TWI292540B - Semiconductor test data analysis system, method for displaying therein, and method for analyzing semiconductor test data implemented therein - Google Patents

Semiconductor test data analysis system, method for displaying therein, and method for analyzing semiconductor test data implemented therein Download PDF

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Publication number
TWI292540B
TWI292540B TW092117608A TW92117608A TWI292540B TW I292540 B TWI292540 B TW I292540B TW 092117608 A TW092117608 A TW 092117608A TW 92117608 A TW92117608 A TW 92117608A TW I292540 B TWI292540 B TW I292540B
Authority
TW
Taiwan
Prior art keywords
analysis
data
job
image
information
Prior art date
Application number
TW092117608A
Other languages
English (en)
Chinese (zh)
Other versions
TW200406692A (en
Inventor
Iguchi Yasuhiko
Enokida Mitsuhiro
Tamura Hiroshi
Louis Dombroski Earl
Thomas Robert Claus
Original Assignee
Agilent Technologies Inc
Sandia Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc, Sandia Technologies Inc filed Critical Agilent Technologies Inc
Publication of TW200406692A publication Critical patent/TW200406692A/zh
Application granted granted Critical
Publication of TWI292540B publication Critical patent/TWI292540B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
TW092117608A 2002-06-28 2003-06-27 Semiconductor test data analysis system, method for displaying therein, and method for analyzing semiconductor test data implemented therein TWI292540B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/186,171 US6898545B2 (en) 2002-06-28 2002-06-28 Semiconductor test data analysis system

Publications (2)

Publication Number Publication Date
TW200406692A TW200406692A (en) 2004-05-01
TWI292540B true TWI292540B (en) 2008-01-11

Family

ID=29718020

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092117608A TWI292540B (en) 2002-06-28 2003-06-27 Semiconductor test data analysis system, method for displaying therein, and method for analyzing semiconductor test data implemented therein

Country Status (4)

Country Link
US (2) US6898545B2 (enExample)
EP (1) EP1376144A3 (enExample)
JP (1) JP2004072093A (enExample)
TW (1) TWI292540B (enExample)

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US7200523B1 (en) * 2005-11-30 2007-04-03 Taiwan Semiconductor Manufacturing Company, Ltd. Method and system for filtering statistical process data to enhance process performance
US20100076724A1 (en) * 2008-09-23 2010-03-25 Harold Lee Brown Method for capturing and analyzing test result data
US20140277467A1 (en) 2013-03-14 2014-09-18 Spinal Stabilization Technologies, Llc Prosthetic Spinal Disk Nucleus
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US20160217192A1 (en) * 2013-10-02 2016-07-28 Hitachi, Ltd. Search system and search method
US10786360B2 (en) 2014-11-04 2020-09-29 Spinal Stabilization Technologies Llc Percutaneous implantable nuclear prosthesis
WO2016073568A1 (en) 2014-11-04 2016-05-12 Spinal Stabilization Technologies Llc Percutaneous implantable nuclear prosthesis
US10204188B2 (en) * 2015-03-13 2019-02-12 Samsung Electronics Co., Ltd. Systems, methods and computer program products for analyzing performance of semiconductor devices
EP3344156B1 (en) 2015-09-01 2020-01-08 Spinal Stabilization Technologies LLC Implantable nuclear prosthesis
JP2020004070A (ja) * 2018-06-28 2020-01-09 ルネサスエレクトロニクス株式会社 半導体製品品質管理サーバ、半導体装置、および半導体製品品質管理システム
JP7457712B2 (ja) 2018-09-04 2024-03-28 スパイナル スタビライゼーション テクノロジーズ リミテッド ライアビリティ カンパニー 植込み可能な髄核補綴物、キット、および関連する方法
US11475052B1 (en) 2019-11-08 2022-10-18 Tableau Software, Inc. Using visual cues to validate object models of database tables
CN114297052B (zh) * 2021-12-13 2025-03-21 上海金仕达软件科技股份有限公司 测试数据生成方法及装置

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Also Published As

Publication number Publication date
EP1376144A2 (en) 2004-01-02
EP1376144A3 (en) 2006-01-18
US20050119852A1 (en) 2005-06-02
US6898545B2 (en) 2005-05-24
TW200406692A (en) 2004-05-01
US7035752B2 (en) 2006-04-25
US20040002829A1 (en) 2004-01-01
JP2004072093A (ja) 2004-03-04

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