JPS6439566A - Fast device test system - Google Patents

Fast device test system

Info

Publication number
JPS6439566A
JPS6439566A JP62195354A JP19535487A JPS6439566A JP S6439566 A JPS6439566 A JP S6439566A JP 62195354 A JP62195354 A JP 62195354A JP 19535487 A JP19535487 A JP 19535487A JP S6439566 A JPS6439566 A JP S6439566A
Authority
JP
Japan
Prior art keywords
observation
waveform
trigger signal
signal
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62195354A
Other languages
Japanese (ja)
Inventor
Kunio Yoshihara
Keiji Wakimoto
Koichi Motoike
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Toshiba Electronic Device Solutions Corp
Original Assignee
Toshiba Corp
Toshiba Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Microelectronics Corp filed Critical Toshiba Corp
Priority to JP62195354A priority Critical patent/JPS6439566A/en
Publication of JPS6439566A publication Critical patent/JPS6439566A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To test fast operation by observing the waveform of a trigger signal, feeding the processing result of observation data back to a trigger signal generation part through a high-frequency oscillation part and generating a stable trigger signal waveform, and then testing an object measurement. CONSTITUTION:A control part 21 sets a signal sequence to be supplied to the object 24 of measurement in a pulse pattern generation part 23 and also sets the frequency FCK1 of a reference high-frequency signal. A trigger signal generation part 25 inputs a signal of frequency FCK1 from the oscillation part 22 and converts the input signal into a trigger signal which is frequency-divided to a quarter. This trigger signal is branched into two; and one is applied to the trigger terminal of a waveform observation part 26 and the other is applied to a waveform observation terminal A. An observation part 26 transfers the sampling observation waveform of the trigger signal as observation waveform data to the control part 21. The control part 21 processes this observation waveform data. Then the observation part 26 observes the output waveform of the object 24 through a waveform observation terminal B at the point of time of the stabilization of the trigger signal as well as trigger signal waveform observation and sends the result to the control part 21. The processing result of the control part 21 is outputted to an output part 27.
JP62195354A 1987-08-06 1987-08-06 Fast device test system Pending JPS6439566A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62195354A JPS6439566A (en) 1987-08-06 1987-08-06 Fast device test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62195354A JPS6439566A (en) 1987-08-06 1987-08-06 Fast device test system

Publications (1)

Publication Number Publication Date
JPS6439566A true JPS6439566A (en) 1989-02-09

Family

ID=16339775

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62195354A Pending JPS6439566A (en) 1987-08-06 1987-08-06 Fast device test system

Country Status (1)

Country Link
JP (1) JPS6439566A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007278977A (en) * 2006-04-11 2007-10-25 Hioki Ee Corp Measuring instrument

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007278977A (en) * 2006-04-11 2007-10-25 Hioki Ee Corp Measuring instrument

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