TWI670504B - 保護繼電裝置之特性試驗系統 - Google Patents

保護繼電裝置之特性試驗系統 Download PDF

Info

Publication number
TWI670504B
TWI670504B TW107135106A TW107135106A TWI670504B TW I670504 B TWI670504 B TW I670504B TW 107135106 A TW107135106 A TW 107135106A TW 107135106 A TW107135106 A TW 107135106A TW I670504 B TWI670504 B TW I670504B
Authority
TW
Taiwan
Prior art keywords
relay device
test
signal
circuit
protective relay
Prior art date
Application number
TW107135106A
Other languages
English (en)
Chinese (zh)
Other versions
TW202004207A (zh
Inventor
多田羅裕紀
笹川悟
Original Assignee
日商三菱電機股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商三菱電機股份有限公司 filed Critical 日商三菱電機股份有限公司
Application granted granted Critical
Publication of TWI670504B publication Critical patent/TWI670504B/zh
Publication of TW202004207A publication Critical patent/TW202004207A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272—Apparatus, systems or circuits therefor
    • G01R31/3274—Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3275—Fault detection or status indication
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/333—Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/02—Details
    • H02H3/05—Details with means for increasing reliability, e.g. redundancy arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Emergency Protection Circuit Devices (AREA)
TW107135106A 2018-05-30 2018-10-04 保護繼電裝置之特性試驗系統 TWI670504B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
WOPCT/JP2018/020810 2018-05-30
PCT/JP2018/020810 WO2019229886A1 (ja) 2018-05-30 2018-05-30 保護継電装置の特性試験システム
??PCT/JP2018/020810 2018-05-30

Publications (2)

Publication Number Publication Date
TWI670504B true TWI670504B (zh) 2019-09-01
TW202004207A TW202004207A (zh) 2020-01-16

Family

ID=65037123

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107135106A TWI670504B (zh) 2018-05-30 2018-10-04 保護繼電裝置之特性試驗系統

Country Status (6)

Country Link
JP (1) JP6456573B1 (ja)
KR (1) KR102462925B1 (ja)
CN (1) CN112154340B (ja)
PH (1) PH12020552022A1 (ja)
TW (1) TWI670504B (ja)
WO (1) WO2019229886A1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109765447B (zh) * 2019-01-29 2021-12-21 国网冀北电力有限公司唐山供电公司 一种智能变电站继电保护自动测试方法
CN110687375B (zh) * 2019-10-11 2021-08-20 南京能云电力科技有限公司 一种继电保护装置并行自动测试系统及方法
CN113075910A (zh) * 2021-02-25 2021-07-06 南京南瑞继保电气有限公司 一种继电保护装置整机复检智能测试系统及方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN200990499Y (zh) * 2006-10-26 2007-12-12 天津理工大学 一种基于小波理论的dsp继电保护控制装置
CN201589855U (zh) * 2009-12-15 2010-09-22 江西省电力科学研究院 继电保护测试仪检测装置
CN202217998U (zh) * 2009-09-03 2012-05-09 帕西·西姆公司 具有夹层的悬臂断路器机构的保护装置
US20150219740A1 (en) * 2000-02-17 2015-08-06 Pass & Seymour, Inc. Protective device with automated self-test

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH069426B2 (ja) * 1986-08-25 1994-02-02 三菱電機株式会社 保護継電器の点検装置
JPS63198885A (ja) * 1987-02-14 1988-08-17 Nippon Telegr & Teleph Corp <Ntt> 電圧検出継電器用試験器
JPH02136020A (ja) * 1988-11-17 1990-05-24 Toshiba Corp 保護継電器
JP2892667B2 (ja) * 1989-01-11 1999-05-17 株式会社日立製作所 模擬送電線試験装置
JPH03215114A (ja) * 1990-01-19 1991-09-20 Toshiba Corp 点検機能付保護継電装置
JP3281210B2 (ja) * 1994-02-07 2002-05-13 株式会社東芝 保護継電システムの試験装置
JP3329607B2 (ja) * 1994-12-22 2002-09-30 株式会社東芝 電力系統保護リレー装置
CN1126840A (zh) * 1995-01-10 1996-07-17 李瑞鸿 一种开关触点压降的测试方法及装置
JP3310522B2 (ja) * 1996-01-16 2002-08-05 株式会社日立エンジニアリングサービス Ａｖｒの静特性・動特性自動試験用現地支援ツール
US6247003B1 (en) * 1998-08-13 2001-06-12 Mcgraw-Edison Company Current transformer saturation correction using artificial neural networks
DE10210920B4 (de) * 2002-03-13 2005-02-03 Moeller Gmbh Leistungsschalter mit elektronischem Auslöser
KR100824515B1 (ko) * 2006-12-27 2008-04-22 주식회사 효성 디지털 전력 계통 계측 장치 및 그 방법
CN100543488C (zh) * 2006-12-29 2009-09-23 沈阳工业大学 合成试验同步控制系统
JP5322784B2 (ja) 2009-06-08 2013-10-23 三菱電機株式会社 保護継電装置の特性試験システム
JP5596615B2 (ja) * 2011-04-22 2014-09-24 株式会社日立製作所 ディジタル形保護リレー装置
KR101207619B1 (ko) * 2011-09-01 2012-12-03 피앤씨테크 주식회사 가상 고장파형 발생 기능을 내장한 보호계전기
WO2013175846A1 (ja) * 2012-05-21 2013-11-28 三菱電機株式会社 保護継電装置の動作試験システム
JP6105236B2 (ja) * 2012-09-11 2017-03-29 三菱電機株式会社 マージングユニット
JP6552162B2 (ja) 2014-05-19 2019-07-31 株式会社タレンティオ 情報処理装置、情報処理方法、およびプログラム
CN104898050B (zh) * 2015-06-16 2018-06-08 上海电器科学研究所（集团）有限公司 一种用于剩余电流保护断路器测试装置的多输出电源
KR101649704B1 (ko) * 2015-07-28 2016-08-19 엘에스산전 주식회사 디지털 보호 계전기의 전원 감시장치
SE1650931A1 (en) * 2016-06-29 2017-12-30 Megger Sweden Ab System for analyzing high voltage circuit breakers

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150219740A1 (en) * 2000-02-17 2015-08-06 Pass & Seymour, Inc. Protective device with automated self-test
CN200990499Y (zh) * 2006-10-26 2007-12-12 天津理工大学 一种基于小波理论的dsp继电保护控制装置
CN202217998U (zh) * 2009-09-03 2012-05-09 帕西·西姆公司 具有夹层的悬臂断路器机构的保护装置
CN201589855U (zh) * 2009-12-15 2010-09-22 江西省电力科学研究院 继电保护测试仪检测装置

Also Published As

Publication number Publication date
KR20210005089A (ko) 2021-01-13
PH12020552022A1 (en) 2021-06-14
CN112154340A (zh) 2020-12-29
TW202004207A (zh) 2020-01-16
WO2019229886A1 (ja) 2019-12-05
JPWO2019229886A1 (ja) 2020-06-18
JP6456573B1 (ja) 2019-01-23
KR102462925B1 (ko) 2022-11-04
CN112154340B (zh) 2024-03-19

Similar Documents

Publication Publication Date Title
TWI670504B (zh) 保護繼電裝置之特性試驗系統
KR102050255B1 (ko) 변환기들의 배선을 테스트하기 위한 방법 및 테스트 디바이스
WO2014027571A1 (ja) デジタル保護リレー、デジタル保護リレー試験装置、およびデジタル保護リレー試験方法
JP2006343267A (ja) 直流回路の絶縁抵抗測定器、静電容量測定器、絶縁抵抗測定方法および静電容量測定方法
KR101617117B1 (ko) 보호 계전 장치의 동작 시험 시스템
JP2010210238A (ja) プローブカード、それを備えた半導体検査装置及びプローブカードのヒューズチェック方法
US9515478B2 (en) System for protecting of a plurality of DC voltage sources
KR101123882B1 (ko) 계전기 설정값 시험 장치 및 방법
JP2019109192A (ja) 絶縁監視装置および絶縁監視システム
JP2010043873A (ja) 地絡継電器試験装置
JP5313061B2 (ja) ワンシート検査装置及びその検査方法
US10809299B2 (en) Testing device and method for testing a control unit of a switching device of a switchgear installation
JP2010015921A (ja) マルチプレクサスイッチの試験方法とその装置および多点測定装置
WO2009081522A1 (ja) 試験装置および測定装置
JP2006177765A (ja) アーステスター及びその接地抵抗測定方法
JP4967690B2 (ja) 接触検査装置
JP2755697B2 (ja) 保護継電装置
JP2008164409A (ja) 半導体試験装置
JP4033801B2 (ja) 絶縁劣化検出装置
JPH1194919A (ja) 電子ユニットの検査方法
JP4895117B2 (ja) 半導体試験装置
JP2012185136A (ja) 温度測定装置
JP4965138B2 (ja) 測定装置
JPH07107683A (ja) 開閉器制御装置
JPH09127172A (ja) 保護リレー試験装置