions 31 and 32 are oxide regions formed using any suitable shallow trench isolation process.
• dielectric regions 31 and 32 can be formed on the regions 12 and 22.
• FIG. 7 illustrates location 5 subsequent to the formation of a region 13 of the same conductivity type as region 12.
• region 13 can be a P-type region formed using known masking techniques.
• P-type region 13 is referred to as a P- body, and will have a dopant concentration greater than region 12 of approximately 1- 5el7/cm ⁇ 3, and can be formed by implanting a P-type species, such as Boron.
• the region 12, as illustrated, is immediately adjacent to region 22, however, portions of region 12 may reside partially, or entirely between regions 13 and 22.
• FIG. 8 illustrates location 5 subsequent to the formation of the doped region 24.
• Doped region 24, also referred to as a sinker has a conductivity-type (polarity) that is the same as the layer 21, and is thereby electrically coupled to the buried layer 21.
• the dopant concentration of region 24 is typically larger then that of buried layer 21, and is in the range of Iel7 to Iel9 /cm ⁇ 3.
• region 24 is formed by implanting an N-type species, such as phosphorus.
• FIG. 9 illustrates location 5 subsequent to formation of doped regions 14 and 23.
• Doped regions 23 create contacts referred to as ties to commonly doped regions 24 and 22.
• Doped region 14 creates a tie to region 13, where regions 13 and 14 are of the same conductivity-type. Typical dopant concentrations of the regions 14 and 23 are in the range of approximately 5el9-le20/cm ⁇ 3.
• FIG. 1 illustrates location 5 subsequent to the formation of a conductive layer 41, a portion of which is a Schottky contact to the region 22 in that it has an appropriate work function differential between itself and the underlying region 22 to form a Schottky region 25.
• the conductive layer 41 is a suicide 41 formed by the deposition and anneal of Cobalt metal.
• a terminal 53 is illustrated connected to the suicide 41.
• the term "terminal" is used broadly to indicate a conductive element or portion of a conductive element that interfaces to a portion of the Schottky device of FIG. 1.
• a terminal will typically have conductivity greater than the regions of the Schottky device to which it contacts.
• a contact via or conductive trace formed of a metal or heavily doped poly silicon will typically form a terminal.
• the suicide 41 is a portion of the conductive structure that forms the anode of the Schottky device, while a terminal 52 is a portion of a conductive structure that interfaces with well tie 23 and forms the Schottky cathode.
• FIG. 1 also illustrates a connection 45, which is a conductive connection, such as a metal trace, connecting the tie 23 of region 22 to the tie 23 of region 24.
• the terminals 51 and 52 may be considered part of the connection 45, or separate from the connection 45.
• the connection 45 can be replaced with a connection between the anode 51 and the tie 23 to region 24 as will be discussed further herein.
• the suicide 41 is in contact with a first region and a second region of opposite conductivity types.
• the first region is a P-type region formed by regions 11, 12, 13 and 14, while the second region is a N-type region formed by regions 22 and 23.
• Terminal 52 of the Schottky device is electrically coupled to the region 22 through the tie region 23.
• At least a portion of the P-type region 11 immediately underlies the region 22 and is in electrical contact with the suicide 41 through P-type regions 12, 13 and 14.
• FIG. 10 illustrates a three-dimensional representation of a specific embodiment of a Schottky device.
• the suicide 41 is not illustrated for purposes of clarity and would typically overly the interleaved structures between the isolation regions 31 and 32, and be in contact with terminal 53 (such as shown in FIG. 1).
• FIG. 10 illustrates interleaved structures formed from regions 13 and 22, as viewed from a plan view of the Schottky device.
• a common interface location 131 is shared between an interleave structure of region 22 and an interleave structure of region 13; thereby creating a planar interface that is substantially orthogonal to the upper surface of the Schottky device.
• the common interface 131 may not be shared by regions 13 and 22 along the entire depth of the regions 12 and 22, and that part of p-type region 12 may interface with region 22, thereby separating regions 13 and 22.
• the interleave structure of region 22 also shares a common interface 132 with region 13 to create generally a planar interface that is substantially orthogonal to the upper surface of the Schottky device and to the planar interface beginning at common edge 131.
• the regions 11, 12, and 13 make a region having a common conductivity type, and that a substantially planar interface is formed between an interleave structure of region 22 and the underlying region 11. This interface is substantially orthogonal to the planar interfaces beginning at common edges 131 and 132.
• the P-type interleave structures of region 13 extend to the buried layer 11. In an alternate embodiment, the P-type interleave structures of region 13 stop within the region 22.
• FIG. 11 illustrates a three-dimensional view of an alternate embodiment of the present disclosure. Specifically, FIG. 11 illustrates a Schottky device similar to that described at FIG. 10. However, instead of having the interleaved structures of regions 13 and 22, non- interleaved regions 63 and 73 are illustrated that are analogous to regions 13 and 22 without interleave structures.
• the disclosed Schottky device of FIG. lconducts current from the anode 53 to the cathode 52 when forward biased.
• a Schottky region 25 formed in the N- type region 22 underlying the suicide 41 limits current flow in the reverse direction during a reverse bias condition.
• the Schottky device of FIG. 1 forms a depletion region that extends into the region 22 from multiple directions. First, the region 22 is depleted from left-to-right, i.e. from the region 13 as illustrated in FIG. 1. Second, the region 22 is depleted into and out of the page illustrating FIG. 1 when the regions 13 and 22 are interleaved.
• first and second depletion actions cause a single-RESURF (Reduced Surface Field) action in that they deplete region 22 in a direction parallel to a plane that is substantially parallel with the interface between region 22 and suicide 41.
• the Cathode 52 is electrically connected to the buried layer 22 through region 24, the region 11 is depleted during reverse bias, thereby enhancing the depletion of the region 22 during reverse bias in a second plane substantially orthogonal to the plane formed by the interface between region 22 and suicide 41.
• depletion action from below is included, the effect is referred to as a double-RESURF action.
• the depletion region created from left-to-right in the region 22 during reverse bias will extend past the Schottky region underlying the suicide 41 to the isolation region 32 as the reverse bias voltage increases.
• This extension of the depletion region past the Schottky region substantially clamps the electric field seen the Schottky region as the reverse bias voltage increases, and hence limits the reverse leakage current through the Schottky region.
• the Schottky device of FIG. 1 is substantially less susceptible to high leakage current in reverse bias conditions than conventional devices.
• FIG. 12 illustrates a cross-sectional view of an alternate embodiment of the present disclosure. Specifically, the Schottky device of FIG. 12 is similar to the Schottky device of FIG. 1, and analogous regions are commonly numbered. However, instead of implementing separate layers 11 and 13 having a common conductivity type, only a single region 211 is implemented.
• a dielectric layer 202 is disposed prior to formation of the suicide 41 and separates the tie region 23 from the Schottky region 225.
• a N-type region 222 is disposed within the epitaxial layer 12 and overlies a portion of P-type region 211. Note that the N-type region 222 has been illustrated as significantly thinner than the N-type region 22 of previous embodiments to emphasis the fact that the thickness of the N-type region can vary from embodiment to embodiment. Subsequent to formation of the suicide 41 a Schottky region will result at the N-type region 211. Operation of the device of FIG. 12 is similar to that of FIG. 1, wherein depletion occurs in the lateral direction to protect the Schottky region during high- voltage reverse bias conditions.
• FIG. 13 illustrates a cross-sectional, view of an alternate embodiment of the present disclosure.
• the Schottky device of FIG. 13 is similar to the Schottky device of FIG 1. Analogous regions between FIGs. 12 and 13 are commonly numbered.
• the Schottky device of FIG. 13 differs from the Schottky device of FIG. 12 in that a dielectric spacer 204 is disposed over the P-type region 211 between region 31 and silicide 41. In this manner, the length of Schottky region 225 is the distance between the dielectric spacers 202 and 204.
• a conductive connection 246 connects the silicide 41 the tie region 14.
• FIG. 14 illustrates a cross-sectional view of an alternate embodiment of the present disclosure.
• the Schottky device of FIG. 14 is similar to the Schottky device of FIG 10. Analogous regions between HGs. 14 and 10 are commonly numbered.
• the Schottky device of FIG. 14 differs from the Schottky device of FIG. 10 in that a dielectric spacer 233 is disposed over the substrate 10 within region 13 and 22. In this manner, the length of Schottky region 225 is the distance between the dielectric spacers 233 and 232.
• a conductive connection 247 connects the silicide 41 the tie region 14.

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• 2004
  • 2004-06-30 US US10/881,678 patent/US7355260B2/en not_active Expired - Lifetime
• 2005
  • 2005-05-19 KR KR1020067027790A patent/KR20070026690A/ko not_active Withdrawn
  • 2005-05-19 JP JP2007519217A patent/JP4975618B2/ja not_active Expired - Lifetime
  • 2005-05-19 CN CN200580021992A patent/CN100576569C/zh not_active Expired - Fee Related
  • 2005-05-19 WO PCT/US2005/017704 patent/WO2006007143A2/en not_active Ceased
  • 2005-06-15 TW TW094119834A patent/TWI358835B/zh not_active IP Right Cessation

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