US7490283B2
(en)
|
2004-05-13 |
2009-02-10 |
Sandisk Corporation |
Pipelined data relocation and improved chip architectures
|
US7158421B2
(en)
*
|
2005-04-01 |
2007-01-02 |
Sandisk Corporation |
Use of data latches in multi-phase programming of non-volatile memories
|
US7849381B2
(en)
|
2004-12-21 |
2010-12-07 |
Sandisk Corporation |
Method for copying data in reprogrammable non-volatile memory
|
US7447078B2
(en)
*
|
2005-04-01 |
2008-11-04 |
Sandisk Corporation |
Method for non-volatile memory with background data latch caching during read operations
|
US7463521B2
(en)
|
2005-04-01 |
2008-12-09 |
Sandisk Corporation |
Method for non-volatile memory with managed execution of cached data
|
US7206230B2
(en)
*
|
2005-04-01 |
2007-04-17 |
Sandisk Corporation |
Use of data latches in cache operations of non-volatile memories
|
US7196928B2
(en)
*
|
2005-04-05 |
2007-03-27 |
Sandisk Corporation |
Compensating for coupling during read operations of non-volatile memory
|
US7187585B2
(en)
*
|
2005-04-05 |
2007-03-06 |
Sandisk Corporation |
Read operation for non-volatile storage that includes compensation for coupling
|
US7196946B2
(en)
*
|
2005-04-05 |
2007-03-27 |
Sandisk Corporation |
Compensating for coupling in non-volatile storage
|
US7443726B2
(en)
*
|
2005-12-29 |
2008-10-28 |
Sandisk Corporation |
Systems for alternate row-based reading and writing for non-volatile memory
|
US7349260B2
(en)
*
|
2005-12-29 |
2008-03-25 |
Sandisk Corporation |
Alternate row-based reading and writing for non-volatile memory
|
ITRM20060074A1
(it)
*
|
2006-02-15 |
2007-08-16 |
Micron Technology Inc |
Circuito per dati a latch singolo in un dispositivo di memoria volatile e delle a piu livelli
|
US7400532B2
(en)
|
2006-02-16 |
2008-07-15 |
Micron Technology, Inc. |
Programming method to reduce gate coupling interference for non-volatile memory
|
KR100703806B1
(ko)
*
|
2006-02-16 |
2007-04-09 |
삼성전자주식회사 |
비휘발성 메모리, 이를 위한 데이터 유효성을 판단하는장치 및 방법
|
DE602007011736D1
(de)
*
|
2006-03-03 |
2011-02-17 |
Sandisk Corp |
Leseoperation für nichtflüchtige speicherung mit floating-gate-kopplungskompensation
|
US7499319B2
(en)
|
2006-03-03 |
2009-03-03 |
Sandisk Corporation |
Read operation for non-volatile storage with compensation for coupling
|
US7436733B2
(en)
|
2006-03-03 |
2008-10-14 |
Sandisk Corporation |
System for performing read operation on non-volatile storage with compensation for coupling
|
DE102006018245A1
(de)
*
|
2006-04-13 |
2007-10-18 |
Aurenz, Hans-Peter |
System zur Ansteuerung von Endgeräten
|
WO2007131062A2
(en)
|
2006-05-05 |
2007-11-15 |
Sandisk Corporation |
Non-volatile memory with background data latch caching during read operations and methods therefor
|
KR101202537B1
(ko)
|
2006-05-12 |
2012-11-19 |
애플 인크. |
메모리 디바이스를 위한 결합된 왜곡 추정 및 에러 보정 코딩
|
CN103280239B
(zh)
|
2006-05-12 |
2016-04-06 |
苹果公司 |
存储设备中的失真估计和消除
|
US8239735B2
(en)
|
2006-05-12 |
2012-08-07 |
Apple Inc. |
Memory Device with adaptive capacity
|
US7440331B2
(en)
|
2006-06-01 |
2008-10-21 |
Sandisk Corporation |
Verify operation for non-volatile storage using different voltages
|
WO2008097320A2
(en)
*
|
2006-06-01 |
2008-08-14 |
Virginia Tech Intellectual Properties, Inc. |
Premixing injector for gas turbine engines
|
US7457163B2
(en)
|
2006-06-01 |
2008-11-25 |
Sandisk Corporation |
System for verifying non-volatile storage using different voltages
|
US7450421B2
(en)
|
2006-06-02 |
2008-11-11 |
Sandisk Corporation |
Data pattern sensitivity compensation using different voltage
|
US7310272B1
(en)
|
2006-06-02 |
2007-12-18 |
Sandisk Corporation |
System for performing data pattern sensitivity compensation using different voltage
|
US7352628B2
(en)
*
|
2006-06-19 |
2008-04-01 |
Sandisk Corporation |
Systems for programming differently sized margins and sensing with compensations at select states for improved read operations in a non-volatile memory
|
US7606084B2
(en)
*
|
2006-06-19 |
2009-10-20 |
Sandisk Corporation |
Programming differently sized margins and sensing with compensations at select states for improved read operations in non-volatile memory
|
US7471568B2
(en)
*
|
2006-06-21 |
2008-12-30 |
Macronix International Co., Ltd. |
Multi-level cell memory structures with enlarged second bit operation window
|
US7599229B2
(en)
*
|
2006-06-21 |
2009-10-06 |
Macronix International Co., Ltd. |
Methods and structures for expanding a memory operation window and reducing a second bit effect
|
US7443729B2
(en)
*
|
2006-07-20 |
2008-10-28 |
Sandisk Corporation |
System that compensates for coupling based on sensing a neighbor using coupling
|
US7400535B2
(en)
*
|
2006-07-20 |
2008-07-15 |
Sandisk Corporation |
System that compensates for coupling during programming
|
US7894269B2
(en)
*
|
2006-07-20 |
2011-02-22 |
Sandisk Corporation |
Nonvolatile memory and method for compensating during programming for perturbing charges of neighboring cells
|
US7885119B2
(en)
|
2006-07-20 |
2011-02-08 |
Sandisk Corporation |
Compensating for coupling during programming
|
US7330376B1
(en)
*
|
2006-07-27 |
2008-02-12 |
Macronix International Co., Ltd. |
Method for memory data storage by partition into narrower threshold voltage distribution regions
|
US7366017B2
(en)
|
2006-08-22 |
2008-04-29 |
Micron Technology, Inc. |
Method for modifying data more than once in a multi-level cell memory location within a memory array
|
JP5052070B2
(ja)
|
2006-08-23 |
2012-10-17 |
ルネサスエレクトロニクス株式会社 |
データ読み出し回路及びデータ読み出し方法
|
WO2008026203A2
(en)
*
|
2006-08-27 |
2008-03-06 |
Anobit Technologies |
Estimation of non-linear distortion in memory devices
|
KR100822560B1
(ko)
*
|
2006-09-04 |
2008-04-16 |
주식회사 하이닉스반도체 |
낸드 플래시 메모리의 전류 측정 회로
|
US7423476B2
(en)
*
|
2006-09-25 |
2008-09-09 |
Micron Technology, Inc. |
Current mirror circuit having drain-source voltage clamp
|
JP2008084485A
(ja)
*
|
2006-09-28 |
2008-04-10 |
Toshiba Corp |
不揮発性半導体記憶装置及びデータ読出方法
|
WO2008042605A1
(en)
*
|
2006-09-29 |
2008-04-10 |
Sandisk Corporation |
Reverse reading in non-volatile memory with compensation for coupling
|
US7447076B2
(en)
|
2006-09-29 |
2008-11-04 |
Sandisk Corporation |
Systems for reverse reading in non-volatile memory with compensation for coupling
|
US7684247B2
(en)
*
|
2006-09-29 |
2010-03-23 |
Sandisk Corporation |
Reverse reading in non-volatile memory with compensation for coupling
|
US7975192B2
(en)
|
2006-10-30 |
2011-07-05 |
Anobit Technologies Ltd. |
Reading memory cells using multiple thresholds
|
US7924648B2
(en)
*
|
2006-11-28 |
2011-04-12 |
Anobit Technologies Ltd. |
Memory power and performance management
|
US8151163B2
(en)
|
2006-12-03 |
2012-04-03 |
Anobit Technologies Ltd. |
Automatic defect management in memory devices
|
US7900102B2
(en)
|
2006-12-17 |
2011-03-01 |
Anobit Technologies Ltd. |
High-speed programming of memory devices
|
WO2008083162A1
(en)
*
|
2006-12-28 |
2008-07-10 |
Sandisk Corporation |
Retention margin program verification
|
US7616506B2
(en)
*
|
2006-12-28 |
2009-11-10 |
Sandisk Corporation |
Systems for complete word line look ahead with efficient data latch assignment in non-volatile memory read operations
|
WO2008083132A2
(en)
*
|
2006-12-28 |
2008-07-10 |
Sandisk Corporation |
Complete word line look ahead with efficient data latch assignment in non-volatile memory read operations
|
US7616499B2
(en)
*
|
2006-12-28 |
2009-11-10 |
Sandisk Corporation |
Retention margin program verification
|
US7616505B2
(en)
*
|
2006-12-28 |
2009-11-10 |
Sandisk Corporation |
Complete word line look ahead with efficient data latch assignment in non-volatile memory read operations
|
US7701765B2
(en)
*
|
2006-12-28 |
2010-04-20 |
Micron Technology, Inc. |
Non-volatile multilevel memory cell programming
|
US7652918B2
(en)
*
|
2006-12-28 |
2010-01-26 |
Sandisk Corporation |
Retention margin program verification
|
TWI380311B
(en)
*
|
2006-12-29 |
2012-12-21 |
Sandisk Technologies Inc |
Systems and methods for margined neighbor reading for non-volatile memory read operations including coupling compensation
|
US7606070B2
(en)
|
2006-12-29 |
2009-10-20 |
Sandisk Corporation |
Systems for margined neighbor reading for non-volatile memory read operations including coupling compensation
|
US7518923B2
(en)
|
2006-12-29 |
2009-04-14 |
Sandisk Corporation |
Margined neighbor reading for non-volatile memory read operations including coupling compensation
|
US7440324B2
(en)
|
2006-12-29 |
2008-10-21 |
Sandisk Corporation |
Apparatus with alternating read mode
|
US7495962B2
(en)
|
2006-12-29 |
2009-02-24 |
Sandisk Corporation |
Alternating read mode
|
ATE475186T1
(de)
*
|
2006-12-29 |
2010-08-15 |
Sandisk Corp |
Lesen einer nichtflüchtigen speicherzelle unter berücksichtigung des speicherstatus einer benachbarten speicherzelle
|
US7619919B2
(en)
*
|
2007-01-12 |
2009-11-17 |
Marvell World Trade Ltd. |
Multi-level memory
|
US7751240B2
(en)
|
2007-01-24 |
2010-07-06 |
Anobit Technologies Ltd. |
Memory device with negative thresholds
|
US8151166B2
(en)
|
2007-01-24 |
2012-04-03 |
Anobit Technologies Ltd. |
Reduction of back pattern dependency effects in memory devices
|
US7660166B2
(en)
*
|
2007-01-31 |
2010-02-09 |
Sandisk Il Ltd. |
Method of improving programming precision in flash memory
|
US7502255B2
(en)
*
|
2007-03-07 |
2009-03-10 |
Sandisk Corporation |
Method for cache page copy in a non-volatile memory
|
US7499320B2
(en)
*
|
2007-03-07 |
2009-03-03 |
Sandisk Corporation |
Non-volatile memory with cache page copy
|
WO2008111058A2
(en)
|
2007-03-12 |
2008-09-18 |
Anobit Technologies Ltd. |
Adaptive estimation of memory cell read thresholds
|
US8001320B2
(en)
|
2007-04-22 |
2011-08-16 |
Anobit Technologies Ltd. |
Command interface for memory devices
|
US7924616B2
(en)
*
|
2007-05-04 |
2011-04-12 |
Micron Technology, Inc. |
Word line voltage boost system and method for non-volatile memory devices and memory devices and processor-based system using same
|
US8234545B2
(en)
|
2007-05-12 |
2012-07-31 |
Apple Inc. |
Data storage with incremental redundancy
|
WO2008139441A2
(en)
*
|
2007-05-12 |
2008-11-20 |
Anobit Technologies Ltd. |
Memory device with internal signal processing unit
|
US8073648B2
(en)
*
|
2007-05-14 |
2011-12-06 |
Sandisk Il Ltd. |
Measuring threshold voltage distribution in memory using an aggregate characteristic
|
ITRM20070273A1
(it)
*
|
2007-05-16 |
2008-11-17 |
Micron Technology Inc |
Lettura di celle di memoria non volatile a livello mutiplo.
|
KR100892583B1
(ko)
*
|
2007-06-08 |
2009-04-08 |
삼성전자주식회사 |
커플링을 고려한 메모리 셀의 데이터 프로그램 장치 및 그방법
|
KR101303177B1
(ko)
*
|
2007-06-22 |
2013-09-17 |
삼성전자주식회사 |
불휘발성 메모리 소자 및 그 동작 방법
|
US7849383B2
(en)
*
|
2007-06-25 |
2010-12-07 |
Sandisk Corporation |
Systems and methods for reading nonvolatile memory using multiple reading schemes
|
US20080320366A1
(en)
*
|
2007-06-25 |
2008-12-25 |
Lin Jason T |
Methods of reading nonvolatile memory
|
KR101373795B1
(ko)
|
2007-06-29 |
2014-03-13 |
샌디스크 테크놀로지스, 인코포레이티드 |
소스 바이어스 모든 비트라인 감지를 이용하는 비휘발성 저장 요소
|
US7545678B2
(en)
*
|
2007-06-29 |
2009-06-09 |
Sandisk Corporation |
Non-volatile storage with source bias all bit line sensing
|
US7471567B1
(en)
|
2007-06-29 |
2008-12-30 |
Sandisk Corporation |
Method for source bias all bit line sensing in non-volatile storage
|
US7925936B1
(en)
|
2007-07-13 |
2011-04-12 |
Anobit Technologies Ltd. |
Memory device with non-uniform programming levels
|
US8259497B2
(en)
|
2007-08-06 |
2012-09-04 |
Apple Inc. |
Programming schemes for multi-level analog memory cells
|
JP4510060B2
(ja)
*
|
2007-09-14 |
2010-07-21 |
株式会社東芝 |
不揮発性半導体記憶装置の読み出し/書き込み制御方法
|
US7652929B2
(en)
*
|
2007-09-17 |
2010-01-26 |
Sandisk Corporation |
Non-volatile memory and method for biasing adjacent word line for verify during programming
|
US8174905B2
(en)
|
2007-09-19 |
2012-05-08 |
Anobit Technologies Ltd. |
Programming orders for reducing distortion in arrays of multi-level analog memory cells
|
US8527819B2
(en)
|
2007-10-19 |
2013-09-03 |
Apple Inc. |
Data storage in analog memory cell arrays having erase failures
|
US8000141B1
(en)
|
2007-10-19 |
2011-08-16 |
Anobit Technologies Ltd. |
Compensation for voltage drifts in analog memory cells
|
US8068360B2
(en)
|
2007-10-19 |
2011-11-29 |
Anobit Technologies Ltd. |
Reading analog memory cells using built-in multi-threshold commands
|
US7675772B2
(en)
*
|
2007-10-26 |
2010-03-09 |
Micron Technology, Inc. |
Multilevel memory cell operation
|
KR101509836B1
(ko)
|
2007-11-13 |
2015-04-06 |
애플 인크. |
멀티 유닛 메모리 디바이스에서의 메모리 유닛의 최적화된 선택
|
US7613045B2
(en)
*
|
2007-11-26 |
2009-11-03 |
Sandisk Il, Ltd. |
Operation sequence and commands for measuring threshold voltage distribution in memory
|
US8225181B2
(en)
|
2007-11-30 |
2012-07-17 |
Apple Inc. |
Efficient re-read operations from memory devices
|
US8209588B2
(en)
|
2007-12-12 |
2012-06-26 |
Anobit Technologies Ltd. |
Efficient interference cancellation in analog memory cell arrays
|
US8085586B2
(en)
|
2007-12-27 |
2011-12-27 |
Anobit Technologies Ltd. |
Wear level estimation in analog memory cells
|
US8156398B2
(en)
|
2008-02-05 |
2012-04-10 |
Anobit Technologies Ltd. |
Parameter estimation based on error correction code parity check equations
|
US7924587B2
(en)
|
2008-02-21 |
2011-04-12 |
Anobit Technologies Ltd. |
Programming of analog memory cells using a single programming pulse per state transition
|
US7864573B2
(en)
*
|
2008-02-24 |
2011-01-04 |
Anobit Technologies Ltd. |
Programming analog memory cells for reduced variance after retention
|
US8230300B2
(en)
|
2008-03-07 |
2012-07-24 |
Apple Inc. |
Efficient readout from analog memory cells using data compression
|
US8059457B2
(en)
|
2008-03-18 |
2011-11-15 |
Anobit Technologies Ltd. |
Memory device with multiple-accuracy read commands
|
US8400858B2
(en)
|
2008-03-18 |
2013-03-19 |
Apple Inc. |
Memory device with reduced sense time readout
|
US7808836B2
(en)
*
|
2008-04-29 |
2010-10-05 |
Sandisk Il Ltd. |
Non-volatile memory with adaptive setting of state voltage levels
|
US7808819B2
(en)
*
|
2008-04-29 |
2010-10-05 |
Sandisk Il Ltd. |
Method for adaptive setting of state voltage levels in non-volatile memory
|
US7848144B2
(en)
*
|
2008-06-16 |
2010-12-07 |
Sandisk Corporation |
Reverse order page writing in flash memories
|
US7821839B2
(en)
*
|
2008-06-27 |
2010-10-26 |
Sandisk Il Ltd. |
Gain control for read operations in flash memory
|
US8059447B2
(en)
*
|
2008-06-27 |
2011-11-15 |
Sandisk 3D Llc |
Capacitive discharge method for writing to non-volatile memory
|
WO2010002945A1
(en)
*
|
2008-07-01 |
2010-01-07 |
Lsi Corporation |
Methods and apparatus for intercell interference mitigation using modulation coding
|
US20100027340A1
(en)
*
|
2008-07-31 |
2010-02-04 |
Ercole Rosario Di Iorio |
Pattern dependent string resistance compensation
|
US7995388B1
(en)
|
2008-08-05 |
2011-08-09 |
Anobit Technologies Ltd. |
Data storage using modified voltages
|
US7924613B1
(en)
|
2008-08-05 |
2011-04-12 |
Anobit Technologies Ltd. |
Data storage in analog memory cells with protection against programming interruption
|
US7876611B2
(en)
*
|
2008-08-08 |
2011-01-25 |
Sandisk Corporation |
Compensating for coupling during read operations in non-volatile storage
|
US8130528B2
(en)
|
2008-08-25 |
2012-03-06 |
Sandisk 3D Llc |
Memory system with sectional data lines
|
US8949684B1
(en)
|
2008-09-02 |
2015-02-03 |
Apple Inc. |
Segmented data storage
|
US8169825B1
(en)
|
2008-09-02 |
2012-05-01 |
Anobit Technologies Ltd. |
Reliable data storage in analog memory cells subjected to long retention periods
|
US8482978B1
(en)
|
2008-09-14 |
2013-07-09 |
Apple Inc. |
Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
|
US8000135B1
(en)
|
2008-09-14 |
2011-08-16 |
Anobit Technologies Ltd. |
Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
|
US9378835B2
(en)
|
2008-09-30 |
2016-06-28 |
Seagate Technology Llc |
Methods and apparatus for soft data generation for memory devices based using reference cells
|
US8027209B2
(en)
|
2008-10-06 |
2011-09-27 |
Sandisk 3D, Llc |
Continuous programming of non-volatile memory
|
US8239734B1
(en)
|
2008-10-15 |
2012-08-07 |
Apple Inc. |
Efficient data storage in storage device arrays
|
US8261159B1
(en)
|
2008-10-30 |
2012-09-04 |
Apple, Inc. |
Data scrambling schemes for memory devices
|
US8208304B2
(en)
|
2008-11-16 |
2012-06-26 |
Anobit Technologies Ltd. |
Storage at M bits/cell density in N bits/cell analog memory cell devices, M>N
|
KR101642465B1
(ko)
|
2008-12-12 |
2016-07-25 |
삼성전자주식회사 |
불휘발성 메모리 장치의 액세스 방법
|
US7944754B2
(en)
*
|
2008-12-31 |
2011-05-17 |
Sandisk Corporation |
Non-volatile memory and method with continuous scanning time-domain sensing
|
US8174857B1
(en)
|
2008-12-31 |
2012-05-08 |
Anobit Technologies Ltd. |
Efficient readout schemes for analog memory cell devices using multiple read threshold sets
|
US8248831B2
(en)
|
2008-12-31 |
2012-08-21 |
Apple Inc. |
Rejuvenation of analog memory cells
|
US7813181B2
(en)
*
|
2008-12-31 |
2010-10-12 |
Sandisk Corporation |
Non-volatile memory and method for sensing with pipelined corrections for neighboring perturbations
|
US8924661B1
(en)
|
2009-01-18 |
2014-12-30 |
Apple Inc. |
Memory system including a controller and processors associated with memory devices
|
KR101074539B1
(ko)
*
|
2009-02-04 |
2011-10-17 |
주식회사 하이닉스반도체 |
불휘발성 메모리 장치 및 그 동작 방법
|
US8228701B2
(en)
|
2009-03-01 |
2012-07-24 |
Apple Inc. |
Selective activation of programming schemes in analog memory cell arrays
|
US8832354B2
(en)
|
2009-03-25 |
2014-09-09 |
Apple Inc. |
Use of host system resources by memory controller
|
US8259506B1
(en)
|
2009-03-25 |
2012-09-04 |
Apple Inc. |
Database of memory read thresholds
|
US8238157B1
(en)
|
2009-04-12 |
2012-08-07 |
Apple Inc. |
Selective re-programming of analog memory cells
|
US8279650B2
(en)
|
2009-04-20 |
2012-10-02 |
Sandisk 3D Llc |
Memory system with data line switching scheme
|
US8139418B2
(en)
|
2009-04-27 |
2012-03-20 |
Micron Technology, Inc. |
Techniques for controlling a direct injection semiconductor memory device
|
JP2011008838A
(ja)
*
|
2009-06-23 |
2011-01-13 |
Toshiba Corp |
不揮発性半導体記憶装置およびその書き込み方法
|
US7898864B2
(en)
*
|
2009-06-24 |
2011-03-01 |
Sandisk Corporation |
Read operation for memory with compensation for coupling based on write-erase cycles
|
US8479080B1
(en)
|
2009-07-12 |
2013-07-02 |
Apple Inc. |
Adaptive over-provisioning in memory systems
|
US8130544B2
(en)
*
|
2009-08-17 |
2012-03-06 |
Skymedi Corporation |
Method of reducing bit error rate for a flash memory
|
US8077515B2
(en)
*
|
2009-08-25 |
2011-12-13 |
Micron Technology, Inc. |
Methods, devices, and systems for dealing with threshold voltage change in memory devices
|
US8495465B1
(en)
|
2009-10-15 |
2013-07-23 |
Apple Inc. |
Error correction coding over multiple memory pages
|
US8677054B1
(en)
|
2009-12-16 |
2014-03-18 |
Apple Inc. |
Memory management schemes for non-volatile memory devices
|
US8694814B1
(en)
|
2010-01-10 |
2014-04-08 |
Apple Inc. |
Reuse of host hibernation storage space by memory controller
|
US8572311B1
(en)
|
2010-01-11 |
2013-10-29 |
Apple Inc. |
Redundant data storage in multi-die memory systems
|
US8504885B2
(en)
|
2010-03-31 |
2013-08-06 |
Lsi Corporation |
Methods and apparatus for approximating a probability density function or distribution for a received value in communication or storage systems
|
US8429500B2
(en)
|
2010-03-31 |
2013-04-23 |
Lsi Corporation |
Methods and apparatus for computing a probability value of a received value in communication or storage systems
|
US8775913B2
(en)
|
2010-03-31 |
2014-07-08 |
Lsi Corporation |
Methods and apparatus for computing soft data or log likelihood ratios for received values in communication or storage systems
|
US8218366B2
(en)
|
2010-04-18 |
2012-07-10 |
Sandisk Technologies Inc. |
Programming non-volatile storage including reducing impact from other memory cells
|
US8694853B1
(en)
|
2010-05-04 |
2014-04-08 |
Apple Inc. |
Read commands for reading interfering memory cells
|
US8451664B2
(en)
|
2010-05-12 |
2013-05-28 |
Micron Technology, Inc. |
Determining and using soft data in memory devices and systems
|
US8572423B1
(en)
|
2010-06-22 |
2013-10-29 |
Apple Inc. |
Reducing peak current in memory systems
|
US8595591B1
(en)
|
2010-07-11 |
2013-11-26 |
Apple Inc. |
Interference-aware assignment of programming levels in analog memory cells
|
US9104580B1
(en)
|
2010-07-27 |
2015-08-11 |
Apple Inc. |
Cache memory for hybrid disk drives
|
US8767459B1
(en)
|
2010-07-31 |
2014-07-01 |
Apple Inc. |
Data storage in analog memory cells across word lines using a non-integer number of bits per cell
|
US8856475B1
(en)
|
2010-08-01 |
2014-10-07 |
Apple Inc. |
Efficient selection of memory blocks for compaction
|
KR101703279B1
(ko)
|
2010-08-05 |
2017-02-06 |
삼성전자 주식회사 |
플래시 메모리 장치 및 플래시 메모리 장치의 독출 방법
|
US8694854B1
(en)
|
2010-08-17 |
2014-04-08 |
Apple Inc. |
Read threshold setting based on soft readout statistics
|
US9021181B1
(en)
|
2010-09-27 |
2015-04-28 |
Apple Inc. |
Memory management for unifying memory cell conditions by using maximum time intervals
|
KR101774471B1
(ko)
*
|
2010-11-25 |
2017-09-05 |
삼성전자주식회사 |
불 휘발성 메모리 장치 및 그것의 읽기 방법
|
US8472280B2
(en)
|
2010-12-21 |
2013-06-25 |
Sandisk Technologies Inc. |
Alternate page by page programming scheme
|
US8782495B2
(en)
*
|
2010-12-23 |
2014-07-15 |
Sandisk Il Ltd |
Non-volatile memory and methods with asymmetric soft read points around hard read points
|
US8099652B1
(en)
*
|
2010-12-23 |
2012-01-17 |
Sandisk Corporation |
Non-volatile memory and methods with reading soft bits in non uniform schemes
|
US8498152B2
(en)
|
2010-12-23 |
2013-07-30 |
Sandisk Il Ltd. |
Non-volatile memory and methods with soft-bit reads while reading hard bits with compensation for coupling
|
US9292377B2
(en)
|
2011-01-04 |
2016-03-22 |
Seagate Technology Llc |
Detection and decoding in flash memories using correlation of neighboring bits and probability based reliability values
|
US9898361B2
(en)
|
2011-01-04 |
2018-02-20 |
Seagate Technology Llc |
Multi-tier detection and decoding in flash memories
|
US8374028B2
(en)
*
|
2011-01-19 |
2013-02-12 |
Micron Technology, Inc. |
Sense operation in a memory device
|
TWI427354B
(zh)
|
2011-01-20 |
2014-02-21 |
Largan Precision Co |
攝像用光學透鏡組
|
US8972650B2
(en)
|
2011-01-28 |
2015-03-03 |
Apple Inc. |
Methods and systems for performing efficient page reads in a non-volatile memory
|
JP5330421B2
(ja)
*
|
2011-02-01 |
2013-10-30 |
株式会社東芝 |
不揮発性半導体記憶装置
|
US9502117B2
(en)
|
2011-03-14 |
2016-11-22 |
Seagate Technology Llc |
Cell-level statistics collection for detection and decoding in flash memories
|
US8472266B2
(en)
|
2011-03-31 |
2013-06-25 |
Sandisk Technologies Inc. |
Reducing neighbor read disturb
|
US8395936B2
(en)
|
2011-05-09 |
2013-03-12 |
Sandisk Technologies Inc. |
Using channel-to-channel coupling to compensate floating gate-to-floating gate coupling in programming of non-volatile memory
|
US8775901B2
(en)
|
2011-07-28 |
2014-07-08 |
SanDisk Technologies, Inc. |
Data recovery for defective word lines during programming of non-volatile memory arrays
|
US8750042B2
(en)
|
2011-07-28 |
2014-06-10 |
Sandisk Technologies Inc. |
Combined simultaneous sensing of multiple wordlines in a post-write read (PWR) and detection of NAND failures
|
US8891297B2
(en)
|
2011-11-01 |
2014-11-18 |
Micron Technology, Inc. |
Memory cell sensing
|
KR101856136B1
(ko)
|
2011-11-15 |
2018-06-21 |
삼성전자주식회사 |
비휘발성 메모리 장치의 동작 제어방법, 그 메모리 컨트롤러 및 이를 포함하는 메모리 시스템
|
US8687421B2
(en)
*
|
2011-11-21 |
2014-04-01 |
Sandisk Technologies Inc. |
Scrub techniques for use with dynamic read
|
US8730722B2
(en)
|
2012-03-02 |
2014-05-20 |
Sandisk Technologies Inc. |
Saving of data in cases of word-line to word-line short in memory arrays
|
TWI497497B
(zh)
*
|
2012-03-19 |
2015-08-21 |
Macronix Int Co Ltd |
記憶體中動態感測區間的方法與裝置
|
US8923041B2
(en)
|
2012-04-11 |
2014-12-30 |
Everspin Technologies, Inc. |
Self-referenced sense amplifier for spin torque MRAM
|
US9171627B2
(en)
|
2012-04-11 |
2015-10-27 |
Aplus Flash Technology, Inc. |
Non-boosting program inhibit scheme in NAND design
|
US9087595B2
(en)
|
2012-04-20 |
2015-07-21 |
Aplus Flash Technology, Inc. |
Shielding 2-cycle half-page read and program schemes for advanced NAND flash design
|
US8937837B2
(en)
|
2012-05-08 |
2015-01-20 |
Sandisk Technologies Inc. |
Bit line BL isolation scheme during erase operation for non-volatile storage
|
US9001577B2
(en)
|
2012-06-01 |
2015-04-07 |
Micron Technology, Inc. |
Memory cell sensing
|
US9323608B2
(en)
*
|
2012-06-07 |
2016-04-26 |
Micron Technology, Inc. |
Integrity of a data bus
|
KR20140018517A
(ko)
*
|
2012-08-02 |
2014-02-13 |
에스케이하이닉스 주식회사 |
반도체 메모리 장치 및 그것의 동작 방법
|
US9076545B2
(en)
|
2013-01-17 |
2015-07-07 |
Sandisk Tecnologies Inc. |
Dynamic adjustment of read voltage levels based on memory cell threshold voltage distribution
|
US9158667B2
(en)
|
2013-03-04 |
2015-10-13 |
Micron Technology, Inc. |
Apparatuses and methods for performing logical operations using sensing circuitry
|
TWI511156B
(zh)
*
|
2013-05-13 |
2015-12-01 |
Winbond Electronics Corp |
參考記憶胞的偏壓產生器及偏壓提供方法
|
US9183940B2
(en)
|
2013-05-21 |
2015-11-10 |
Aplus Flash Technology, Inc. |
Low disturbance, power-consumption, and latency in NAND read and program-verify operations
|
WO2014210424A2
(en)
|
2013-06-27 |
2014-12-31 |
Aplus Flash Technology, Inc. |
Novel nand array architecture for multiple simultaneous program and read
|
WO2015013689A2
(en)
|
2013-07-25 |
2015-01-29 |
Aplus Flash Technology, Inc. |
Nand array hiarchical bl structures for multiple-wl and all -bl simultaneous erase, erase-verify, program, program-verify, and read operations
|
US8964496B2
(en)
|
2013-07-26 |
2015-02-24 |
Micron Technology, Inc. |
Apparatuses and methods for performing compare operations using sensing circuitry
|
US8971124B1
(en)
|
2013-08-08 |
2015-03-03 |
Micron Technology, Inc. |
Apparatuses and methods for performing logical operations using sensing circuitry
|
US9153305B2
(en)
|
2013-08-30 |
2015-10-06 |
Micron Technology, Inc. |
Independently addressable memory array address spaces
|
US9293205B2
(en)
|
2013-09-14 |
2016-03-22 |
Aplus Flash Technology, Inc |
Multi-task concurrent/pipeline NAND operations on all planes
|
US9019785B2
(en)
|
2013-09-19 |
2015-04-28 |
Micron Technology, Inc. |
Data shifting via a number of isolation devices
|
US9165683B2
(en)
|
2013-09-23 |
2015-10-20 |
Sandisk Technologies Inc. |
Multi-word line erratic programming detection
|
US9449675B2
(en)
|
2013-10-31 |
2016-09-20 |
Micron Technology, Inc. |
Apparatuses and methods for identifying an extremum value stored in an array of memory cells
|
US9430191B2
(en)
|
2013-11-08 |
2016-08-30 |
Micron Technology, Inc. |
Division operations for memory
|
WO2015100434A2
(en)
|
2013-12-25 |
2015-07-02 |
Aplus Flash Technology, Inc |
A HYBRID NAND WITH ALL-BL m-PAGE OPERATION SCHEME
|
US20150270015A1
(en)
*
|
2014-03-19 |
2015-09-24 |
Micron Technology, Inc. |
Memory mapping
|
US9934856B2
(en)
|
2014-03-31 |
2018-04-03 |
Micron Technology, Inc. |
Apparatuses and methods for comparing data patterns in memory
|
US9552251B2
(en)
*
|
2014-04-22 |
2017-01-24 |
Sandisk Technologies Llc |
Neighboring word line program disturb countermeasure for charge-trapping memory
|
US8886877B1
(en)
*
|
2014-05-15 |
2014-11-11 |
Sandisk Technologies Inc. |
In-situ block folding for nonvolatile memory
|
US9711206B2
(en)
|
2014-06-05 |
2017-07-18 |
Micron Technology, Inc. |
Performing logical operations using sensing circuitry
|
US9779019B2
(en)
|
2014-06-05 |
2017-10-03 |
Micron Technology, Inc. |
Data storage layout
|
US9449674B2
(en)
|
2014-06-05 |
2016-09-20 |
Micron Technology, Inc. |
Performing logical operations using sensing circuitry
|
US9711207B2
(en)
|
2014-06-05 |
2017-07-18 |
Micron Technology, Inc. |
Performing logical operations using sensing circuitry
|
US9496023B2
(en)
|
2014-06-05 |
2016-11-15 |
Micron Technology, Inc. |
Comparison operations on logical representations of values in memory
|
US9910787B2
(en)
|
2014-06-05 |
2018-03-06 |
Micron Technology, Inc. |
Virtual address table
|
US10074407B2
(en)
|
2014-06-05 |
2018-09-11 |
Micron Technology, Inc. |
Apparatuses and methods for performing invert operations using sensing circuitry
|
US9830999B2
(en)
|
2014-06-05 |
2017-11-28 |
Micron Technology, Inc. |
Comparison operations in memory
|
US9704540B2
(en)
|
2014-06-05 |
2017-07-11 |
Micron Technology, Inc. |
Apparatuses and methods for parity determination using sensing circuitry
|
US9455020B2
(en)
|
2014-06-05 |
2016-09-27 |
Micron Technology, Inc. |
Apparatuses and methods for performing an exclusive or operation using sensing circuitry
|
US9786335B2
(en)
|
2014-06-05 |
2017-10-10 |
Micron Technology, Inc. |
Apparatuses and methods for performing logical operations using sensing circuitry
|
US9460809B2
(en)
|
2014-07-10 |
2016-10-04 |
Sandisk Technologies Llc |
AC stress mode to screen out word line to word line shorts
|
US9514835B2
(en)
|
2014-07-10 |
2016-12-06 |
Sandisk Technologies Llc |
Determination of word line to word line shorts between adjacent blocks
|
US9484086B2
(en)
|
2014-07-10 |
2016-11-01 |
Sandisk Technologies Llc |
Determination of word line to local source line shorts
|
US9443612B2
(en)
|
2014-07-10 |
2016-09-13 |
Sandisk Technologies Llc |
Determination of bit line to low voltage signal shorts
|
WO2016014731A1
(en)
|
2014-07-22 |
2016-01-28 |
Aplus Flash Technology, Inc. |
Yukai vsl-based vt-compensation for nand memory
|
US9971647B2
(en)
*
|
2014-07-31 |
2018-05-15 |
Winbond Electronics Corporation |
Apparatus and method for programming ECC-enabled NAND flash memory
|
US9240249B1
(en)
|
2014-09-02 |
2016-01-19 |
Sandisk Technologies Inc. |
AC stress methods to screen out bit line defects
|
US9202593B1
(en)
|
2014-09-02 |
2015-12-01 |
Sandisk Technologies Inc. |
Techniques for detecting broken word lines in non-volatile memories
|
US9589602B2
(en)
|
2014-09-03 |
2017-03-07 |
Micron Technology, Inc. |
Comparison operations in memory
|
US9847110B2
(en)
|
2014-09-03 |
2017-12-19 |
Micron Technology, Inc. |
Apparatuses and methods for storing a data value in multiple columns of an array corresponding to digits of a vector
|
US10068652B2
(en)
|
2014-09-03 |
2018-09-04 |
Micron Technology, Inc. |
Apparatuses and methods for determining population count
|
US9904515B2
(en)
|
2014-09-03 |
2018-02-27 |
Micron Technology, Inc. |
Multiplication operations in memory
|
US9898252B2
(en)
|
2014-09-03 |
2018-02-20 |
Micron Technology, Inc. |
Multiplication operations in memory
|
US9740607B2
(en)
|
2014-09-03 |
2017-08-22 |
Micron Technology, Inc. |
Swap operations in memory
|
US9747961B2
(en)
|
2014-09-03 |
2017-08-29 |
Micron Technology, Inc. |
Division operations in memory
|
US9449694B2
(en)
|
2014-09-04 |
2016-09-20 |
Sandisk Technologies Llc |
Non-volatile memory with multi-word line select for defect detection operations
|
US9836218B2
(en)
|
2014-10-03 |
2017-12-05 |
Micron Technology, Inc. |
Computing reduction and prefix sum operations in memory
|
US9940026B2
(en)
|
2014-10-03 |
2018-04-10 |
Micron Technology, Inc. |
Multidimensional contiguous memory allocation
|
KR102233074B1
(ko)
|
2014-10-08 |
2021-03-30 |
삼성전자주식회사 |
저장 장치 및 그것의 신뢰성 검증 방법
|
US10163467B2
(en)
|
2014-10-16 |
2018-12-25 |
Micron Technology, Inc. |
Multiple endianness compatibility
|
US10147480B2
(en)
|
2014-10-24 |
2018-12-04 |
Micron Technology, Inc. |
Sort operation in memory
|
US9779784B2
(en)
|
2014-10-29 |
2017-10-03 |
Micron Technology, Inc. |
Apparatuses and methods for performing logical operations using sensing circuitry
|
US10073635B2
(en)
|
2014-12-01 |
2018-09-11 |
Micron Technology, Inc. |
Multiple endianness compatibility
|
US9747960B2
(en)
|
2014-12-01 |
2017-08-29 |
Micron Technology, Inc. |
Apparatuses and methods for converting a mask to an index
|
US10061590B2
(en)
|
2015-01-07 |
2018-08-28 |
Micron Technology, Inc. |
Generating and executing a control flow
|
US10032493B2
(en)
|
2015-01-07 |
2018-07-24 |
Micron Technology, Inc. |
Longest element length determination in memory
|
US9583163B2
(en)
|
2015-02-03 |
2017-02-28 |
Micron Technology, Inc. |
Loop structure for operations in memory
|
EP3254286B1
(en)
|
2015-02-06 |
2019-09-11 |
Micron Technology, INC. |
Apparatuses and methods for parallel writing to multiple memory device locations
|
WO2016126472A1
(en)
|
2015-02-06 |
2016-08-11 |
Micron Technology, Inc. |
Apparatuses and methods for scatter and gather
|
EP3254287A4
(en)
|
2015-02-06 |
2018-08-08 |
Micron Technology, INC. |
Apparatuses and methods for memory device as a store for program instructions
|
CN107408408B
(zh)
|
2015-03-10 |
2021-03-05 |
美光科技公司 |
用于移位决定的装置及方法
|
US9898253B2
(en)
|
2015-03-11 |
2018-02-20 |
Micron Technology, Inc. |
Division operations on variable length elements in memory
|
US9741399B2
(en)
|
2015-03-11 |
2017-08-22 |
Micron Technology, Inc. |
Data shift by elements of a vector in memory
|
WO2016144726A1
(en)
|
2015-03-12 |
2016-09-15 |
Micron Technology, Inc. |
Apparatuses and methods for data movement
|
US10146537B2
(en)
|
2015-03-13 |
2018-12-04 |
Micron Technology, Inc. |
Vector population count determination in memory
|
US10049054B2
(en)
|
2015-04-01 |
2018-08-14 |
Micron Technology, Inc. |
Virtual register file
|
US10140104B2
(en)
|
2015-04-14 |
2018-11-27 |
Micron Technology, Inc. |
Target architecture determination
|
US9959923B2
(en)
|
2015-04-16 |
2018-05-01 |
Micron Technology, Inc. |
Apparatuses and methods to reverse data stored in memory
|
US10073786B2
(en)
|
2015-05-28 |
2018-09-11 |
Micron Technology, Inc. |
Apparatuses and methods for compute enabled cache
|
US9704541B2
(en)
|
2015-06-12 |
2017-07-11 |
Micron Technology, Inc. |
Simulating access lines
|
US9921777B2
(en)
|
2015-06-22 |
2018-03-20 |
Micron Technology, Inc. |
Apparatuses and methods for data transfer from sensing circuitry to a controller
|
US9996479B2
(en)
|
2015-08-17 |
2018-06-12 |
Micron Technology, Inc. |
Encryption of executables in computational memory
|
US9659666B2
(en)
|
2015-08-31 |
2017-05-23 |
Sandisk Technologies Llc |
Dynamic memory recovery at the sub-block level
|
US9721652B2
(en)
|
2015-11-17 |
2017-08-01 |
Sandisk Technologies Llc |
State dependent sensing for wordline interference correction
|
US9905276B2
(en)
|
2015-12-21 |
2018-02-27 |
Micron Technology, Inc. |
Control of sensing components in association with performing operations
|
US9952925B2
(en)
|
2016-01-06 |
2018-04-24 |
Micron Technology, Inc. |
Error code calculation on sensing circuitry
|
US10048888B2
(en)
|
2016-02-10 |
2018-08-14 |
Micron Technology, Inc. |
Apparatuses and methods for partitioned parallel data movement
|
US9892767B2
(en)
|
2016-02-12 |
2018-02-13 |
Micron Technology, Inc. |
Data gathering in memory
|
US9971541B2
(en)
|
2016-02-17 |
2018-05-15 |
Micron Technology, Inc. |
Apparatuses and methods for data movement
|
US10956439B2
(en)
|
2016-02-19 |
2021-03-23 |
Micron Technology, Inc. |
Data transfer with a bit vector operation device
|
US9899070B2
(en)
|
2016-02-19 |
2018-02-20 |
Micron Technology, Inc. |
Modified decode for corner turn
|
US9697876B1
(en)
|
2016-03-01 |
2017-07-04 |
Micron Technology, Inc. |
Vertical bit vector shift in memory
|
US9997232B2
(en)
|
2016-03-10 |
2018-06-12 |
Micron Technology, Inc. |
Processing in memory (PIM) capable memory device having sensing circuitry performing logic operations
|
US10262721B2
(en)
|
2016-03-10 |
2019-04-16 |
Micron Technology, Inc. |
Apparatuses and methods for cache invalidate
|
US10379772B2
(en)
|
2016-03-16 |
2019-08-13 |
Micron Technology, Inc. |
Apparatuses and methods for operations using compressed and decompressed data
|
US9910637B2
(en)
|
2016-03-17 |
2018-03-06 |
Micron Technology, Inc. |
Signed division in memory
|
US11074988B2
(en)
|
2016-03-22 |
2021-07-27 |
Micron Technology, Inc. |
Apparatus and methods for debugging on a host and memory device
|
US10120740B2
(en)
|
2016-03-22 |
2018-11-06 |
Micron Technology, Inc. |
Apparatus and methods for debugging on a memory device
|
US10388393B2
(en)
|
2016-03-22 |
2019-08-20 |
Micron Technology, Inc. |
Apparatus and methods for debugging on a host and memory device
|
US10474581B2
(en)
|
2016-03-25 |
2019-11-12 |
Micron Technology, Inc. |
Apparatuses and methods for cache operations
|
US10977033B2
(en)
|
2016-03-25 |
2021-04-13 |
Micron Technology, Inc. |
Mask patterns generated in memory from seed vectors
|
US10074416B2
(en)
|
2016-03-28 |
2018-09-11 |
Micron Technology, Inc. |
Apparatuses and methods for data movement
|
US10430244B2
(en)
|
2016-03-28 |
2019-10-01 |
Micron Technology, Inc. |
Apparatuses and methods to determine timing of operations
|
US10453502B2
(en)
|
2016-04-04 |
2019-10-22 |
Micron Technology, Inc. |
Memory bank power coordination including concurrently performing a memory operation in a selected number of memory regions
|
US10607665B2
(en)
|
2016-04-07 |
2020-03-31 |
Micron Technology, Inc. |
Span mask generation
|
US9818459B2
(en)
|
2016-04-19 |
2017-11-14 |
Micron Technology, Inc. |
Invert operations using sensing circuitry
|
US9659605B1
(en)
|
2016-04-20 |
2017-05-23 |
Micron Technology, Inc. |
Apparatuses and methods for performing corner turn operations using sensing circuitry
|
US10153008B2
(en)
|
2016-04-20 |
2018-12-11 |
Micron Technology, Inc. |
Apparatuses and methods for performing corner turn operations using sensing circuitry
|
US10042608B2
(en)
|
2016-05-11 |
2018-08-07 |
Micron Technology, Inc. |
Signed division in memory
|
US9659610B1
(en)
|
2016-05-18 |
2017-05-23 |
Micron Technology, Inc. |
Apparatuses and methods for shifting data
|
US10049707B2
(en)
|
2016-06-03 |
2018-08-14 |
Micron Technology, Inc. |
Shifting data
|
US10008273B2
(en)
*
|
2016-06-13 |
2018-06-26 |
Sandisk Technologies Llc |
Cell current based bit line voltage
|
US10387046B2
(en)
|
2016-06-22 |
2019-08-20 |
Micron Technology, Inc. |
Bank to bank data transfer
|
US10037785B2
(en)
|
2016-07-08 |
2018-07-31 |
Micron Technology, Inc. |
Scan chain operation in sensing circuitry
|
US10388360B2
(en)
|
2016-07-19 |
2019-08-20 |
Micron Technology, Inc. |
Utilization of data stored in an edge section of an array
|
US10733089B2
(en)
|
2016-07-20 |
2020-08-04 |
Micron Technology, Inc. |
Apparatuses and methods for write address tracking
|
US10387299B2
(en)
|
2016-07-20 |
2019-08-20 |
Micron Technology, Inc. |
Apparatuses and methods for transferring data
|
US9972367B2
(en)
|
2016-07-21 |
2018-05-15 |
Micron Technology, Inc. |
Shifting data in sensing circuitry
|
US9767864B1
(en)
|
2016-07-21 |
2017-09-19 |
Micron Technology, Inc. |
Apparatuses and methods for storing a data value in a sensing circuitry element
|
US10303632B2
(en)
|
2016-07-26 |
2019-05-28 |
Micron Technology, Inc. |
Accessing status information
|
US10468087B2
(en)
|
2016-07-28 |
2019-11-05 |
Micron Technology, Inc. |
Apparatuses and methods for operations in a self-refresh state
|
US9990181B2
(en)
|
2016-08-03 |
2018-06-05 |
Micron Technology, Inc. |
Apparatuses and methods for random number generation
|
US11029951B2
(en)
|
2016-08-15 |
2021-06-08 |
Micron Technology, Inc. |
Smallest or largest value element determination
|
US10606587B2
(en)
|
2016-08-24 |
2020-03-31 |
Micron Technology, Inc. |
Apparatus and methods related to microcode instructions indicating instruction types
|
US10466928B2
(en)
|
2016-09-15 |
2019-11-05 |
Micron Technology, Inc. |
Updating a register in memory
|
US10387058B2
(en)
|
2016-09-29 |
2019-08-20 |
Micron Technology, Inc. |
Apparatuses and methods to change data category values
|
US10014034B2
(en)
|
2016-10-06 |
2018-07-03 |
Micron Technology, Inc. |
Shifting data in sensing circuitry
|
US10529409B2
(en)
|
2016-10-13 |
2020-01-07 |
Micron Technology, Inc. |
Apparatuses and methods to perform logical operations using sensing circuitry
|
US9805772B1
(en)
|
2016-10-20 |
2017-10-31 |
Micron Technology, Inc. |
Apparatuses and methods to selectively perform logical operations
|
US10373666B2
(en)
|
2016-11-08 |
2019-08-06 |
Micron Technology, Inc. |
Apparatuses and methods for compute components formed over an array of memory cells
|
US10423353B2
(en)
|
2016-11-11 |
2019-09-24 |
Micron Technology, Inc. |
Apparatuses and methods for memory alignment
|
US9761300B1
(en)
|
2016-11-22 |
2017-09-12 |
Micron Technology, Inc. |
Data shift apparatuses and methods
|
US10402340B2
(en)
|
2017-02-21 |
2019-09-03 |
Micron Technology, Inc. |
Memory array page table walk
|
US10403352B2
(en)
|
2017-02-22 |
2019-09-03 |
Micron Technology, Inc. |
Apparatuses and methods for compute in data path
|
US10268389B2
(en)
|
2017-02-22 |
2019-04-23 |
Micron Technology, Inc. |
Apparatuses and methods for in-memory operations
|
US10838899B2
(en)
|
2017-03-21 |
2020-11-17 |
Micron Technology, Inc. |
Apparatuses and methods for in-memory data switching networks
|
US11222260B2
(en)
|
2017-03-22 |
2022-01-11 |
Micron Technology, Inc. |
Apparatuses and methods for operating neural networks
|
US10185674B2
(en)
|
2017-03-22 |
2019-01-22 |
Micron Technology, Inc. |
Apparatus and methods for in data path compute operations
|
US10049721B1
(en)
|
2017-03-27 |
2018-08-14 |
Micron Technology, Inc. |
Apparatuses and methods for in-memory operations
|
US10043570B1
(en)
|
2017-04-17 |
2018-08-07 |
Micron Technology, Inc. |
Signed element compare in memory
|
US10147467B2
(en)
|
2017-04-17 |
2018-12-04 |
Micron Technology, Inc. |
Element value comparison in memory
|
US9997212B1
(en)
|
2017-04-24 |
2018-06-12 |
Micron Technology, Inc. |
Accessing data in memory
|
US10942843B2
(en)
|
2017-04-25 |
2021-03-09 |
Micron Technology, Inc. |
Storing data elements of different lengths in respective adjacent rows or columns according to memory shapes
|
US10236038B2
(en)
|
2017-05-15 |
2019-03-19 |
Micron Technology, Inc. |
Bank to bank data transfer
|
US10068664B1
(en)
|
2017-05-19 |
2018-09-04 |
Micron Technology, Inc. |
Column repair in memory
|
US9928126B1
(en)
|
2017-06-01 |
2018-03-27 |
Apple Inc. |
Recovery from cross-temperature read failures by programming neighbor word lines
|
US10013197B1
(en)
|
2017-06-01 |
2018-07-03 |
Micron Technology, Inc. |
Shift skip
|
US10262701B2
(en)
|
2017-06-07 |
2019-04-16 |
Micron Technology, Inc. |
Data transfer between subarrays in memory
|
US10152271B1
(en)
|
2017-06-07 |
2018-12-11 |
Micron Technology, Inc. |
Data replication
|
US10318168B2
(en)
|
2017-06-19 |
2019-06-11 |
Micron Technology, Inc. |
Apparatuses and methods for simultaneous in data path compute operations
|
US10115464B1
(en)
*
|
2017-07-27 |
2018-10-30 |
Sandisk Technologies Llc |
Electric field to reduce select gate threshold voltage shift
|
US10162005B1
(en)
|
2017-08-09 |
2018-12-25 |
Micron Technology, Inc. |
Scan chain operations
|
US10534553B2
(en)
|
2017-08-30 |
2020-01-14 |
Micron Technology, Inc. |
Memory array accessibility
|
US10346092B2
(en)
|
2017-08-31 |
2019-07-09 |
Micron Technology, Inc. |
Apparatuses and methods for in-memory operations using timing circuitry
|
US10416927B2
(en)
|
2017-08-31 |
2019-09-17 |
Micron Technology, Inc. |
Processing in memory
|
US10741239B2
(en)
|
2017-08-31 |
2020-08-11 |
Micron Technology, Inc. |
Processing in memory device including a row address strobe manager
|
US10818358B2
(en)
|
2017-09-22 |
2020-10-27 |
Toshiba Memory Corporation |
Memory system including a semiconductor memory having a memory cell and a write circuit configured to write data to the memory cell
|
US10409739B2
(en)
|
2017-10-24 |
2019-09-10 |
Micron Technology, Inc. |
Command selection policy
|
US10522210B2
(en)
|
2017-12-14 |
2019-12-31 |
Micron Technology, Inc. |
Apparatuses and methods for subarray addressing
|
US10332586B1
(en)
|
2017-12-19 |
2019-06-25 |
Micron Technology, Inc. |
Apparatuses and methods for subrow addressing
|
CN108133730B
(zh)
*
|
2017-12-22 |
2020-09-11 |
联芸科技(杭州)有限公司 |
快闪存储器的读取控制方法、存储器读取装置和存储器系统
|
US10614875B2
(en)
|
2018-01-30 |
2020-04-07 |
Micron Technology, Inc. |
Logical operations using memory cells
|
US10437557B2
(en)
|
2018-01-31 |
2019-10-08 |
Micron Technology, Inc. |
Determination of a match between data values stored by several arrays
|
US11194477B2
(en)
|
2018-01-31 |
2021-12-07 |
Micron Technology, Inc. |
Determination of a match between data values stored by three or more arrays
|
US10725696B2
(en)
|
2018-04-12 |
2020-07-28 |
Micron Technology, Inc. |
Command selection policy with read priority
|
US10440341B1
(en)
|
2018-06-07 |
2019-10-08 |
Micron Technology, Inc. |
Image processor formed in an array of memory cells
|
US10769071B2
(en)
|
2018-10-10 |
2020-09-08 |
Micron Technology, Inc. |
Coherent memory access
|
US11175915B2
(en)
|
2018-10-10 |
2021-11-16 |
Micron Technology, Inc. |
Vector registers implemented in memory
|
US10741262B2
(en)
*
|
2018-10-12 |
2020-08-11 |
Macronix International Co., Ltd. |
NAND flash operating techniques mitigating program disturbance
|
US10483978B1
(en)
|
2018-10-16 |
2019-11-19 |
Micron Technology, Inc. |
Memory device processing
|
US11184446B2
(en)
|
2018-12-05 |
2021-11-23 |
Micron Technology, Inc. |
Methods and apparatus for incentivizing participation in fog networks
|
US12118056B2
(en)
|
2019-05-03 |
2024-10-15 |
Micron Technology, Inc. |
Methods and apparatus for performing matrix transformations within a memory array
|
US10867655B1
(en)
|
2019-07-08 |
2020-12-15 |
Micron Technology, Inc. |
Methods and apparatus for dynamically adjusting performance of partitioned memory
|
US11360768B2
(en)
|
2019-08-14 |
2022-06-14 |
Micron Technolgy, Inc. |
Bit string operations in memory
|
US11238932B2
(en)
|
2019-09-20 |
2022-02-01 |
Samsung Electronics Co., Ltd. |
Method of operating nonvolatile memory device, nonvolatile memory device performing the same and method of operating memory system using the same
|
US11449577B2
(en)
|
2019-11-20 |
2022-09-20 |
Micron Technology, Inc. |
Methods and apparatus for performing video processing matrix operations within a memory array
|
US11853385B2
(en)
|
2019-12-05 |
2023-12-26 |
Micron Technology, Inc. |
Methods and apparatus for performing diversity matrix operations within a memory array
|
US11227641B1
(en)
|
2020-07-21 |
2022-01-18 |
Micron Technology, Inc. |
Arithmetic operations in memory
|
KR20220015245A
(ko)
*
|
2020-07-30 |
2022-02-08 |
삼성전자주식회사 |
프로그래밍 동안 양방향 채널 프리차지를 수행하는 비휘발성 메모리 장치
|
CN114093408A
(zh)
*
|
2020-10-20 |
2022-02-25 |
长江存储科技有限责任公司 |
存储器的读取方法以及电压补偿装置
|
US11557334B2
(en)
|
2021-05-05 |
2023-01-17 |
Sandisk Technologies Llc |
Nonvolatile memory with combined reads
|
US11556416B2
(en)
|
2021-05-05 |
2023-01-17 |
Apple Inc. |
Controlling memory readout reliability and throughput by adjusting distance between read thresholds
|
US11847342B2
(en)
|
2021-07-28 |
2023-12-19 |
Apple Inc. |
Efficient transfer of hard data and confidence levels in reading a nonvolatile memory
|
CN113971977B
(zh)
*
|
2021-09-22 |
2024-08-20 |
长沙市致存科技有限责任公司 |
存储器的读干扰影响检测方法、装置、设备及存储介质
|
TWI813498B
(zh)
*
|
2022-11-07 |
2023-08-21 |
群聯電子股份有限公司 |
資料讀取方法、記憶體儲存裝置及記憶體控制電路單元
|