TWI805823B - 基板供給系統及基板加工裝置 - Google Patents
基板供給系統及基板加工裝置 Download PDFInfo
- Publication number
- TWI805823B TWI805823B TW108128524A TW108128524A TWI805823B TW I805823 B TWI805823 B TW I805823B TW 108128524 A TW108128524 A TW 108128524A TW 108128524 A TW108128524 A TW 108128524A TW I805823 B TWI805823 B TW I805823B
- Authority
- TW
- Taiwan
- Prior art keywords
- cassette
- substrate
- loading
- supply system
- wafer
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 181
- 238000003860 storage Methods 0.000 claims abstract description 208
- 230000007246 mechanism Effects 0.000 claims abstract description 157
- 238000000605 extraction Methods 0.000 claims abstract description 42
- 238000003475 lamination Methods 0.000 claims description 13
- 239000000284 extract Substances 0.000 claims description 6
- 235000012431 wafers Nutrition 0.000 description 185
- 230000032258 transport Effects 0.000 description 19
- 230000003028 elevating effect Effects 0.000 description 16
- 238000001514 detection method Methods 0.000 description 15
- 239000004065 semiconductor Substances 0.000 description 10
- 239000010408 film Substances 0.000 description 9
- 230000008878 coupling Effects 0.000 description 7
- 238000010168 coupling process Methods 0.000 description 7
- 238000005859 coupling reaction Methods 0.000 description 7
- 238000005520 cutting process Methods 0.000 description 5
- 238000002360 preparation method Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000007723 transport mechanism Effects 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Dicing (AREA)
- Separation, Sorting, Adjustment, Or Bending Of Sheets To Be Conveyed (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP2018-205614 | 2018-10-31 | ||
| JP2018205614 | 2018-10-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202018846A TW202018846A (zh) | 2020-05-16 |
| TWI805823B true TWI805823B (zh) | 2023-06-21 |
Family
ID=70463152
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW108128524A TWI805823B (zh) | 2018-10-31 | 2019-08-12 | 基板供給系統及基板加工裝置 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7432243B2 (enExample) |
| CN (1) | CN112912998A (enExample) |
| TW (1) | TWI805823B (enExample) |
| WO (1) | WO2020090518A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI718078B (zh) * | 2020-07-13 | 2021-02-01 | 環球晶圓股份有限公司 | 晶片承載裝置 |
| KR20250078502A (ko) * | 2023-02-03 | 2025-06-02 | 야마하하쓰도키 가부시키가이샤 | 레이저 가공 장치, 반도체칩 및 반도체칩의 제조 방법 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050245051A1 (en) * | 2002-04-01 | 2005-11-03 | Mitsuboshi Diamond Industrial Co., Ltd. | Parting method for fragile material substrate and parting device using the method |
| JP2009010287A (ja) * | 2007-06-29 | 2009-01-15 | Tokyo Electron Ltd | 基板の処理システム |
| TW200917356A (en) * | 2003-09-18 | 2009-04-16 | Nec Lcd Technologies Ltd | Method of processing substrate and chemical used in the |
| TW201201313A (en) * | 2010-06-23 | 2012-01-01 | Hitachi High Tech Corp | Vacuum processing apparatus |
| TW201816872A (zh) * | 2016-10-14 | 2018-05-01 | 日商迪思科股份有限公司 | 晶圓之加工方法 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6347036A (ja) * | 1986-08-15 | 1988-02-27 | Toshiba Corp | 物品の移載装置 |
| JP3054480B2 (ja) * | 1991-12-20 | 2000-06-19 | 株式会社日立製作所 | ペレットボンディング装置 |
| JPH0778794A (ja) * | 1993-06-22 | 1995-03-20 | Disco Abrasive Syst Ltd | ダイシング装置のカセットテーブル |
| JPH09199575A (ja) * | 1996-01-18 | 1997-07-31 | Toshiba Mechatronics Kk | 半導体ペレットボンディング装置 |
| JP5675378B2 (ja) * | 2011-01-13 | 2015-02-25 | 株式会社ディスコ | 樹脂塗布装置 |
| JP5686469B2 (ja) | 2011-01-28 | 2015-03-18 | 富士機械製造株式会社 | ダイ供給装置 |
| US9545724B2 (en) | 2013-03-14 | 2017-01-17 | Brooks Automation, Inc. | Tray engine with slide attached to an end effector base |
| JP2015138856A (ja) | 2014-01-22 | 2015-07-30 | 株式会社ディスコ | 切削装置 |
| JP2017175029A (ja) | 2016-03-25 | 2017-09-28 | 富士機械製造株式会社 | ウエハ搬送装置 |
-
2019
- 2019-08-12 TW TW108128524A patent/TWI805823B/zh active
- 2019-10-18 CN CN201980036023.9A patent/CN112912998A/zh active Pending
- 2019-10-18 JP JP2020553785A patent/JP7432243B2/ja active Active
- 2019-10-18 WO PCT/JP2019/041058 patent/WO2020090518A1/ja not_active Ceased
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050245051A1 (en) * | 2002-04-01 | 2005-11-03 | Mitsuboshi Diamond Industrial Co., Ltd. | Parting method for fragile material substrate and parting device using the method |
| TW200917356A (en) * | 2003-09-18 | 2009-04-16 | Nec Lcd Technologies Ltd | Method of processing substrate and chemical used in the |
| JP2009010287A (ja) * | 2007-06-29 | 2009-01-15 | Tokyo Electron Ltd | 基板の処理システム |
| TW201201313A (en) * | 2010-06-23 | 2012-01-01 | Hitachi High Tech Corp | Vacuum processing apparatus |
| TW201816872A (zh) * | 2016-10-14 | 2018-05-01 | 日商迪思科股份有限公司 | 晶圓之加工方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2020090518A1 (ja) | 2021-09-16 |
| TW202018846A (zh) | 2020-05-16 |
| JP7432243B2 (ja) | 2024-02-16 |
| CN112912998A (zh) | 2021-06-04 |
| WO2020090518A1 (ja) | 2020-05-07 |
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