TW320686B - - Google Patents

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Publication number
TW320686B
TW320686B TW86100839A TW86100839A TW320686B TW 320686 B TW320686 B TW 320686B TW 86100839 A TW86100839 A TW 86100839A TW 86100839 A TW86100839 A TW 86100839A TW 320686 B TW320686 B TW 320686B
Authority
TW
Taiwan
Prior art keywords
signal
delay time
pulse
signal path
oscillation
Prior art date
Application number
TW86100839A
Other languages
English (en)
Chinese (zh)
Original Assignee
Adoban Tesuto Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adoban Tesuto Kk filed Critical Adoban Tesuto Kk
Application granted granted Critical
Publication of TW320686B publication Critical patent/TW320686B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
TW86100839A 1996-01-25 1997-01-25 TW320686B (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8010920A JPH09203772A (ja) 1996-01-25 1996-01-25 遅延時間測定方法及び遅延時間測定用パルス発生装置

Publications (1)

Publication Number Publication Date
TW320686B true TW320686B (fr) 1997-11-21

Family

ID=11763693

Family Applications (1)

Application Number Title Priority Date Filing Date
TW86100839A TW320686B (fr) 1996-01-25 1997-01-25

Country Status (6)

Country Link
JP (1) JPH09203772A (fr)
KR (1) KR19980703081A (fr)
DE (1) DE19780113T1 (fr)
GB (1) GB2316493A (fr)
TW (1) TW320686B (fr)
WO (1) WO1997027494A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5787092A (en) * 1997-05-27 1998-07-28 Hewlett-Packard Co. Test chip circuit for on-chip timing characterization
DE10024476A1 (de) * 2000-05-18 2001-12-20 Infineon Technologies Ag Vorrichtung zum Testen einer elektrischen Schaltung
JP4846215B2 (ja) * 2004-08-27 2011-12-28 株式会社アドバンテスト パルス発生器、タイミング発生器、及びパルス幅調整方法
JP2006189336A (ja) * 2005-01-06 2006-07-20 Advantest Corp 半導体デバイス、試験装置、及び測定方法
KR100921815B1 (ko) * 2007-06-18 2009-10-16 주식회사 애트랩 지연시간 측정회로 및 지연시간 측정 방법
JP2009063567A (ja) * 2008-08-22 2009-03-26 Advantest Corp 半導体試験システム
JP2009031297A (ja) * 2008-08-22 2009-02-12 Advantest Corp 半導体試験システム

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2965049B2 (ja) * 1991-07-31 1999-10-18 株式会社アドバンテスト タイミング発生装置
JPH0534418A (ja) * 1991-07-31 1993-02-09 Oki Electric Ind Co Ltd テスト回路
JPH05281288A (ja) * 1992-03-31 1993-10-29 Oki Electric Ind Co Ltd テスト回路

Also Published As

Publication number Publication date
KR19980703081A (ko) 1998-09-05
WO1997027494A1 (fr) 1997-07-31
DE19780113T1 (de) 1998-02-26
GB9720222D0 (en) 1997-11-26
GB2316493A (en) 1998-02-25
JPH09203772A (ja) 1997-08-05

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