TWI318784B - Clamping apparatus for use in glass substrate inspection - Google Patents
Clamping apparatus for use in glass substrate inspectionInfo
- Publication number
- TWI318784B TWI318784B TW092137454A TW92137454A TWI318784B TW I318784 B TWI318784 B TW I318784B TW 092137454 A TW092137454 A TW 092137454A TW 92137454 A TW92137454 A TW 92137454A TW I318784 B TWI318784 B TW I318784B
- Authority
- TW
- Taiwan
- Prior art keywords
- glass substrate
- clamping apparatus
- substrate inspection
- inspection
- clamping
- Prior art date
Links
- 239000011521 glass Substances 0.000 title 1
- 238000007689 inspection Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P40/00—Technologies relating to the processing of minerals
- Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
- Y02P40/57—Improving the yield, e-g- reduction of reject rates
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Jigs For Machine Tools (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030088936A KR100582345B1 (ko) | 2003-12-09 | 2003-12-09 | 유리기판의 검사를 위한 클램핑장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200520135A TW200520135A (en) | 2005-06-16 |
TWI318784B true TWI318784B (en) | 2009-12-21 |
Family
ID=34737865
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092137454A TWI318784B (en) | 2003-12-09 | 2003-12-30 | Clamping apparatus for use in glass substrate inspection |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2005172783A (zh) |
KR (1) | KR100582345B1 (zh) |
CN (1) | CN1626466B (zh) |
TW (1) | TWI318784B (zh) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101138727B1 (ko) * | 2005-08-04 | 2012-04-24 | 엘아이지에이디피 주식회사 | 기판 클램핑 장치, 이송장치 및 그 검사장치 |
KR100846682B1 (ko) * | 2006-12-11 | 2008-07-17 | (주)테크윙 | 테스트핸들러용 하이픽스보드 클램핑장치 |
KR100824028B1 (ko) * | 2007-03-28 | 2008-04-21 | (주)오성엔지니어링 | 엘씨디용 포토마스크 그립퍼 |
JP4985447B2 (ja) * | 2007-05-10 | 2012-07-25 | 株式会社Ihi | 基板搬送装置 |
JP4560578B1 (ja) * | 2009-03-26 | 2010-10-13 | シャープ株式会社 | 液晶パネル点灯検査装置 |
KR101045277B1 (ko) * | 2009-07-07 | 2011-06-29 | (주)테크윙 | 테스트 핸들러용 하이픽스보드 클램핑장치 |
CN102603199A (zh) * | 2011-01-18 | 2012-07-25 | 坤辉科技实业股份有限公司 | 侧固式玻璃吊架 |
CN102674006A (zh) * | 2011-03-14 | 2012-09-19 | 无锡康力电子有限公司 | 玻璃镀膜机用装片架 |
JP5899503B2 (ja) | 2011-07-13 | 2016-04-06 | パナソニックIpマネジメント株式会社 | 描画装置及び方法 |
KR20140069277A (ko) * | 2011-09-27 | 2014-06-09 | 어플라이드 머티어리얼스, 인코포레이티드 | 얇은 유리 기판들을 위한 캐리어 및 그 이용 |
JP2013187389A (ja) * | 2012-03-08 | 2013-09-19 | Nippon Electric Glass Co Ltd | ガラス基板の搬送装置及び搬送方法 |
JP6061182B2 (ja) * | 2012-09-07 | 2017-01-18 | 大日本印刷株式会社 | 金属薄板の寸法測定装置及び金属薄板の寸法測定方法 |
JP6142486B2 (ja) * | 2012-09-07 | 2017-06-07 | 大日本印刷株式会社 | 金属薄板の寸法測定装置及び金属薄板の寸法測定方法 |
JP2014080645A (ja) * | 2012-10-15 | 2014-05-08 | I Plant:Kk | 基板保持装置 |
CN102963726B (zh) * | 2012-11-30 | 2015-09-30 | 江西沃格光电股份有限公司 | 无痕活动式玻璃夹具 |
CN103901044A (zh) * | 2012-12-28 | 2014-07-02 | 鸿富锦精密工业(深圳)有限公司 | 检测系统 |
CN103245672A (zh) * | 2013-05-16 | 2013-08-14 | 西北工业大学 | 一种用于刀具磨损检测的夹具 |
JP2015034071A (ja) | 2013-08-08 | 2015-02-19 | 日本電気硝子株式会社 | シート部材搬送装置、シート部材支持装置、シート部材検査装置、およびシート部材搬送方法 |
CN104003152B (zh) * | 2014-04-29 | 2016-03-30 | 雄华机械(苏州)有限公司 | 一种可调滚轮轨道宽窄的调整机构 |
CN104505352B (zh) * | 2014-11-28 | 2017-07-14 | 苏州晟成光伏设备有限公司 | 高位el检查机对中机构 |
CN104608075B (zh) * | 2015-02-11 | 2016-04-06 | 中国工程物理研究院激光聚变研究中心 | 大尺寸钕玻璃片透射波面误差检测夹具 |
KR102186362B1 (ko) * | 2015-06-02 | 2020-12-04 | 삼성디스플레이 주식회사 | 기판 정렬 장치 및 기판 정렬 방법 |
CN105116569B (zh) * | 2015-09-11 | 2018-07-31 | 昆山精讯电子技术有限公司 | 显示面板载台及显示面板检测装置 |
GB2544741B (en) * | 2015-11-24 | 2017-12-06 | Robert Shillabeer Timothy | Clamp for holding a workpiece for machining |
FR3049940B1 (fr) * | 2016-04-06 | 2018-04-13 | Saint- Gobain Glass France | Dispositif de support pour feuille de verre notamment dans une installation de lavage |
KR102319387B1 (ko) * | 2016-05-26 | 2021-11-01 | 주식회사 아이에스시 | 보정 클램핑 유닛 및 이를 구비하는 테스트 핸들러용 클램핑 장치 |
CN108214416B (zh) * | 2018-01-03 | 2021-01-26 | 京东方科技集团股份有限公司 | 显示面板检测用工作台 |
CN109031710B (zh) * | 2018-03-27 | 2023-11-10 | 中山市正科电器实业有限公司 | 一种液晶显示器的检查装置 |
CN109799627B (zh) * | 2018-12-26 | 2021-11-26 | 江苏宏芯亿泰智能装备有限公司 | 玻璃基板的宏观检查装置 |
CN110076454A (zh) * | 2019-04-16 | 2019-08-02 | 徐州工业职业技术学院 | 一种多工位智能光纤激光焊接机械工作平台 |
CN110053957A (zh) * | 2019-04-29 | 2019-07-26 | 东莞市鸿仁自动化设备科技有限公司 | 一种薄板的智能化堆叠系统及堆叠方法 |
CN111438645B (zh) * | 2020-04-02 | 2022-02-22 | 深圳市华星光电半导体显示技术有限公司 | 显示面板治具 |
CN113511548A (zh) * | 2020-04-09 | 2021-10-19 | 群翊工业股份有限公司 | 基板摊平装置及其摊平方法 |
CN112851136A (zh) * | 2021-02-05 | 2021-05-28 | 安徽科技学院 | 一种光学玻璃镀膜用自动化夹具 |
KR102470535B1 (ko) * | 2021-05-03 | 2022-11-28 | 주식회사 티케이씨 | 기판처리장비의 기판 파지용 지그장치 |
CN114102007B (zh) * | 2021-10-29 | 2023-10-20 | 上海摩太展示用品设计制作有限公司 | 一种钣金焊接夹具 |
CN114656168B (zh) * | 2022-04-06 | 2022-11-25 | 南京萃智激光应用技术研究院有限公司 | 一种玻璃加工用激光焊接设备 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3243044B2 (ja) * | 1993-03-15 | 2002-01-07 | 株式会社日立製作所 | 基板処理用キャリア |
JP4138926B2 (ja) * | 1998-02-13 | 2008-08-27 | 株式会社アマダ | 板材加工装置のワーククランプ装置 |
KR100764313B1 (ko) * | 2000-04-26 | 2007-10-05 | 올림푸스 가부시키가이샤 | 홀더기구 |
JP2002014309A (ja) * | 2000-06-30 | 2002-01-18 | Minolta Co Ltd | フィルムホルダ、フィルム収容治具及びこれらを用いた液晶表示素子の製造方法 |
JP2003029657A (ja) * | 2001-07-19 | 2003-01-31 | Minolta Co Ltd | 表示素子の製造方法及びフィルム基板保持具 |
JP2003270155A (ja) * | 2002-03-15 | 2003-09-25 | Olympus Optical Co Ltd | 基板保持装置及び検査装置 |
JP2003302346A (ja) * | 2002-04-12 | 2003-10-24 | Hitachi Electronics Eng Co Ltd | 薄板ワークの表面検査装置 |
-
2003
- 2003-12-09 KR KR1020030088936A patent/KR100582345B1/ko active IP Right Grant
- 2003-12-30 TW TW092137454A patent/TWI318784B/zh not_active IP Right Cessation
-
2004
- 2004-01-08 JP JP2004002984A patent/JP2005172783A/ja active Pending
- 2004-01-16 CN CN2004100019894A patent/CN1626466B/zh not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CN1626466B (zh) | 2010-05-12 |
TW200520135A (en) | 2005-06-16 |
JP2005172783A (ja) | 2005-06-30 |
CN1626466A (zh) | 2005-06-15 |
KR20050055884A (ko) | 2005-06-14 |
KR100582345B1 (ko) | 2006-05-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI318784B (en) | Clamping apparatus for use in glass substrate inspection | |
GB2416839B (en) | Substrate inspection apparatus | |
EP1617209A4 (en) | DEVICE FOR INSPECTING THE END SURFACE OF A TRANSPARENT SUBSTRATE AND METHOD OF INSPECTING THE SAME | |
EP1600270A4 (en) | DEVICE AND METHOD FOR SUBSTRATE SEPARATION | |
EP1805792A4 (en) | SUBSTRATE PROCESSING APPARATUS | |
IL173980A0 (en) | Method and apparatus for detecting defects in wafers | |
GB0515157D0 (en) | Light measurement method and apparatus | |
SG123765A1 (en) | Lithographic apparatus with multiple alignment arrangements and alignment measurement method | |
EP1743873A4 (en) | DEVICE AND METHOD FOR THE PRODUCTION OF FLAT GLASS | |
EP1826529A4 (en) | DEVICE FOR STUDYING THE EXTERNAL APPEARANCE | |
SG118225A1 (en) | Substrate supporting apparatus | |
AU2002365570A8 (en) | Method for detecting defects in substrates | |
EP1677098A4 (en) | DEVICE AND METHOD FOR INSPECTING DEFECTS IN A SURFACE | |
EP1511986A4 (en) | APPARATUS FOR MEASURING THE SURFACE SPEED OF A GREEN | |
IL165287A0 (en) | Surface inspection apparatus | |
EG24235A (en) | Method and apparatus for strenghthening glass | |
TWI340356B (en) | Defect display apparatus | |
TWI340249B (en) | Test apparatus | |
GB0327630D0 (en) | Method and apparatus for measuring surface configuration | |
EP1607758A4 (en) | TEST DEVICE | |
EP1666903A4 (en) | TEST DEVICE | |
GB2417794B (en) | Apparatus and methods for performing parallel processes | |
GB0226996D0 (en) | Sample inspection apparatus | |
GB2421841B (en) | Process and device for measuring ions | |
TWI320585B (en) | Apparatus for polishing wafer and process for polishing wafer |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK4A | Expiration of patent term of an invention patent |