TWI649569B - Method for checking the continuity of electrical characteristics of electronic components of wafers - Google Patents

Method for checking the continuity of electrical characteristics of electronic components of wafers Download PDF

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Publication number
TWI649569B
TWI649569B TW104112571A TW104112571A TWI649569B TW I649569 B TWI649569 B TW I649569B TW 104112571 A TW104112571 A TW 104112571A TW 104112571 A TW104112571 A TW 104112571A TW I649569 B TWI649569 B TW I649569B
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TW
Taiwan
Prior art keywords
electronic component
wafer
electrical characteristics
chip
disk
Prior art date
Application number
TW104112571A
Other languages
English (en)
Chinese (zh)
Other versions
TW201602599A (zh
Inventor
野中智
藤田清久
Original Assignee
日商慧萌高新科技有限公司
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Application filed by 日商慧萌高新科技有限公司 filed Critical 日商慧萌高新科技有限公司
Publication of TW201602599A publication Critical patent/TW201602599A/zh
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Publication of TWI649569B publication Critical patent/TWI649569B/zh

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
TW104112571A 2014-05-02 2015-04-20 Method for checking the continuity of electrical characteristics of electronic components of wafers TWI649569B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014095206A JP6370599B2 (ja) 2014-05-02 2014-05-02 チップ電子部品の電気特性の連続的な検査方法
JP2014-095206 2014-05-02

Publications (2)

Publication Number Publication Date
TW201602599A TW201602599A (zh) 2016-01-16
TWI649569B true TWI649569B (zh) 2019-02-01

Family

ID=54451269

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104112571A TWI649569B (zh) 2014-05-02 2015-04-20 Method for checking the continuity of electrical characteristics of electronic components of wafers

Country Status (4)

Country Link
JP (1) JP6370599B2 (ja)
KR (1) KR102277875B1 (ja)
CN (1) CN105044586B (ja)
TW (1) TWI649569B (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105575303A (zh) * 2015-12-24 2016-05-11 中颖电子股份有限公司 液晶驱动芯片测试方法及使用这种测试方法的液晶驱动芯片
JP6673296B2 (ja) * 2016-09-23 2020-03-25 株式会社村田製作所 処理装置、部品搬送装置及び処理方法
JP6727651B2 (ja) 2016-09-30 2020-07-22 株式会社ヒューモラボラトリー チップ電子部品の電気特性の連続的な検査方法
JP6500880B2 (ja) * 2016-11-28 2019-04-17 株式会社村田製作所 電子部品の選別方法、電子部品の選別装置、テーピング電子部品連の製造装置
JP6679552B2 (ja) * 2017-10-02 2020-04-15 株式会社ヒューモラボラトリー チップ電子部品の検査選別方法
JP7075139B2 (ja) 2020-06-02 2022-05-25 株式会社ヒューモラボラトリー チップ電子部品検査選別装置用のチップ電子部品搬送円盤
JP7107589B2 (ja) * 2020-08-28 2022-07-27 株式会社ヒューモラボラトリー チップ電子部品検査用のローラ電極接触子を備えた装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002214295A (ja) * 2001-01-16 2002-07-31 Murata Mfg Co Ltd 電子部品検査装置用測定プローブのクリーニング方法及びこれを用いる電子部品検査装置
JP2002217255A (ja) * 2001-01-17 2002-08-02 Seiko Epson Corp 半導体測定装置
JP2006030131A (ja) * 2004-07-21 2006-02-02 Hioki Ee Corp 抵抗測定方法およびその装置
TWI286216B (en) * 2004-06-29 2007-09-01 Pixart Imaging Inc Single chip test method, component and its test system
CN101103426A (zh) * 2004-11-22 2008-01-09 电子科学工业公司 重复测试电组件的方法和机器
WO2014010623A1 (ja) * 2012-07-10 2014-01-16 株式会社ヒューモラボラトリー チップ電子部品の検査方法および検査装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101178660B1 (ko) * 2008-07-18 2012-08-30 니혼덴산리드가부시키가이샤 핀 선단부의 클리닝 기구를 가지는 기판 검사 장치
JP5453011B2 (ja) * 2009-08-07 2014-03-26 株式会社ヒューモラボラトリー 電子部品特性検査分類装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002214295A (ja) * 2001-01-16 2002-07-31 Murata Mfg Co Ltd 電子部品検査装置用測定プローブのクリーニング方法及びこれを用いる電子部品検査装置
JP2002217255A (ja) * 2001-01-17 2002-08-02 Seiko Epson Corp 半導体測定装置
TWI286216B (en) * 2004-06-29 2007-09-01 Pixart Imaging Inc Single chip test method, component and its test system
JP2006030131A (ja) * 2004-07-21 2006-02-02 Hioki Ee Corp 抵抗測定方法およびその装置
CN101103426A (zh) * 2004-11-22 2008-01-09 电子科学工业公司 重复测试电组件的方法和机器
WO2014010623A1 (ja) * 2012-07-10 2014-01-16 株式会社ヒューモラボラトリー チップ電子部品の検査方法および検査装置

Also Published As

Publication number Publication date
CN105044586A (zh) 2015-11-11
TW201602599A (zh) 2016-01-16
CN105044586B (zh) 2019-06-14
JP2015213121A (ja) 2015-11-26
KR20150126294A (ko) 2015-11-11
KR102277875B1 (ko) 2021-07-14
JP6370599B2 (ja) 2018-08-08

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