TWI376841B - - Google Patents

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Publication number
TWI376841B
TWI376841B TW097136420A TW97136420A TWI376841B TW I376841 B TWI376841 B TW I376841B TW 097136420 A TW097136420 A TW 097136420A TW 97136420 A TW97136420 A TW 97136420A TW I376841 B TWI376841 B TW I376841B
Authority
TW
Taiwan
Prior art keywords
contactor
recess
electrode
inclined surface
inspected
Prior art date
Application number
TW097136420A
Other languages
English (en)
Chinese (zh)
Other versions
TW200924314A (en
Inventor
Eichi Osato
Hidekazu Miura
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200924314A publication Critical patent/TW200924314A/zh
Application granted granted Critical
Publication of TWI376841B publication Critical patent/TWI376841B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/50—Fixed connections
    • H01R12/51—Fixed connections for rigid printed circuits or like structures
    • H01R12/55—Fixed connections for rigid printed circuits or like structures characterised by the terminals
    • H01R12/57—Fixed connections for rigid printed circuits or like structures characterised by the terminals surface mounting terminals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Electrotherapy Devices (AREA)
TW097136420A 2007-10-23 2008-09-23 Contact and electrical connecting apparatus using it TW200924314A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007275074A JP5113481B2 (ja) 2007-10-23 2007-10-23 接触子及びこれを用いる電気的接続装置

Publications (2)

Publication Number Publication Date
TW200924314A TW200924314A (en) 2009-06-01
TWI376841B true TWI376841B (enExample) 2012-11-11

Family

ID=40490492

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097136420A TW200924314A (en) 2007-10-23 2008-09-23 Contact and electrical connecting apparatus using it

Country Status (6)

Country Link
US (1) US7753693B2 (enExample)
JP (1) JP5113481B2 (enExample)
KR (1) KR101001642B1 (enExample)
CN (1) CN101419244B (enExample)
DE (1) DE102008052360B4 (enExample)
TW (1) TW200924314A (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5906579B2 (ja) * 2011-04-08 2016-04-20 セイコーエプソン株式会社 端子モジュールおよび記録装置
US9797926B2 (en) 2012-11-07 2017-10-24 Omron Corporation Contact and electrical connection testing apparatus using the same
TWI657362B (zh) 2015-03-23 2019-04-21 群創光電股份有限公司 觸控裝置
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
KR102111942B1 (ko) * 2016-06-28 2020-05-18 가부시키가이샤 니혼 마이크로닉스 전기적 접속장치 및 접촉자
CN112771387A (zh) * 2018-07-27 2021-05-07 日置电机株式会社 测量装置
CN111060802A (zh) * 2019-11-28 2020-04-24 苏州韬盛电子科技有限公司 用于大电流测试以及高频测试的金属接触器
KR20230015824A (ko) 2020-04-07 2023-01-31 스미스 인터커넥트 아메리카스, 인크. 반도체 집적 회로를 위한 테스트 소켓
CN115877170A (zh) * 2021-09-27 2023-03-31 史密斯互连美洲公司 具有擦拭触件的测试插座的系统和方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW302022U (en) * 1996-09-20 1997-04-01 Tian-Yi Chen Conducting interface apparatus for testing jig of integrated circuit
US5888075A (en) * 1997-02-10 1999-03-30 Kabushiki Kaisha Nihon Micronics Auxiliary apparatus for testing device
JP2001035578A (ja) * 1999-05-14 2001-02-09 Mitsubishi Electric Corp 電子回路装置のテスト用ソケット及びその製造方法
JP2003123874A (ja) 2001-10-16 2003-04-25 Micronics Japan Co Ltd 接触子及びその製造方法並びに電気的接続装置
JP4388932B2 (ja) * 2004-01-13 2009-12-24 株式会社日本マイクロニクス 電気的接続装置
JP4592292B2 (ja) * 2004-01-16 2010-12-01 株式会社日本マイクロニクス 電気的接続装置
EP1753100A4 (en) * 2004-06-03 2008-05-07 Nihon Micronics Kk CONTACTOR AND ELECTRICAL CONNECTOR
US7625219B2 (en) * 2005-04-21 2009-12-01 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
TWM302022U (en) 2006-05-29 2006-12-01 Tangerine System Co Ltd Transmitting interface apparatus of integrated circuit test fixture

Also Published As

Publication number Publication date
JP2009103563A (ja) 2009-05-14
DE102008052360A8 (de) 2009-08-13
KR20090041315A (ko) 2009-04-28
DE102008052360A1 (de) 2009-04-30
CN101419244B (zh) 2012-10-10
JP5113481B2 (ja) 2013-01-09
DE102008052360B4 (de) 2019-07-11
US20090104795A1 (en) 2009-04-23
TW200924314A (en) 2009-06-01
CN101419244A (zh) 2009-04-29
US7753693B2 (en) 2010-07-13
KR101001642B1 (ko) 2010-12-17

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