GB9720222D0 - Method of measuring a delay time and pulse generating apparatus for measuring a delay time for use in implementing this method - Google Patents

Method of measuring a delay time and pulse generating apparatus for measuring a delay time for use in implementing this method

Info

Publication number
GB9720222D0
GB9720222D0 GBGB9720222.0A GB9720222A GB9720222D0 GB 9720222 D0 GB9720222 D0 GB 9720222D0 GB 9720222 A GB9720222 A GB 9720222A GB 9720222 D0 GB9720222 D0 GB 9720222D0
Authority
GB
United Kingdom
Prior art keywords
delay time
measuring
signal path
state
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB9720222.0A
Other versions
GB2316493A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of GB9720222D0 publication Critical patent/GB9720222D0/en
Publication of GB2316493A publication Critical patent/GB2316493A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Abstract

A method for accurately measuring the delay time of a signal path (10) constituted by an IC of a CMOS structure in a state which is the same as, or approximate to, the actual operation state. A loop oscillation circuit including the signal path (10) is constittuted, and is brought into a loop oscillation state by feeding a start pulse ST to the circuit. An interpolation pulse P 1 having a frequency which is the same as, or approximate to, the frequency of the pulse signal propagated with the signal path is in an actual operation state, is inserted, this interpolation pulse P 1 and the loop oscillation signal P LO are fed to the signal path, and the signal path is brought into the substantially same temperature state as that of the actual operation state. The cycle of the loop oscillation signal P LO is measured under this state so as to measure the delay time of the signal path.
GB9720222A 1996-01-25 1997-01-24 Delay time measuring method and pulse generator for measuring delay time for use in said measuring method Withdrawn GB2316493A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8010920A JPH09203772A (en) 1996-01-25 1996-01-25 Delay time measuring method, and pulse generating device for measuring delay time
PCT/JP1997/000154 WO1997027494A1 (en) 1996-01-25 1997-01-24 Delay time measuring method and pulse generator for measuring delay time for use in said measuring method

Publications (2)

Publication Number Publication Date
GB9720222D0 true GB9720222D0 (en) 1997-11-26
GB2316493A GB2316493A (en) 1998-02-25

Family

ID=11763693

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9720222A Withdrawn GB2316493A (en) 1996-01-25 1997-01-24 Delay time measuring method and pulse generator for measuring delay time for use in said measuring method

Country Status (6)

Country Link
JP (1) JPH09203772A (en)
KR (1) KR19980703081A (en)
DE (1) DE19780113T1 (en)
GB (1) GB2316493A (en)
TW (1) TW320686B (en)
WO (1) WO1997027494A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5787092A (en) * 1997-05-27 1998-07-28 Hewlett-Packard Co. Test chip circuit for on-chip timing characterization
DE10024476A1 (en) * 2000-05-18 2001-12-20 Infineon Technologies Ag Device for testing an electrical circuit
JP4846215B2 (en) * 2004-08-27 2011-12-28 株式会社アドバンテスト Pulse generator, timing generator, and pulse width adjustment method
JP2006189336A (en) * 2005-01-06 2006-07-20 Advantest Corp Semiconductor device, tester, and measurement method
KR100921815B1 (en) * 2007-06-18 2009-10-16 주식회사 애트랩 Delay time measurement circuit and method
JP2009031297A (en) * 2008-08-22 2009-02-12 Advantest Corp Semiconductor testing system
JP2009063567A (en) * 2008-08-22 2009-03-26 Advantest Corp Semiconductor testing system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0534418A (en) * 1991-07-31 1993-02-09 Oki Electric Ind Co Ltd Test circuit
JP2965049B2 (en) * 1991-07-31 1999-10-18 株式会社アドバンテスト Timing generator
JPH05281288A (en) * 1992-03-31 1993-10-29 Oki Electric Ind Co Ltd Test circuit

Also Published As

Publication number Publication date
JPH09203772A (en) 1997-08-05
KR19980703081A (en) 1998-09-05
TW320686B (en) 1997-11-21
GB2316493A (en) 1998-02-25
WO1997027494A1 (en) 1997-07-31
DE19780113T1 (en) 1998-02-26

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)