TWI772601B - 切割裝置的設定方法 - Google Patents
切割裝置的設定方法 Download PDFInfo
- Publication number
- TWI772601B TWI772601B TW108102468A TW108102468A TWI772601B TW I772601 B TWI772601 B TW I772601B TW 108102468 A TW108102468 A TW 108102468A TW 108102468 A TW108102468 A TW 108102468A TW I772601 B TWI772601 B TW I772601B
- Authority
- TW
- Taiwan
- Prior art keywords
- cutting
- reference position
- unit
- contact
- chuck table
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018-011497 | 2018-01-26 | ||
JP2018011497A JP6968501B2 (ja) | 2018-01-26 | 2018-01-26 | 切削装置のセットアップ方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201932237A TW201932237A (zh) | 2019-08-16 |
TWI772601B true TWI772601B (zh) | 2022-08-01 |
Family
ID=67412991
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW108102468A TWI772601B (zh) | 2018-01-26 | 2019-01-23 | 切割裝置的設定方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6968501B2 (ja) |
KR (1) | KR102551970B1 (ja) |
CN (1) | CN110076917B (ja) |
TW (1) | TWI772601B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7154336B2 (ja) * | 2021-03-26 | 2022-10-17 | Towa株式会社 | 切断装置、及び、切断品の製造方法 |
CN113140491B (zh) * | 2021-05-26 | 2022-07-12 | 吉林华微电子股份有限公司 | 贴膜机和半导体器件生产系统 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1691302A (zh) * | 2004-04-21 | 2005-11-02 | 株式会社迪思科 | 切削刀片的位置偏移的检测方法 |
US20070122926A1 (en) * | 2001-04-10 | 2007-05-31 | S.O.I.Tec Silicon On Insulator Technologies S.A. | Substrate layer cutting device and method |
CN103311114A (zh) * | 2012-03-09 | 2013-09-18 | 株式会社迪思科 | 切削装置 |
CN104520040A (zh) * | 2012-08-17 | 2015-04-15 | 伊利诺斯工具制品有限公司 | 样品制备锯 |
TW201544248A (zh) * | 2014-04-25 | 2015-12-01 | Disco Corp | 切削裝置 |
CN106024709A (zh) * | 2015-03-31 | 2016-10-12 | 株式会社迪思科 | 晶片的分割方法 |
TW201640607A (zh) * | 2015-01-29 | 2016-11-16 | Disco Corp | 校準方法 |
TW201740452A (zh) * | 2016-05-11 | 2017-11-16 | Disco Corp | 切割裝置 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2890902B2 (ja) * | 1991-06-20 | 1999-05-17 | 富士通株式会社 | 半導体装置の製造方法及び製造装置 |
GB9307761D0 (en) | 1993-04-15 | 1993-06-02 | Emhart Glass Mach Invest | Glassware forming machine |
JP3540474B2 (ja) * | 1995-11-11 | 2004-07-07 | 株式会社ソディック | ワイヤ放電加工装置の基準接触位置の位置決め方法及びその装置 |
JPH11345787A (ja) * | 1998-06-01 | 1999-12-14 | Disco Abrasive Syst Ltd | ダイシング装置 |
JP2005203540A (ja) * | 2004-01-15 | 2005-07-28 | Disco Abrasive Syst Ltd | ウエーハの切削方法 |
JP4594144B2 (ja) * | 2005-03-28 | 2010-12-08 | 大日本スクリーン製造株式会社 | 検査装置および位置ずれ量取得方法 |
JP5122341B2 (ja) * | 2008-03-26 | 2013-01-16 | 株式会社ディスコ | 切削装置 |
JP2010184331A (ja) | 2009-02-13 | 2010-08-26 | Disco Abrasive Syst Ltd | 保持テーブルおよび加工装置 |
JP5313026B2 (ja) | 2009-04-17 | 2013-10-09 | 株式会社ディスコ | 切削装置 |
JP2013258205A (ja) | 2012-06-11 | 2013-12-26 | Disco Abrasive Syst Ltd | 切削装置 |
JP6078297B2 (ja) * | 2012-10-31 | 2017-02-08 | 株式会社ディスコ | 加工装置 |
JP6125867B2 (ja) | 2013-03-26 | 2017-05-10 | 株式会社ディスコ | 切削方法 |
JP6255285B2 (ja) * | 2014-03-18 | 2017-12-27 | 株式会社ディスコ | 検出方法 |
JP6422805B2 (ja) | 2015-03-27 | 2018-11-14 | 株式会社ディスコ | 切削装置 |
JP6356655B2 (ja) * | 2015-12-10 | 2018-07-11 | ファナック株式会社 | 加工屑を除去する機能を有する加工システム |
JP6727699B2 (ja) * | 2016-04-19 | 2020-07-22 | 株式会社ディスコ | 切削装置のセットアップ方法 |
-
2018
- 2018-01-26 JP JP2018011497A patent/JP6968501B2/ja active Active
-
2019
- 2019-01-11 KR KR1020190003707A patent/KR102551970B1/ko active IP Right Grant
- 2019-01-16 CN CN201910039065.XA patent/CN110076917B/zh active Active
- 2019-01-23 TW TW108102468A patent/TWI772601B/zh active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070122926A1 (en) * | 2001-04-10 | 2007-05-31 | S.O.I.Tec Silicon On Insulator Technologies S.A. | Substrate layer cutting device and method |
CN1691302A (zh) * | 2004-04-21 | 2005-11-02 | 株式会社迪思科 | 切削刀片的位置偏移的检测方法 |
CN103311114A (zh) * | 2012-03-09 | 2013-09-18 | 株式会社迪思科 | 切削装置 |
CN104520040A (zh) * | 2012-08-17 | 2015-04-15 | 伊利诺斯工具制品有限公司 | 样品制备锯 |
TW201544248A (zh) * | 2014-04-25 | 2015-12-01 | Disco Corp | 切削裝置 |
TW201640607A (zh) * | 2015-01-29 | 2016-11-16 | Disco Corp | 校準方法 |
CN106024709A (zh) * | 2015-03-31 | 2016-10-12 | 株式会社迪思科 | 晶片的分割方法 |
TW201740452A (zh) * | 2016-05-11 | 2017-11-16 | Disco Corp | 切割裝置 |
Also Published As
Publication number | Publication date |
---|---|
CN110076917B (zh) | 2022-08-30 |
JP2019129282A (ja) | 2019-08-01 |
CN110076917A (zh) | 2019-08-02 |
KR102551970B1 (ko) | 2023-07-05 |
KR20190091196A (ko) | 2019-08-05 |
TW201932237A (zh) | 2019-08-16 |
JP6968501B2 (ja) | 2021-11-17 |
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