TWI772601B - 切割裝置的設定方法 - Google Patents

切割裝置的設定方法 Download PDF

Info

Publication number
TWI772601B
TWI772601B TW108102468A TW108102468A TWI772601B TW I772601 B TWI772601 B TW I772601B TW 108102468 A TW108102468 A TW 108102468A TW 108102468 A TW108102468 A TW 108102468A TW I772601 B TWI772601 B TW I772601B
Authority
TW
Taiwan
Prior art keywords
cutting
reference position
unit
contact
chuck table
Prior art date
Application number
TW108102468A
Other languages
English (en)
Chinese (zh)
Other versions
TW201932237A (zh
Inventor
笠井剛史
Original Assignee
日商迪思科股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商迪思科股份有限公司 filed Critical 日商迪思科股份有限公司
Publication of TW201932237A publication Critical patent/TW201932237A/zh
Application granted granted Critical
Publication of TWI772601B publication Critical patent/TWI772601B/zh

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • B28D5/0082Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/02Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
    • B28D5/022Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
TW108102468A 2018-01-26 2019-01-23 切割裝置的設定方法 TWI772601B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018-011497 2018-01-26
JP2018011497A JP6968501B2 (ja) 2018-01-26 2018-01-26 切削装置のセットアップ方法

Publications (2)

Publication Number Publication Date
TW201932237A TW201932237A (zh) 2019-08-16
TWI772601B true TWI772601B (zh) 2022-08-01

Family

ID=67412991

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108102468A TWI772601B (zh) 2018-01-26 2019-01-23 切割裝置的設定方法

Country Status (4)

Country Link
JP (1) JP6968501B2 (ja)
KR (1) KR102551970B1 (ja)
CN (1) CN110076917B (ja)
TW (1) TWI772601B (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7154336B2 (ja) * 2021-03-26 2022-10-17 Towa株式会社 切断装置、及び、切断品の製造方法
CN113140491B (zh) * 2021-05-26 2022-07-12 吉林华微电子股份有限公司 贴膜机和半导体器件生产系统

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1691302A (zh) * 2004-04-21 2005-11-02 株式会社迪思科 切削刀片的位置偏移的检测方法
US20070122926A1 (en) * 2001-04-10 2007-05-31 S.O.I.Tec Silicon On Insulator Technologies S.A. Substrate layer cutting device and method
CN103311114A (zh) * 2012-03-09 2013-09-18 株式会社迪思科 切削装置
CN104520040A (zh) * 2012-08-17 2015-04-15 伊利诺斯工具制品有限公司 样品制备锯
TW201544248A (zh) * 2014-04-25 2015-12-01 Disco Corp 切削裝置
CN106024709A (zh) * 2015-03-31 2016-10-12 株式会社迪思科 晶片的分割方法
TW201640607A (zh) * 2015-01-29 2016-11-16 Disco Corp 校準方法
TW201740452A (zh) * 2016-05-11 2017-11-16 Disco Corp 切割裝置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2890902B2 (ja) * 1991-06-20 1999-05-17 富士通株式会社 半導体装置の製造方法及び製造装置
GB9307761D0 (en) 1993-04-15 1993-06-02 Emhart Glass Mach Invest Glassware forming machine
JP3540474B2 (ja) * 1995-11-11 2004-07-07 株式会社ソディック ワイヤ放電加工装置の基準接触位置の位置決め方法及びその装置
JPH11345787A (ja) * 1998-06-01 1999-12-14 Disco Abrasive Syst Ltd ダイシング装置
JP2005203540A (ja) * 2004-01-15 2005-07-28 Disco Abrasive Syst Ltd ウエーハの切削方法
JP4594144B2 (ja) * 2005-03-28 2010-12-08 大日本スクリーン製造株式会社 検査装置および位置ずれ量取得方法
JP5122341B2 (ja) * 2008-03-26 2013-01-16 株式会社ディスコ 切削装置
JP2010184331A (ja) 2009-02-13 2010-08-26 Disco Abrasive Syst Ltd 保持テーブルおよび加工装置
JP5313026B2 (ja) 2009-04-17 2013-10-09 株式会社ディスコ 切削装置
JP2013258205A (ja) 2012-06-11 2013-12-26 Disco Abrasive Syst Ltd 切削装置
JP6078297B2 (ja) * 2012-10-31 2017-02-08 株式会社ディスコ 加工装置
JP6125867B2 (ja) 2013-03-26 2017-05-10 株式会社ディスコ 切削方法
JP6255285B2 (ja) * 2014-03-18 2017-12-27 株式会社ディスコ 検出方法
JP6422805B2 (ja) 2015-03-27 2018-11-14 株式会社ディスコ 切削装置
JP6356655B2 (ja) * 2015-12-10 2018-07-11 ファナック株式会社 加工屑を除去する機能を有する加工システム
JP6727699B2 (ja) * 2016-04-19 2020-07-22 株式会社ディスコ 切削装置のセットアップ方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070122926A1 (en) * 2001-04-10 2007-05-31 S.O.I.Tec Silicon On Insulator Technologies S.A. Substrate layer cutting device and method
CN1691302A (zh) * 2004-04-21 2005-11-02 株式会社迪思科 切削刀片的位置偏移的检测方法
CN103311114A (zh) * 2012-03-09 2013-09-18 株式会社迪思科 切削装置
CN104520040A (zh) * 2012-08-17 2015-04-15 伊利诺斯工具制品有限公司 样品制备锯
TW201544248A (zh) * 2014-04-25 2015-12-01 Disco Corp 切削裝置
TW201640607A (zh) * 2015-01-29 2016-11-16 Disco Corp 校準方法
CN106024709A (zh) * 2015-03-31 2016-10-12 株式会社迪思科 晶片的分割方法
TW201740452A (zh) * 2016-05-11 2017-11-16 Disco Corp 切割裝置

Also Published As

Publication number Publication date
CN110076917B (zh) 2022-08-30
JP2019129282A (ja) 2019-08-01
CN110076917A (zh) 2019-08-02
KR102551970B1 (ko) 2023-07-05
KR20190091196A (ko) 2019-08-05
TW201932237A (zh) 2019-08-16
JP6968501B2 (ja) 2021-11-17

Similar Documents

Publication Publication Date Title
KR20170077029A (ko) 웨이퍼의 가공 방법
JP2011108979A (ja) 被加工物の切削方法
JP5009179B2 (ja) ウェーハ搬送装置およびウェーハ加工装置
TWI772601B (zh) 切割裝置的設定方法
US11521867B2 (en) Cutting apparatus
JP5340832B2 (ja) マウントフランジの端面修正方法
TWI809103B (zh) 切割裝置
JP7218055B2 (ja) チャックテーブル
JP6224350B2 (ja) 加工装置
JP2011023686A (ja) 切削装置
JP7143020B2 (ja) 処理装置
JP2009206362A (ja) 板状物の切削方法
TW202101572A (zh) 切割裝置
JP7166709B2 (ja) 切削装置
TWI711078B (zh) 封裝晶圓的對準方法
JP2009206363A (ja) 切削ブレードばたつき検出方法
JP5220439B2 (ja) 板状物の切削方法
TWI782033B (zh) 切割刀片的安裝方法
TWI754742B (zh) 扇狀晶圓片的加工方法
KR20210012901A (ko) 절삭 유닛의 위치 검출 방법, 및 절삭 장치
TWI779194B (zh) 工件加工方法
JP2011110579A (ja) レーザ加工装置
CN111489981A (zh) 关键图案的检测方法和装置
JP2009076773A (ja) チャックテーブル機構
TWI830833B (zh) 切削裝置