TWI634595B - Substrate processing method - Google Patents

Substrate processing method Download PDF

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Publication number
TWI634595B
TWI634595B TW105139460A TW105139460A TWI634595B TW I634595 B TWI634595 B TW I634595B TW 105139460 A TW105139460 A TW 105139460A TW 105139460 A TW105139460 A TW 105139460A TW I634595 B TWI634595 B TW I634595B
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TW
Taiwan
Prior art keywords
substrate
processing
cutting
roller
processing unit
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TW105139460A
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Chinese (zh)
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TW201717268A (en
Inventor
鬼頭義昭
鈴木智也
堀正和
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尼康股份有限公司
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Publication of TW201717268A publication Critical patent/TW201717268A/en
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Publication of TWI634595B publication Critical patent/TWI634595B/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67745Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303Apparatus specially adapted to the manufacture of LCDs
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C65/00Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
    • B29C65/02Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure
    • B29C65/18Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure using heated tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C65/00Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
    • B29C65/48Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor using adhesives, i.e. using supplementary joining material; solvent bonding
    • B29C65/50Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor using adhesives, i.e. using supplementary joining material; solvent bonding using adhesive tape, e.g. thermoplastic tape; using threads or the like
    • B29C65/5057Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor using adhesives, i.e. using supplementary joining material; solvent bonding using adhesive tape, e.g. thermoplastic tape; using threads or the like positioned between the surfaces to be joined
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C65/00Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
    • B29C65/74Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by welding and severing, or by joining and severing, the severing being performed in the area to be joined, next to the area to be joined, in the joint area or next to the joint area
    • B29C65/745Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by welding and severing, or by joining and severing, the severing being performed in the area to be joined, next to the area to be joined, in the joint area or next to the joint area using a single unit having both a severing tool and a welding tool
    • B29C65/7451Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by welding and severing, or by joining and severing, the severing being performed in the area to be joined, next to the area to be joined, in the joint area or next to the joint area using a single unit having both a severing tool and a welding tool the severing tool and the welding tool being movable with respect to one-another
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C65/00Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
    • B29C65/78Means for handling the parts to be joined, e.g. for making containers or hollow articles, e.g. means for handling sheets, plates, web-like materials, tubular articles, hollow articles or elements to be joined therewith; Means for discharging the joined articles from the joining apparatus
    • B29C65/7841Holding or clamping means for handling purposes
    • B29C65/7847Holding or clamping means for handling purposes using vacuum to hold at least one of the parts to be joined
    • BPERFORMING OPERATIONS; TRANSPORTING
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    • B29C66/01General aspects dealing with the joint area or with the area to be joined
    • B29C66/05Particular design of joint configurations
    • B29C66/10Particular design of joint configurations particular design of the joint cross-sections
    • B29C66/11Joint cross-sections comprising a single joint-segment, i.e. one of the parts to be joined comprising a single joint-segment in the joint cross-section
    • B29C66/112Single lapped joints
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C66/00General aspects of processes or apparatus for joining preformed parts
    • B29C66/40General aspects of joining substantially flat articles, e.g. plates, sheets or web-like materials; Making flat seams in tubular or hollow articles; Joining single elements to substantially flat surfaces
    • B29C66/41Joining substantially flat articles ; Making flat seams in tubular or hollow articles
    • B29C66/43Joining a relatively small portion of the surface of said articles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C66/00General aspects of processes or apparatus for joining preformed parts
    • B29C66/80General aspects of machine operations or constructions and parts thereof
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    • B29C66/822Transmission mechanisms
    • B29C66/8221Scissor or lever mechanisms, i.e. involving a pivot point
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C66/00General aspects of processes or apparatus for joining preformed parts
    • B29C66/80General aspects of machine operations or constructions and parts thereof
    • B29C66/83General aspects of machine operations or constructions and parts thereof characterised by the movement of the joining or pressing tools
    • B29C66/832Reciprocating joining or pressing tools
    • B29C66/8322Joining or pressing tools reciprocating along one axis
    • B29C66/83221Joining or pressing tools reciprocating along one axis cooperating reciprocating tools, each tool reciprocating along one axis
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C66/00General aspects of processes or apparatus for joining preformed parts
    • B29C66/80General aspects of machine operations or constructions and parts thereof
    • B29C66/83General aspects of machine operations or constructions and parts thereof characterised by the movement of the joining or pressing tools
    • B29C66/832Reciprocating joining or pressing tools
    • B29C66/8324Joining or pressing tools pivoting around one axis
    • B29C66/83241Joining or pressing tools pivoting around one axis cooperating pivoting tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C66/00General aspects of processes or apparatus for joining preformed parts
    • B29C66/80General aspects of machine operations or constructions and parts thereof
    • B29C66/84Specific machine types or machines suitable for specific applications
    • B29C66/853Machines for changing web rolls or filaments, e.g. for joining a replacement web to an expiring web
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C66/00General aspects of processes or apparatus for joining preformed parts
    • B29C66/90Measuring or controlling the joining process
    • B29C66/93Measuring or controlling the joining process by measuring or controlling the speed
    • B29C66/934Measuring or controlling the joining process by measuring or controlling the speed by controlling or regulating the speed
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H19/00Changing the web roll
    • B65H19/10Changing the web roll in unwinding mechanisms or in connection with unwinding operations
    • B65H19/18Attaching, e.g. pasting, the replacement web to the expiring web
    • B65H19/1842Attaching, e.g. pasting, the replacement web to the expiring web standing splicing, i.e. the expiring web being stationary during splicing contact
    • B65H19/1852Attaching, e.g. pasting, the replacement web to the expiring web standing splicing, i.e. the expiring web being stationary during splicing contact taking place at a distance from the replacement roll
    • BPERFORMING OPERATIONS; TRANSPORTING
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    • B65H19/10Changing the web roll in unwinding mechanisms or in connection with unwinding operations
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    • B65H19/1857Support arrangement of web rolls
    • B65H19/1873Support arrangement of web rolls with two stationary roll supports carrying alternately the replacement and the expiring roll
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4821Flat leads, e.g. lead frames with or without insulating supports
    • H01L21/4825Connection or disconnection of other leads to or from flat leads, e.g. wires, bumps, other flat leads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
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    • B65G2249/00Aspects relating to conveying systems for the manufacture of fragile sheets
    • B65G2249/04Arrangements of vacuum systems or suction cups
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2301/00Handling processes for sheets or webs
    • B65H2301/40Type of handling process
    • B65H2301/46Splicing
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    • B65H2301/4615Processing webs in splicing process after splicing
    • B65H2301/4617Processing webs in splicing process after splicing cutting webs in splicing process
    • B65H2301/46172Processing webs in splicing process after splicing cutting webs in splicing process cutting expiring web only
    • BPERFORMING OPERATIONS; TRANSPORTING
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    • B65H2301/00Handling processes for sheets or webs
    • B65H2301/40Type of handling process
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    • B65H2301/463Splicing splicing means, i.e. means by which a web end is bound to another web end
    • B65H2301/4631Adhesive tape
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    • BPERFORMING OPERATIONS; TRANSPORTING
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    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2408/00Specific machines
    • B65H2408/20Specific machines for handling web(s)
    • B65H2408/21Accumulators
    • B65H2408/217Accumulators of rollers type, e.g. with at least one fixed and one movable roller
    • B65H2408/2171Accumulators of rollers type, e.g. with at least one fixed and one movable roller the position of the movable roller(s), i.e. the web loop, being positively actuated
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2801/00Application field
    • B65H2801/61Display device manufacture, e.g. liquid crystal displays
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/02Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
    • C03B33/023Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
    • C03B33/0235Ribbons
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133351Manufacturing of individual cells out of a plurality of cells, e.g. by dicing
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133354Arrangements for aligning or assembling substrates
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00Technologies relating to the processing of minerals
    • Y02P40/50Glass production, e.g. reusing waste heat during processing or shaping
    • Y02P40/57Improving the yield, e-g- reduction of reject rates

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Nonlinear Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Advancing Webs (AREA)
  • Replacement Of Web Rolls (AREA)
  • Liquid Crystal (AREA)
  • Controlling Rewinding, Feeding, Winding, Or Abnormalities Of Webs (AREA)
  • Folding Of Thin Sheet-Like Materials, Special Discharging Devices, And Others (AREA)
  • Electroluminescent Light Sources (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

基板處理系統,具備:第1處理單元,對以速度V1搬送之基板連續地施加第1處理;以及第2處理單元,以速度V2搬送以第1處理單元處理後之基板,對基板連續地施加第2處理;其特徵在於:視第1、第2處理單元之各個之性能,可將速度之關係設定成V1>V2之情形,設置複數個第2處理單元,且進一步具備切斷機構、與選擇投入機構;視第1、第2處理單元之各個之性能,可將速度之關係設定成V1<V2之情形,設置複數個第1處理單元,且進一步具備將藉由複數個第1處理單元施加第1處理之複數個基板依序接合並投入第2處理單元之接合機構。 A substrate processing system includes: a first processing unit that continuously applies a first process to a substrate conveyed at a speed V1; and a second processing unit that transports a substrate that has been processed by a first processing unit at a speed V2 and continuously applies the substrate The second process is characterized in that, depending on the performance of each of the first and second processing units, the speed relationship can be set to V1> V2, a plurality of second processing units are provided, and a cutting mechanism is further provided. Select the input mechanism; depending on the performance of each of the first and second processing units, the speed relationship can be set to V1 <V2, a plurality of first processing units are set up, and further equipped with a plurality of first processing units The plurality of substrates subjected to the first process are sequentially bonded and put into a bonding mechanism of the second processing unit.

Description

基板處理方法 Substrate processing method

本發明之形態係關於切斷機構、接合機構、基板處理系統、基板處理裝置、以及基板處理方法。 Aspects of the present invention relate to a cutting mechanism, a bonding mechanism, a substrate processing system, a substrate processing apparatus, and a substrate processing method.

本申請係根據2012年5月23日申請之美國臨時申請61/650712及2012年6月1日申請之美國臨時申請61/654500主張優先權,將其內容援引於此。 This application claims priority based on US Provisional Application 61/650712 filed on May 23, 2012 and US Provisional Application 61/654500 filed on June 1, 2012, the contents of which are incorporated herein by reference.

在液晶顯示元件等之大畫面顯示元件,在平面狀玻璃基板上沉積ITO(Indium Tin Oxide)等之透明電極或Si等之半導體物質後蒸鍍金屬材料,塗布光阻並轉印電路圖案。之後,使光阻顯影後,藉由蝕刻形成電路圖案等。然而,隨著顯示元件之大型化玻璃基板亦大型化,因此基板搬送亦變得困難。因此,已提案有在具有可撓性之基板(例如,聚醯亞胺、PET、金屬箔等之膜構件、或極薄玻璃片等)上形成顯示元件之被稱為捲對捲方式(以下,僅記載為「捲筒方式」)之技術(例如,參照專利文獻1)。 On a large-screen display element such as a liquid crystal display element, a transparent electrode such as ITO (Indium Tin Oxide) or a semiconductor substance such as Si is deposited on a flat glass substrate, a metal material is vapor-deposited, a photoresist is applied, and a circuit pattern is transferred. Then, after developing the photoresist, a circuit pattern or the like is formed by etching. However, as the size of glass substrates of display devices has also increased, substrate transportation has become difficult. Therefore, a roll-to-roll method (hereinafter referred to as a roll-to-roll method) has been proposed in which a display element is formed on a flexible substrate (for example, a film member such as polyimide, PET, metal foil, or an extremely thin glass sheet). (Only described as "reel system") (for example, refer to Patent Document 1).

又,在專利文獻2提案有與可旋轉之圓筒狀光罩之外周部接近地配置捲繞於輸送輥且移動之可撓性長條片(基板),使光罩圖案連續地曝光於基板之技術。 Further, in Patent Document 2, a flexible long sheet (substrate) wound around a conveying roller and moving is arranged close to the outer peripheral portion of a rotatable cylindrical mask, and the mask pattern is continuously exposed on the substrate. Technology.

又,在專利文獻3提案有將以捲筒方式輸送之可撓性長條片(基板)之圖案形成區域暫時保持在平面載台,使透過放大投影透鏡投影之光 罩之圖案像掃描曝光於該圖案形成區域之技術。 Further, in Patent Document 3, it is proposed to temporarily hold a pattern forming area of a flexible long sheet (substrate) conveyed by a roll on a flat stage, so as to transmit light projected through a magnifying projection lens. The pattern of the mask is scanned and exposed to the pattern forming area.

專利文獻1:國際公開第2008/129819號 Patent Document 1: International Publication No. 2008/129819

專利文獻2:日本實開昭60-019037號 Patent Document 2: Japanese Publication No. 60-019037

專利文獻3:日本特開2011-22584號 Patent Document 3: Japanese Patent Application Laid-Open No. 2011-22584

然而,上述習知技術存在以下之問題。 However, the above conventional techniques have the following problems.

對長條片狀基板依序施以複數個處理時,依據各處理單元之性能,適於處理之基板之搬送速度在各單元(各處理內容)分別不同。例如,專利文獻2之曝光處理之情形,因塗布在基板表面之感光層之感度與曝光用照明光之亮度等,使基板之搬送速度(作業時間)受到限制。又,蝕刻或鍍敷等之濕式處理或該濕式處理後之乾燥、加熱步驟,藉由將基板緩慢地搬送,亦可得到能使液槽或乾燥/加熱爐小型化等之優點。 When sequentially processing a plurality of long sheet substrates, the conveying speed of the substrate suitable for processing varies according to the performance of each processing unit in each unit (each processing content). For example, in the case of the exposure process in Patent Document 2, the sensitivity of the photosensitive layer applied on the surface of the substrate, the brightness of the exposure illumination light, and the like limit the transport speed (working time) of the substrate. In addition, the wet processing such as etching or plating, or the drying and heating steps after the wet processing can also provide advantages such that the liquid tank or the drying / heating furnace can be miniaturized by slowly transferring the substrate.

此外,在機能性材料之沉積處理、或印刷或噴墨印刷之步驟等,為了維持高精度化(微細化)並同時確保產率,亦有最佳基板搬送速度。然而,此等最佳基板搬送速度大多因處理單元而不同。 In addition, in the process of depositing functional materials, or the steps of printing or inkjet printing, etc., in order to maintain high precision (thinning) while ensuring productivity, there is also an optimal substrate transfer speed. However, these optimal substrate transfer speeds often differ depending on the processing unit.

在構築此種組合複數個處理單元,使長條片狀基板依序通過並持續進行一連串處理之捲筒方式之生產線(處理系統)之情形,基板之搬送速度(生產線之速度)不得不配合處理中之基板搬送速度最低之處理單元。 In the case of a reel-type production line (processing system) in which such a combination of a plurality of processing units is constructed to sequentially pass a long sheet of substrate and to continuously perform a series of processes, the substrate transfer speed (speed of the production line) has to be matched with the processing The processing unit with the lowest substrate transfer speed.

因此,處理速度快之處理單元,儘管在性能上未完全發揮,亦以慢速度搬送基板。因此,處理單元之效率變差且有可能無法提升生產線整體之產率。 Therefore, a processing unit with a high processing speed, although not fully utilized in performance, also carries the substrate at a slow speed. Therefore, the efficiency of the processing unit is deteriorated and the productivity of the entire production line may not be improved.

本發明形態之目的在於提供有助於產率提升之切斷機構、接 合機構、基板處理系統、以及基板處理方法。 The purpose of the aspect of the present invention is to provide a cutting mechanism, Combination mechanism, substrate processing system, and substrate processing method.

又,專利文獻1中,係以捲方式搬送可撓性片狀基板並主要使用印刷(噴墨)方式在片狀基板上形成電子元件。然而,在一般印刷現場,當捲繞於供應捲筒之片狀基板之剩餘量變少,即暫時停止印刷裝置,在印刷裝置與回收捲筒之間將片狀基板切斷,將作為回收捲筒捲繞之完成印刷之片狀基板送至下一步驟。此情形,在印刷裝置之入口至出口之印刷路徑中,殘留印刷途中之片狀基板,此全部作為不良品而廢棄。在紙或膜上以彩色墨水印刷之情形,印刷成本極為低價。然而,以捲筒方式形成電子元件之情形,片狀基板之每單位長度(m)之製造成本仍舊高價,若如一般印刷現場般將殘留在裝置內之片狀基板廢棄,則過於浪費且成本增加。 Further, in Patent Document 1, a flexible sheet substrate is conveyed in a roll method, and an electronic element is formed on the sheet substrate mainly by a printing (inkjet) method. However, at the general printing site, when the remaining amount of the sheet substrate wound on the supply roll becomes small, the printing device is temporarily stopped, and the sheet substrate is cut between the printing device and the recycling roll, and it will be used as a recycling roll. The wound printed sheet substrate is sent to the next step. In this case, in the printing path from the entrance to the exit of the printing apparatus, the sheet substrates in the middle of printing remain, and all of them are discarded as defective products. When printing with color ink on paper or film, the printing cost is extremely low. However, in the case of forming electronic components in the form of a roll, the manufacturing cost per unit length (m) of the chip substrate is still high. If the chip substrate remaining in the device is discarded like a general printing site, it is too wasteful and costly. increase.

尤其是,將有機EL構成之中型、大型顯示面板形成在片狀基板上之情形,片狀基板連續地通過一連串之複數個處理裝置、例如感光層印刷裝置、專利文獻3之曝光裝置、濕式處理裝置、乾燥裝置等之後,捲繞於回收捲筒。是以,可推測從供應捲筒至回收捲筒通過複數個處理裝置(處理步驟)之片狀基板極長,一旦停止片狀基板之搬送後,會浪費相當長距離之片狀基板。 In particular, when a medium-sized or large-sized display panel composed of an organic EL is formed on a sheet substrate, the sheet substrate is continuously passed through a series of processing devices such as a photosensitive layer printing device, an exposure device of Patent Document 3, and a wet type. After a processing apparatus, a drying apparatus, etc., it winds up on a collection reel. Therefore, it is presumed that the sheet substrate that passes through a plurality of processing devices (processing steps) from the supply reel to the recovery reel is extremely long, and once the sheet substrate is stopped from being transported, it will waste a considerable distance of the sheet substrate.

本發明另一形態之目的在於提供抑制成本增加且提高產率之基板處理裝置以及基板處理方法。 An object of another aspect of the present invention is to provide a substrate processing apparatus and a substrate processing method capable of suppressing an increase in cost and improving productivity.

本發明第1形態之基板處理系統,具備:第1處理單元,對往長邊方向以速度V1搬送之基板連續地施加第1處理;以及第2處理單元,以速度V2搬送以第1處理單元處理後之基板,對基板連續地施加第2處理; 其特徵在於:視第1、第2處理單元之各個之性能,可將速度之關係設定成V1>V2之情形,設置複數個第2處理單元,且在第1處理單元之後進一步具備將已施加第1處理之基板以長邊方向之既定長度切斷之切斷機構、與將切斷後之基板投入複數個第2處理單元之任一個之選擇投入機構;視第1、第2處理單元之各個之性能,可將速度之關係設定成V1<V2之情形,設置複數個第1處理單元,且在第2處理單元之前進一步具備將藉由複數個第1處理單元之各個施加第1處理之複數個基板在長邊方向依序接合並投入第2處理單元之接合機構。 A substrate processing system according to a first aspect of the present invention includes: a first processing unit that continuously applies a first process to a substrate that is transported at a speed of V1 in a longitudinal direction; and a second processing unit that transports a first process unit at a speed of V2 After the processed substrate, a second treatment is continuously applied to the substrate; It is characterized in that depending on the performance of each of the first and second processing units, the speed relationship can be set to V1> V2, a plurality of second processing units are set, and after the first processing unit is further equipped with The cutting mechanism for cutting the substrate to be processed at a predetermined length in the long-side direction, and the selection input mechanism for putting the cut substrate into any one of a plurality of second processing units; depending on each of the first and second processing units For the performance, the relationship between speed can be set to V1 <V2, a plurality of first processing units are provided, and the second processing unit is further provided with a plurality of first processing units to be applied with a plurality of first processing units before the second processing unit. The individual substrates are sequentially bonded in the long-side direction and put into a bonding mechanism of the second processing unit.

本發明第2形態之基板處理方法,具備:藉由第1處理單元對往長邊方向以速度V1搬送之基板連續地施加第1處理之動作;以及以速度V2搬送以第1處理單元處理後之基板,藉由第2處理單元對基板連續地施加第2處理之動作;其特徵在於:視第1、第2處理單元之各個之性能,可將速度之關係設定成V1>V2之情形,使用複數個第2處理單元,且在第1處理單元之後進一步具有將已施加第1處理之基板以長邊方向之既定長度切斷之步驟、與將切斷後之基板投入複數個第2處理單元之任一個之選擇投入步驟;視第1、第2處理單元之各個之性能,可將速度之關係設定成V1<V2之情形,使用複數個第1處理單元,且在第2處理單元之前進一步具有將藉由複數個第1處理單元之各個施加第1處理之複數個基板在長邊方向依序接合並投入第2處理單元之接合步驟。 A substrate processing method according to a second aspect of the present invention includes: the first processing unit continuously applies the first processing to a substrate transported at a speed of V1 in the longitudinal direction; and the first processing unit is transported at a speed of V2 and processed by the first processing unit. For the substrate, the second processing operation is continuously applied to the substrate by the second processing unit. It is characterized in that, depending on the performance of each of the first and second processing units, the speed relationship can be set to V1> V2. A plurality of second processing units are used, and after the first processing unit, a step of cutting the substrate to which the first treatment has been applied to a predetermined length in a long side direction, and putting the cut substrate into the plurality of second processing units are further provided. According to the performance of each of the first and second processing units, the speed relationship can be set to V1 <V2, using a plurality of first processing units, and further before the second processing unit There is a bonding step of sequentially bonding a plurality of substrates to which the first processing is applied by each of the plurality of first processing units in the long side direction and putting them into the second processing unit.

本發明第3形態之切斷機構,具備:切斷部,將已進行既定處理之基板切斷;以及緩衝部,基板之儲存量可依據已施加既定處理之基 板之搬送量改變,調整朝向切斷部搬送之基板之搬送量。 A cutting mechanism according to a third aspect of the present invention includes: a cutting section that cuts a substrate that has been subjected to a predetermined process; and a buffer section that can store the substrate in accordance with a base to which the predetermined process has been applied. The conveyance amount of the board is changed, and the conveyance amount of the board conveyed toward the cutting section is adjusted.

本發明第4形態之接合機構,具備:接合部,將施加既定處理之基板接合;以及緩衝部,基板之儲存量可依據施加既定處理之基板之搬送量改變,調整從接合部投入至既定處理之基板之搬送量。 A bonding mechanism according to a fourth aspect of the present invention includes: a bonding portion that joins substrates to which a predetermined process is applied; and a buffer portion, in which a storage amount of the substrate can be changed according to a transport amount of the substrate to which the predetermined process is applied, and adjusts the input from the bonding portion to the predetermined process. The amount of substrate transport.

本發明第5形態之基板處理系統,係使往長邊方向搬送之基板通過第1處理單元後,通過第2處理單元,其特徵在於:具備切斷機構,該切斷機構,使在第2處理單元之基板之搬送速度相對於在第1處理單元之基板之搬送速度降低時,在第1處理單元與第2處理單元之間將基板以長邊方向之既定長度切斷;具備接合機構,該接合機構,使在第2處理單元之基板之搬送速度相對於在第1處理單元之基板之搬送速度增加時,在第1處理單元與第2處理單元之間將基板在長邊方向接合。 A substrate processing system according to a fifth aspect of the present invention is that a substrate transported in a long direction passes through a first processing unit and then passes through a second processing unit, and is characterized by including a cutting mechanism, and the cutting mechanism When the substrate transfer speed of the processing unit is lower than the substrate transfer speed of the first processing unit, the substrate is cut between the first processing unit and the second processing unit by a predetermined length in the longitudinal direction; In the bonding mechanism, when the substrate transfer speed of the second processing unit is increased relative to the substrate transfer speed of the first processing unit, the substrate is bonded in the longitudinal direction between the first processing unit and the second processing unit.

本發明第6形態之基板處理裝置,具備:第1安裝部,安裝捲繞有長帶之第1基板之第1輥;第2安裝部,安裝捲繞有長帶之第2基板之第2輥;處理機構,將第1基板與第2基板之任一方作為處理基板往長邊方向輸送並同時施加既定處理;緩衝機構,配置在處理機構與第1安裝部之間,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出;以及基板接續更換機構,在緩衝機構與第1安裝部之間將第1基板切斷,且將從第2輥供應之第2基板之前端部接合在切斷之第1基板之終端部,往緩衝機構送出。 A substrate processing apparatus according to a sixth aspect of the present invention includes a first mounting section for mounting a first roller on which a long substrate is wound around a first substrate, and a second mounting section for mounting a second substrate on which a long substrate is wound around a second substrate. Roller; a processing mechanism that transports one of the first substrate and the second substrate as a processing substrate to the long side and applies a predetermined process at the same time; a buffer mechanism is disposed between the processing mechanism and the first mounting portion, and starts from the first roller The first substrate supplied is temporarily stored within a predetermined longest storage range, and then sent to a processing mechanism; and a substrate connection replacement mechanism, which cuts the first substrate between the buffer mechanism and the first mounting portion, and supplies it from the second roller The front end portion of the second substrate is bonded to the terminal portion of the cut first substrate, and is sent to the buffer mechanism.

本發明第7形態之基板處理裝置,具備:第1安裝部,安裝捲繞有長帶之第1基板之第1輥;第2安裝部,安裝捲繞有長帶之第2基板 之第2輥;處理機構,將第1基板與第2基板之任一方作為處理基板往長邊方向輸送並同時施加既定處理;緩衝機構,配置在處理機構與第1安裝部之間,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出;以及基板接續更換機構,在緩衝機構與第1安裝部之間將第1基板切斷,且將從第2輥供應之第2基板之前端部連結在切斷之第1基板之緩衝機構側之既定部分,往緩衝機構送出。 A substrate processing apparatus according to a seventh aspect of the present invention includes: a first mounting section for mounting a first roller on which a first substrate is wound with a long tape; and a second mounting section for mounting a second substrate on which a long tape is wound The second roller; the processing mechanism, which transports one of the first substrate and the second substrate to the long side as a processing substrate and applies predetermined processing at the same time; the buffer mechanism is disposed between the processing mechanism and the first mounting portion, and After the first substrate supplied by the first roller is temporarily stored within the predetermined longest storage range, it is sent to the processing mechanism; and the substrate connection and replacement mechanism cuts the first substrate between the buffer mechanism and the first mounting portion, and will cut the first substrate from the first The front end of the second substrate supplied by the two rolls is connected to a predetermined portion of the buffer mechanism side of the cut first substrate and sent to the buffer mechanism.

本發明第8形態之基板處理裝置,具備:第1安裝部,將捲繞有長帶之第1基板之第1輥可拆裝地安裝;保持部,以既定長度保持與第1基板同等規格之第2基板;處理機構,將第1基板與第2基板之任一方作為處理基板往長邊方向輸送並同時施加既定處理;緩衝機構,配置在處理機構與第1安裝部之間,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出;以及基板接續更換機構,在緩衝機構與第1安裝部之間將第1基板切斷,且將從保持部供應之第2基板之前端部連接在切斷之第1基板之緩衝機構側之既定部分,往緩衝機構送出。 A substrate processing apparatus according to an eighth aspect of the present invention includes a first mounting section for detachably mounting a first roller of a first substrate wound with a long tape, and a holding section for holding a predetermined length equal to that of the first substrate. The second substrate; the processing mechanism, which transports one of the first substrate and the second substrate to the long side as a processing substrate and applies predetermined processing at the same time; the buffer mechanism is arranged between the processing mechanism and the first mounting portion, and After the first substrate supplied by the first roller is temporarily stored within the predetermined longest storage range, it is sent to the processing mechanism; and the substrate connection and replacement mechanism cuts the first substrate between the buffer mechanism and the first mounting portion, and will keep the An end portion of the second substrate supplied before the first substrate is connected to a predetermined portion of the buffer mechanism side of the cut first substrate, and is sent to the buffer mechanism.

本發明第9形態之基板處理方法,係將已投入之長帶基板作為處理基板往長邊方向輸送並同時以處理機構施加既定處理,其特徵在於,包含:將捲繞有長帶基板之第1輥安裝在第1輥安裝部之動作;將捲繞有長帶基板之第2輥安裝在第2輥安裝部之動作;以配置在處理機構與第1輥安裝部之間之緩衝機構,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出之動作;以及在暫時儲存之第1基板往處理機構送出之期間,在緩衝機構與第1輥安裝部之間將第1基板切 斷,且將從第2輥供應之第2基板之前端部連結在切斷之第1基板之緩衝機構側之既定部分之動作。 The substrate processing method of the ninth aspect of the present invention is to transport a long-length substrate that has been put into the long-side direction as a processing substrate and apply a predetermined treatment to the processing mechanism at the same time. The method includes the following steps: 1 roll mounted on the first roll mounting section; 2 roll mounted on the long roll substrate is mounted on the 2 roll mounting section; a buffer mechanism arranged between the processing mechanism and the 1 roll mounting section, The operation of sending out the first substrate supplied from the first roller to the processing mechanism after temporarily storing it within the predetermined longest storage range; and mounting the buffering mechanism with the first roller while the temporarily stored first substrate is sent to the processing mechanism. Cut the first substrate between parts The first end of the second substrate supplied from the second roll is connected to a predetermined portion of the buffering mechanism side of the first substrate to be cut.

本發明第10形態之基板處理方法,係將已投入之長帶基板作為處理基板往長邊方向輸送並同時以處理機構施加既定處理,其特徵在於,包含:將捲繞有長帶基板之第1輥安裝在第1輥安裝部之動作;將與第1基板同等規格之第2基板以既定長度保持在保持部之動作;以配置在處理機構與第1輥安裝部之間之緩衝機構,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出之動作;以及在暫時儲存之第1基板往處理機構送出之期間,在緩衝機構與第1輥安裝部之間將第1基板切斷,且將從保持部供應之第2基板之前端部連結在切斷之第1基板之緩衝機構側之既定部分之動作。 The tenth aspect of the substrate processing method of the present invention is to transport a long-length substrate that has been put into the long-side direction as a processing substrate and apply a predetermined treatment to the processing mechanism at the same time. The method includes the following steps: One roller is mounted on the first roller mounting portion; the second substrate having the same specifications as the first substrate is held in the holding portion by a predetermined length; a buffer mechanism disposed between the processing mechanism and the first roller mounting portion, The operation of sending out the first substrate supplied from the first roller to the processing mechanism after temporarily storing it within the predetermined longest storage range; and mounting the buffering mechanism with the first roller while the temporarily stored first substrate is sent to the processing mechanism. The operation of cutting the first substrate between the parts and connecting the end portion before the second substrate supplied from the holding part to a predetermined portion of the buffer mechanism side of the cut first substrate.

本發明之形態中,能有效率地運用在複數個處理步驟之各個使用之處理單元,使基板處理之生產線整體之產率提升。 In the form of the present invention, the processing unit used in each of the plurality of processing steps can be efficiently used, so that the overall yield of the substrate processing line can be improved.

又,本發明之另一形態中,可大幅地減少基板之浪費,能有效地抑制成本增加。 Moreover, in another aspect of the present invention, it is possible to significantly reduce the waste of the substrate, and it is possible to effectively suppress an increase in cost.

BF1‧‧‧第1緩衝機構(第1緩衝部、緩衝機構) BF1‧‧‧The first buffer mechanism (the first buffer unit, the buffer mechanism)

BF2‧‧‧第2緩衝機構(第2緩衝部) BF2‧‧‧Second buffer mechanism (second buffer section)

CSa‧‧‧第1接帶器部(基板接續更換機構) CSa‧‧‧The first tape connector unit (substrate connection replacement mechanism)

CSb‧‧‧第2接帶器部(第2基板接續更換機構) CSb‧‧‧Second Tap Adapter Unit (Second Substrate Connection Replacement Mechanism)

CU10‧‧‧切斷機構 CU10‧‧‧ Cut-off mechanism

FS‧‧‧基板 FS‧‧‧ substrate

P‧‧‧基板 P‧‧‧ substrate

PK,PK2‧‧‧引入基板(第3基板) PK, PK2‧‧‧Introduced substrate (3rd substrate)

PU10‧‧‧接合機構 PU10‧‧‧Joint mechanism

RR1‧‧‧供應輥(第1輥) RR1‧‧‧Supply Roller (Roll 1)

RR2‧‧‧供應輥(第2輥) RR2‧‧‧Supply roller (second roller)

RR3‧‧‧回收輥(第3輥) RR3‧‧‧Recycling roller (3rd roller)

RR4‧‧‧回收輥(第4輥) RR4‧‧‧Recycling roller (4th roller)

RS1‧‧‧第1安裝部 RS1‧‧‧The first mounting section

RS2‧‧‧第2安裝部 RS2‧‧‧Second Mounting Section

RS3‧‧‧第3安裝部 RS3‧‧‧The third mounting section

RS4‧‧‧第4安裝部 RS4‧‧‧Fourth Mounting Section

ST‧‧‧選擇投入機構 ST‧‧‧Select input institution

SYS‧‧‧元件製造系統(基板處理裝置) SYS‧‧‧component manufacturing system (substrate processing device)

UA,UB,UB1~UB3,UC‧‧‧處理單元 UA, UB, UB1 ~ UB3, UC‧‧‧Processing unit

U1~Un‧‧‧處理裝置(處理機構) U1 ~ Un‧‧‧processing device (processing mechanism)

圖1係以示意方式顯示第1實施形態之基板處理系統之圖。 FIG. 1 is a view schematically showing a substrate processing system according to the first embodiment.

圖2係第1實施形態之切斷機構之概略立體圖。 Fig. 2 is a schematic perspective view of a cutting mechanism according to the first embodiment.

圖3係第1實施形態之第1接帶器部之概略外觀立體圖。 Fig. 3 is a perspective view showing a schematic appearance of a first taper section of the first embodiment.

圖4係第1實施形態之第2接帶器部之概略外觀立體圖。 Fig. 4 is a perspective view showing a schematic appearance of a second taper section of the first embodiment.

圖5係第1實施形態之基板處理系統之控制方塊圖。 Fig. 5 is a control block diagram of the substrate processing system of the first embodiment.

圖6係顯示第1實施形態之元件製造系統之一部分構成之圖。 Fig. 6 is a diagram showing a part of the structure of a component manufacturing system according to the first embodiment.

圖7係說明構成第1實施形態之生產線之複數個處理單元之模型配置例之圖。 Fig. 7 is a diagram illustrating a model arrangement example of a plurality of processing units constituting the production line of the first embodiment.

圖8係說明第1實施形態之生產線之作業時間提升之時序圖。 FIG. 8 is a timing chart illustrating the improvement of the operation time of the production line of the first embodiment.

圖9係顯示作為第2實施形態之基板處理裝置之元件製造系統之一部分構成之圖。 Fig. 9 is a diagram showing a part of a component manufacturing system of a substrate processing apparatus according to a second embodiment.

圖10係顯示第2實施形態之第1接帶器部及第1緩衝機構之概略構成之圖。 FIG. 10 is a diagram showing a schematic configuration of a first tape receiver section and a first buffer mechanism of the second embodiment.

圖11係顯示第2實施形態之第2接帶器部及第2緩衝機構之概略構成之圖。 Fig. 11 is a diagram showing a schematic configuration of a second tape receiver unit and a second buffer mechanism of the second embodiment.

圖12係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 FIG. 12 is a diagram showing a substrate bonding / cutting operation on the substrate supply side of the second embodiment.

圖13係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 FIG. 13 is a diagram showing a substrate bonding / cutting operation on the substrate supply side of the second embodiment.

圖14係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 FIG. 14 is a diagram showing a substrate bonding / cutting operation on the substrate supply side of the second embodiment.

圖15係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 FIG. 15 is a diagram showing a substrate bonding / cutting operation on the substrate supply side of the second embodiment.

圖16係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 FIG. 16 is a diagram showing a substrate bonding / cutting operation on the substrate supply side of the second embodiment.

圖17係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 FIG. 17 is a diagram showing a substrate bonding / cutting operation on the substrate supply side of the second embodiment.

圖18係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 FIG. 18 is a diagram showing a substrate bonding / cutting operation on the substrate supply side of the second embodiment.

圖19係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 FIG. 19 is a diagram showing a substrate bonding / cutting operation on the substrate supply side of the second embodiment.

圖20係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 FIG. 20 is a diagram showing a substrate bonding / cutting operation on the substrate collection side of the second embodiment.

圖21係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 FIG. 21 is a diagram showing a substrate bonding / cutting operation on a substrate recovery side of the second embodiment.

圖22係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 FIG. 22 is a diagram showing a substrate bonding / cutting operation on a substrate recovery side of the second embodiment.

圖23係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 FIG. 23 is a diagram showing a substrate bonding / cutting operation on the substrate collection side of the second embodiment.

圖24係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 FIG. 24 is a diagram showing a substrate bonding / cutting operation on the substrate collection side of the second embodiment.

圖25係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 FIG. 25 is a diagram showing a substrate bonding / cutting operation on the substrate collection side of the second embodiment.

(第1實施形態) (First Embodiment)

以下,參照圖1至圖6說明本發明之切斷機構、接合機構、基板處理系統、以及基板處理方法之實施形態。 Hereinafter, embodiments of the cutting mechanism, the bonding mechanism, the substrate processing system, and the substrate processing method according to the present invention will be described with reference to FIGS. 1 to 6.

圖1係作為一例以示意方式顯示使片狀基板P依序通過三個處理步驟A、B、C之輥方式之基板處理系統SYS之圖。 FIG. 1 is a diagram schematically showing, as an example, a substrate processing system SYS of a roller system in which a sheet substrate P is sequentially passed through three processing steps A, B, and C.

基板處理系統之主體構成為對基板P作為步驟A施加處理A(第1處理)之處理單元UA(第1處理單元)、作為步驟B施加處理B(第1處理、第2處理)之處理單元UB(第1處理單元、第2處理單元)、作為步驟C施加處理C(第2處理)之處理單元UC(第2處理單元)、切斷機構CU10、接合機構PU10、選擇投入機構ST1,ST2、控制部CT(參照圖5)。 The main body of the substrate processing system is a processing unit UA (first processing unit) that applies a process A (first process) to the substrate P, and a processing unit that applies a process B (first process, second process) to step B. UB (first processing unit, second processing unit), processing unit UC (second processing unit) to apply process C (second process) as step C, cutting mechanism CU10, joint mechanism PU10, selection input mechanism ST1, ST2 Control unit CT (refer to FIG. 5).

處理單元UA具備用於安裝供應輥RRA之輥安裝部RSA,將已施加處理A之基板P往切斷機構CU10送出。處理單元UB由分別施加相同處理B之處理單元UB1~UB3構成,例如,在處理單元UA之基板搬送方向之下游側配置成上下3段、或水平3列。 The processing unit UA includes a roller mounting section RSA for mounting the supply roller RRA, and sends the substrate P to which the processing A has been applied to the cutting mechanism CU10. The processing unit UB is composed of the processing units UB1 to UB3 to which the same processing B is applied, for example, the processing unit UA is arranged on the downstream side of the substrate conveying direction of the processing unit UA in three vertical rows or three horizontal rows.

各處理單元UB1~UB3具備用以安裝已施加處理A之基板P之輥之安裝部RSB11~RSB31、用以安裝已施加處理B之基板P之輥之安裝部RSB12~RSB32,來自安裝在安裝部RSB11~RSB31之輥RRB11~RRB31(以下,適當稱為子輥RRB11~RRB31)之基板P,在施加處理B後,捲繞至安裝 在安裝部RSB12~RSB32之輥RRB12~RRB32(以下,適當稱為子輥RRB12~RRB32)。 Each of the processing units UB1 to UB3 includes a mounting portion RSB11 to RSB31 for mounting the roller to which the substrate P has been applied, and a mounting portion RSB12 to RSB32 for mounting the roller to which the substrate P has been applied, from the mounting portion. The substrate P of the rollers RRB11 to RRB31 (hereinafter referred to as the sub-rollers RRB11 to RRB31) of RSB11 to RSB31 is wound to the installation after applying the process B Rollers RRB12 to RRB32 (hereinafter referred to as sub-rollers RRB12 to RRB32 as appropriate) in the mounting sections RSB12 to RSB32.

此外,圖1中,在處理單元UA後段之切斷機構CU10之後設有捲繞已施加處理A之基板P之輥RR1。在此輥RR1捲繞基板P之既定長度量後,切斷基板P,輥RR1係作為子輥RRB11~RRB31之任一個安裝在各處理單元UB1~UB3之安裝部RSB11~RSB31之任一個。 Further, in FIG. 1, a roller RR1 for winding the substrate P to which the process A has been applied is provided after the cutting mechanism CU10 at the rear stage of the processing unit UA. After the roller RR1 is wound around a predetermined length of the substrate P, the substrate P is cut, and the roller RR1 is mounted on any one of the mounting sections RSB11 to RSB31 of each of the processing units UB1 to UB3 as the sub-rollers RRB11 to RRB31.

處理單元UC可將以處理單元UB1~UB3施加處理B後之子輥RRB12~RRB32之任一個作為輥RR2安裝。捲繞於此輥RR2之基板P(已施加處理A、B之中間產品)係透過接合機構PU10搬入處理單元UC,被施加處理C。接受處理C之基板P捲繞回收至安裝在輥安裝部RSC之回收輥RRC。 The processing unit UC may install any one of the child rollers RRB12 to RRB32 after the processing B is applied to the processing units UB1 to UB3 as the roller RR2. The substrate P (intermediate product to which treatments A and B have been applied) wound around this roller RR2 is carried into the processing unit UC through the bonding mechanism PU10 and is subjected to the treatment C. The substrate P that has undergone the process C is wound and recovered to a recovery roller RRC mounted on the roller mounting section RSC.

本實施形態中,在處理單元UA之處理A之處理速度VA(基板P之搬送速度)、在處理單元UB1~UB3之處理B之處理速度VB(基板P之搬送速度)、在處理單元UC之處理C之處理速度VC(基板P之搬送速度)之關係如下。 In this embodiment, the processing speed VA (transport speed of the substrate P) in the processing unit UA, the processing speed VB (transport speed of the substrate P) in the processing B in the processing units UB1 to UB3, and the processing speed UC in the processing unit UC. The relationship between the processing speed VC (transfer speed of the substrate P) of the process C is as follows.

VA≒VC>VB VA ≒ VC> VB

此外,在處理單元UA與處理單元UB1~UB3之任一個之間,基板P之搬送速度為VA>VB,因此處理單元UA與搬送速度(V1)高之第1處理單元對應,處理單元UB1~UB3之任一個與搬送速度(V2)低之第2處理單元對應。另一方面,在處理單元UB1~UB3之任一個與處理單元UC之間,基板P之搬送速度為VB<VC,因此處理單元UB1~UB3之任一個與搬送速度(V1)低之 第1處理單元對應,處理單元UC與搬送速度(V2)高之第2處理單元對應。 In addition, between the processing unit UA and any one of the processing units UB1 to UB3, the transfer speed of the substrate P is VA> VB. Therefore, the processing unit UA corresponds to the first processing unit with a high transfer speed (V1), and the processing units UB1 to UB1 ~ Any of UB3 corresponds to the second processing unit having a low conveying speed (V2). On the other hand, between any one of the processing units UB1 to UB3 and the processing unit UC, the transfer speed of the substrate P is VB <VC, so any of the processing units UB1 to UB3 is lower than the transfer speed (V1). The first processing unit corresponds, and the processing unit UC corresponds to the second processing unit having a high conveyance speed (V2).

本實施形態中,處理速度VA、VC可設定成處理速度VB之約3倍。如以往,實施處理步驟B之處理單元UB為一台之情形,從供應輥RRA至回收輥RRC連接成一個之基板P依序通過處理單元UA,UB,UC,因此其搬送速度與最慢之處理速度VB一致。亦即,生產線整體之作業時間(線速度、產率)被最慢之處理單元限制。 In this embodiment, the processing speeds VA and VC can be set to approximately three times the processing speed VB. As in the past, in the case where there is one processing unit UB that implements processing step B, one substrate P connected from the supply roller RRA to the recovery roller RRC passes through the processing units UA, UB, and UC in sequence, so its transfer speed is the slowest. The processing speed VB is consistent. That is, the operating time (line speed, yield) of the entire production line is limited by the slowest processing unit.

本實施形態中,藉由使處理速度慢之處理單元UB複線化(此處為三台並置),可成為不受限制之構成。為了達成此複線化(或設置複數個),必須要基板P捲繞至輥RR1既定長度量後不暫時停止處理步驟A與處理步驟B而切斷基板P之機構CU10。 In this embodiment, the processing unit UB, which has a slow processing speed, is double-lined (here, three units are juxtaposed), so that it can have an unlimited configuration. In order to achieve this re-threading (or multiple installations), the mechanism CU10 that cuts the substrate P without temporarily stopping the processing step A and the processing step B after winding the substrate P to a predetermined length of the roller RR1 is necessary.

切斷機構CU10主要以既定長度切斷已施加處理A之基板P,如圖1及圖2所示,具備第1緩衝機構(第1緩衝部)BF1與第1接帶器部CSa(切斷部)。又,切斷機構CU10進一步具備使第1接帶器部CSa(切斷部)之動作與在第1緩衝機構BF1(第1緩衝部)之基板P之儲存量連動之連動控制部。 The cutting mechanism CU10 mainly cuts the substrate P to which the process A has been applied at a predetermined length. As shown in FIG. 1 and FIG. 2, the cutting mechanism CU10 includes a first buffer mechanism (first buffer portion) BF1 and a first tape feeder portion CSa (cutting). unit). Further, the cutting mechanism CU10 further includes an interlocking control unit that interlocks the operation of the first tape receiver section CSa (cutting section) with the storage amount of the substrate P in the first buffering mechanism BF1 (first buffering section).

第1緩衝機構BF1具有設在實施作為第1處理之處理A之單元UA與第1接帶器部CSa之間且以多數個輥等使基板P折返儲存既定長度量之張力捲筒機構DR1,藉由張力捲筒機構DR1之上下動等,將基板P之儲存長度可變地調整並同時將基板P搬入/搬出。第1緩衝機構BF1具備與處理單元UA之基板P之搬送方向之下游側相鄰設置且調整往第1接帶器部CSa搬出之基板P之搬送量(或搬送速度)之夾持驅動捲筒NR1(參照圖 5)。張力捲筒機構DR1之驅動及夾持驅動捲筒NR1之驅動被控制部CT控制。 The first buffer mechanism BF1 includes a tension reel mechanism DR1 which is provided between the unit UA which implements the process A as the first process and the first tape receiver unit CSa, and returns the substrate P with a plurality of rollers and the like to store a predetermined length. By the tension reel mechanism DR1 moving up and down, the storage length of the substrate P is variably adjusted, and the substrate P is carried in / out at the same time. The first buffer mechanism BF1 is provided with a clamping drive roll which is disposed adjacent to the downstream side of the substrate P in the processing direction of the processing unit UA and adjusts the transfer amount (or transfer speed) of the substrate P to the first tape receiver section CSa. NR1 (refer to the figure 5). The driving of the tension reel mechanism DR1 and the driving of the clamp driving reel NR1 are controlled by the control unit CT.

此處,藉由顯示第1接帶器部CSa之概略立體外觀之圖3說明其構成。 Here, the structure will be described with reference to FIG. 3 which shows a schematic three-dimensional appearance of the first tape connector portion CSa.

第1接帶器部CSa具備在上面具有以例如多孔質材形成之吸附墊1且往基板P之搬送方向(以下,僅稱為搬送方向)移動自如之滑件2、將滑件2往搬送方向移動自如地支承之附導軌之升降台3、使升降台3升降之驅動部4、升降台3位於上升位置時往基板P之寬度方向移動且可將吸附在滑件2之吸附墊1之基板P切斷之刀具部5、可對基板P黏貼黏著帶TP之黏貼部6、及設在升降台3上方且以兩側保持捲繞已施加處理A之基板P之輥RR1用之捲繞軸7之保持部8(可上下動)。 The first belt adapter section CSa includes a slider 2 on which the suction pad 1 formed of, for example, a porous material is provided on the upper surface and can be moved freely in the transport direction of the substrate P (hereinafter, simply referred to as the transport direction). The lifting platform 3 with guide rail supported by the direction, the driving part 4 for lifting the lifting platform 3, and the lifting platform 3 is moved to the width direction of the substrate P when the lifting platform 3 is in the rising position, and can be adsorbed on the adsorption pad 1 of the sliding member 2. The cutter part 5 for cutting the substrate P, the adhesive part 6 for adhering the adhesive tape TP to the substrate P, and the winding for the roller RR1 provided above the lifting platform 3 and holding the substrate P to which the treatment A has been applied on both sides Holding portion 8 of shaft 7 (movable up and down).

此外,捲繞軸7,在其外周面之一部分(或全周面)黏貼有黏著力高之樹脂膜或材料,在基板P之前端部接觸捲繞軸7之外周面後,藉由使捲繞軸7旋轉,可自動地捲繞基板P。 In addition, the winding shaft 7 is adhered with a resin film or a material having a high adhesive force to a part (or the entire peripheral surface) of the outer peripheral surface. After the front end of the substrate P contacts the outer peripheral surface of the winding shaft 7, the The substrate P can be automatically wound by rotating around the shaft 7.

此等滑件2、升降台3、驅動部4、刀具部5、黏貼部6、及保持部8構成為一體化之工作站部SN,可載置在腳輪台等搬送,且可定位在既定位置。 These sliders 2, the lifting table 3, the driving section 4, the cutter section 5, the sticking section 6, and the holding section 8 constitute an integrated work station section SN, which can be carried on casters, etc., and can be positioned at a predetermined position. .

此等滑件2、驅動部4、刀具部5、黏貼部6之各驅動被控制部CT控制(參照圖5)。 Each drive of these sliders 2, the drive part 4, the cutter part 5, and the sticking part 6 is controlled by the control part CT (refer FIG. 5).

又,工作站部SN具備可保持基板P並往長邊方向移動且包含滑件2、升降台3、驅動部4等之移動部,及使移動部移動至切斷機構CU10之切斷 區域或接合機構PU10之接合區域之移動控制部。 The workstation unit SN includes a moving unit that can move the substrate P in the longitudinal direction while holding the substrate P, and a cutting unit that moves the moving unit to the cutting mechanism CU10. Zone or the movement control unit of the joint area of the joint mechanism PU10.

此外,本實施形態中之黏貼部6係藉由黏著帶TP將基板P貼合,但為其他黏貼方式(機構)亦可。例如,將接著劑往基板P之與搬送方向正交之寬度方向塗布成帶狀並加壓貼合之方式、基板P為樹脂膜等之情形加熱基板P之欲貼合部分並壓接之方式、或超音波接合等之方式亦可。 In addition, although the adhesive part 6 in this embodiment adheres the board | substrate P by the adhesive tape TP, it can also be another adhesive method (mechanism). For example, a method in which the adhesive is applied to the substrate P in a width direction orthogonal to the conveying direction in a strip shape and pressure-bonded, and when the substrate P is a resin film, the portion to be bonded to the substrate P is heated and pressure-bonded. Or ultrasonic bonding.

又,設在滑件2上面之吸附墊1雖藉由真空壓保持基板P,但藉由真空壓以外之機械式開閉機構(開閉手等)將基板P卡止在滑件1之上面之構成亦可。 In addition, although the suction pad 1 provided on the slider 2 holds the substrate P by vacuum pressure, the substrate P is locked on the slider 1 by a mechanical opening and closing mechanism (opening and closing hands) other than vacuum pressure. Yes.

此外,圖1所示之選擇投入機構ST1,在控制部CT之控制下,將已施加處理A之基板P捲繞於捲繞軸7之輥RR1(以下,稱為子輥RR1)作為子輥RRB11,RRB21,RRB31之任一個選擇性投入安裝部RSB11~RSB31之任一個,且將預備之捲繞軸7搬送至子輥RR1被搬出而空出來之第1接帶器部CSa之保持部8。 In addition, the selection and input mechanism ST1 shown in FIG. 1, under the control of the control unit CT, rolls the substrate P to which the process A has been applied onto a roll RR1 (hereinafter, referred to as a sub-roller RR1) of the winding shaft 7 as a sub-roller. Any one of RRB11, RRB21, and RRB31 is selectively put into any of the mounting sections RSB11 to RSB31, and the prepared winding shaft 7 is transported to the holding section 8 of the first belt take-up section CSa which is vacated by the sub-roller RR1. .

本實施形態中,處理速度VA、VC為處理速度VB之約3倍,處理單元UB亦設置三台,因此子輥RR1(亦即,子輥RRB11~RRB31,RRB12~RRB32,後述RR2)捲繞之基板P之長度係設定成捲繞於成為親輥之供應輥RRA之基板P之長度之1/3程度。 In this embodiment, the processing speeds VA and VC are about three times the processing speed VB, and three processing units UB are also provided. Therefore, the sub-rollers RR1 (that is, the sub-rollers RRB11 to RRB31, RRB12 to RRB32, and RR2 described later) are wound. The length of the substrate P is set to approximately 1/3 of the length of the substrate P wound around the supply roll RRA which becomes a parent roll.

是以,切斷機構CU10以將捲繞於供應輥RRA之基板P之全長大致三等分之既定長度將基板P切斷。 Therefore, the cutting mechanism CU10 cuts the substrate P to a predetermined length of approximately one-third of the total length of the substrate P wound around the supply roller RRA.

又,圖1之選擇投入機構ST2,在控制部CT之控制下,選擇將以處理單元UB1~UB3之任一個施加處理B後之基板P捲繞既定長度量 之安裝部RSB12~RSB32之子輥RRB12~RRB32之任一個,投入接合機構PU10(輥搬送),且對子輥RRB12~RRB32之任一個被搬送而空出來之安裝部RSB12~RSB32安裝預備之捲繞軸。 In addition, under the control of the control unit CT, the selection and input mechanism ST2 in FIG. 1 selects a substrate P to be wound around a predetermined length by applying processing B to any of the processing units UB1 to UB3. Any of the mounting sections RSB12 ~ RSB32 of the sub-rollers RRB12 ~ RRB32 is put into the joint mechanism PU10 (roller conveyance), and any of the sub-rollers RRB12 ~ RRB32 is transported and vacated. The mounting section RSB12 ~ RSB32 is prepared for winding axis.

接合機構PU10主要將施加處理B並搬送之子輥RRB12~RRB32之任一個作為子輥RR2,接合於之前投入被切斷之基板之終端附近,如圖1所示,具備第2接帶器部CSb(接合部)與第2緩衝機構(第2緩衝部)BF2。又,接合機構PU10,包含將已施加處理B之基板接合之第2接帶器部CSb(接合部)、與基板之儲存量可依據施加處理B之基板之搬送量改變且調整從接合部投入至處理B之基板之搬送量之第2緩衝機構(緩衝部)BF2。 The bonding mechanism PU10 mainly uses any one of the sub-rollers RRB12 to RRB32 to which the process B is applied and transported as the sub-roller RR2, and is bonded to the vicinity of the terminal of the substrate that was previously cut off. As shown in FIG. 1, the second belt connector CSb is provided. (Joint portion) and the second buffer mechanism (second buffer portion) BF2. In addition, the bonding mechanism PU10 includes a second tape taker section CSb (bonding section) for bonding the substrate to which the process B has been applied, and the storage amount with the substrate can be changed according to the amount of the substrate to which the process B is applied, and the input from the bonding section can be adjusted. The second buffering mechanism (buffering portion) BF2 to the amount of substrates transferred to process B.

第2接帶器部CSb,如圖4所示,在設置在上述第1接帶器部CSa之工作站部SN使基板P之搬送方向成為相反之狀態下設置。亦即,第2接帶器部CSb具備在上面具有吸附墊1且往搬送方向移動自如之滑件2、將滑件2往搬送方向移動自如地支承之附導軌之升降台3、使升降台3升降之驅動部4、升降台3位於上升位置時往基板P之寬度方向移動且可將吸附在滑件2之吸附墊1之基板P切斷之刀具部5、可對基板P黏貼黏著帶TP之黏貼部6、及設在升降台3上方且以兩側保持捲繞已施加處理B之基板P之子輥RR2用之捲繞軸7之保持部8。 As shown in FIG. 4, the second tape receiver section CSb is provided in a state where the work station section SN provided in the first tape adapter section CSa has the substrate P in the opposite direction. That is, the second belt adapter section CSb includes a slider 2 having an upper surface of the suction pad 1 and capable of moving freely in the conveying direction, and a lifting platform 3 with a guide rail that supports the slider 2 to move freely in the conveying direction. 3 Lifting driving part 4, Lifting table 3 When moving to the width direction of the substrate P when the lifting platform 3 is in the rising position, the cutter part that can cut the substrate P adsorbed on the suction pad 1 of the slider 2 5. Adhesive tape can be adhered to the substrate P The adhesive portion 6 of the TP and the holding portion 8 of the winding shaft 7 provided on the lifting platform 3 and holding the winding roller 7 for winding the sub-roller RR2 of the substrate P to which the process B has been applied are held on both sides.

第2緩衝機構BF2與第1緩衝機構BF1構成相同,將搬入處理單元UC之基板P在可調整長度之範圍可變地儲存,與處理單元UC之基板P之搬送方向之上游側相鄰設置。 The second buffer mechanism BF2 has the same structure as the first buffer mechanism BF1. The substrate P carried into the processing unit UC is variably stored within an adjustable length range, and is disposed adjacent to the upstream side of the substrate P of the processing unit UC in the conveying direction.

第2緩衝機構BF2具備在基板P之搬送方向相鄰之複數個捲筒彼此往相反方向升降可將基板P之儲存量可變地調整之張力捲筒機構DR2、及調整從第2接帶器部CSb往張力捲筒機構DR2搬送之基板P之搬送量(搬送速度)之夾持驅動捲筒NR2(參照圖5)。張力捲筒機構DR2之驅動及夾持驅動捲筒NR2之驅動被控制部CT控制。 The second buffer mechanism BF2 is provided with a tension reel mechanism DR2 capable of variably adjusting the storage amount of the substrate P while a plurality of reels adjacent to each other in the conveying direction of the substrate P are moved upward and downward in opposite directions. The clamping drive roll NR2 (refer to FIG. 5) of the amount of conveyance (conveying speed) of the substrate P that is transferred from the portion CSb to the tension roll mechanism DR2. The driving of the tension reel mechanism DR2 and the driving of the clamp driving reel NR2 are controlled by the control unit CT.

圖5係圖1~圖4所示之基板處理系統之控制方塊圖。 FIG. 5 is a control block diagram of the substrate processing system shown in FIGS. 1 to 4.

如圖5所示,控制部CT控制處理單元UA,UB(UB1~UB3),UC之動作,且統籌控制設在切斷機構CU10與接合機構PU10之各個之滑件2、驅動部4、刀具部5、黏貼部6、選擇投入機構ST1,ST2、張力捲筒機構DR1,DR2、夾持驅動捲筒NR1,NR2等之驅動。此外,控制部CT計數管理供應輥RRA、回收輥RRC之旋轉驅動、在各步驟(各處理單元)之基板P之搬送長度,計數管理成為基板P之供應側之各輥之基板殘餘量、成為基板P之回收側之各輥之基板捲繞量,亦進行處理步驟A~C之整體作業時間之管理、各輥分別之處理上有無問題或產生不良情形之程度或部位等資訊之管理。控制部CT包含使切斷機構CU10之動作與在第1緩衝部BF1之基板P之儲存量連動之連動控制部。同樣地,控制部CT包含使接合機構PU10之動作與在第2緩衝部BF2之基板P之儲存量連動之連動控制部。 As shown in FIG. 5, the control unit CT controls the operations of the processing units UA, UB (UB1 to UB3), and UC, and controls the sliders 2, the driving unit 4, and the cutters provided in each of the cutting mechanism CU10 and the coupling mechanism PU10 in an integrated manner. Part 5, Adhesive part 6, Selective input mechanism ST1, ST2, tension reel mechanism DR1, DR2, clamping drive reels NR1, NR2 and so on. In addition, the control unit CT counts and manages the rotation driving of the supply roller RRA and the recovery roller RRC, and the conveyance length of the substrate P in each step (each processing unit). The winding amount of the substrates of the rolls on the recovery side of the substrate P is also managed by the management of the overall operating time of processing steps A to C, the management of each roll, whether there is a problem or the degree or location of the problem. The control unit CT includes an interlocking control unit that interlocks the operation of the cutting mechanism CU10 with the storage amount of the substrate P in the first buffer unit BF1. Similarly, the control unit CT includes an interlocking control unit that interlocks the operation of the bonding mechanism PU10 with the storage amount of the substrate P in the second buffer portion BF2.

接著,說明上述構成之基板處理系統之動作。 Next, the operation of the substrate processing system configured as described above will be described.

此處,如圖1所示,在處理單元UB1處理B完成之後一刻,子輥RRB12被選擇投入機構ST2搬送至第2接帶器部CSb之保持部8。又,在處理單元UB2,對從安裝在安裝部RSB21之子輥RRB21引出之基板P施加處理B。 又,在處理單元UB3,在成為下一個處理對象之子輥RRB31安裝至安裝部RSB31為止待機。 Here, as shown in FIG. 1, immediately after the processing unit UB1 completes processing B, the sub-roller RRB12 is transported to the holding section 8 of the second belt receiver section CSb by the selection and input mechanism ST2. In the processing unit UB2, a process B is applied to the substrate P drawn out from the sub-roller RRB21 mounted on the mounting portion RSB21. The processing unit UB3 waits until the sub-roller RRB31 to be processed next is mounted to the mounting portion RSB31.

又,以下說明中,由於各構成機器之動作被控制部CT控制,因此省略其記載。 In the following description, since the operations of the respective constituent devices are controlled by the control unit CT, the description thereof is omitted.

首先,在第1接帶器部CSa之保持部8所保持之子輥RR1,以既定長度捲繞已施加處理A之基板P後,在第1緩衝機構BF1,夾持驅動捲筒NR1停止驅動,停止對第1接帶器部CSa之基板P之供應。此時,在處理單元UA持續進行處理A,基板P被送往第1緩衝機構BF1。因此,在第1緩衝機構BF1之張力捲筒機構DR1驅動成使基板P之儲存量增加之方向。 First, the sub-roller RR1 held by the holding section 8 of the first tape receiver section CSa winds the substrate P to which the process A has been applied at a predetermined length, and then stops and drives the driving roller NR1 in the first buffer mechanism BF1. The supply of the substrate P to the first tape receiver section CSa is stopped. At this time, the processing unit UA continues to perform the process A, and the substrate P is sent to the first buffer mechanism BF1. Therefore, the tension reel mechanism DR1 in the first buffer mechanism BF1 is driven in a direction to increase the storage amount of the substrate P.

與來自第1緩衝機構BF1之基板P之供應停止連動,在第1接帶器部CSa進行基板P之切斷處理。 In conjunction with the stoppage of the supply of the substrate P from the first buffer mechanism BF1, the substrate P is cut in the first tape receiver portion CSa.

具體而言,首先,滑件2移動至與刀具部5對向之位置後,藉由驅動部4之作動使升降台3與滑件2一起上升。藉由滑件2之上升,吸附墊1從背面(下面)吸附保持基板P,定位刀具部5之切斷位置。之後,刀具部5,往基板P之寬度方向移動並將基板P切斷。基板P被切斷後,選擇投入機構ST1將子輥RR1作為子輥RRB31投入處理單元UB3之安裝部RSB31。又,選擇投入機構ST1在子輥RR1排出後成為空的第1接帶器部CSa之保持部8裝填預備之捲繞軸7。 Specifically, first, after the slider 2 is moved to a position facing the cutter section 5, the lift table 3 and the slider 2 are raised together by the operation of the drive section 4. As the slider 2 rises, the suction pad 1 sucks and holds the substrate P from the back surface (lower surface), and positions the cutting position of the cutter portion 5. Thereafter, the cutter section 5 moves in the width direction of the substrate P and cuts the substrate P. After the substrate P is cut, the selection and input mechanism ST1 puts the sub-roller RR1 as the sub-roller RRB31 into the mounting portion RSB31 of the processing unit UB3. In addition, the selection and input mechanism ST1 is configured to hold the prepared winding shaft 7 in the holding section 8 of the first belt receiver section CSa which becomes empty after the sub-roller RR1 is discharged.

在第1接帶器部CSa,捲繞軸7安裝在保持部8後,滑件2移動(同時夾持驅動捲筒NR1亦同步旋轉既定量)以使吸附保持在滑件2上面 之基板P之前端部分位於捲繞軸7之下方,支承捲繞軸7之保持部8下降一定距離,基板P之前端部分密合於捲繞軸7之外周面之黏著部。如此,從第1緩衝機構BF1側延伸之基板P之前端部分連接於新的捲繞軸7後,解除吸附墊1之吸附保持,之後,保持部8返回原本之高度位置,藉由驅動部4之作動使升降台3與滑件2一起下降。 In the first taper section CSa, after the winding shaft 7 is mounted on the holding section 8, the slider 2 moves (at the same time, the driving roller NR1 is simultaneously rotated and the predetermined amount is rotated) to keep the suction on the slider 2. The front end portion of the substrate P is located below the winding shaft 7, the holding portion 8 supporting the winding shaft 7 is lowered a certain distance, and the front end portion of the substrate P is closely adhered to the adhesive portion on the outer peripheral surface of the winding shaft 7. In this way, after the front end portion of the substrate P extending from the side of the first buffer mechanism BF1 is connected to the new winding shaft 7, the suction holding of the suction pad 1 is released, and then the holding portion 8 returns to the original height position, and the driving portion 4 This action lowers the lifting platform 3 together with the slider 2.

之後,夾持驅動捲筒NR1與新的捲繞軸7之旋轉驅動再次開始,來自第1緩衝機構BF1之基板P之供應再次開始,基板P捲繞至新的捲繞軸7。基板P之供應再次開始後,夾持驅動捲筒NR1以較與在處理單元UA之處理速度VA對應之基板P之輸送速度(亦即,基板P送至第1緩衝機構BF1之速度)稍快之速度旋轉。在張力捲筒機構DR1,與夾持驅動捲筒NR1之驅動對應,驅動成使基板P之儲存量減少之方向。 After that, the rotation driving of the clamp driving reel NR1 and the new winding shaft 7 starts again, the supply of the substrate P from the first buffer mechanism BF1 starts again, and the substrate P is wound on the new winding shaft 7. After the supply of the substrate P is started again, the grip driving roll NR1 is slightly faster than the conveyance speed of the substrate P corresponding to the processing speed VA in the processing unit UA (that is, the speed at which the substrate P is sent to the first buffer mechanism BF1). Speed. The tension reel mechanism DR1 is driven in a direction corresponding to the driving of the clamp driving reel NR1 to decrease the storage amount of the substrate P.

在儲存在第1緩衝機構BF1之基板P之長度為大致最小後,以與在處理單元UA之基板P之輸送速度相同之速度驅動夾持驅動捲筒NR1。 After the length of the substrate P stored in the first buffer mechanism BF1 is approximately the minimum, the grip driving roller NR1 is driven at the same speed as the conveyance speed of the substrate P in the processing unit UA.

另一方面,從安裝在處理單元UB3之安裝部RSB31之子輥RRB31引出基板P,以與處理速度VB對應之速度輸送並施加處理B,捲繞至安裝在安裝部RSB32之子輥RRB32。 On the other hand, the substrate P is pulled out from the sub-roller RRB31 mounted on the mounting section RSB31 of the processing unit UB3, conveyed and applied with the processing B at a speed corresponding to the processing speed VB, and wound around the sub-roller RRB32 mounted on the mounting section RSB32.

在處理單元UB3,在對從子輥RRB31引出之基板P施加處理B之期間,在處理單元UB2,對從子輥RRB21引出之基板P之處理B完成,捲繞有基板P之子輥RRB2在安裝部RSB22待機。 In the processing unit UB3, while the process B is applied to the substrate P drawn out from the sub-roller RRB31, the processing unit UB2 completes the process B of the substrate P drawn out from the sub-roller RRB21, and the sub-roller RRB2 wound with the substrate P is installed. The RSB22 is on standby.

藉由選擇投入機構ST2,對來自之前作為子輥RR2安裝在 接合機構PU10之子輥RRB12之基板P之處理單元UC之處理C完成後,在接合機構PU10之第2緩衝機構BF2之夾持驅動捲筒NR2之驅動停止,往張力捲筒機構DR2之基板P之供應停止。 By selecting the input mechanism ST2, the After the processing C of the processing unit UC of the substrate P of the sub-roller RRB12 of the bonding mechanism PU10 is completed, the driving of the clamping drive roll NR2 of the second buffer mechanism BF2 of the bonding mechanism PU10 stops, and the drive of the substrate P of the tension roll mechanism DR2 Supply stopped.

此時,在處理單元UC持續進行處理C。因此,張力捲筒機構DR2作動,以與在處理單元UC之基板P之輸送量(處理速度VC)對應之一定速度將儲存在第2緩衝機構BF2之基板P往處理單元UC送出。 At this time, processing C is continuously performed in the processing unit UC. Therefore, the tension reel mechanism DR2 operates to send the substrate P stored in the second buffer mechanism BF2 to the processing unit UC at a constant speed corresponding to the conveyance amount (processing speed VC) of the substrate P in the processing unit UC.

在第2接帶器部CSb,與在第1接帶器部CSa之切斷處理同樣地,滑件2移動至與刀具部5對向之位置後,藉由驅動部4之作動使升降台3與滑件2一起上升。藉由滑件2之上升,吸附墊1從背面(下面)吸附保持來自子輥RRB12之基板P,定位刀具部5之切斷位置。之後,刀具部5,往基板P之寬度方向移動並將基板P切斷。基板P被切斷後,選擇投入機構ST2從保持部8取出捲繞有子輥RR2(RRB12)之捲繞軸7,在空的保持部8安裝在安裝部RSB22待機之子輥RRB22作為子輥RR2。 In the second belt-receiver section CSb, similar to the cutting process in the first belt-receiver section CSa, the slider 2 is moved to a position opposite to the cutter section 5, and then the lifting table is moved by the operation of the drive section 4. 3 rises with slider 2. As the slider 2 rises, the suction pad 1 sucks and holds the substrate P from the sub-roller RRB12 from the back surface (lower surface), and positions the cutting position of the cutter portion 5. Thereafter, the cutter section 5 moves in the width direction of the substrate P and cuts the substrate P. After the substrate P is cut, the selection mechanism ST2 takes out the winding shaft 7 wound with the sub-roller RR2 (RRB12) from the holding section 8 and mounts the empty holding section 8 on the sub-roller RRB22 waiting for the mounting section RSB22 as the sub-roller RR2.

作為子輥RR2,子輥RRB22安裝在第2接帶器部CSb之保持部8後,從子輥RR2引出之基板P之前端部分與之前切斷之第2緩衝機構BF2側之基板P之後端部對準,二片基板P皆以吸附墊1保持。在此狀態下,二片基板P藉由黏著帶TP接合。基板P接合後,解除吸附墊1之吸附保持,之後,藉由驅動部4之作動使升降台3與滑件2一起下降。之後,藉由驅動夾持驅動捲筒NR2,從第2接帶器部CSb往第2緩衝機構BF2之基板P之供應再次開始。 As the sub-roller RR2, after the sub-roller RRB22 is mounted on the holding portion 8 of the second belt receiver section CSb, the front end portion of the substrate P led out from the sub-roller RR2 and the rear end of the substrate P on the side of the second buffer mechanism BF2 cut off before The two substrates P are held by the suction pad 1. In this state, the two substrates P are bonded by the adhesive tape TP. After the substrate P is bonded, the suction and holding of the suction pad 1 is released, and thereafter, the lifter 3 and the slider 2 are lowered together by the operation of the driving unit 4. After that, the reel NR2 is driven and driven to supply the substrate P from the second tape receiver section CSb to the second buffer mechanism BF2 again.

基板P之供應再次開始後,夾持驅動捲筒NR2以較與在處 理單元UC之處理速度VC對應之基板P之輸送速度稍快之速度旋轉。在張力捲筒機構DR2,與夾持驅動捲筒NR2之驅動對應,驅動成使基板P之儲存量增加之方向。 After the supply of the substrate P is started again, the grip driving roll NR2 is compared with the existing one. The processing speed VC of the processing unit UC rotates at a speed slightly higher than the conveying speed of the substrate P. The tension reel mechanism DR2 is driven in a direction that increases the storage amount of the substrate P in correspondence with the driving of the clamp driving reel NR2.

在儲存在第2緩衝機構BF2之基板P之長度為大致最大後,以與在處理單元UC之基板P之輸送速度相同之速度驅動夾持驅動捲筒NR2。接著,從透過第2緩衝機構BF2輸送至處理單元UC之子輥RRB22(子輥RR2)引出之基板P係以處理速度VC施加處理C。 After the length of the substrate P stored in the second buffer mechanism BF2 is approximately the maximum, the grip driving roller NR2 is driven at the same speed as the conveyance speed of the substrate P in the processing unit UC. Next, the substrate P drawn from the sub-roller RRB22 (sub-roller RR2) conveyed to the processing unit UC through the second buffer mechanism BF2 is applied with the process C at the processing speed VC.

如上述,以處理單元UA施加處理A後之基板P,捲繞為依據處理單元UB之台數分割之長度之子輥RR1後,依序投入處理單元UB1~UB3並施加處理B之後,從處理單元UB1~UB3作為子輥RR2依序投入處理單元UC並施加處理C。關於處理速度VB較處理速度VC慢之處理單元UB,依據處理速度之比設有三台,因此表觀上,從三台處理單元UB1~UB3以與用處理速度VB之3倍之處理速度施加處理B後之情形相同之週期將子輥RR2投入處理單元VC。 As described above, the substrate P after the processing A is applied by the processing unit UA is wound into a sub-roller RR1 of a length divided according to the number of the processing unit UB, and is sequentially input into the processing units UB1 to UB3 and the processing B is applied. UB1 to UB3 are sequentially put into the processing unit UC as the sub-rollers RR2, and process C is applied. Regarding the processing unit UB whose processing speed VB is slower than the processing speed VC, there are three processing units based on the processing speed ratio. Therefore, from the three processing units UB1 to UB3, processing is applied at a processing speed three times the processing speed VB. The sub-roller RR2 is put into the processing unit VC at the same period after B.

如上述,本實施形態中,依據處理單元UA,UB之各個之性能,可設定成處理速度VA>處理速度VB之情形,將處理單元UA之台數n與處理單元UB之台數m之關係設成n<m,將基板P切斷成與台數m對應之長度之子輥並選擇性投入m台處理單元UB1~UBm之任一個。因此,不會受限於低處理速度VB,生產線整體觀之,能以處理速度VA處理基板P。 As described above, in this embodiment, according to the performance of each of the processing units UA and UB, the processing speed VA> processing speed VB can be set, and the relationship between the number n of the processing units UA and the number m of the processing units UB can be set. It is set to n <m, and the substrate P is cut into sub-rollers having a length corresponding to the number m, and is selectively put into any one of the m processing units UB1 to UBm. Therefore, it is not limited to the low processing speed VB, and the production line as a whole can process the substrate P at the processing speed VA.

又,依據處理單元UB,UC之各個之性能,可設定成處理速度VB<處理速度VC之情形,將以複數台(m)處理單元UB1~UBm施加處理B 後之子輥RR2之基板P依序接合並投入n台(n<m)處理單元UC。因此,可實質上抑制基板P從處理單元UB搬入至處理單元UC為止之等待時間。 In addition, depending on the performance of each of the processing units UB and UC, the processing speed VB <processing speed VC can be set, and processing B will be applied to a plurality of (m) processing units UB1 to UBm. The substrates P of the subsequent child rolls RR2 are sequentially bonded and put into n (n <m) processing units UC. Therefore, the waiting time until the substrate P is carried in from the processing unit UB to the processing unit UC can be substantially suppressed.

是以,此情形亦不會受限於低處理速度VB,能以處理速度VC(≒VA)處理基板P。 Therefore, this situation is not limited to the low processing speed VB, and the substrate P can be processed at the processing speed VC (≒ VA).

是以,本實施形態中,即使依序施加處理速度不同之複數個處理A~C之情形,亦可謀求產率提升。又,本實施形態中,依據處理速度之比設定處理單元UB之台數。因此,不過度設置設備即可實現高效率基板處理。此外,本實施形態中,將複線化之處理單元UB1~UB3在上下方向多段設置之情形,不增加設置面積(footprint)即可實施高效率基板處理。 Therefore, in this embodiment, even if a plurality of processes A to C with different processing speeds are sequentially applied, the productivity can be improved. In this embodiment, the number of processing units UB is set according to the ratio of processing speed. Therefore, high-efficiency substrate processing can be realized without excessively setting the equipment. In addition, in the present embodiment, when the multi-line processing units UB1 to UB3 are installed in multiple stages in the up-down direction, high-efficiency substrate processing can be performed without increasing the footprint.

又,本實施形態中,使附緩衝機構之切斷機構CU10與附緩衝機構之接合機構PU10為可使用於切斷用與接合用之任一者之共通構成,設置為工作站部SN。因此,不需個別設置不同種之裝置,亦可降低生產設備之成本。 Moreover, in this embodiment, the cutting mechanism CU10 with a buffer mechanism and the coupling mechanism PU10 with a buffer mechanism have a common structure that can be used for either cutting or joining, and are provided as the work station section SN. Therefore, it is not necessary to separately install different kinds of devices, and the cost of production equipment can be reduced.

亦即,在一連串之複數個處理單元中之相鄰處理單元間,若相對於基板P之搬送方向之上游側之處理單元,下游側之處理單元之處理速度較低,則在其間設置工作站部SN作為切斷機構CU10,處理速度之關係相反之情形,在相鄰處理單元間設置工作站部SN作為接合機構PU10即可。 That is, if the processing speed of the processing unit on the downstream side is lower than that of the processing unit on the upstream side relative to the transport direction of the substrate P in a series of a plurality of processing units, a workstation unit is set in between. If the SN is the cutting mechanism CU10 and the relationship between the processing speeds is reversed, it is sufficient to provide a workstation SN as the joining mechanism PU10 between adjacent processing units.

亦即,本實施形態之基板處理系統,在一連串之複數個處理單元中之相鄰處理單元間,相對於基板P之搬送方向之上游側之處理單元(第1處理單元)之基板P之搬送速度,使下游側之處理單元(第2處理單元) 之基板P之搬送速度降低時,在第1處理單元與第2處理單元之間具備將基板P以長帶方向之既定長度切斷之切斷機構CU10,相對於第1處理單元之基板P之搬送速度,使第2處理單元之基板P之搬送速度增加時,在第1處理單元與第2處理單元之間具備將基板P在長邊方向接合之接合機構PU10。 That is, the substrate processing system of this embodiment transfers the substrate P of the processing unit (the first processing unit) upstream of the processing unit (the first processing unit) in the upstream direction of the substrate P in a series of a plurality of processing units. Speed to enable downstream processing unit (second processing unit) When the transfer speed of the substrate P is reduced, a cutting mechanism CU10 for cutting the substrate P by a predetermined length in the long-length direction is provided between the first processing unit and the second processing unit. When the transfer speed increases the transfer speed of the substrate P of the second processing unit, a bonding mechanism PU10 for bonding the substrate P in the longitudinal direction is provided between the first processing unit and the second processing unit.

(元件製造系統) (Component Manufacturing System)

接著,參照圖6說明適用上述基板處理系統之元件製造系統。 Next, a component manufacturing system to which the substrate processing system is applied will be described with reference to FIG. 6.

圖6係顯示作為基板處理系統之元件製造系統(可撓性顯示器生產線)之一部分之構成之圖。此處,顯示從供應輥RR1引出之可撓性基板P(片、膜等)依序經過n台處理裝置U1,U2,U3,U4,…Un捲繞至回收輥RR2之例。上位控制裝置CONT(控制部)統籌控制構成生產線之各處理裝置U1~Un。 FIG. 6 is a diagram showing the structure of a part of a component manufacturing system (flexible display production line) as a substrate processing system. Here, an example is shown in which the flexible substrate P (sheet, film, etc.) drawn out from the supply roll RR1 is sequentially wound onto the recovery roll RR2 through n processing devices U1, U2, U3, U4, ... Un. The upper-level control device CONT (control unit) controls the processing devices U1 to Un constituting the production line.

此外,圖6所示之處理裝置U1~Un為圖1所示之處理單元UA~UC之任一者亦可,使處理裝置U1~Un中之二個以上之連續之處理裝置一起對應處理單元UA~UC之任一者亦可。 In addition, the processing devices U1 to Un shown in FIG. 6 may be any one of the processing units UA to UC shown in FIG. 1, and two or more consecutive processing devices among the processing devices U1 to Un may correspond to the processing units together. Either UA ~ UC can be used.

圖6中,正交座標系XYZ設定成基板P之表面(或背面)與XZ面垂直,與基板P之搬送方向(長帶方向)正交之寬度方向設定成Y軸方向。此外,該基板P係預先藉由既定前置處理將其表面改質活性化者,或在表面形成有精密圖案化用之微細之分隔壁構造(凹凸構造)者亦可。 In FIG. 6, the orthogonal coordinate system XYZ is set so that the front surface (or back surface) of the substrate P is perpendicular to the XZ plane, and the width direction orthogonal to the transport direction (long belt direction) of the substrate P is set to the Y-axis direction. In addition, the substrate P may be one whose surface is modified and activated by a predetermined pretreatment in advance, or a fine partition wall structure (concave-convex structure) for precise patterning may be formed on the surface.

捲繞至供應輥RR1之基板P係藉由夾持之驅動捲筒DR10引出並搬送至處理裝置U1。基板P之Y軸方向(寬度方向)之中心係藉由邊 緣位置控制器EPC1以相對於目標位置位在±十數μm~數十μm程度之範圍之方式進行伺服控制。 The substrate P wound on the supply roll RR1 is drawn out by a driven driving roll DR10 and transferred to the processing device U1. The center of the Y-axis direction (width direction) of the substrate P is The edge position controller EPC1 performs servo control in a manner ranging from ± decades to several tens of μm relative to the target position.

處理裝置U1係以印刷方式在基板P之搬送方向(長邊方向)將感光性機能液(光阻、感光性矽烷耦合材、感光性耦合材、感光性親撥液改質劑、感光性鍍敷還原劑、UV硬化樹脂液等)連續地或選擇性地塗布在基板P表面之塗布裝置。在處理裝置U1內設有塗布機構Gp1與急速地除去塗布在基板P上之感光性機能液所含之溶劑或水分之乾燥機構Gp2等,該塗布機構Gp1包含捲繞有基板P之壓體捲筒DR20、在此壓體捲筒DR20上將感光性機能液均勻地塗布在基板P表面之塗布用捲筒、或將感光性機能液作為油墨印刷圖案之凸版或凹版之版體捲筒等。 The processing device U1 is a method for printing the photosensitive functional liquid (photoresist, photosensitive silane coupling material, photosensitive coupling material, photosensitive liquid-repellent modifier, and photosensitive plating) in the conveying direction (long side direction) of the substrate P by printing. A coating device that applies a reducing agent, a UV curing resin solution, or the like continuously or selectively to the surface of the substrate P. The processing unit U1 is provided with a coating mechanism Gp1 and a drying mechanism Gp2 that rapidly removes the solvent or moisture contained in the photosensitive functional liquid coated on the substrate P. The coating mechanism Gp1 includes a compact body roll around which the substrate P is wound. Drum DR20, a coating roll in which a photosensitive functional fluid is uniformly coated on the surface of the substrate P on this compact roll DR20, or a plate roll in which a photosensitive functional fluid is used as an ink printing pattern for a relief or gravure.

處理裝置U2係將從處理裝置U1搬送來之基板P加熱至既定溫度(例如,數十~120℃程度)並使塗布在表面之感光性機能層穩定地固定之加熱裝置。在處理裝置U2內設有使基板P折返並搬送之複數個捲筒與空氣旋轉桿、將搬入而來之基板P加熱之加熱室部HA1、使加熱後之基板P之溫度下降成與後續步驟(處理裝置U3)之環境溫度一致之冷卻室部HA2、及夾持之驅動捲筒DR3等。 The processing device U2 is a heating device that heats the substrate P transferred from the processing device U1 to a predetermined temperature (for example, about several tens to 120 ° C.) and stabilizes the photosensitive functional layer applied on the surface. The processing device U2 is provided with a plurality of reels and air rotating rods for returning and conveying the substrate P, a heating chamber portion HA1 for heating the substrate P carried in, and reducing the temperature of the heated substrate P to subsequent steps. (Processing unit U3) The cooling chamber portion HA2 with the same ambient temperature, and the driving drum DR3 held by it.

處理裝置U3係對從處理裝置U2搬送而來之基板P之感光性機能層照射與顯示器用電路圖案或配線圖案對應之紫外線之圖案化光之曝光裝置。在處理裝置U3內設有將基板P之Y軸方向(寬度方向)之中心控制成一定位置之邊緣位置控制器EPC、夾持之驅動捲筒DR4、將基板P以既定張力局部捲繞並將基板P上之圖案曝光部分支承成均勻之圓筒面狀之 旋轉筒DR5、及對基板P賦予既定鬆弛(空隙)DL之二組驅動捲筒DR6,DR7等。 The processing device U3 is an exposure device that irradiates the photosensitive functional layer of the substrate P transported from the processing device U2 with the patterned light of ultraviolet rays corresponding to the display circuit pattern or wiring pattern. The processing device U3 is provided with an edge position controller EPC that controls the center of the Y-axis direction (width direction) of the substrate P to a certain position, a driving roll DR4 that is clamped, and the substrate P is partially wound with a predetermined tension and The pattern exposure portion on the substrate P is supported in a uniform cylindrical surface. The two sets of rotary drums DR5 and DR6, DR7, etc., which provide a predetermined slack (gap) DL to the substrate P.

再者,在處理裝置U3內設有透射型圓筒光罩DM、設在該圓筒光罩DM內且照明形成在圓筒光罩DM之外周面之光罩圖案之照明機構IU、及對準顯微鏡AM1,AM2,該對準顯微鏡AM1,AM2,為了使圓筒光罩DM之光罩圖案之一部分之像與基板P在藉由旋轉筒DR5支承成圓筒面狀之基板P之一部分相對地對準,檢測預先形成在基板P之對準標記等。 Further, a transmissive cylindrical mask DM, an illumination mechanism IU provided in the cylindrical mask DM and illuminating a mask pattern formed on the outer peripheral surface of the cylindrical mask DM are provided in the processing device U3, and The quasi-microscopes AM1 and AM2, and the alignment microscopes AM1 and AM2, are arranged so that an image of a portion of the mask pattern of the cylindrical mask DM and a portion of the substrate P are opposed to a portion of the substrate P supported by the rotating barrel DR5 in a cylindrical surface. Ground alignment, detection of alignment marks and the like formed on the substrate P in advance.

處理裝置U4係對從處理裝置U3搬送而來之基板P之感光性機能層進行濕式顯影處理、化學鍍處理等之各種濕式處理之至少一個之濕式處理裝置。在處理裝置U4內設有在Z軸方向階層化之三個處理槽BT1,BT2,BT3、彎折基板P並搬送之複數個捲筒、及夾持之驅動捲筒DR8等。 The processing device U4 is a wet processing device that performs at least one of various wet processing such as wet development processing and chemical plating processing on the photosensitive functional layer of the substrate P transferred from the processing device U3. The processing unit U4 is provided with three processing tanks BT1, BT2, and BT3, which are layered in the Z-axis direction, a plurality of rolls that are bent and conveyed by the substrate P, and a driving roll DR8 that is clamped.

處理裝置U5係將從處理裝置U4搬送而來之基板P加熱並將因濕式製程濕的基板P之水分含有量調整成既定值之加熱乾燥裝置,但省略詳細說明。之後,經過幾個處理裝置並通過一連串製程之最後之處理裝置Un之基板P,透過夾持之驅動捲筒DR10捲繞至回收捲筒RR2。在捲繞時亦以基板P之Y軸方向(寬度方向)之中心、或Y軸方向之基板端在Y軸方向不偏差之方式,藉由邊緣位置控制器EPC2依序修正控制驅動捲筒DR10與回收捲筒RR2之Y軸方向之相對位置。 The processing device U5 is a heating and drying device that heats the substrate P carried from the processing device U4 and adjusts the moisture content of the substrate P wetted by the wet process to a predetermined value, but detailed description is omitted. After that, the substrate P, which passes through several processing apparatuses and passes through the last processing apparatus Un of the series of processes, is wound by the driven driving roll DR10 to the recovery roll RR2. When winding, the center of the Y-axis direction (width direction) of the substrate P, or the Y-axis direction of the substrate end does not deviate in the Y-axis direction, and the edge-position controller EPC2 sequentially corrects and controls the driving roll DR10. Relative position to the Y-axis direction of the recovery roll RR2.

上述圖6之元件製造系統中,與各處理裝置U1,U2,U3,U4,U5,…Un之處理速度對應,處理速度慢之處理單元複線化且並置複數台,且在該處理裝置之前設置切斷機構CU10,設置用以將基板投入複數個處理 裝置之任一個之選擇投入機構ST1。 In the component manufacturing system of FIG. 6 described above, corresponding to the processing speed of each processing device U1, U2, U3, U4, U5, ... Un, the processing unit with slow processing speed is multi-lined and a plurality of sets are juxtaposed, and it is set before the processing device The cutting mechanism CU10 is provided to put the substrate into a plurality of processes A selection input mechanism ST1 of any one of the devices.

又,在處理速度慢之複數台處理裝置之後設置將從各處理裝置搬出之複數個基板依序接合之接合機構PU10,藉此即使依序施加處理速度大幅不同之複數個處理之情形,不會受到處理速度最低之處理步驟之限制,可謀求產率提升。 In addition, a bonding mechanism PU10 for sequentially bonding a plurality of substrates carried out from each processing device is provided after a plurality of processing devices with a slow processing speed, so that even if a plurality of processings with greatly different processing speeds are sequentially applied, the situation does not occur. Limited by the processing step with the lowest processing speed, the productivity can be improved.

圖6所示之生產線之情形,進行加熱處理之處理裝置U2極力地將基板P之搬送速度抑制較低,可縮小室部HA1,HA2之容積,相對應地,具有可削減使用電力且亦可降低裝置設置之設置面積之優點。 In the case of the production line shown in FIG. 6, the processing device U2 that performs the heat treatment suppresses the substrate P conveying speed as low as possible, and can reduce the volume of the chambers HA1 and HA2. Correspondingly, it can reduce the use of power and can also The advantage of reducing the installation area of the device.

另一方面,在緊鄰處理裝置U2之前之處理裝置U1,將感光性機能液圖案化並印刷塗布在基板P表面之情形,使用圖案印刷用之版體(凹版或凸版)捲筒,在此捲筒塗布感光性機能液作為油墨後,使基板P抵接於版體捲筒以轉印圖案。此情形,為了使從版體捲筒至基板P之圖案轉印特性良好,必須以某種程度快之速度輸送基板P。 On the other hand, when the processing device U1 immediately before the processing device U2 patterns and prints the photosensitive functional liquid on the surface of the substrate P, a plate body (gravure or letterpress) for pattern printing is used. After the cylinder is coated with the photosensitive functional liquid as the ink, the substrate P is brought into contact with the plate roll to transfer the pattern. In this case, in order to make the pattern transfer characteristics from the plate roll to the substrate P good, it is necessary to transport the substrate P at a certain speed.

如上述,在處理裝置U1與處理裝置U2,視裝置性能有可能所欲之基板搬送速度(處理速度)大幅地不同。是以,在此種情形,將處理裝置U1設為圖1中之處理單元UA,將處理裝置U2如圖1中之處理單元UB1~UB3般複線化,則可構築高效率且產率高之生產線。 As described above, the processing apparatus U1 and the processing apparatus U2 differ greatly in the substrate transfer speed (processing speed) depending on the device performance. Therefore, in this case, if the processing unit U1 is set as the processing unit UA in FIG. 1, and the processing unit U2 is rewired like the processing units UB1 to UB3 in FIG. 1, a high efficiency and high yield can be constructed. production line.

此處,在之前之圖1之處理系統(生產線)之情形,相較於習知單線化處理,期盼多少程度之作業時間提升,根據圖7所示之模型例,參照圖8之時序圖進行說明。 Here, in the case of the previous processing system (production line) of FIG. 1, compared to the conventional single-line processing, how much work time is expected to improve. According to the model example shown in FIG. 7, refer to the timing diagram of FIG. 8. Be explained.

圖7(a)係顯示使處理三個步驟A、B、C之各個之處理單元 UA,UB,UC各為一台而進行單線化處理之情形之模型例。此處,在供應輥RRA捲繞有全長1200m之基板P。又,各處理單元UA~UC之裝置之性能假設具有以下處理能力。亦即,處理單元UA具有以最大15cm/s輸送基板P並進行處理之能力,處理單元UB具有以最大5cm/s輸送基板P並進行處理之能力,處理單元UC具有以最大15cm/s輸送基板P並進行處理之能力。 Fig. 7 (a) shows a processing unit that makes each of the three steps A, B, and C process UA, UB, and UC are examples of a model in which one line is processed. Here, a substrate P having a total length of 1200 m is wound around a supply roll RRA. The performance of the devices of each processing unit UA ~ UC is assumed to have the following processing capabilities. That is, the processing unit UA has the ability to transport and process the substrate P at a maximum of 15 cm / s, the processing unit UB has the capability to transport and process the substrate P at a maximum of 5 cm / s, and the processing unit UC has the capability to transport the substrate at a maximum of 15 cm / s P and ability to process.

上述單線化之情形,生產線整體之基板P之搬送速度與最慢之處理單元UB之速度5cm/s一致,因此生產作業時間時間(對1200m之基板施加步驟處理A、B、C全部之時間)成為400分(6小時40分)。 In the case of the single line, the conveying speed of the substrate P in the entire production line is consistent with the speed of the slowest processing unit UB 5cm / s, so the production operation time (the time for applying steps A, B, and C to the 1200m substrate) It is 400 minutes (6 hours and 40 minutes).

相對於此,圖7(b)係顯示如之前圖1般複線化之生產線之模型例。各處理單元UA,UB(UB1~UB3),UC之各性能與圖7(a)之說明相同。與上述圖1同樣地,使處理處理步驟B之處理單元UB複線化,設置三台處理單元UB1~UB3,設包含處理單元UA後之切斷機構CU10之切斷處理時間與選擇投入機構ST1進行之子輥更換時間等之準備時間為3分,設包含處理單元UC前之接合機構PU10之接合處理時間與選擇投入機構ST2進行之子輥更換時間等之準備時間為3分。 In contrast, FIG. 7 (b) shows a model example of a production line that has been re-lined as in FIG. 1 before. The performance of each processing unit UA, UB (UB1 ~ UB3), UC is the same as that described in Fig. 7 (a). As in FIG. 1 described above, the processing unit UB of the processing step B is doubled, three processing units UB1 to UB3 are provided, and the cutting processing time of the cutting mechanism CU10 including the processing unit UA is performed with the selection and input mechanism ST1. The preparation time for the replacement time of the child roller is 3 minutes, and the preparation time including the replacement processing time of the bonding mechanism PU10 before the processing unit UC and the replacement time of the child roller by the selection input mechanism ST2 is 3 minutes.

又,如圖7(b)般,由於使處理速度慢之處理單元UB複線化,因此處理單元UA,UC設定成以各自之性能所保障之最大速度15cm/s搬送基板P。 As shown in FIG. 7 (b), the processing unit UB, which has a slow processing speed, is double-lined. Therefore, the processing units UA and UC are set to transport the substrate P at a maximum speed of 15 cm / s guaranteed by their performance.

圖8之時序圖係估計圖7(b)之模型例之作業時間,使生產線S1,S2,S3假設地與三個處理單元UB1~UB3之各個對應,顯示各處理時間者。在處理開始時,來自供應輥RRA之基板P雖以處理單元UA處理,但 基板P在切斷機構CU10被分割成全長1200m之1/3。因此,投入處理單元UA之基板之第一個400m,如生產線S1所示,以約44.4分處理後,在切斷機構CU10經過3分之準備時間,被送至處理單元UB1。 The timing diagram of FIG. 8 estimates the operation time of the model example of FIG. 7 (b), and the production lines S1, S2, and S3 are assumed to correspond to each of the three processing units UB1 to UB3, and each processing time is displayed. At the start of processing, although the substrate P from the supply roller RRA is processed by the processing unit UA, The substrate P is divided into 1/3 of a total length of 1200 m by the cutting mechanism CU10. Therefore, the first 400m of the substrate put into the processing unit UA, as shown in the production line S1, is processed to about 44.4 minutes, and after the cutting mechanism CU10 has passed the preparation time of 3 minutes, it is sent to the processing unit UB1.

處理單元UB1,處理400m之基板P之作業時間時間為133.3分。之後,作為既定準備時間(子輥之安裝等)經過約3分後,第一個400m之基板被投入處理單元UC,以搬送速度15cm/s進行處理。處理單元UC之400m之基板之作業時間時間為44.4分。 The processing time of the processing unit UB1 for processing 400 m of the substrate P is 133.3 minutes. Then, after about 3 minutes as a predetermined preparation time (installation of the sub-roller, etc.), the first 400m substrate is put into the processing unit UC and processed at a transfer speed of 15cm / s. The working time of the 400m substrate of the processing unit UC is 44.4 minutes.

在此期間,如生產線S2所示,處理單元UA持續約44.4分之第2個400m之基板之處理,接著,如生產線S3所示,以搬送速度15cm/s持續約44.4分之第3個400m之基板之處理。第2個400m之基板在切斷機構CU10之準備時間3分後輸送至處理單元UB2,此處處理約133.3分。 During this period, as shown in the production line S2, the processing unit UA continued to process the second 400m substrate of about 44.4 minutes, and then, as shown in the production line S3, the third 400m of about 44.4 minutes was continued at a transfer speed of 15cm / s. Substrate processing. The second 400m substrate was transported to the processing unit UB2 after 3 minutes of the preparation time of the cutting mechanism CU10, where it was processed for about 133.3 minutes.

在處理單元UC,第一個400m之基板之處理完成為開始時點起算228.1分後。然而,在此之前,第2個400m之基板之處理在處理單元UB2完成,第2個400m之基板透過接合機構PU10、選擇投入機構ST2在約3分之準備時間之後接合於第一個400m之基板之終端部分。 In the processing unit UC, the processing of the first 400m substrate is counted after 228.1 minutes from the beginning. However, before that, the processing of the second 400m substrate was completed in the processing unit UB2, and the second 400m substrate was bonded to the first 400m through the bonding mechanism PU10 and the selection input mechanism ST2 after about 3 minutes of preparation time. The terminal part of the substrate.

之後,處理單元UC以搬送速度15cm/s持續處理接合於第一個400m之基板之第2個400m之基板。 After that, the processing unit UC continuously processes the second 400m substrate bonded to the first 400m substrate at a transfer speed of 15 cm / s.

同樣地,如生產線S3所示,以切斷機構CU10切斷之第3個(最後一個)400m之基板,在處理單元UA之處理完成後,投入處理單元UB3,在133.3分後捲繞至子輥RRB32。第3個400m之基板,在處理單元UC中第2個400m之基板之處理完成前,在處理單元UB3之處理完成。 Similarly, as shown in the production line S3, the third (last) 400m substrate cut by the cutting mechanism CU10 is put into the processing unit UB3 after the processing of the processing unit UA is completed, and is wound to the child after 133.3 minutes. Roller RRB32. The processing of the third 400m substrate in the processing unit UC is completed before the processing of the second 400m substrate in the processing unit UC is completed.

在處理單元UC第2個400m之基板被處理之期間,第3個400m之基板透過接合機構PU10、選擇投入機構ST2在約3分之準備時間之後接合於第二個400m之基板之終端部分。之後,處理單元UC以搬送速度15cm/s持續處理接合於第二個400m之基板之第三個400m之基板。 While the second 400m substrate of the processing unit UC is being processed, the third 400m substrate is bonded to the terminal portion of the second 400m substrate through the bonding mechanism PU10 and the selection input mechanism ST2 after a preparation time of about 3 minutes. After that, the processing unit UC continuously processes the third 400m substrate bonded to the second 400m substrate at a transfer speed of 15 cm / s.

如上述,藉由使處理步驟B之單元複線化,1200m之基板P之處理在317分(5小時17分)結束。相較於圖7(a)所示之單線化處理之模型例,為約20%之作業時間提升(生產時間之縮短)。 As described above, by linearizing the unit of the processing step B, the processing of the 1200-meter substrate P is completed at 317 minutes (5 hours and 17 minutes). Compared with the example of the single-line processing model shown in Fig. 7 (a), the operation time is increased by about 20% (the production time is shortened).

圖7(b)所示之模型例中,雖設捲繞至作為親輥之供應輥RRA之基板P之全長為1200m,但即使為更長之長度,只要以每400m進行在切斷機構CU10之基板之分割,即可使投入生產線之基板連續地持續輸送至最後之處理步驟C。 In the model example shown in FIG. 7 (b), although the total length of the substrate P wound around the supply roll RRA as a parent roll is 1200 m, even for a longer length, the cutting mechanism CU10 is performed every 400 m. The division of the substrate can continuously convey the substrate put into the production line to the final processing step C.

此外,圖7(b)所示之模型例中,雖以相同處理速度(5cm/s)一起運轉三台處理單元UB1~UB3,但在可調整範圍使各單元UB1~UB3之基板之搬送速度微量不同亦可。 In addition, in the model example shown in FIG. 7 (b), although the three processing units UB1 to UB3 are operated together at the same processing speed (5 cm / s), the substrate transfer speed of each unit UB1 to UB3 is adjusted within the adjustable range. Minor differences are also possible.

以上,參照圖式說明本發明較佳實施形態,但本發明並不限於此。上述例中所示之各構成構件之諸形狀或組合等為一例,在不脫離本發明主旨之範圍內可根據設計要求等進行各種變更。 As mentioned above, although preferred embodiment of this invention was described with reference to drawings, this invention is not limited to this. The shapes, combinations, and the like of the constituent members shown in the above examples are examples, and various changes can be made according to design requirements and the like without departing from the spirit of the present invention.

例如,上述實施形態中,為設置三台處理單元UB1~UB3之構成,但只要依據處理速度之比設定,為設置二台或四台以上之構成亦可。 For example, in the above embodiment, the configuration is provided with three processing units UB1 to UB3, but as long as it is set according to the processing speed ratio, it may be configured with two or more than four.

又,上述實施形態中,使以單線構成之生產線中之一部分步驟複線化。然而,即使是原本之生產線(生產相同產品、種類)從最初步驟至 最後步驟複線化之情形,亦可為應用上述實施形態之構成。 Moreover, in the above-mentioned embodiment, a part of the steps of a production line constituted by a single line is multi-lined. However, even the original production line (producing the same product, type) from the initial steps to In the case where the final step is re-threaded, the above-mentioned embodiment may be used.

例如,原本,圖7(a)之單線化處理之生產線並置二條之情形,在二台處理單元UA(UA1,UA2)之各個之後設置切斷機構CU10(CU101,CU102),之後之二台低作業時間之處理單元UB則追加三台作為五台單元UB1~UB5而複線化,接著,在之後設置二台接合機構PU10(PU101,PU102),在之後設置二台處理單元UC(UC1,UC2)亦可。 For example, originally, in the case where two single-line processing production lines were placed side by side in FIG. 7 (a), a cutting mechanism CU10 (CU101, CU102) was installed after each of the two processing units UA (UA1, UA2), and the second two were low. The processing unit UB of the working time is added to three units as five units UB1 to UB5 and then re-wired. Then, two joint units PU10 (PU101, PU102) are set up later, and two processing units UC (UC1, UC2) are set up later. Yes.

上述構成中,以切斷機構CU101,CU102之任一個切斷之單位長度(例如400m)之基板輸送至五台處理單元UB1~UB5中之空的任一個單元之方式,構成選擇投入機構ST2,以接合機構PU101,PU102之各個接受五台處理單元UB1~UB5之任一個處裡過之單位長度(例如400m)之基板之方式,構成選擇投入機構ST2。 In the above configuration, the selection input mechanism ST2 is constituted so that a substrate of a unit length (for example, 400 m) cut by any of the cutting mechanisms CU101 and CU102 is conveyed to any one of the five processing units UB1 to UB5. Each of the bonding mechanisms PU101 and PU102 accepts a substrate having a unit length (for example, 400 m) of one of the five processing units UB1 to UB5 to form a selection input mechanism ST2.

又,在最初之處理單元UA1,UA2之處理,為了使處理單元UA以單位長度(例如400m)處理來自供應輥RRA之基板後處理單元UA2開始來自供應輥RRA之基板之處理,意圖地賦予時間差較佳。 In addition, in the processing of the first processing units UA1 and UA2, in order for the processing unit UA to process the substrate from the supply roll RRA in a unit length (for example, 400 m), the processing unit UA2 starts processing of the substrate from the supply roll RRA, intentionally giving a time difference. Better.

如此,可避免在二台處理單元UA1,UA2之各個同時地安裝親輥(RRA)之輥更換作業(產生生產之暫時中斷),且使各處理單元有效率地運轉。 In this way, it is possible to avoid the roll replacement operation (the temporary interruption of production) of the two roll units (UAA, UA2) installed at the same time, and to make each process unit operate efficiently.

(第2實施形態) (Second Embodiment)

以下,參照圖9至圖25說明本發明之基板處理裝置及基板處理方法之實施形態。本實施形態中,針對與上述實施形態相同之構成要素賦予相同符號以簡化或省略其說明。 Hereinafter, embodiments of a substrate processing apparatus and a substrate processing method according to the present invention will be described with reference to FIGS. 9 to 25. In this embodiment, the same reference numerals are given to the same constituent elements as those in the above-mentioned embodiment to simplify or omit their description.

圖9係顯示作為本實施形態之基板處理裝置之元件製造系統(可撓性顯示器生產線)SYS之一部分之構成之圖。此處,顯示下述例子,元件製造系統SYS具備安裝供應輥(第1輥)RR1之第1安裝部RS1、安裝供應輥(第2輥)RR2之第2安裝部RS2(保持部)、安裝回收輥(第3輥)RR3之第3安裝部RS3、安裝回收輥(第4輥)RR4之第4安裝部RS4,從供應輥RR1,RR2之任一方引出之可撓性基板P(片、膜等)依序經過第1接帶器部(基板接續更換機構)CSa、第1緩衝機構BF1、n台處理裝置U1,U2,U3,U4,U5,…Un、第2緩衝機構BF2、第2接帶器部(第2基板接續更換機構)CSb,捲繞至回收輥RR3,RR4之任一方。 FIG. 9 is a diagram showing the structure of a part of a component manufacturing system (flexible display production line) SYS which is a substrate processing apparatus of this embodiment. Here, an example is shown. The component manufacturing system SYS includes a first mounting section RS1 for mounting a supply roller (first roller) RR1, a second mounting section RS2 (holding section) for mounting a supply roller (second roller) RR2, and mounting. The third mounting portion RS3 of the recovery roller (third roller) RR3, the fourth mounting portion RS4 of the recovery roller (fourth roller) RR4, and the flexible substrate P (sheet, (Film, etc.) sequentially pass through the first tape receiver unit (substrate connection replacement mechanism) CSa, the first buffer mechanism BF1, n processing devices U1, U2, U3, U4, U5, ... Un, the second buffer mechanism BF2, the first 2 The belt take-up unit (second substrate connection replacement mechanism) CSb is wound around one of the recovery rollers RR3 and RR4.

此外,本實施形態中,將作為處理基板投入第1、第2緩衝機構BF1,BF2、處理裝置U1…Un之基板適當地稱為基板P來說明。將在投入前從供應輥RR1,RR2引出之基板適當地稱為基板P1,P2來說明。將處理裝置U1…Un處理後以回收輥RR3,RR4回收之基板適當地稱為基板P3,P4來說明。 In addition, in this embodiment, the substrates which are put into the first, second buffer mechanisms BF1, BF2, and the processing devices U1 ... Un as processing substrates are appropriately referred to as a substrate P and described. The substrates taken out from the supply rollers RR1 and RR2 before being put in are appropriately referred to as substrates P1 and P2. The substrates recovered by the processing units U1 ... Un and processed by the recovery rollers RR3 and RR4 are appropriately referred to as substrates P3 and P4.

上位控制裝置CONT(控制部、第2控制部)統籌控制構成生產線之各處理裝置U1~Un、及第1、第2接帶器部CSa,CSb、第1、第2緩衝機構BF1,BF2。又,上位控制裝置CONT控制在第1安裝部RS1安裝在供應輥RR1之馬達軸MT1之旋轉驅動、及在第2安裝部RS2安裝在供應輥RR2之馬達軸MT2之旋轉驅動。又,上位控制裝置CONT包含使基板P1(第1基板)之切斷動作與在第1緩衝機構BF1(緩衝機構)之基板P1之儲存量連動之連動控制部。又,上位控制裝置CONT包含使基板P(處理基板)之切斷 動作與在第2緩衝機構BF2之基板P之儲存量連動之連動控制部。 The upper control device CONT (control unit, second control unit) controls the processing units U1 to Un, the first and second belt adapter units CSa, CSb, and the first and second buffer mechanisms BF1 and BF2. The higher-level control device CONT controls the rotational drive of the motor shaft MT1 mounted on the supply roller RR1 in the first mounting section RS1 and the rotational drive of the motor shaft MT2 mounted on the supply roller RR2 in the second mounting section RS2. The higher-level control device CONT includes an interlocking control unit that interlocks the cutting operation of the substrate P1 (the first substrate) with the storage amount of the substrate P1 in the first buffer mechanism BF1 (the buffer mechanism). The high-level control device CONT includes cutting of the substrate P (processing substrate). An interlocking control unit that operates in accordance with the storage amount of the substrate P in the second buffer mechanism BF2.

又,如圖10所示,在第1安裝部RS1之附近設有檢測在供應輥RR1之基板P1之供應狀況之供應感測器S1。供應感測器S1,在檢測出基板P1之供應結束時,將結束訊號輸出至上位控制裝置CONT。同樣地,在第2安裝部RS2之附近設有檢測在供應輥RR2之基板P2之供應狀況之供應感測器S2。供應感測器S2,在檢測出基板P2之供應結束時,將結束訊號輸出至上位控制裝置CONT。 As shown in FIG. 10, a supply sensor S1 is provided near the first mounting portion RS1 to detect the supply status of the substrate P1 on the supply roller RR1. When the supply sensor S1 detects the end of the supply of the substrate P1, it outputs an end signal to the higher-level control device CONT. Similarly, a supply sensor S2 is provided near the second mounting portion RS2 to detect the supply condition of the substrate P2 on the supply roller RR2. When the supply sensor S2 detects the end of the supply of the substrate P2, it outputs an end signal to the higher-level control device CONT.

圖9中,正交座標系XYZ設定成基板P之表面(或背面)與XZ面垂直,與基板P之搬送方向(長帶方向)正交之寬度方向設定成Y軸方向。此外,該基板P係預先藉由既定前置處理將其表面改質活性化者,或在表面形成有精密圖案化用之微細之分隔壁構造(凹凸構造)者亦可。 In FIG. 9, the orthogonal coordinate system XYZ is set so that the front surface (or back surface) of the substrate P is perpendicular to the XZ plane, and the width direction orthogonal to the transport direction (long belt direction) of the substrate P is set to the Y-axis direction. In addition, the substrate P may be one whose surface is modified and activated by a predetermined pretreatment in advance, or a fine partition wall structure (concave-convex structure) for precise patterning may be formed on the surface.

圖10係顯示第1接帶器部CSa及第1緩衝機構BF1之概略構成之圖。 FIG. 10 is a diagram showing a schematic configuration of the first tape receiver portion CSa and the first buffer mechanism BF1.

第1接帶器部CSa將從供應輥RR1,RR2之任一方引出並送出至第1緩衝機構BF1之基板接替成從供應輥RR1,RR2之另一方引出之基板,具備夾持驅動捲筒NR1、切斷接合單元CU1,CU2。又,第1接帶器部CSa(基板接續更換機構)具備以將從供應輥RR2(第2輥)供應之基板P2(第2基板)之前端部接合在切斷之基板P1(第1基板)之終端部位置後將基板P1(第1基板)切斷之方式控制切斷動作及接合動作之控制部。 The first belt take-up section CSa is taken out from one of the supply rollers RR1 and RR2 and is sent to the first buffer mechanism BF1. The substrate is taken out from the other of the supply rollers RR1 and RR2 and has a clamping drive roll NR1. 1. Cut off the joint units CU1 and CU2. In addition, the first tape receiver portion CSa (substrate connection replacement mechanism) includes a substrate P1 (first substrate) which is bonded to the front end of the substrate P2 (second substrate) supplied from the supply roller RR2 (second roller). ) Is a control unit that controls the cutting operation and the joining operation to cut the substrate P1 (the first substrate) after the terminal portion is positioned.

夾持驅動捲筒NR1,在上位控制裝置CONT之控制下,保持基板P1或基板P2並輸送至第1緩衝機構BF1或停止基板P之輸送,在Z 軸方向配置在第1安裝部RS1與第2安裝部RS2之大致中間位置。 Under the control of the upper control device CONT, the clamp driving roll NR1 holds the substrate P1 or the substrate P2 and conveys it to the first buffer mechanism BF1 or stops the conveyance of the substrate P. The axial direction is arranged at a substantially intermediate position between the first mounting portion RS1 and the second mounting portion RS2.

切斷接合單元CU1,CU2以與通過夾持驅動捲筒NR1之Z軸方向之位置之XY平面平行之假想接合面VF1為中心在Z軸方向對稱地配置。切斷接合單元CU1在面對假想接合面VF1之位置具備吸附墊1A、刀具2A、及張力捲筒3A。又,切斷接合單元CU1藉由未圖示之旋轉機構,在圖10中實線所示之切斷接合單元CU2與吸附墊1A對向之接合位置與圖10中二點鏈線所示之吸附墊1A與第1安裝部RS1對向之貼設位置之間旋轉移動(擺動)。再者,切斷接合單元CU1,在接合位置,藉由未圖示之移動機構,往相對於假想接合面VF1(亦即切斷接合單元CU2)離開/接近之方向移動。吸附墊1A,在切斷接合單元CU1位於接合位置時,配置在較刀具2A靠基板P(基板P1)之輸送方向之下游側(+X軸側)。 The cutting and joining units CU1 and CU2 are symmetrically arranged in the Z-axis direction with the imaginary joining surface VF1 parallel to the XY plane at the position in the Z-axis direction of the NR1 by the clamp drive. The cutting and joining unit CU1 includes a suction pad 1A, a cutter 2A, and a tension reel 3A at positions facing the virtual joining surface VF1. In addition, the cutting and joining unit CU1 uses a rotating mechanism (not shown) to indicate the joining position of the cutting and joining unit CU2 opposite to the suction pad 1A shown in solid lines in FIG. 10 and the two-dot chain line shown in FIG. 10. The suction pad 1A rotates (oscillates) between the attachment position facing the first attachment portion RS1. Furthermore, the cutting and joining unit CU1 is moved in a direction away from and approaching the virtual joining surface VF1 (that is, the cutting and joining unit CU2) by a moving mechanism (not shown) at the joining position. The suction pad 1A is disposed on the downstream side (+ X-axis side) of the substrate P (substrate P1) in the transport direction of the substrate 2 (the substrate P1) when the cutting and joining unit CU1 is located at the joining position.

同樣地,切斷接合單元CU2在面對假想接合面VF1之位置具備吸附墊1B、刀具2B、及張力捲筒3B。又,切斷接合單元CU2藉由未圖示之旋轉機構,在圖10中實線所示之切斷接合單元CU1與吸附墊1B對向之接合位置與圖10中二點鏈線所示之吸附墊1B與第1安裝部RS2對向之貼設位置之間旋轉移動(擺動)。再者,切斷接合單元CU2,在接合位置,藉由未圖示之移動機構,往相對於假想接合面VF1(亦即切斷接合單元CU1)離開/接近之方向移動。吸附墊1B,在切斷接合單元CU2位於接合位置時,配置在較刀具2B靠基板P(基板P2)之輸送方向之下游側(+X軸側)。 Similarly, the cutting and joining unit CU2 includes a suction pad 1B, a cutter 2B, and a tension roll 3B at positions facing the virtual joining surface VF1. In addition, the cutting and joining unit CU2 has a rotation mechanism (not shown), and the joining position of the cutting and joining unit CU1 and the adsorption pad 1B shown by the solid line in FIG. 10 is the same as the two-dot chain line shown in FIG. 10. The suction pad 1B rotates (oscillates) between the attachment position facing the first mounting portion RS2. In addition, the cutting and joining unit CU2 is moved in a direction away from and approaching the virtual joining surface VF1 (that is, the cutting and joining unit CU1) by a moving mechanism (not shown) at the joining position. The suction pad 1B is arranged on the downstream side (+ X-axis side) of the substrate P (substrate P2) in the conveying direction when the cutting and joining unit CU2 is located at the joining position.

此等切斷接合單元CU1,CU2之移動係藉由上位控制裝置CONT控制。 The movement of these cut-off joint units CU1, CU2 is controlled by the upper control device CONT.

第1緩衝機構BF1配置在處理裝置(處理機構)U1與第1接帶器部CSa之間,將從第1接帶器部CSa輸送之基板P在既定最長儲存範圍內暫時儲存後往處理裝置U1送出,具備張力捲筒機構DR1與夾持驅動捲筒NR2。 The first buffer mechanism BF1 is disposed between the processing device (processing mechanism) U1 and the first tape feeder section CSa, and temporarily stores the substrate P transported from the first tape feeder section CSa within a predetermined longest storage range and then transfers it to the processing device. U1 is sent out and includes a tension reel mechanism DR1 and a clamp drive reel NR2.

夾持驅動捲筒NR2保持以第1緩衝機構BF1儲存之基板P並輸送至處理裝置U1,在較張力捲筒機構DR1靠基板P之輸送方向下游側與夾持驅動捲筒NR1配置在大致相同之Z軸位置。 The grip driving reel NR2 holds the substrate P stored by the first buffer mechanism BF1 and conveys it to the processing unit U1. The grip driving reel NR2 is disposed at approximately the same position as the grip driving reel NR1 on the downstream side of the substrate P in the transport direction of the tension reel mechanism DR1. Z-axis position.

張力捲筒機構DR1,升降範圍相對地位於上方之複數個上段捲筒RJ1與升降範圍相對地位於下方之下段捲筒RK1交互排列在X方向,且各捲筒RJ1,RK1分別可獨立地往Z軸方向移動。上段捲筒RJ1之上死點位置JU1及下死點位置JD1設定在下段捲筒RK1之上死點位置JU2及下死點位置JD2上方之位置。此等張力捲筒機構DR1之動作亦藉由上位控制裝置CONT控制。 The tension reel mechanism DR1 has a plurality of upper reels RJ1 whose lifting range is relatively above and a lower reel RK1 which is relatively below the lifting range is arranged in the X direction alternately, and each of the reels RJ1 and RK1 can independently go to Z Move in the axis direction. The upper dead point position JU1 and the lower dead point position JD1 of the upper reel RJ1 are set at positions above the upper dead point position JU2 and the lower dead point position JD2 of the lower reel RK1. The operation of these tension reel mechanisms DR1 is also controlled by the upper control device CONT.

圖11係顯示第2接帶器部CSb及第2緩衝機構BF2之概略構成之圖。 FIG. 11 is a diagram showing a schematic configuration of the second tape receiver section CSb and the second buffer mechanism BF2.

第2緩衝機構BF2配置在處理裝置(處理機構)Un與第2接帶器部CSb之間,將從處理裝置Un輸送之基板P在既定最長儲存範圍內暫時儲存後往第2接帶器部CSb送出,具備夾持驅動捲筒NR3與張力捲筒機構DR2。 The second buffer mechanism BF2 is disposed between the processing device (processing mechanism) Un and the second tape feeder section CSb, and temporarily stores the substrate P transported from the processing device Un within the predetermined longest storage range to the second tape feeder section. The CSb is sent out, and includes a nip drive reel NR3 and a tension reel mechanism DR2.

張力捲筒機構DR2,升降範圍相對地位於上方之複數個上段捲筒RJ2與升降範圍相對地位於下方之下段捲筒RK2交互排列在X軸方向,且各捲筒RJ2,RK2分別可獨立地往Z軸方向移動。上段捲筒RJ2之上 死點位置JU3及下死點位置JD3設定在下段捲筒RK2之上死點位置JU4及下死點位置JD4上方之位置。此等張力捲筒機構DR2之動作亦藉由上位控制裝置CONT控制。 The tension reel mechanism DR2 has a plurality of upper reels RJ2 whose lifting range is relatively above and a lower reel RK2 which is relatively below the lifting range is arranged alternately in the X-axis direction, and each of the reels RJ2 and RK2 can be moved independently. Move in the Z axis direction. Above the reel RJ2 The dead point position JU3 and the lower dead point position JD3 are set at positions above the dead point position JU4 and the lower dead point position JD4 above the lower roll RK2. The operation of these tension reel mechanisms DR2 is also controlled by the upper control device CONT.

第2接帶器部CSb將從第2緩衝機構BF2輸送並以回收輥RR3,RR4之任一方回收之基板P接替成回收至回收輥RR3,RR4之另一方,具備夾持驅動捲筒NR4、切斷接合單元CU3,CU4。 The second belt taker unit CSb replaces the substrate P transported from the second buffer mechanism BF2 and recovered by one of the recovery rollers RR3 and RR4 to the other of the recovery rollers RR3 and RR4, and includes a clamping drive roll NR4, Disconnect the joint units CU3, CU4.

夾持驅動捲筒NR4,在上位控制裝置CONT之控制下,使從第2緩衝機構BF2輸送之基板P朝向切斷接合單元CU3,CU4輸送或停止基板P之輸送,Z軸方向之位置配置在第3安裝部RS3與第4安裝部RS4之大致中間位置且與XY平面平行之假想接合面VF2之位置。 The grip drive roll NR4 is controlled by the upper control device CONT to make the substrate P conveyed from the second buffer mechanism BF2 toward the cutting and bonding unit CU3, CU4 or stop the conveyance of the substrate P. The position in the Z axis direction is arranged at The position of an imaginary joint surface VF2 of the third mounting portion RS3 and the fourth mounting portion RS4 at an approximately intermediate position and parallel to the XY plane.

切斷接合單元CU3,CU4以假想接合面VF2為中心在Z軸方向對稱地配置。切斷接合單元CU3在面對假想接合面VF2之位置具備吸附墊1C、刀具2C、及張力捲筒3C。又,切斷接合單元CU3藉由未圖示之旋轉機構,在圖11中實線所示之切斷接合單元CU4與吸附墊1C對向之接合位置與圖11中二點鏈線所示之吸附墊1C與第3安裝部RS3對向之貼設位置之間旋轉移動(擺動)。再者,切斷接合單元CU3,在接合位置,藉由未圖示之移動機構,往相對於假想接合面VF2(亦即切斷接合單元CU4)離開/接近之方向移動。 The cutting joining units CU3 and CU4 are symmetrically arranged in the Z-axis direction with the virtual joining surface VF2 as a center. The cutting and joining unit CU3 includes a suction pad 1C, a cutter 2C, and a tension roll 3C at positions facing the virtual joining surface VF2. In addition, the cutting and joining unit CU3 uses a rotating mechanism (not shown) to indicate the joining position of the cutting and joining unit CU4 opposite to the suction pad 1C shown by the solid line in FIG. 11 and the two-dot chain line shown in FIG. 11. The suction pad 1C rotates (oscillates) between the attachment position facing the third mounting portion RS3. Further, the cutting and joining unit CU3 is moved in a direction away from and approaching the virtual joining surface VF2 (ie, the cutting and joining unit CU4) by a moving mechanism (not shown) at the joining position.

吸附墊1C,在切斷接合單元CU3位於接合位置時,配置在較刀具2C靠基板P之輸送方向之上游側(-X軸側)。 When the cutting and joining unit CU3 is located at the joining position, the suction pad 1C is disposed on the upstream side (-X axis side) of the substrate P in the conveying direction of the substrate 2 relative to the tool 2C.

同樣地,切斷接合單元CU4在面對假想接合面VF2之位置 具備吸附墊1D、刀具2D、及張力捲筒3D。又,切斷接合單元CU4藉由未圖示之旋轉機構,在圖11中實線所示之切斷接合單元CU3與吸附墊1D對向之接合位置與圖11中二點鏈線所示之吸附墊1D與第4安裝部RS4對向之貼設位置之間旋轉移動(擺動)。再者,切斷接合單元CU4,在接合位置,藉由未圖示之移動機構,往相對於假想接合面VF2(亦即切斷接合單元CU3)離開/接近之方向移動。吸附墊1D,在切斷接合單元CU4位於接合位置時,配置在較刀具2D靠基板P之輸送方向之上游側(-X軸側)。 Similarly, the cutting and joining unit CU4 faces the virtual joining surface VF2. Equipped with suction pad 1D, cutter 2D, and tension roll 3D. In addition, the cutting and joining unit CU4 has a rotation mechanism (not shown), and the joining position of the cutting and joining unit CU3 and the suction pad 1D shown by the solid line in FIG. 11 is the same as the two-dot chain line shown in FIG. 11. The suction pad 1D rotates (oscillates) between the attachment position facing the fourth attachment portion RS4. Further, the cutting and joining unit CU4 is moved in a direction of leaving / approaching with respect to the virtual joining surface VF2 (that is, the cutting and joining unit CU3) by a not-shown moving mechanism at the joining position. When the cutting and joining unit CU4 is located at the joining position, the suction pad 1D is arranged on the upstream side (-X axis side) of the substrate P in the conveying direction with respect to the tool 2D.

此等切斷接合單元CU3,CU4之移動係藉由上位控制裝置CONT控制。 The movement of these cut-off joint units CU3, CU4 is controlled by the upper control device CONT.

如圖11所示,在第3安裝部RS3回收捲筒RR3安裝在馬達軸MT3。在第4安裝部RS4回收捲筒RR4安裝在馬達軸MT4。馬達軸MT3之旋轉驅動及馬達軸MT4之旋轉驅動係藉由上位控制裝置CONT控制。 As shown in FIG. 11, the recovery reel RR3 is mounted on the motor shaft MT3 in the third mounting portion RS3. The recovery roll RR4 is mounted on the motor shaft MT4 in the fourth mounting section RS4. The rotation drive of the motor shaft MT3 and the rotation drive of the motor shaft MT4 are controlled by the upper control device CONT.

又,如圖11所示,在第3安裝部RS3之附近設有檢測在回收捲筒RR3之基板P3之捲繞狀況之捲繞感測器S3。捲繞感測器S3,在檢測出基板P3之捲繞結束時,將結束訊號輸出至上位控制裝置CONT。同樣地,在第4安裝部RS4之附近設有檢測在回收捲筒RR4之基板P4之捲繞狀況之捲繞感測器S4。捲繞感測器S4,在檢測出基板P4之捲繞結束時,將結束訊號輸出至上位控制裝置CONT。 As shown in FIG. 11, a winding sensor S3 is provided near the third mounting portion RS3 to detect the winding state of the substrate P3 on the recovery roll RR3. The winding sensor S3 outputs an end signal to the host controller CONT when the winding end of the substrate P3 is detected. Similarly, a winding sensor S4 is provided near the fourth mounting portion RS4 to detect the winding state of the substrate P4 on the recovery roll RR4. When the winding sensor S4 detects the end of winding of the substrate P4, it outputs an end signal to the host controller CONT.

回收捲筒RR3,RR4具備前端部連接在輥芯且終端部接合有基板P3或基板P4之引入用引入基板(第3基板)PK(圖11中,僅圖示回收捲筒RR4之基板PK)。作為基板PK,與進行處理裝置U1~Un之處理之基板P相同材料亦可,與基板P大致相同厚度且材質不同亦可。 The take-up rolls RR3 and RR4 are provided with a lead-in introduction substrate (third base) PK whose lead end is connected to the roller core and the end part is joined with the substrate P3 or the substrate P4 (only the base plate PK of the take-up roll RR4 is shown in FIG. 11). . The substrate PK may be the same material as the substrate P that is processed by the processing devices U1 to Un, and may be substantially the same thickness and different in material from the substrate P.

本實施形態之處理裝置U5為將從處理裝置U4搬送而來之基板P加熱並將因濕式製程濕的基板P之水分含有量調整成既定值或施加半導體材料之結晶化或包含金屬奈米粒子之油墨之溶劑除去等用之熱回火(200℃以下)之加熱乾燥裝置,但省略詳細說明。之後,經過幾個處理裝置且通過一連串製程之最後之處理裝置Un之基板P,在第2緩衝機構BF2暫時地儲存,以第2接帶器部CSb適當地進行接替,捲繞至回收輥RR3或回收輥RR4。 The processing device U5 of this embodiment is to heat the substrate P carried from the processing device U4 and adjust the moisture content of the substrate P wetted by the wet process to a predetermined value or apply crystallization of a semiconductor material or include metal nanometers. A heating and drying device for thermal tempering (200 ° C or lower) used for removing the solvent of particles of ink, etc., but detailed description is omitted. After that, the substrate P, which has passed through several processing devices and passed through the last processing device Un of the series of processes, is temporarily stored in the second buffer mechanism BF2, and is appropriately replaced with the second belt taker section CSb, and is wound onto the recovery roller RR3. Or recovery roller RR4.

接著,參照圖12至圖19說明上述構成之元件製造系統SYS之基板P之處理中之第1接帶器部CSa及第1緩衝機構BF1之動作。此外,構成元件製造系統SYS之各種處理裝置、構成機器等之動作雖藉由上位控制裝置CONT控制,但在以下說明中,省略關於上位控制裝置CONT控制之記載。 Next, operations of the first tape receiver unit CSa and the first buffer mechanism BF1 in the processing of the substrate P of the component manufacturing system SYS configured as described above will be described with reference to FIGS. 12 to 19. In addition, although the operations of various processing devices, components, and the like constituting the component manufacturing system SYS are controlled by the high-level control device CONT, the description of the high-level control device CONT control is omitted in the following description.

圖12係從供應輥RR1引出之基板P1透過切斷接合單元CU1之捲筒3A及夾持驅動捲筒NR1作為第1基板輸送至第1緩衝機構BF1且在第1緩衝機構BF1暫時地儲存之圖。如圖12所示,在第1緩衝機構BF1,上段捲筒RJ1位於上死點位置JU1,下段捲筒RK1位於下死點位置JD2,藉此基板P在第1緩衝機構BF1儲存接近最長之長度。 FIG. 12 shows that the substrate P1 drawn from the supply roller RR1 passes through the reel 3A and the clamping drive reel NR1 of the cutting and joining unit CU1 as the first substrate and is transported to the first buffer mechanism BF1 and temporarily stored in the first buffer mechanism BF1. Illustration. As shown in FIG. 12, in the first buffer mechanism BF1, the upper reel RJ1 is located at the upper dead center position JU1, and the lower reel RK1 is located at the lower dead center position JD2, whereby the substrate P is stored in the first buffer mechanism BF1 near the longest length. .

在第2安裝部RS2,捲繞有在供應輥RR1之基板P1用盡之情形接替之基板P2之供應輥RR2安裝在馬達軸MT2後,使切斷接合單元CU2旋動以使吸附墊1B移動至貼設位置。使基板P2之前端部吸附(連結或連接)固定於位於貼設位置之吸附墊1B,之後,在與吸附側相反側之面貼設 兩面帶T。 In the second mounting portion RS2, the supply roller RR2, which is replaced by the substrate P1 of the supply roller RR1 when the substrate P1 runs out, is mounted on the motor shaft MT2, and the cutting and joining unit CU2 is rotated to move the suction pad 1B. To the placement. The front end of the substrate P2 is sucked (connected or connected) and fixed to the suction pad 1B located at the mounting position, and then it is mounted on the surface opposite to the suction side. T on both sides.

上述基板P2吸附於吸附墊1B及兩面帶之貼設係藉由操作員進行或使用機器手等進行。 The attachment of the substrate P2 to the adsorption pad 1B and the double-sided tape is performed by an operator or a robot.

貼設有兩面帶T之基板P2對吸附墊1B之吸附固定完成後,如圖13所示,使切斷接合單元CU2旋動以使基板P2移動至接合位置,且藉由馬達軸MT2之旋轉驅動使供應輥RR2往與基板P2之供應方向相反方向(圖13中逆時針方向)旋轉,藉此對基板P2賦予既定張力。 After the substrate P2 with T on both sides is attached to the adsorption pad 1B, as shown in FIG. 13, the cutting and joining unit CU2 is rotated to move the substrate P2 to the joining position, and the motor shaft MT2 is rotated. The driving causes the supply roller RR2 to rotate in a direction opposite to the supply direction of the substrate P2 (counterclockwise in FIG. 13), thereby applying a predetermined tension to the substrate P2.

另一方面,供應感測器S1檢測來自供應輥RR1之基板P1之供應結束後,停止夾持驅動捲筒NR1之驅動,且使馬達軸MT1往與基板P1之輸送方向相反方向旋轉驅動,藉此對夾持驅動捲筒NR1與供應輥RR1之間之基板P1賦予弱張力。 On the other hand, after the supply sensor S1 detects the completion of the supply of the substrate P1 from the supply roller RR1, the driving of the nip driving reel NR1 is stopped, and the motor shaft MT1 is rotationally driven in a direction opposite to the conveying direction of the substrate P1. This applies a weak tension to the substrate P1 between the nip drive roll NR1 and the supply roller RR1.

夾持驅動捲筒NR1之驅動停止後夾持驅動捲筒NR2亦持續驅動。因此,張力捲筒機構DR1作動,與夾持驅動捲筒NR2之驅動對應,適當地進行上段捲筒RJ1之下降及下段捲筒RK1之上升。藉此,儲存在第1緩衝機構BF1之基板P藉由夾持驅動捲筒NR2往處理裝置U1以一定速度持續輸送。 After the driving of the clamp driving reel NR1 is stopped, the clamp driving reel NR2 is continuously driven. Therefore, the tension reel mechanism DR1 operates corresponding to the driving of the clamp driving reel NR2, and appropriately lowers the upper reel RJ1 and lowers the lower reel RK1. Thereby, the substrate P stored in the first buffer mechanism BF1 is continuously conveyed to the processing device U1 at a constant speed by the clamp driving roller NR2.

接著,如圖14所示,使切斷接合單元CU1,CU2往彼此接近方向移動,在介有兩面帶T之狀態下將基板P1,P2一定時間壓接在吸附墊1A,1B間。藉此,基板P2在後續步驟被切斷,在基板P1之終端部之位置透過兩面帶T與基板P1貼合而接合。 Next, as shown in FIG. 14, the cutting and bonding units CU1 and CU2 are moved toward each other, and the substrates P1 and P2 are crimped between the suction pads 1A and 1B for a certain period of time with the T on both sides. Thereby, the board | substrate P2 is cut | disconnected in a subsequent step, and it is bonded to the board | substrate P1 through the both-surface tape T at the position of the terminal part of the board | substrate P1, and is bonded.

此外,在進行基板P1,P2之接合處理之期間,夾持驅動捲筒 NR2及張力捲筒機構DR1亦持續驅動,儲存在第1緩衝機構BF1之基板P藉由夾持驅動捲筒NR2往處理裝置U1以一定速度持續輸送。 In addition, during the bonding process of the substrates P1 and P2, the driving roll is clamped and driven. The NR2 and the tension reel mechanism DR1 are also continuously driven. The substrate P stored in the first buffer mechanism BF1 is continuously driven to the processing device U1 at a certain speed by clamping and driving the reel NR2.

基板P1與基板P2接合後,使在切斷接合單元CU2之吸附墊1B開放於大氣,之後,如圖15所示,使切斷接合單元CU2往離開切斷接合單元CU1之方向(+Z軸方向)移動。藉此,從供應輥RR2引出之基板P2之前端部,在藉由兩面帶T接合(連結或連接)於基板P1之狀態下,吸附保持於切斷接合單元CU1之吸附墊1A。 After the substrate P1 and the substrate P2 are bonded, the adsorption pad 1B of the cutting and bonding unit CU2 is opened to the atmosphere. Then, as shown in FIG. 15, the cutting and bonding unit CU2 is moved away from the cutting and bonding unit CU1 (+ Z axis). Direction). Thereby, the front end of the substrate P2 drawn from the supply roller RR2 is sucked and held on the suction pad 1A of the cutting and joining unit CU1 in a state of being bonded (connected or connected) to the substrate P1 by the double-sided tape T.

之後,在切斷接合單元CU1與供應輥RR1之間對基板P1賦予張力之狀態下,藉由在切斷接合單元CU1之刀具2A將對向之基板P1切斷。作為刀具2A,可採用例如使刃尖往基板P1之寬度方向(Y軸方向)滑動以切斷基板P1之構成。 Thereafter, in a state where tension is applied to the substrate P1 between the cutting and joining unit CU1 and the supply roller RR1, the opposing substrate P1 is cut by the cutter 2A of the cutting and joining unit CU1. As the cutter 2A, for example, a configuration can be adopted in which the cutting edge is slid in the width direction (Y-axis direction) of the substrate P1 to cut the substrate P1.

在進行基板P1之切斷處理之期間,夾持驅動捲筒NR2及張力捲筒機構DR1亦持續驅動,儲存在第1緩衝機構BF1之基板P藉由夾持驅動捲筒NR2往處理裝置U1以一定速度持續輸送。 During the cutting process of the substrate P1, the clamp driving reel NR2 and the tension reel mechanism DR1 are continuously driven, and the substrate P stored in the first buffer mechanism BF1 is clamped to drive the reel NR2 to the processing device U1 to Continuous delivery at a certain speed.

基板P1被切斷後,使在切斷接合單元CU1之吸附墊1A開放於大氣,之後,如圖16所示,使切斷接合單元CU1往離開切斷接合單元CU2(假想接合面VF1)之方向(-Z軸方向)移動。藉此,從供應輥RR1引出之基板P1,藉由與供應輥RR1之輸送方向相反方向之旋轉,捲繞至此供應輥RR1。 After the substrate P1 is cut, the suction pad 1A of the cutting and joining unit CU1 is opened to the atmosphere, and then, as shown in FIG. 16, the cutting and joining unit CU1 is moved away from the cutting and joining unit CU2 (imaginary joining surface VF1). (-Z axis direction). Thereby, the substrate P1 drawn out from the supply roll RR1 is wound around the supply roll RR1 by rotation in a direction opposite to the conveying direction of the supply roll RR1.

又,關於供應輥RR2,藉由與供應輥RR2之輸送方向相反方向之旋轉力矩,基板P2在旋轉輥RR2與夾持驅動捲筒NR1(及捲筒3B) 之間被賦予張力。藉此,連接於儲存在第1緩衝機構BF1之基板P之基板切換至作為從供應輥RR2引出之第2基板之基板P2。作為第2基板之基板P2,具有與基板P1(第1基板)同等之規格亦可。 Regarding the supply roller RR2, the substrate P2 is rotated by the rotation roller RR2 and the nip drive roll NR1 (and the roll 3B) by a rotation torque in a direction opposite to the conveying direction of the supply roll RR2. Tension is given between. Thereby, the substrate connected to the substrate P stored in the first buffer mechanism BF1 is switched to the substrate P2 as the second substrate drawn out from the supply roller RR2. The substrate P2 as the second substrate may have the same specifications as the substrate P1 (the first substrate).

之後,夾持驅動捲筒NR1以較夾持驅動捲筒NR2稍快之速度旋轉,在張力捲筒機構DR1,如圖17所示,與夾持驅動捲筒NR1之驅動對應,適當地進行上段捲筒RJ1之上升及下段捲筒RK1之下降。又,藉由馬達軸MT2往輸送方向旋轉驅動,從供應輥RR2引出之基板P2被送入,在第1緩衝機構BF1之基板P之儲存長度增加。 After that, the clamp driving reel NR1 rotates at a slightly faster speed than the clamp driving reel NR2. As shown in FIG. 17, the tension reel mechanism DR1 corresponds to the driving of the clamp driving reel NR1, and the upper stage is appropriately performed. The reel RJ1 rises and the lower reel RK1 falls. In addition, the motor shaft MT2 is driven to rotate in the conveying direction, and the substrate P2 drawn out from the supply roller RR2 is fed in, and the storage length of the substrate P in the first buffer mechanism BF1 is increased.

接著,在第1緩衝機構BF1之基板P之儲存長度成為大致最大後,夾持驅動捲筒NR1以與夾持驅動捲筒NR2相同速度旋轉,藉此在第1緩衝機構BF1之基板P之儲存長度均衡。又,基板P1大致用盡之供應輥RR1,從第1安裝部RS1移除(可拆裝),如圖18所示,安裝捲繞有基板P5之另一供應輥RR5。 Next, after the storage length of the substrate P of the first buffer mechanism BF1 becomes approximately the maximum, the grip driving roll NR1 rotates at the same speed as the grip driving roll NR2, thereby storing the substrate P in the first buffer mechanism BF1. Balanced length. Further, the supply roller RR1 of the substrate P1 that is almost exhausted is removed (detachable) from the first mounting portion RS1, and as shown in FIG. 18, another supply roller RR5 on which the substrate P5 is wound is mounted.

安裝供應輥RR5後,根據供應感測器S2之檢測結果,在供應輥RR2之基板P2用盡前,如圖18所示,使切斷接合單元CU1旋動以使吸附墊1A移動至貼設位置。使基板P5之前端部吸附固定(連結或連接)於位於貼設位置之吸附墊1A,之後,在與吸附側相反側之面貼設兩面帶T。 After the supply roller RR5 is installed, according to the detection result of the supply sensor S2, before the substrate P2 of the supply roller RR2 is used up, as shown in FIG. 18, the cutting and joining unit CU1 is rotated to move the suction pad 1A to the placement position. The front end of the substrate P5 is suction-fixed (connected or connected) to the suction pad 1A located at the mounting position, and then, two-sided tape T is attached to the surface opposite to the suction side.

之後,藉由馬達軸MT1之旋轉驅動使供應輥RR5往與基板P5之供應方向相反方向(圖18中逆時針方向)旋轉,藉此對基板P5賦予既定張力並同時使切斷接合單元CU1旋動,如圖19所示,移動至接合位置。 Thereafter, the supply roller RR5 is rotated in a direction opposite to the supply direction of the substrate P5 (counterclockwise in FIG. 18) by the rotational driving of the motor shaft MT1, thereby applying a predetermined tension to the substrate P5 and rotating the cutting and joining unit CU1 at the same time. As shown in FIG. 19, it moves to the engagement position.

接著,供應感測器S2檢測在供應輥RR2之基板P2之供應 結束後,停止夾持驅動捲筒NR1之驅動,且與上述步驟同樣地,使切斷接合單元CU1,CU2往彼此接近方向移動,在介在有兩面帶T之狀態下,在吸附墊1A,1B間將基板P2,P5壓接一定時間,再者,藉由在切斷接合單元CU2之刀具2B將基板P2切斷。藉此,連接於儲存在第1緩衝機構BF1之基板P之基板切換至從供應輥RR5引出之基板P5。 Next, the supply sensor S2 detects the supply of the substrate P2 on the supply roller RR2. After the completion, stop the driving of the clamp driving reel NR1, and move the cutting and joining units CU1 and CU2 toward each other in the same manner as the above steps, with the two sides with T on the suction pads 1A, 1B. The substrates P2 and P5 are crimped together for a certain period of time, and the substrate P2 is cut by the cutter 2B of the cutting unit CU2. Thereby, the substrate connected to the substrate P stored in the first buffer mechanism BF1 is switched to the substrate P5 pulled out from the supply roller RR5.

如上述,依序切換之基板P,在施加處理裝置U1之感光性機能液之塗布處理、處理裝置U2之加熱處理、處理裝置U3之圖案曝光處理、處理裝置U4之濕式處理、及處理裝置U5之加熱乾燥處理後,依序送至第2緩衝機構BF2、第2接帶器部CSb,回收至回收輥RR3或回收輥RR4。 As described above, the substrates P sequentially switched are applied with the photosensitive functional liquid of the processing device U1, the heating processing of the processing device U2, the pattern exposure processing of the processing device U3, the wet processing of the processing device U4, and the processing device. After the heating and drying process of U5, it is sequentially sent to the second buffer mechanism BF2, the second belt receiver section CSb, and recovered to the recovery roll RR3 or the recovery roll RR4.

接著,參照圖20至圖25說明上述構成之元件製造系統SYS之基板P之處理中之回收輥側之第2接帶器部CSb及第2緩衝機構BF2之動作。 Next, the operations of the second belt receiver CSb and the second buffer mechanism BF2 on the recovery roller side in the processing of the substrate P of the component manufacturing system SYS configured as described above will be described with reference to FIGS. 20 to 25.

圖20係處理基板即基板P透過夾持驅動捲筒NR3輸送至第2緩衝機構BF2並儲存,從第2緩衝機構BF2透過夾持驅動捲筒NR4輸送(排出)之基板P透過切斷接合單元CU3之捲筒3C回收至安裝在第3安裝部RS3之回收輥RR3之圖。又,如圖20所示,在第2緩衝機構BF2,上段捲筒RJ2位於下死點位置JD3,下段捲筒RK2位於上死點位置JU4,藉此基板P以接近最短之長度儲存在第2緩衝機構BF2。 FIG. 20 shows that the substrate P, which is a processing substrate, is conveyed to the second buffer mechanism BF2 through the clamp driving reel NR3 and stored, and the substrate P conveyed (discharged) from the second buffer mechanism BF2 through the clamp driving reel NR4 is transmitted through the cutting and bonding unit. The roll 3C of CU3 is recovered to the recovery roll RR3 mounted on the third mounting portion RS3. As shown in FIG. 20, in the second buffer mechanism BF2, the upper reel RJ2 is located at the lower dead center position JD3, and the lower reel RK2 is located at the upper dead center position JU4, so that the substrate P is stored in the second shortest length in the second Buffer mechanism BF2.

在第4安裝部RS4,在回收輥RR3之捲繞回收完成後,回收基板P之回收輥RR4安裝在馬達軸MT4,之後,使切斷接合單元CU4旋動以使吸附墊1D移動至貼設位置。使前端部連接於回收輥RR4之引入基板 PK(以下,僅稱為基板PK)之終端部吸附固定(連結或連接)於位於貼設位置之吸附墊1D,之後,在與吸附側相反側之面貼設兩面帶T。在基板PK貼設兩面帶T之後,使切斷接合單元CU4旋動以移動至接合位置,且藉由馬達軸MT4之旋轉驅動,使回收輥RR4往基板PK(基板P)之回收方向(圖20中順時針方向)旋轉,藉此對基板PK賦予既定張力。 In the fourth mounting portion RS4, after the winding recovery of the recovery roller RR3 is completed, the recovery roller RR4 of the recovery substrate P is mounted on the motor shaft MT4, and then the cutting and joining unit CU4 is rotated to move the suction pad 1D to the placement position. The leading end is connected to the lead-in board of the recovery roller RR4. The terminal portion of the PK (hereinafter, simply referred to as the substrate PK) is suction-fixed (connected or connected) to the suction pad 1D located at the mounting position, and then, two sides of the tape T are mounted on the surface opposite to the suction side. After attaching T on both sides of the substrate PK, the cutting and joining unit CU4 is rotated to move to the joining position, and the rotation of the motor shaft MT4 drives the recovery roller RR4 to the recovery direction of the substrate PK (substrate P) (Fig. 20 center clockwise), thereby giving the substrate PK a predetermined tension.

接著,捲繞感測器S3檢測回收輥RR3之基板P之回收結束後,停止夾持驅動捲筒NR4之驅動,且使張力捲筒機構DR2作動,適當地進行上段捲筒RJ2之上升及下段捲筒RK2之下降。藉此,從處理裝置U5藉由夾持驅動捲筒NR3輸送之基板P,在第2緩衝機構BF2之儲存長度係以一定量(與在生產線之基板P之搬送速度對應之輸送量)增加並同時儲存。 Next, after the winding sensor S3 detects the recovery of the substrate P of the recovery roller RR3, the driving of the clamp driving reel NR4 is stopped, and the tension reel mechanism DR2 is actuated, and the ascent of the upper reel RJ2 and the lower reel Reel of RK2 drops. As a result, the substrate P conveyed from the processing device U5 by the grip driving roll NR3, and the storage length of the second buffer mechanism BF2 is increased by a certain amount (the conveyance amount corresponding to the conveyance speed of the substrate P on the production line) and increased. Also stored.

另一方面,回收輥RR3之基板P之回收結束後,如圖21所示,使切斷接合單元CU3,CU4往彼此接近方向移動,在介在有兩面帶T之狀態下,在吸附墊1C,1D間將基板P,PK壓接一定時間。藉此,基板PK之終端部,在成為後續步驟中基板P被切斷時之前端部之位置,透過兩面帶T與基板P貼合並接合(連結或連接)。 On the other hand, after the recovery of the substrate P of the recovery roller RR3 is completed, as shown in FIG. 21, the cutting and joining units CU3 and CU4 are moved toward each other, and in a state of having T on both sides, the suction pad 1C, The substrates P and PK are crimped for a certain time between 1D. Thereby, the terminal portion of the substrate PK becomes the position of the end portion before the substrate P is cut in the subsequent step, and is bonded (joined or connected) to the substrate P through the two-sided tape T.

基板P與基板PK接合後,使在切斷接合單元CU4之吸附墊1D開放於大氣,之後,如圖22所示,使切斷接合單元CU4往離開切斷接合單元CU3之方向(+Z軸方向)移動。藉此,基板PK之前端部,在藉由兩面帶T接合於基板P之狀態下,吸附保持於切斷接合單元CU3之吸附墊1C。 After the substrate P and the substrate PK are bonded, the suction pad 1D of the cutting and bonding unit CU4 is opened to the atmosphere. Then, as shown in FIG. 22, the cutting and bonding unit CU4 is moved away from the cutting and bonding unit CU3 (+ Z axis). Direction). Thereby, the front end portion of the substrate PK is sucked and held on the suction pad 1C of the cutting and bonding unit CU in a state of being bonded to the substrate P by the double-sided tape T.

之後,在切斷接合單元CU3與回收輥RR3之間對基板P賦予張力之狀態下,藉由在切斷接合單元CU3之刀具2C,將對向之基板P切 斷。基板P被切斷後,使在切斷接合單元CU3之吸附墊1C開放於大氣,之後,如圖23所示,使切斷接合單元CU3往離開切斷接合單元CU4之方向(-Z軸方向)移動。藉此,從第2緩衝機構BF2輸送之基板P(亦即,在處理裝置U1~Un進行處理之基板P)之回收對象切換至回收輥RR4。 After that, in a state where tension is applied to the substrate P between the cutting and joining unit CU3 and the recovery roll RR3, the opposing substrate P is cut by the cutter 2C of the cutting and joining unit CU3. Off. After the substrate P is cut, the suction pad 1C of the cutting and joining unit CU3 is opened to the atmosphere, and then, as shown in FIG. 23, the cutting and joining unit CU3 is moved away from the cutting and joining unit CU4 (-Z axis direction). mobile. Thereby, the recovery target of the substrate P transported from the second buffer mechanism BF2 (that is, the substrate P processed in the processing devices U1 to Un) is switched to the recovery roller RR4.

在上述第2接帶器部CSb之接合處理及切斷處理進行之期間,亦適當地進行第2緩衝機構BF2內之上段捲筒RJ2之上升及下段捲筒RK2之下降,從處理裝置U5藉由夾持驅動捲筒NR3輸送之基板P,在第2緩衝機構BF2之儲存長度係以一定量增加並同時儲存。 During the above-mentioned joining process and cutting process of the second taper section CSb, the rising of the upper roll RJ2 and the lower of the lower roll RK2 in the second buffer mechanism BF2 are appropriately performed, and borrowed from the processing device U5. The length of the substrate P conveyed by the grip driving roll NR3 is increased by a certain amount in the second buffer mechanism BF2 and stored at the same time.

接著,往回收輥RR4之基板P之回收對象切換完成後,夾持驅動捲筒NR4以較夾持驅動捲筒NR3稍快之速度旋轉,在張力捲筒機構DR2,與夾持驅動捲筒NR4之驅動對應,適當地進行上段捲筒RJ2之下降及下段捲筒RK2之上升,在第2接帶器部CSb之接合處理及切斷處理之期間,使儲存在第2緩衝機構BF2之基板P之長度減少,成為初始狀態即大致最小之儲存長度(參照圖24)。儲存在第2緩衝機構BF2之基板P之長度成為大致最小後,使夾持驅動捲筒NR4以與夾持驅動捲筒NR3相同之速度旋轉。 Next, after the switching of the recovery target of the substrate P to the recovery roll RR4 is completed, the grip driving roll NR4 rotates at a slightly faster speed than the grip driving roll NR3, and the tension roll mechanism DR2 and the grip driving roll NR4 In response to the driving, the lower roll RJ2 and the lower roll RK2 are appropriately raised, and the substrate P stored in the second buffer mechanism BF2 is made during the bonding process and the cutting process of the second tape receiver section CSb. The length is reduced, and it becomes the initial minimum storage length (refer to FIG. 24). After the length of the substrate P stored in the second buffer mechanism BF2 has been substantially minimized, the grip drive roll NR4 is rotated at the same speed as the grip drive roll NR3.

另一方面,在基板P之回收完成後之第3安裝部RS3,移除回收輥RR3,如圖24所示,將連接(連結或接合)有引入基板PK2(以下,僅稱為基板PK2)之前端部之回收輥RR6安裝在馬達軸MT3,且使基板PK2之終端部吸附固定在於貼設位置旋動之切斷接合單元CU3之吸附墊1C,之後,在與吸附側相反側之面貼設兩面帶T。 On the other hand, after the recovery of the substrate P is completed at the third mounting portion RS3, the recovery roller RR3 is removed. As shown in FIG. 24, the connection (connection or bonding) is introduced into the substrate PK2 (hereinafter, simply referred to as the substrate PK2). The recovery roller RR6 at the front end is mounted on the motor shaft MT3, and the terminal portion of the substrate PK2 is sucked and fixed at the suction pad 1C of the cutting and joining unit CU3 which is rotated at the mounting position, and then is stuck on the surface opposite to the suction side Let T be on both sides.

在基板PK2貼設兩面帶T後,使切斷接合單元CU3旋動以移動至接合位置,且藉由馬達軸MT3之旋轉驅動使回收輥RR6往基板PK2(基板P)之回收方向(圖25中順時針方向)旋轉,藉此,在對基板PK2賦予既定張力之狀態下,待機至捲繞感測器S4檢測出回收輥RR3之回收結束為止。 After attaching T on both sides of the substrate PK2, the cutting and joining unit CU3 is rotated to move to the joining position, and the recovery roller RR6 is moved to the recovery direction of the substrate PK2 (substrate P) by the rotation driving of the motor shaft MT3 (FIG. 25) (Clockwise in the middle), thereby waiting in a state where a predetermined tension is applied to the substrate PK2 until the winding sensor S4 detects that the recovery of the recovery roller RR3 is completed.

如以上說明,本實施形態中,在第1緩衝機構BF1暫時儲存基板P並送至處理裝置U1之期間,將從新的供應輥RR2引出之基板P2接替基板P,輸送至第1緩衝機構BF1。因此,不停止處理裝置U1~Un之各處理即可變更作為供應來源之輥。是以,本實施形態中,可避免在供應輥之變更時點投入處理裝置U1~Un之基板P浪費而導致成本增加之事態。 As described above, in the present embodiment, while the first buffer mechanism BF1 temporarily stores the substrate P and sends it to the processing apparatus U1, the substrate P2 drawn from the new supply roller RR2 takes over the substrate P and transfers it to the first buffer mechanism BF1. Therefore, the roller as a source of supply can be changed without stopping each process of the processing devices U1 to Un. Therefore, in the present embodiment, it is possible to avoid a situation in which the substrate P that is put into the processing apparatuses U1 to Un is wasted at the time of the change of the supply roller and the cost is increased.

再者,本實施形態中,在從處理裝置Un輸送之基板P在第2緩衝機構BF2暫時儲存之期間,切換基板之回收對象。因此,在變更基板P之回收對象時亦可避免在變更時點投入處理裝置U1~Un之基板P浪費而導致成本增加之事態。 Furthermore, in the present embodiment, while the substrate P transported from the processing apparatus Un is temporarily stored in the second buffering mechanism BF2, the target for recovery of the substrate is switched. Therefore, when changing the collection target of the substrate P, it is also possible to avoid a situation in which the substrate P that is put into the processing devices U1 to Un at the time of the change is wasted and the cost is increased.

又,本實施形態中,在第1接帶器部CSa及第2接帶器部CSb,將新的基板接合於之前已使用之基板後,將之前之基板切斷。因此,在先執行切斷之情形,不會因賦予之張力在切斷時基板分離而產生妨礙接合等之缺陷,能穩定地執行基板處理。 In the present embodiment, a new substrate is bonded to a previously used substrate in the first and second tape receiver portions CSa and CSb, and the previous substrate is cut. Therefore, in the case where the cutting is performed first, the substrate tension can be prevented from causing defects such as the joint separation during cutting due to the applied tension, and the substrate processing can be performed stably.

以上,參照圖式說明本發明較佳實施形態,但本發明並不限於上述例。在上述例所示之各構成構件之諸形狀或組合等為一例,在不脫離本發明主旨之範圍內,可依據設計要求等進行各種變更。 As mentioned above, although preferred embodiment of this invention was described with reference to drawings, this invention is not limited to the said example. The shapes, combinations, and the like of the constituent members shown in the above examples are examples, and various changes can be made in accordance with design requirements and the like without departing from the spirit of the present invention.

例如,上述實施形態中,例示處理機構具備複數個處理裝置U1~Un之構成。然而,並不限於此,在一個處理裝置設置上述基板接續更換機構之構成亦可。 For example, in the embodiment described above, the processing mechanism is exemplified by a configuration including a plurality of processing devices U1 to Un. However, the present invention is not limited to this, and a configuration in which the above-mentioned substrate connection replacement mechanism is provided in one processing device may be used.

又,上述實施形態中,為另外具備連接有引入基板PK之回收輥之構成。然而,例如,為使用已用過且前端部之基板被切斷之供應輥之構成亦可。 Moreover, in the said embodiment, it is a structure provided with the recovery roll to which the lead-in board | substrate PK was connected separately. However, for example, a configuration in which a supply roller that has been used and the substrate at the front end portion is cut may be used.

又,上述實施形態中,為在供應側及回收側分別具備二個輥安裝部之構成。然而,分別具備三個以上之輥安裝部亦可。 Moreover, in the said embodiment, it was a structure which provided the two roll mounting parts on the supply side and the collection side, respectively. However, it is also possible to provide three or more roller mounting portions.

上述實施形態中,從二個供應輥之一方供應之基板成為輥終端之前,自動地接足來自另一輥之基板,可不停止生產線持續進行處理。若在生產線之某處,在形成在基板上之圖案產生缺陷或產生製造裝置之缺陷,則會有作出大量不良品之虞。 In the above embodiment, before the substrate supplied from one of the two supply rollers becomes the roller terminal, the substrate from the other roller is automatically taken over, and the processing can be continued without stopping the production line. If there is a defect in a pattern formed on a substrate or a defect in a manufacturing device somewhere in a production line, there is a risk of making a large number of defective products.

因此,為下述生產線(工廠)構成亦可,即在最終產品完成前之生產線,將長帶基板之狀態進行製程之多數個步驟劃分成幾個區塊,在各區塊內進行輥對輥之連續處理,在下一個步驟區塊,以捲繞有形成半完成品之基板之輥單位進行搬送,安裝在既定安裝部(RS1或RS2)。此情形,基板搬送能以步驟區塊單位連續地進行,即使在某個步驟區塊產生問題(圖案缺陷或裝置缺陷等)之情形,僅使該步驟區塊暫時停止即可,可減少不良品大量產生。 Therefore, it is also possible to constitute a production line (factory), that is, the production line before the completion of the final product, divides the majority of steps of the process of the long-band substrate into several blocks, and performs roll-to-roll in each block. For continuous processing, in the next step block, it is transported in units of rollers on which the substrate forming the semi-finished product is wound, and is mounted on the predetermined mounting section (RS1 or RS2). In this case, the substrate transfer can be performed continuously in units of step blocks. Even if a problem (pattern defect, device defect, etc.) occurs in a certain step block, only the step block can be temporarily stopped, which can reduce defective products. Produced in large numbers.

又,上述實施形態中,安裝在二個安裝部RS1,RS2之各個之供應輥RR1,RR2,產品製造用之片狀基板捲繞相同長度量,在來自一供 應輥RR1之基板供應結束(輥終端)之前一刻,接替成另一供應輥RR2之基板,供應輥RR2之基板用盡前持續進行處理。然而,安裝在安裝部RS1,RS2之一方之供應輥,僅在將成為輥終端之另一方之供應輥更換成新的輥之期間,對處理裝置U1~Un持續供應基板之使用方法亦可。 In the above embodiment, the supply rollers RR1 and RR2 mounted on each of the two mounting portions RS1 and RS2, and the sheet substrate for product manufacturing are wound by the same amount of Immediately before the supply of the substrate of the roller RR1 (roller end), the substrate of the other roller RR2 is replaced, and the substrate of the roller RR2 is continuously processed until it is used up. However, the supply rollers installed in one of the mounting sections RS1 and RS2 can only be used while the substrates are continuously supplied to the processing units U1 to Un while the supply rollers at the other end of the rollers are replaced with new ones.

此情形,例如,設成為輥終端之供應輥為RR2,將該輥RR2從安裝部RS2移除,將新的供應輥安裝在安裝部RS2,設在第1接帶器部CSa之接合準備完成之狀態(圖13之狀態)前之準備時間為180秒,在此期間,從另一方之供應輥RR1投入處理裝置U1(生產線)之基板(P1)之長度,設處理中之基板之輸送速度為50mm/秒,則成為9m。 In this case, for example, suppose that the supply roller serving as the roller terminal is RR2, remove the roller RR2 from the mounting section RS2, install a new supply roller on the mounting section RS2, and complete the preparation for joining the first belt receiver section CSa. The preparation time before the state (state of FIG. 13) is 180 seconds. During this period, the length of the substrate (P1) from the other supply roller RR1 into the processing device U1 (production line) is set as the substrate conveying speed during processing. When it is 50 mm / second, it becomes 9 m.

因此,該9m量之基板(P1)從另一方之供應輥RR1供應後,立刻藉由第1接帶器部CSa,將來自安裝在安裝部RS2之新的供應輥RR2之基板(P2)之前端接合(連結或連接)於從供應輥RR1僅投入處理裝置U1大致9m之基板(P1)之位置,此外,將該基板(P1)切斷,替換成來自供應輥RR2之基板(P2)亦可。 Therefore, after the substrate (P1) of the 9m quantity is supplied from the other supply roller RR1, the substrate (P2) from the new supply roller RR2 installed in the mounting portion RS2 is immediately transferred by the first tape receiver portion CSa. The front end is bonded (connected or connected) at a position where only the substrate (P1) from the supply roller RR1 is fed into the processing unit U1 only about 9m, and the substrate (P1) is cut and replaced with the substrate (P2) from the supply roller RR2. can.

又,如上述,將來自安裝在安裝部RS1之供應輥RR1之基板(P1)利用為暫時性接替基板(例如約9m)之情形,關於對該基板(P1)進行之處理,設為各處理裝置U1~Un之條件決定或維護管理用之引導處理,在此形成之元件不使用為最終產品亦可。 As described above, when the substrate (P1) from the supply roller RR1 mounted on the mounting portion RS1 is used as a temporary replacement substrate (for example, about 9m), the processing performed on the substrate (P1) is set as each processing. The conditions of the devices U1 ~ Un are determined or guided for maintenance and management. The components formed here may not be used as final products.

再者,利用為暫時性接替基板(例如約9m)之情形,不須將該基板(P1)預先捲繞於供應輥RR1,將例如切斷成10m之長度之枚葉式基板折疊後保管於箱子等,從該箱子逐一取出基板(10m)並供應至第1接帶器部 CSa亦可。 In addition, in the case of temporarily replacing a substrate (for example, about 9m), it is not necessary to wind the substrate (P1) on the supply roller RR1 in advance, and to fold and store a leaf-type substrate cut to a length of 10m, for example, Boxes, etc., take out substrates (10m) one by one from this box and supply them to the first tape receiver CSa is also available.

此外,本發明之技術範圍並不限於上述各實施形態。例如,上述各實施形態說明之要素之一個以上有省略之情形。又,上述各實施形態說明之要素可適當地組合。 The technical scope of the present invention is not limited to the embodiments described above. For example, one or more of the elements described in the above embodiments may be omitted. The elements described in each of the above embodiments can be appropriately combined.

Claims (4)

一種基板處理方法,將長條之第1片狀基板沿著長條方向連續搬入處理裝置,藉由前述處理裝置實施為了於前述第1片狀基板上形成電子元件之處理,其特徵在於:包含接合階段,藉由配置於前述處理裝置之前述第1片狀基板之搬入側之接合機構,於前述第1片狀基板之成為前述長條方向之端部之部分接合第2片狀基板;引導處理階段,在與前述第1片狀基板接合後之前述第2片狀基板從接合部起既定長度通過前述處理裝置之期間,進行為了前述處理裝置之條件決定或維護管理之引導處理。A substrate processing method, in which a long first sheet substrate is continuously carried into a processing device along the long direction, and a processing for forming an electronic component on the first sheet substrate is performed by the processing device, and is characterized in that: In the bonding stage, a second sheet substrate is bonded to a portion of the first sheet substrate that becomes an end portion in the long direction by a bonding mechanism arranged on the carrying-in side of the first sheet substrate; In the processing stage, while the second sheet-like substrate is bonded to the first sheet-like substrate, the second sheet-like substrate passes through the processing device with a predetermined length from the bonding portion, and a guiding process is performed for condition determination or maintenance management of the processing device. 如申請專利範圍第1項之基板處理方法,其中,前述接合階段包含藉由配置於前述接合機構與前述處理裝置之間之緩衝機構,將搬入前述處理裝置之前述第1片狀基板或前述第2片狀基板以長條方向之長度在既定最長儲存範圍內改變之方式儲存之動作。For example, the substrate processing method according to the scope of application for the patent, wherein the bonding stage includes the first sheet substrate or the first substrate to be carried into the processing device by a buffer mechanism disposed between the bonding mechanism and the processing device. Two pieces of substrate are stored in such a way that the length in the strip direction is changed within a predetermined longest storage range. 如申請專利範圍第2項之基板處理方法,其中,包含於前述接合階段之前,將前述第1片狀基板對前述緩衝機構之搬入暫時停止,藉由與前述接合機構一起配置於前述緩衝機構之搬入側之切斷機構,將前述第1片狀基板在長條方向切斷之步驟,前述第2片狀基板,藉由前述接合機構而接合於前述切斷後之前述第1片狀基板之端部。For example, the method for processing a substrate according to item 2 of the patent application includes temporarily stopping the loading of the first sheet-shaped substrate to the buffer mechanism before the bonding stage, and arranging the buffer mechanism with the bonding mechanism together with the buffer mechanism. A step of cutting in the carrying-in side to cut the first sheet substrate in a long direction, and the second sheet substrate is bonded to the end of the first sheet substrate after the cutting by the bonding mechanism; unit. 如申請專利範圍第2項之基板處理方法,其中,前述接合階段包含將前述第1片狀基板對前述緩衝機構之搬入暫時停止,藉由與前述接合機構一起配置於前述緩衝機構之搬入側之切斷機構,將前述第1片狀基板在長條方向切斷之切斷步驟,在切斷前藉由前述接合機構將前述第2片狀基板之端部接合於由前述切斷機構進行之切斷後預定成為端部之前述第1片狀基板之部分後,實行前述切斷步驟。For example, the substrate processing method of the second scope of the patent application, wherein the bonding stage includes temporarily stopping the loading of the first sheet-shaped substrate to the buffer mechanism, and is disposed on the loading side of the buffer mechanism together with the bonding mechanism. The cutting mechanism is a cutting step for cutting the first sheet substrate in a long direction. Before cutting, the end portion of the second sheet substrate is bonded to the cutting substrate by the bonding mechanism. After cutting, a portion of the first sheet substrate that is intended to be an end portion is subjected to the aforementioned cutting step.
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