TWI850134B - 工程基板結構之製造方法 - Google Patents

工程基板結構之製造方法 Download PDF

Info

Publication number
TWI850134B
TWI850134B TW112140126A TW112140126A TWI850134B TW I850134 B TWI850134 B TW I850134B TW 112140126 A TW112140126 A TW 112140126A TW 112140126 A TW112140126 A TW 112140126A TW I850134 B TWI850134 B TW I850134B
Authority
TW
Taiwan
Prior art keywords
layer
ceramic substrate
bonding layer
bonding
single crystal
Prior art date
Application number
TW112140126A
Other languages
English (en)
Chinese (zh)
Other versions
TW202406024A (zh
Inventor
弗拉基米爾 歐迪諾布魯朵夫
山姆 巴斯賽利
薛瑞 法倫斯
Original Assignee
美商克若密斯股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 美商克若密斯股份有限公司 filed Critical 美商克若密斯股份有限公司
Publication of TW202406024A publication Critical patent/TW202406024A/zh
Application granted granted Critical
Publication of TWI850134B publication Critical patent/TWI850134B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/0237Materials
    • H01L21/0242Crystalline insulating materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/20Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
    • H01L21/2003Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy characterised by the substrate
    • H01L21/2007Bonding of semiconductor wafers to insulating substrates or to semiconducting substrates using an intermediate insulating layer
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • C23C16/401Oxides containing silicon
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/56After-treatment
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/40AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403AIII-nitrides
    • C30B29/406Gallium nitride
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/02428Structure
    • H01L21/0243Surface structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02436Intermediate layers between substrates and deposited layers
    • H01L21/02439Materials
    • H01L21/02441Group 14 semiconducting materials
    • H01L21/0245Silicon, silicon germanium, germanium
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02436Intermediate layers between substrates and deposited layers
    • H01L21/02516Crystal orientation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02524Group 14 semiconducting materials
    • H01L21/02532Silicon, silicon germanium, germanium
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02538Group 13/15 materials
    • H01L21/0254Nitrides
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
    • H10H20/0137Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/815Bodies having stress relaxation structures, e.g. buffer layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/819Bodies characterised by their shape, e.g. curved or truncated substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/84Coatings, e.g. passivation layers or antireflective coatings
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/40AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403AIII-nitrides
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/018Bonding of wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/034Manufacture or treatment of coatings

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Recrystallisation Techniques (AREA)
  • Laminated Bodies (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Prostheses (AREA)
TW112140126A 2016-06-24 2017-06-13 工程基板結構之製造方法 TWI850134B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201662354623P 2016-06-24 2016-06-24
US62/354,623 2016-06-24

Publications (2)

Publication Number Publication Date
TW202406024A TW202406024A (zh) 2024-02-01
TWI850134B true TWI850134B (zh) 2024-07-21

Family

ID=60784362

Family Applications (5)

Application Number Title Priority Date Filing Date
TW112140126A TWI850134B (zh) 2016-06-24 2017-06-13 工程基板結構之製造方法
TW112103239A TWI823763B (zh) 2016-06-24 2017-06-13 工程基板結構
TW111118186A TWI795293B (zh) 2016-06-24 2017-06-13 工程基板結構
TW110125436A TWI767788B (zh) 2016-06-24 2017-06-13 工程基板結構
TW106119603A TWI734794B (zh) 2016-06-24 2017-06-13 多晶陶瓷基板及其製造方法

Family Applications After (4)

Application Number Title Priority Date Filing Date
TW112103239A TWI823763B (zh) 2016-06-24 2017-06-13 工程基板結構
TW111118186A TWI795293B (zh) 2016-06-24 2017-06-13 工程基板結構
TW110125436A TWI767788B (zh) 2016-06-24 2017-06-13 工程基板結構
TW106119603A TWI734794B (zh) 2016-06-24 2017-06-13 多晶陶瓷基板及其製造方法

Country Status (8)

Country Link
US (6) US10134589B2 (enExample)
EP (2) EP3475975B1 (enExample)
JP (4) JP6719600B2 (enExample)
KR (4) KR102747292B1 (enExample)
CN (2) CN116936703A (enExample)
SG (1) SG11201811295TA (enExample)
TW (5) TWI850134B (enExample)
WO (1) WO2017222873A1 (enExample)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107406335B (zh) * 2016-03-22 2020-12-08 住友电气工业株式会社 陶瓷基板、层叠体和saw器件
US10290674B2 (en) 2016-04-22 2019-05-14 QROMIS, Inc. Engineered substrate including light emitting diode and power circuitry
US10297445B2 (en) * 2016-06-14 2019-05-21 QROMIS, Inc. Engineered substrate structure for power and RF applications
TWI850134B (zh) 2016-06-24 2024-07-21 美商克若密斯股份有限公司 工程基板結構之製造方法
US10622468B2 (en) * 2017-02-21 2020-04-14 QROMIS, Inc. RF device integrated on an engineered substrate
US10411108B2 (en) 2017-03-29 2019-09-10 QROMIS, Inc. Vertical gallium nitride Schottky diode
TWI789420B (zh) * 2017-08-31 2023-01-11 美商康寧公司 可攜式電子裝置的外殼及製造其之方法
CN110473919A (zh) * 2018-05-11 2019-11-19 世界先进积体电路股份有限公司 半导体结构、高电子迁移率晶体管及半导体结构制造方法
CN110752251A (zh) * 2018-07-24 2020-02-04 兆远科技股份有限公司 复合衬底及其制造方法
TWI736962B (zh) * 2019-01-31 2021-08-21 財團法人工業技術研究院 複合式基板及其製造方法
US11688825B2 (en) 2019-01-31 2023-06-27 Industrial Technology Research Institute Composite substrate and light-emitting diode
CN111509095B (zh) * 2019-01-31 2022-01-04 财团法人工业技术研究院 复合式基板及其制造方法
TWI706563B (zh) * 2019-03-25 2020-10-01 世界先進積體電路股份有限公司 半導體結構、高電子遷移率電晶體及半導體結構的製造方法
CN111785773A (zh) * 2019-04-04 2020-10-16 世界先进积体电路股份有限公司 半导体结构、高电子迁移率晶体管及半导体结构制造方法
US10790143B1 (en) 2019-07-03 2020-09-29 Vanguard International Semiconductor Corporation Semiconductor structure, high electron mobility transistor, and method for fabricating semiconductor structure
US12046502B2 (en) * 2019-09-09 2024-07-23 Watlow Electric Manufacturing Company Electrostatic puck and method of manufacture
KR102789020B1 (ko) * 2019-12-19 2025-04-01 삼성전기주식회사 전자부품 내장기판
JP7701364B2 (ja) 2020-02-11 2025-07-01 クロミス,インコーポレイテッド スパッタリングされたマグネシウム源を使用して窒化ガリウム材料中のマグネシウムを拡散させるための方法およびシステム
JP7319227B2 (ja) * 2020-05-11 2023-08-01 信越化学工業株式会社 Iii-v族化合物結晶用ベース基板及びその製造方法
CN115698391A (zh) * 2020-06-09 2023-02-03 信越化学工业株式会社 Iii族氮化物系外延生长用基板及其制造方法
JP7368336B2 (ja) * 2020-09-30 2023-10-24 信越半導体株式会社 紫外線発光素子用金属貼り合わせ基板の製造方法、及び紫外線発光素子の製造方法
US11462402B2 (en) * 2020-10-21 2022-10-04 Cornell University Suboxide molecular-beam epitaxy and related structures
EP4306689A4 (en) * 2021-03-10 2025-06-25 Shin-Etsu Chemical Co., Ltd. SEED SUBSTRATE FOR USE IN EPITAXIAL GROWTH AND METHOD FOR MANUFACTURING SAME, AND SEMICONDUCTOR SUBSTRATE AND METHOD FOR MANUFACTURING SAME
JP7755451B2 (ja) * 2021-10-27 2025-10-16 信越化学工業株式会社 エピタキシャル成長用種基板およびその製造方法、ならびに半導体基板およびその製造方法
JP7657530B2 (ja) * 2021-12-28 2025-04-07 信越化学工業株式会社 高特性エピタキシャル成長用基板とその製造方法
CN116230643A (zh) * 2023-03-09 2023-06-06 东科半导体(安徽)股份有限公司 GaN器件用陶瓷基板及其制备方法和GaN器件及其制备方法
WO2025117418A1 (en) * 2023-11-30 2025-06-05 Applied Materials, Inc. Methods for enabling chemical mechanical polishing and bonding of aluminum-containing materials
WO2025147360A1 (en) * 2024-01-03 2025-07-10 The Board Of Trustees Of The Leland Stanford Junior University. Devices and methods involving a diffusion-dopant profile in semiconductor devices

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070269604A1 (en) * 2006-01-13 2007-11-22 Daniel Francis Method for manufacturing smooth diamond heat sinks
US8927346B2 (en) * 2008-12-31 2015-01-06 Hewlett-Packard Development Company, L.P. Electrically and/or thermally actuated device
US9082692B2 (en) * 2013-01-02 2015-07-14 Micron Technology, Inc. Engineered substrate assemblies with epitaxial templates and related systems, methods, and devices

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH668071A5 (de) 1985-05-21 1988-11-30 Lonza Ag Thiophenonderivate sowie verfahren zur deren herstellung.
JP2631118B2 (ja) * 1988-01-29 1997-07-16 京セラ株式会社 セラミック配線基板の製造方法
JPH0794354B2 (ja) * 1990-06-08 1995-10-11 東海カーボン株式会社 耐酸化性c/c材とその製造方法
JPH0826841A (ja) * 1994-07-11 1996-01-30 Toshiba Corp セラミックス接合体の製造方法およびセラミックス接合体
JP3989027B2 (ja) * 1994-07-12 2007-10-10 テキサス インスツルメンツ インコーポレイテツド キャパシタ及びその製造方法
US5472370A (en) * 1994-07-29 1995-12-05 University Of Arkansas Method of planarizing polycrystalline diamonds, planarized polycrystalline diamonds and products made therefrom
JPH0888153A (ja) * 1994-09-19 1996-04-02 Toshiba Corp 積層構造ウェハおよびその形成方法
TW274625B (enExample) * 1994-09-30 1996-04-21 Hitachi Seisakusyo Kk
JP3430733B2 (ja) * 1994-09-30 2003-07-28 株式会社日立製作所 研磨剤及び研磨方法
JP3012785B2 (ja) * 1995-07-14 2000-02-28 松下電子工業株式会社 容量素子
TW410435B (en) * 1998-06-30 2000-11-01 United Microelectronics Corp The metal interconnection manufacture by using the chemical mechanical polishing process
JP2001097787A (ja) * 1999-10-01 2001-04-10 Murata Mfg Co Ltd 平坦化膜の形成方法、セラミック基板、および電子部品
JP2001194490A (ja) 2000-01-05 2001-07-19 Mitsubishi Heavy Ind Ltd 換気空調設備及び換気空調方法
US20030013211A1 (en) * 2001-07-13 2003-01-16 Chu-Chun Hu Mend method for breakage dielectric film
US6534326B1 (en) * 2002-03-13 2003-03-18 Sharp Laboratories Of America, Inc. Method of minimizing leakage current and improving breakdown voltage of polycrystalline memory thin films
JP2004042883A (ja) 2002-05-14 2004-02-12 Aisin Seiki Co Ltd バンパ装置
US6989314B2 (en) * 2003-02-12 2006-01-24 S.O.I.Tec Silicon On Insulator Technologies S.A. Semiconductor structure and method of making same
FR2851079B1 (fr) * 2003-02-12 2005-08-26 Soitec Silicon On Insulator Structure semi-conductrice sur substrat a forte rugosite
JP4759919B2 (ja) * 2004-01-16 2011-08-31 セイコーエプソン株式会社 電気光学装置の製造方法
JP4237152B2 (ja) * 2005-03-04 2009-03-11 エルピーダメモリ株式会社 半導体装置の製造方法
WO2006116030A2 (en) * 2005-04-21 2006-11-02 Aonex Technologies, Inc. Bonded intermediate substrate and method of making same
US7268051B2 (en) * 2005-08-26 2007-09-11 Corning Incorporated Semiconductor on glass insulator with deposited barrier layer
US8435879B2 (en) * 2005-12-12 2013-05-07 Kyma Technologies, Inc. Method for making group III nitride articles
EP1901345A1 (en) 2006-08-30 2008-03-19 Siltronic AG Multilayered semiconductor wafer and process for manufacturing the same
FR2910702B1 (fr) * 2006-12-26 2009-04-03 Soitec Silicon On Insulator Procede de fabrication d'un substrat mixte
JP2008263010A (ja) * 2007-04-11 2008-10-30 Shin Etsu Chem Co Ltd Soi基板の製造方法
JP5459899B2 (ja) * 2007-06-01 2014-04-02 株式会社半導体エネルギー研究所 半導体装置の作製方法
FR2917232B1 (fr) * 2007-06-06 2009-10-09 Soitec Silicon On Insulator Procede de fabrication d'une structure pour epitaxie sans zone d'exclusion.
JP4693855B2 (ja) 2008-03-06 2011-06-01 株式会社フジクラ 半導体パッケージ及びその製造方法
JP5628530B2 (ja) * 2010-02-10 2014-11-19 株式会社ブリヂストン 貼り合わせ基板用支持基板およびその製造方法
US20110221039A1 (en) * 2010-03-12 2011-09-15 Sinmat, Inc. Defect capping for reduced defect density epitaxial articles
US8497185B2 (en) * 2011-03-07 2013-07-30 Sumitomo Electric Industries, Ltd. Method of manufacturing semiconductor wafer, and composite base and composite substrate for use in that method
US8987728B2 (en) 2011-03-25 2015-03-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method of manufacturing semiconductor device
US20120266810A1 (en) * 2011-04-20 2012-10-25 Taiwan Semiconductor Manufacturing Company, Ltd. Planarization system for high wafer topography
US9659799B2 (en) 2012-08-28 2017-05-23 Asm Ip Holding B.V. Systems and methods for dynamic semiconductor process scheduling
EP2946410A4 (en) * 2013-01-16 2016-08-03 Qmat Inc METHOD FOR PRODUCING OPTOELECTRONIC DEVICES
US8709901B1 (en) * 2013-04-17 2014-04-29 United Microelectronics Corp. Method of forming an isolation structure
JP2014216555A (ja) * 2013-04-26 2014-11-17 株式会社豊田自動織機 半導体基板の製造方法
KR102142709B1 (ko) * 2013-12-05 2020-08-07 엘지이노텍 주식회사 발광 소자 및 이를 구비한 조명 장치
CN112759278A (zh) * 2013-12-22 2021-05-07 应用材料公司 用于紫外线光刻的玻璃陶瓷及其制造方法
JP6509596B2 (ja) 2014-03-18 2019-05-08 株式会社半導体エネルギー研究所 半導体装置
US9368342B2 (en) * 2014-04-14 2016-06-14 Globalfoundries Inc. Defect-free relaxed covering layer on semiconductor substrate with lattice mismatch
US9373761B2 (en) * 2014-09-23 2016-06-21 Osram Sylvania Inc. Patterned thin-film wavelength converter and method of making same
JP6208646B2 (ja) * 2014-09-30 2017-10-04 信越化学工業株式会社 貼り合わせ基板とその製造方法、および貼り合わせ用支持基板
FR3027451B1 (fr) * 2014-10-21 2016-11-04 Soitec Silicon On Insulator Substrat et procede de fabrication d'un substrat
TWI850134B (zh) 2016-06-24 2024-07-21 美商克若密斯股份有限公司 工程基板結構之製造方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070269604A1 (en) * 2006-01-13 2007-11-22 Daniel Francis Method for manufacturing smooth diamond heat sinks
US8927346B2 (en) * 2008-12-31 2015-01-06 Hewlett-Packard Development Company, L.P. Electrically and/or thermally actuated device
US9082692B2 (en) * 2013-01-02 2015-07-14 Micron Technology, Inc. Engineered substrate assemblies with epitaxial templates and related systems, methods, and devices

Also Published As

Publication number Publication date
JP7169321B2 (ja) 2022-11-10
JP2019524615A (ja) 2019-09-05
SG11201811295TA (en) 2019-01-30
JP7611208B2 (ja) 2025-01-09
US12224173B2 (en) 2025-02-11
KR102747292B1 (ko) 2024-12-27
US20210183642A1 (en) 2021-06-17
KR102391997B1 (ko) 2022-04-28
US20180047557A1 (en) 2018-02-15
US10566190B2 (en) 2020-02-18
US10134589B2 (en) 2018-11-20
EP3475975A1 (en) 2019-05-01
US20220059341A1 (en) 2022-02-24
KR20190020336A (ko) 2019-02-28
TWI795293B (zh) 2023-03-01
TWI734794B (zh) 2021-08-01
TW202234596A (zh) 2022-09-01
KR102582390B1 (ko) 2023-09-25
EP3985718A1 (en) 2022-04-20
CN109716508B (zh) 2023-08-15
US20250149333A1 (en) 2025-05-08
WO2017222873A1 (en) 2017-12-28
TWI767788B (zh) 2022-06-11
US12315721B2 (en) 2025-05-27
JP6719600B2 (ja) 2020-07-08
KR20220058653A (ko) 2022-05-09
TWI823763B (zh) 2023-11-21
EP3475975A4 (en) 2020-03-11
KR20230156078A (ko) 2023-11-13
TW202406024A (zh) 2024-02-01
JP2020161833A (ja) 2020-10-01
US20190115208A1 (en) 2019-04-18
CN109716508A (zh) 2019-05-03
US20200234945A1 (en) 2020-07-23
TW202322288A (zh) 2023-06-01
JP2025003942A (ja) 2025-01-14
KR20250021329A (ko) 2025-02-12
US10964535B2 (en) 2021-03-30
JP2023017856A (ja) 2023-02-07
CN116936703A (zh) 2023-10-24
EP3475975B1 (en) 2021-12-15
TW201810543A (zh) 2018-03-16
TW202141706A (zh) 2021-11-01

Similar Documents

Publication Publication Date Title
TWI850134B (zh) 工程基板結構之製造方法
JP7631461B2 (ja) 電力およびrf用途用の設計された基板構造
TW202545359A (zh) 用於功率及rf應用的工程基板結構