TWI526701B - 半導體元件測試用分選機 - Google Patents

半導體元件測試用分選機 Download PDF

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Publication number
TWI526701B
TWI526701B TW103108407A TW103108407A TWI526701B TW I526701 B TWI526701 B TW I526701B TW 103108407 A TW103108407 A TW 103108407A TW 103108407 A TW103108407 A TW 103108407A TW I526701 B TWI526701 B TW I526701B
Authority
TW
Taiwan
Prior art keywords
semiconductor component
component
pocket
gripping head
test
Prior art date
Application number
TW103108407A
Other languages
English (en)
Chinese (zh)
Other versions
TW201439557A (zh
Inventor
羅閏成
成耆炷
Original Assignee
泰克元股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 泰克元股份有限公司 filed Critical 泰克元股份有限公司
Publication of TW201439557A publication Critical patent/TW201439557A/zh
Application granted granted Critical
Publication of TWI526701B publication Critical patent/TWI526701B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW103108407A 2013-04-03 2014-03-11 半導體元件測試用分選機 TWI526701B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020130036093A KR102010275B1 (ko) 2013-04-03 2013-04-03 반도체소자 테스트용 핸들러

Publications (2)

Publication Number Publication Date
TW201439557A TW201439557A (zh) 2014-10-16
TWI526701B true TWI526701B (zh) 2016-03-21

Family

ID=51665454

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103108407A TWI526701B (zh) 2013-04-03 2014-03-11 半導體元件測試用分選機

Country Status (3)

Country Link
KR (1) KR102010275B1 (ko)
CN (1) CN104096684B (ko)
TW (1) TWI526701B (ko)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102433967B1 (ko) * 2014-11-28 2022-08-22 (주)테크윙 전자부품 테스트용 핸들러
CN110780133B (zh) * 2014-11-28 2022-01-04 泰克元有限公司 用于测试电子部件的分选机
KR102228819B1 (ko) * 2015-03-11 2021-03-18 (주)테크윙 반도체소자 테스트용 핸들러
KR102325275B1 (ko) * 2015-07-07 2021-11-11 (주)테크윙 테스트핸들러용 푸셔 조립체 및 매치플레이트
KR102312491B1 (ko) * 2015-08-11 2021-10-15 (주)테크윙 반도체소자 테스트용 핸들러
KR20170078209A (ko) * 2015-12-29 2017-07-07 (주)테크윙 반도체소자 테스트용 핸들러
KR102473315B1 (ko) * 2016-02-19 2022-12-02 (주)테크윙 전자부품 테스트용 핸들러의 가압장치
KR20170116875A (ko) * 2016-04-12 2017-10-20 (주)테크윙 전자부품 테스트용 핸들러
CN107931154B (zh) * 2016-10-13 2019-07-26 泰克元有限公司 电子部件测试用分选机及其示教点调整方法
KR20200071357A (ko) * 2018-12-11 2020-06-19 (주)테크윙 전자부품 테스트용 핸들러
CN110743816B (zh) * 2019-11-08 2020-07-07 深圳市源微创新实业有限公司 一种便捷型半导体存储器检测装置
KR20220114214A (ko) * 2021-02-08 2022-08-17 (주)테크윙 전자부품 테스트용 핸들러의 어댑터
CN116273994B (zh) * 2023-05-26 2023-07-21 北京京瀚禹电子工程技术有限公司 一种具有智能上料分拣功能的电器老炼测试设备

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0387042A (ja) * 1989-08-30 1991-04-11 Nec Corp テーピング品の検査用オートハンドラ
JPH04326742A (ja) * 1991-04-26 1992-11-16 Hitachi Ltd Ｉｃハンドラのソケット位置決め方式
US5500605A (en) * 1993-09-17 1996-03-19 At&T Corp. Electrical test apparatus and method
JPH08233899A (ja) * 1995-02-28 1996-09-13 Ando Electric Co Ltd Ｉｃのコンタクト機構
JP2983163B2 (ja) * 1995-12-27 1999-11-29 株式会社しなのエレクトロニクス Ｉｃハンドラ
JPH10185993A (ja) * 1996-12-26 1998-07-14 Advantest Corp Ｉｃ試験装置
JPH11287842A (ja) * 1998-04-02 1999-10-19 Advantest Corp Ｉｃ試験装置
US6292003B1 (en) * 1998-07-01 2001-09-18 Xilinx, Inc. Apparatus and method for testing chip scale package integrated circuits
US6265886B1 (en) * 1999-07-12 2001-07-24 Micron Technology, Inc. Conductive bump array contactors having an ejector and methods of testing using same
JP2002071750A (ja) * 2000-08-29 2002-03-12 Enplas Corp ハンドラー装置用キャリア，ハンドラー装置用プッシャー及びハンドラー装置
JP2002181887A (ja) * 2000-12-12 2002-06-26 Advantest Corp 電子部品試験装置
JP2002207063A (ja) * 2001-01-09 2002-07-26 Advantest Corp プッシャ及びこれを備えた電子部品試験装置
KR100907337B1 (ko) * 2007-07-26 2009-07-13 주식회사 아이에스시테크놀러지 테스트용 소켓

Also Published As

Publication number Publication date
KR20140121909A (ko) 2014-10-17
CN104096684A (zh) 2014-10-15
CN104096684B (zh) 2017-05-10
KR102010275B1 (ko) 2019-08-13
TW201439557A (zh) 2014-10-16

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