TWI822931B - 包含樹脂的複合基板的磨削方法和磨削裝置 - Google Patents
包含樹脂的複合基板的磨削方法和磨削裝置 Download PDFInfo
- Publication number
- TWI822931B TWI822931B TW108146967A TW108146967A TWI822931B TW I822931 B TWI822931 B TW I822931B TW 108146967 A TW108146967 A TW 108146967A TW 108146967 A TW108146967 A TW 108146967A TW I822931 B TWI822931 B TW I822931B
- Authority
- TW
- Taiwan
- Prior art keywords
- grinding
- composite substrate
- pressure water
- water supply
- resin
- Prior art date
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/04—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor involving a rotary work-table
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/02—Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0076—Other grinding machines or devices grinding machines comprising two or more grinding tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
- B24B41/061—Work supports, e.g. adjustable steadies axially supporting turning workpieces, e.g. magnetically, pneumatically
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B47/00—Drives or gearings; Equipment therefor
- B24B47/10—Drives or gearings; Equipment therefor for rotating or reciprocating working-spindles carrying grinding wheels or workpieces
- B24B47/12—Drives or gearings; Equipment therefor for rotating or reciprocating working-spindles carrying grinding wheels or workpieces by mechanical gearing or electric power
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/06—Dust extraction equipment on grinding or polishing machines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0428—Apparatus for mechanical treatment or grinding or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/06—Planarisation of inorganic insulating materials
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018238095A JP7270373B2 (ja) | 2018-12-20 | 2018-12-20 | 樹脂を含む複合基板の研削方法及び研削装置 |
| JP2018-238095 | 2018-12-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202103842A TW202103842A (zh) | 2021-02-01 |
| TWI822931B true TWI822931B (zh) | 2023-11-21 |
Family
ID=71099076
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW108146967A TWI822931B (zh) | 2018-12-20 | 2019-12-20 | 包含樹脂的複合基板的磨削方法和磨削裝置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11745299B2 (https=) |
| JP (1) | JP7270373B2 (https=) |
| KR (1) | KR102799435B1 (https=) |
| CN (1) | CN111347304B (https=) |
| TW (1) | TWI822931B (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7451324B2 (ja) * | 2020-06-26 | 2024-03-18 | 株式会社荏原製作所 | 基板処理装置および基板処理方法 |
| JP7648403B2 (ja) * | 2021-02-19 | 2025-03-18 | 株式会社岡本工作機械製作所 | 研削方法及び研削装置 |
| JP7831971B2 (ja) * | 2021-09-06 | 2026-03-17 | 株式会社ディスコ | チップの製造方法 |
| CN116921306B (zh) * | 2022-03-30 | 2025-11-07 | 华为技术有限公司 | 一种清洗装置 |
| JP2023158692A (ja) * | 2022-04-19 | 2023-10-31 | 株式会社ディスコ | 被加工物の研削方法 |
| CN121083522A (zh) * | 2025-05-26 | 2025-12-09 | 华海清科(北京)科技有限公司 | 磨轮自锐性增强方法、装置及晶圆减薄设备 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014028425A (ja) * | 2012-06-27 | 2014-02-13 | Okamoto Machine Tool Works Ltd | 半導体デバイス基板の研削方法 |
| TW201544235A (zh) * | 2014-03-12 | 2015-12-01 | 迪思科股份有限公司 | 加工方法 |
| US20170207108A1 (en) * | 2016-01-18 | 2017-07-20 | Samsung Electronics Co., Ltd. | Substrate thinning apparatus, method of thinning substrate by using the same, and method of fabricating semiconductor package |
| TW201842596A (zh) * | 2017-03-31 | 2018-12-01 | 日商琳得科股份有限公司 | 半導體裝置之製造方法及黏著薄片 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3366061B2 (ja) * | 1993-06-30 | 2003-01-14 | 澄夫 田中 | 両面研磨機定盤の洗浄装置 |
| JP2005246491A (ja) | 2004-03-01 | 2005-09-15 | Disco Abrasive Syst Ltd | 研削装置及びウェーハの研削方法 |
| KR100753302B1 (ko) * | 2004-03-25 | 2007-08-29 | 이비덴 가부시키가이샤 | 진공 척, 흡착판, 연마 장치 및 반도체 웨이퍼의 제조 방법 |
| JP2007157930A (ja) * | 2005-12-02 | 2007-06-21 | Tokyo Seimitsu Co Ltd | ウェーハ洗浄装置 |
| JP5084050B2 (ja) | 2008-07-31 | 2012-11-28 | 株式会社Aquapass | 物品表面の小径の孔・袋穴の洗浄方法 |
| JP6166106B2 (ja) | 2013-06-14 | 2017-07-19 | 株式会社ディスコ | サファイア基板の加工方法 |
| JP5827277B2 (ja) | 2013-08-02 | 2015-12-02 | 株式会社岡本工作機械製作所 | 半導体装置の製造方法 |
| JP6205619B2 (ja) * | 2013-11-07 | 2017-10-04 | 株式会社岡本工作機械製作所 | 再生半導体ウエハの製造方法 |
| JP6255254B2 (ja) | 2014-01-27 | 2017-12-27 | 株式会社ディスコ | バイト切削装置 |
| JP2016058655A (ja) * | 2014-09-11 | 2016-04-21 | 株式会社ジェイデバイス | 半導体装置の製造方法 |
| JP2017056522A (ja) | 2015-09-17 | 2017-03-23 | 株式会社ディスコ | 研削ホイール及び研削方法 |
| JP6671167B2 (ja) | 2015-12-16 | 2020-03-25 | 株式会社ディスコ | 積層基板の加工方法 |
| JP2017154186A (ja) | 2016-02-29 | 2017-09-07 | 株式会社ディスコ | 研削装置 |
| JP6850099B2 (ja) * | 2016-09-23 | 2021-03-31 | 株式会社岡本工作機械製作所 | 半導体装置の製造方法及び半導体製造装置 |
| JP7012454B2 (ja) * | 2017-04-27 | 2022-01-28 | 株式会社岡本工作機械製作所 | 静電吸着チャックの製造方法並びに半導体装置の製造方法 |
-
2018
- 2018-12-20 JP JP2018238095A patent/JP7270373B2/ja active Active
-
2019
- 2019-11-25 KR KR1020190151901A patent/KR102799435B1/ko active Active
- 2019-12-10 US US16/708,528 patent/US11745299B2/en active Active
- 2019-12-13 CN CN201911280524.XA patent/CN111347304B/zh active Active
- 2019-12-20 TW TW108146967A patent/TWI822931B/zh active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014028425A (ja) * | 2012-06-27 | 2014-02-13 | Okamoto Machine Tool Works Ltd | 半導体デバイス基板の研削方法 |
| TW201544235A (zh) * | 2014-03-12 | 2015-12-01 | 迪思科股份有限公司 | 加工方法 |
| US20170207108A1 (en) * | 2016-01-18 | 2017-07-20 | Samsung Electronics Co., Ltd. | Substrate thinning apparatus, method of thinning substrate by using the same, and method of fabricating semiconductor package |
| TW201842596A (zh) * | 2017-03-31 | 2018-12-01 | 日商琳得科股份有限公司 | 半導體裝置之製造方法及黏著薄片 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111347304B (zh) | 2023-12-22 |
| US20200198083A1 (en) | 2020-06-25 |
| US11745299B2 (en) | 2023-09-05 |
| TW202103842A (zh) | 2021-02-01 |
| JP7270373B2 (ja) | 2023-05-10 |
| KR20200077404A (ko) | 2020-06-30 |
| JP2020102481A (ja) | 2020-07-02 |
| CN111347304A (zh) | 2020-06-30 |
| KR102799435B1 (ko) | 2025-04-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI822931B (zh) | 包含樹脂的複合基板的磨削方法和磨削裝置 | |
| JP6850099B2 (ja) | 半導体装置の製造方法及び半導体製造装置 | |
| JP7391476B2 (ja) | 研削方法 | |
| JP2014028425A (ja) | 半導体デバイス基板の研削方法 | |
| JP6999322B2 (ja) | ウエーハの研削方法 | |
| JP5172457B2 (ja) | 研削装置及び研削方法 | |
| KR102725508B1 (ko) | 기판 연삭 장치 및 기판 연삭 방법 | |
| CN116237870A (zh) | 修整工具和修整方法 | |
| JP6189032B2 (ja) | 銀貫通電極付きセラミック基板の研削方法 | |
| TW202230504A (zh) | 被加工物之研削方法 | |
| US12358099B2 (en) | Dressing ring | |
| JP6680639B2 (ja) | 加工方法 | |
| CN116038462A (zh) | 一种晶圆减薄方法及减薄装置 | |
| JP2023180612A (ja) | 被加工物の研削方法 | |
| JP7766435B2 (ja) | 基板研削装置及び基板研削方法 | |
| JP7783076B2 (ja) | 被加工物の研削方法 | |
| JP7764264B2 (ja) | 被加工物の加工方法 | |
| US20220274224A1 (en) | Grinding method for workpiece | |
| JP7736591B2 (ja) | 被加工物の研削方法 | |
| CN114650895B (zh) | 研磨系统 | |
| JP2020078835A (ja) | 切削ブレードのドレッシング方法及びドレッサーボード | |
| JP2006198737A (ja) | ビトリファイドボンド砥石 | |
| JP2023180487A (ja) | 搬送ユニット及び加工装置 | |
| TW202239518A (zh) | 磨削方法 | |
| KR20050042386A (ko) | 드레서 세정장치 |