DE19780113T1 - Verfahren zum Messen einer Verzögerungszeit und Impulserzeugungseinrichtung zum Messen einer Verzögerungszeit für den Einsatz bei der Implementierung dieses Verfahrens - Google Patents
Verfahren zum Messen einer Verzögerungszeit und Impulserzeugungseinrichtung zum Messen einer Verzögerungszeit für den Einsatz bei der Implementierung dieses VerfahrensInfo
- Publication number
- DE19780113T1 DE19780113T1 DE19780113T DE19780113T DE19780113T1 DE 19780113 T1 DE19780113 T1 DE 19780113T1 DE 19780113 T DE19780113 T DE 19780113T DE 19780113 T DE19780113 T DE 19780113T DE 19780113 T1 DE19780113 T1 DE 19780113T1
- Authority
- DE
- Germany
- Prior art keywords
- delay time
- measuring
- signal path
- state
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8010920A JPH09203772A (ja) | 1996-01-25 | 1996-01-25 | 遅延時間測定方法及び遅延時間測定用パルス発生装置 |
PCT/JP1997/000154 WO1997027494A1 (fr) | 1996-01-25 | 1997-01-24 | Procede de mesure d'un retard et generateur d'impulsions destine a mesurer le retard selon le procede |
Publications (1)
Publication Number | Publication Date |
---|---|
DE19780113T1 true DE19780113T1 (de) | 1998-02-26 |
Family
ID=11763693
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19780113T Withdrawn DE19780113T1 (de) | 1996-01-25 | 1997-01-24 | Verfahren zum Messen einer Verzögerungszeit und Impulserzeugungseinrichtung zum Messen einer Verzögerungszeit für den Einsatz bei der Implementierung dieses Verfahrens |
Country Status (6)
Country | Link |
---|---|
JP (1) | JPH09203772A (de) |
KR (1) | KR19980703081A (de) |
DE (1) | DE19780113T1 (de) |
GB (1) | GB2316493A (de) |
TW (1) | TW320686B (de) |
WO (1) | WO1997027494A1 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5787092A (en) * | 1997-05-27 | 1998-07-28 | Hewlett-Packard Co. | Test chip circuit for on-chip timing characterization |
DE10024476A1 (de) * | 2000-05-18 | 2001-12-20 | Infineon Technologies Ag | Vorrichtung zum Testen einer elektrischen Schaltung |
JP4846215B2 (ja) * | 2004-08-27 | 2011-12-28 | 株式会社アドバンテスト | パルス発生器、タイミング発生器、及びパルス幅調整方法 |
JP2006189336A (ja) * | 2005-01-06 | 2006-07-20 | Advantest Corp | 半導体デバイス、試験装置、及び測定方法 |
KR100921815B1 (ko) * | 2007-06-18 | 2009-10-16 | 주식회사 애트랩 | 지연시간 측정회로 및 지연시간 측정 방법 |
JP2009031297A (ja) * | 2008-08-22 | 2009-02-12 | Advantest Corp | 半導体試験システム |
JP2009063567A (ja) * | 2008-08-22 | 2009-03-26 | Advantest Corp | 半導体試験システム |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0534418A (ja) * | 1991-07-31 | 1993-02-09 | Oki Electric Ind Co Ltd | テスト回路 |
JP2965049B2 (ja) * | 1991-07-31 | 1999-10-18 | 株式会社アドバンテスト | タイミング発生装置 |
JPH05281288A (ja) * | 1992-03-31 | 1993-10-29 | Oki Electric Ind Co Ltd | テスト回路 |
-
1996
- 1996-01-25 JP JP8010920A patent/JPH09203772A/ja not_active Withdrawn
-
1997
- 1997-01-24 KR KR1019970706490A patent/KR19980703081A/ko not_active Application Discontinuation
- 1997-01-24 WO PCT/JP1997/000154 patent/WO1997027494A1/ja not_active Application Discontinuation
- 1997-01-24 DE DE19780113T patent/DE19780113T1/de not_active Withdrawn
- 1997-01-24 GB GB9720222A patent/GB2316493A/en not_active Withdrawn
- 1997-01-25 TW TW86100839A patent/TW320686B/zh active
Also Published As
Publication number | Publication date |
---|---|
GB9720222D0 (en) | 1997-11-26 |
WO1997027494A1 (fr) | 1997-07-31 |
JPH09203772A (ja) | 1997-08-05 |
TW320686B (de) | 1997-11-21 |
KR19980703081A (ko) | 1998-09-05 |
GB2316493A (en) | 1998-02-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8130 | Withdrawal |