WO2002025746A1 - Element emetteur de lumiere a semiconducteur de nitrure et dispositif optique contenant cet element - Google Patents
Element emetteur de lumiere a semiconducteur de nitrure et dispositif optique contenant cet element Download PDFInfo
- Publication number
- WO2002025746A1 WO2002025746A1 PCT/JP2001/008083 JP0108083W WO0225746A1 WO 2002025746 A1 WO2002025746 A1 WO 2002025746A1 JP 0108083 W JP0108083 W JP 0108083W WO 0225746 A1 WO0225746 A1 WO 0225746A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- nitride semiconductor
- light emitting
- emitting element
- semiconductor light
- optical device
- Prior art date
Links
- 150000004767 nitrides Chemical class 0.000 title abstract 6
- 239000004065 semiconductor Substances 0.000 title abstract 6
- 230000003287 optical effect Effects 0.000 title 1
- 230000004888 barrier function Effects 0.000 abstract 4
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
- H01L33/06—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
- H01L33/32—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2009—Confining in the direction perpendicular to the layer structure by using electron barrier layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34346—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser characterised by the materials of the barrier layers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Crystallography & Structural Chemistry (AREA)
- Biophysics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
- Semiconductor Lasers (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020037004167A KR100550158B1 (ko) | 2000-09-21 | 2001-09-17 | 질화물 반도체 발광소자 및 그것을 포함한 광학장치 |
US10/381,113 US7012283B2 (en) | 2000-09-21 | 2001-09-17 | Nitride semiconductor light emitting element and optical device containing it |
EP01965685A EP1335434A4 (en) | 2000-09-21 | 2001-09-17 | NITRIDE SEMICONDUCTOR LIGHT MISSION ELEMENT AND OPTICAL EQUIPMENT THEREWITH |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000287291A JP2002100838A (ja) | 2000-09-21 | 2000-09-21 | 窒化物半導体発光素子とそれを含む光学装置 |
JP2000-287291 | 2000-09-21 | ||
JP2000-351003 | 2000-11-17 | ||
JP2000351003A JP2002158405A (ja) | 2000-11-17 | 2000-11-17 | 窒化物半導体発光素子、光ピックアップ装置、および、発光装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002025746A1 true WO2002025746A1 (fr) | 2002-03-28 |
Family
ID=26600443
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2001/008083 WO2002025746A1 (fr) | 2000-09-21 | 2001-09-17 | Element emetteur de lumiere a semiconducteur de nitrure et dispositif optique contenant cet element |
Country Status (4)
Country | Link |
---|---|
US (1) | US7012283B2 (ja) |
EP (1) | EP1335434A4 (ja) |
KR (2) | KR100550158B1 (ja) |
WO (1) | WO2002025746A1 (ja) |
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WO2003089694A1 (en) | 2002-04-15 | 2003-10-30 | The Regents Of The University Of California | NON-POLAR (A1,B,In,Ga) QUANTUM WELL AND HETEROSTRUCTURE MATERIALS AND DEVICES |
US8809867B2 (en) | 2002-04-15 | 2014-08-19 | The Regents Of The University Of California | Dislocation reduction in non-polar III-nitride thin films |
US6927412B2 (en) * | 2002-11-21 | 2005-08-09 | Ricoh Company, Ltd. | Semiconductor light emitter |
JP2005191530A (ja) * | 2003-12-03 | 2005-07-14 | Sumitomo Electric Ind Ltd | 発光装置 |
JP2005203520A (ja) * | 2004-01-14 | 2005-07-28 | Sumitomo Electric Ind Ltd | 半導体発光素子 |
DE102005005635A1 (de) * | 2004-08-31 | 2006-03-02 | Osram Opto Semiconductors Gmbh | Strahlungsemittierendes optoelektronisches Bauelement mit einer Quantentopfstruktur und Verfahren zu dessen Herstellung |
US7309144B2 (en) * | 2004-09-21 | 2007-12-18 | Avago Technologies Ecbu Ip (Singapore) Pte Ltd | Stacked light source |
US7737459B2 (en) | 2004-09-22 | 2010-06-15 | Cree, Inc. | High output group III nitride light emitting diodes |
US8368183B2 (en) * | 2004-11-02 | 2013-02-05 | Sharp Kabushiki Kaisha | Nitride semiconductor device |
US7652299B2 (en) * | 2005-02-14 | 2010-01-26 | Showa Denko K.K. | Nitride semiconductor light-emitting device and method for fabrication thereof |
JP2006294975A (ja) * | 2005-04-13 | 2006-10-26 | Mitsubishi Electric Corp | 半導体レーザ |
US20070045638A1 (en) * | 2005-08-24 | 2007-03-01 | Lumileds Lighting U.S., Llc | III-nitride light emitting device with double heterostructure light emitting region |
JP5191650B2 (ja) * | 2005-12-16 | 2013-05-08 | シャープ株式会社 | 窒化物半導体発光素子および窒化物半導体発光素子の製造方法 |
KR100853241B1 (ko) * | 2005-12-16 | 2008-08-20 | 샤프 가부시키가이샤 | 질화물 반도체 발광소자 및 질화물 반도체 레이저 소자의제조방법 |
JP5053102B2 (ja) * | 2006-01-11 | 2012-10-17 | パナソニック株式会社 | 窒化物半導体発光素子、窒化物半導体発光装置及びその製造方法 |
KR20080086905A (ko) | 2006-01-20 | 2008-09-26 | 마쯔시다덴기산교 가부시키가이샤 | 반도체 발광 소자, ⅲ족 질화물 반도체 기판, 및 그 제조방법 |
JP5004597B2 (ja) | 2006-03-06 | 2012-08-22 | シャープ株式会社 | 窒化物半導体発光素子および窒化物半導体発光素子の製造方法 |
JP5430826B2 (ja) | 2006-03-08 | 2014-03-05 | シャープ株式会社 | 窒化物半導体レーザ素子 |
JP4444304B2 (ja) * | 2006-04-24 | 2010-03-31 | シャープ株式会社 | 窒化物半導体発光素子および窒化物半導体発光素子の製造方法 |
US7847306B2 (en) * | 2006-10-23 | 2010-12-07 | Hong Kong Applied Science and Technology Research Insitute Company, Ltd. | Light emitting diode device, method of fabrication and use thereof |
US20080101062A1 (en) * | 2006-10-27 | 2008-05-01 | Hong Kong Applied Science and Technology Research Institute Company Limited | Lighting device for projecting a beam of light |
KR101344477B1 (ko) | 2007-01-18 | 2014-02-17 | 삼성전자주식회사 | 반도체 광소자 및 그 제조 방법 |
TW200834969A (en) * | 2007-02-13 | 2008-08-16 | Epistar Corp | Light-emitting diode and method for manufacturing the same |
US20090034977A1 (en) * | 2007-07-30 | 2009-02-05 | Michael Renne Ty Tan | MULTIPLEXING HIGH SPEED LIGHT EMITTING DIODES (LEDs) |
US8044381B2 (en) | 2007-07-30 | 2011-10-25 | Hewlett-Packard Development Company, L.P. | Light emitting diode (LED) |
JP4475358B1 (ja) * | 2008-08-04 | 2010-06-09 | 住友電気工業株式会社 | GaN系半導体光素子、GaN系半導体光素子を作製する方法、及びエピタキシャルウエハ |
JP5196160B2 (ja) * | 2008-10-17 | 2013-05-15 | 日亜化学工業株式会社 | 半導体発光素子 |
JP2010219376A (ja) * | 2009-03-18 | 2010-09-30 | Sharp Corp | 窒化物半導体発光素子の製造方法 |
JP5004989B2 (ja) * | 2009-03-27 | 2012-08-22 | シャープ株式会社 | 窒化物半導体発光素子及びその製造方法、並びに、半導体光学装置 |
US20110042646A1 (en) * | 2009-08-21 | 2011-02-24 | Sharp Kabushiki Kaisha | Nitride semiconductor wafer, nitride semiconductor chip, method of manufacture thereof, and semiconductor device |
US8575471B2 (en) * | 2009-08-31 | 2013-11-05 | Alliance For Sustainable Energy, Llc | Lattice matched semiconductor growth on crystalline metallic substrates |
US8961687B2 (en) * | 2009-08-31 | 2015-02-24 | Alliance For Sustainable Energy, Llc | Lattice matched crystalline substrates for cubic nitride semiconductor growth |
US8507365B2 (en) * | 2009-12-21 | 2013-08-13 | Alliance For Sustainable Energy, Llc | Growth of coincident site lattice matched semiconductor layers and devices on crystalline substrates |
KR101422452B1 (ko) * | 2009-12-21 | 2014-07-22 | 가부시끼가이샤 도시바 | 질화물 반도체 발광 소자 및 그 제조 방법 |
KR101028286B1 (ko) * | 2009-12-28 | 2011-04-11 | 엘지이노텍 주식회사 | 반도체 발광소자 및 그 제조방법 |
KR101041625B1 (ko) * | 2010-01-27 | 2011-06-16 | 주식회사 스필 | 크기 변경이 용이한 전자식 스위치 아웃렛 박스 |
WO2012074524A1 (en) | 2010-12-01 | 2012-06-07 | Alliance For Sustainable Energy, Llc | Coincident site lattice-matched growth of semiconductors on substrates using compliant buffer layers |
US9041027B2 (en) | 2010-12-01 | 2015-05-26 | Alliance For Sustainable Energy, Llc | Methods of producing free-standing semiconductors using sacrificial buffer layers and recyclable substrates |
US9755023B2 (en) * | 2011-09-30 | 2017-09-05 | The University Of Kentucky Research Foundation | Photoelectrochemical cell including Ga(Sbx)N1-x semiconductor electrode |
WO2013093581A1 (en) * | 2011-12-23 | 2013-06-27 | Soitec | Methods of fabricating dilute nitride semiconductor materials for use in photoactive devices and related structures |
DE112012005422T5 (de) | 2011-12-23 | 2014-09-25 | Soitec | Verfahren zum Bilden von Verdünnt-Nitrid-Materialien zur Verwendung in fotoaktiven Vorrichtungen und zugehörige Strukturen |
KR101376976B1 (ko) * | 2012-06-29 | 2014-03-21 | 인텔렉추얼디스커버리 주식회사 | 반도체 발광 디바이스 |
JP2019186262A (ja) * | 2018-04-02 | 2019-10-24 | ウシオオプトセミコンダクター株式会社 | 窒化物半導体発光素子 |
JP2020120051A (ja) | 2019-01-25 | 2020-08-06 | 株式会社リコー | 窒化物半導体多層構造、発光素子、光源装置及び窒化物半導体多層構造の製造方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH08316581A (ja) * | 1995-05-18 | 1996-11-29 | Sanyo Electric Co Ltd | 半導体装置および半導体発光素子 |
JPH11150294A (ja) * | 1997-11-17 | 1999-06-02 | Hitachi Ltd | 半導体発光素子 |
JPH11204880A (ja) * | 1998-01-16 | 1999-07-30 | Fuji Photo Film Co Ltd | 半導体レーザー |
JPH11284282A (ja) * | 1998-03-31 | 1999-10-15 | Fuji Photo Film Co Ltd | 短波長発光素子 |
JP2000183399A (ja) * | 1998-12-11 | 2000-06-30 | Furukawa Electric Co Ltd:The | GaN系化合物半導体発光素子 |
US20010002048A1 (en) * | 1999-11-30 | 2001-05-31 | Masayoshi Koike | Light-emitting device using group III nitride group compound semiconductor |
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US6072197A (en) * | 1996-02-23 | 2000-06-06 | Fujitsu Limited | Semiconductor light emitting device with an active layer made of semiconductor having uniaxial anisotropy |
JP3448450B2 (ja) * | 1996-04-26 | 2003-09-22 | 三洋電機株式会社 | 発光素子およびその製造方法 |
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JP3282175B2 (ja) * | 1997-02-04 | 2002-05-13 | 日亜化学工業株式会社 | 窒化物半導体素子 |
JPH10242585A (ja) | 1997-02-28 | 1998-09-11 | Hitachi Ltd | 半導体発光素子 |
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JPH11135838A (ja) * | 1997-10-20 | 1999-05-21 | Ind Technol Res Inst | 白色発光ダイオード及びその製造方法 |
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JP4629178B2 (ja) | 1998-10-06 | 2011-02-09 | 日亜化学工業株式会社 | 窒化物半導体素子 |
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-
2001
- 2001-09-17 WO PCT/JP2001/008083 patent/WO2002025746A1/ja not_active Application Discontinuation
- 2001-09-17 KR KR1020037004167A patent/KR100550158B1/ko not_active IP Right Cessation
- 2001-09-17 US US10/381,113 patent/US7012283B2/en not_active Expired - Fee Related
- 2001-09-17 EP EP01965685A patent/EP1335434A4/en not_active Withdrawn
- 2001-09-17 KR KR1020057012001A patent/KR100591705B1/ko not_active IP Right Cessation
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH08316581A (ja) * | 1995-05-18 | 1996-11-29 | Sanyo Electric Co Ltd | 半導体装置および半導体発光素子 |
JPH11150294A (ja) * | 1997-11-17 | 1999-06-02 | Hitachi Ltd | 半導体発光素子 |
JPH11204880A (ja) * | 1998-01-16 | 1999-07-30 | Fuji Photo Film Co Ltd | 半導体レーザー |
JPH11284282A (ja) * | 1998-03-31 | 1999-10-15 | Fuji Photo Film Co Ltd | 短波長発光素子 |
JP2000183399A (ja) * | 1998-12-11 | 2000-06-30 | Furukawa Electric Co Ltd:The | GaN系化合物半導体発光素子 |
US20010002048A1 (en) * | 1999-11-30 | 2001-05-31 | Masayoshi Koike | Light-emitting device using group III nitride group compound semiconductor |
Also Published As
Publication number | Publication date |
---|---|
EP1335434A1 (en) | 2003-08-13 |
US20040026710A1 (en) | 2004-02-12 |
KR20030033114A (ko) | 2003-04-30 |
KR100591705B1 (ko) | 2006-06-20 |
KR100550158B1 (ko) | 2006-02-08 |
US7012283B2 (en) | 2006-03-14 |
EP1335434A4 (en) | 2008-10-15 |
KR20050075456A (ko) | 2005-07-20 |
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