TW312747B - - Google Patents
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- Publication number
- TW312747B TW312747B TW085115431A TW85115431A TW312747B TW 312747 B TW312747 B TW 312747B TW 085115431 A TW085115431 A TW 085115431A TW 85115431 A TW85115431 A TW 85115431A TW 312747 B TW312747 B TW 312747B
- Authority
- TW
- Taiwan
- Prior art keywords
- interface
- contact
- test
- plane
- connector
- Prior art date
Links
- 238000012360 testing method Methods 0.000 claims description 123
- 230000005540 biological transmission Effects 0.000 claims description 10
- 239000000523 sample Substances 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 5
- 230000008878 coupling Effects 0.000 claims description 4
- 238000010168 coupling process Methods 0.000 claims description 4
- 238000005859 coupling reaction Methods 0.000 claims description 4
- 230000013011 mating Effects 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 claims 1
- 231100000331 toxic Toxicity 0.000 claims 1
- 230000002588 toxic effect Effects 0.000 claims 1
- 230000000875 corresponding effect Effects 0.000 description 9
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000012812 general test Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000002079 cooperative effect Effects 0.000 description 1
- 210000004904 fingernail bed Anatomy 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000012771 household material Substances 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/573,026 US5793218A (en) | 1995-12-15 | 1995-12-15 | Generic interface test adapter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW312747B true TW312747B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1997-08-11 |
Family
ID=24290357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW085115431A TW312747B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1995-12-15 | 1996-12-13 |
Country Status (10)
Families Citing this family (45)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6178255B1 (en) * | 1998-04-28 | 2001-01-23 | Cross Match Technologies, Inc. | Individualized fingerprint scanner |
| US6269319B1 (en) | 1999-01-29 | 2001-07-31 | The Mcdonnell Douglas Corporation | Reconfigurable integration test station |
| US6272562B1 (en) * | 1999-05-28 | 2001-08-07 | Cross Match Technologies, Inc. | Access control unit interface |
| US6239592B1 (en) * | 1999-06-02 | 2001-05-29 | Sun Microsystems, Inc. | Test fixture with quick connect and release board interconnect mechanism |
| US6744910B1 (en) | 1999-06-25 | 2004-06-01 | Cross Match Technologies, Inc. | Hand-held fingerprint scanner with on-board image normalization data storage |
| US6886104B1 (en) | 1999-06-25 | 2005-04-26 | Cross Match Technologies | Rechargeable mobile hand-held fingerprint scanner with a data and power communication interface |
| EP1210688A1 (en) * | 1999-08-09 | 2002-06-05 | Cross Match Technologies, Inc. | Method, system, and computer program product for a gui to fingerprint scanner interface |
| AU2178100A (en) * | 1999-08-09 | 2001-03-05 | Cross Match Technologies, Inc. | System and method for sending a packet with position address and line scan data over an interface cable |
| US6658164B1 (en) | 1999-08-09 | 2003-12-02 | Cross Match Technologies, Inc. | Calibration and correction in a fingerprint scanner |
| US7162060B1 (en) | 1999-08-09 | 2007-01-09 | Cross Match Technologies | Method, system, and computer program product for control of platen movement during a live scan |
| US6483932B1 (en) | 1999-08-19 | 2002-11-19 | Cross Match Technologies, Inc. | Method and apparatus for rolled fingerprint capture |
| US6687391B1 (en) | 1999-10-22 | 2004-02-03 | Cross Match Technologies, Inc. | Adjustable, rotatable finger guide in a tenprint scanner with movable prism platen |
| AU2001222942A1 (en) * | 2000-08-18 | 2002-03-04 | Cross Match Technologies, Inc. | Fingerprint scanner auto-capture system and method |
| US6611152B1 (en) | 2000-10-31 | 2003-08-26 | The Boeing Company | Test adapter for configuring the electrical communication between a unit under test and an electronic test station and associated separator plate |
| US6928195B2 (en) | 2000-12-18 | 2005-08-09 | Cross Match Technologies, Inc. | Palm scanner using a programmable nutating mirror for increased resolution |
| TW561263B (en) * | 2001-03-10 | 2003-11-11 | Samsung Electronics Co Ltd | Parallel test board used in testing semiconductor memory devices |
| AU2002305229A1 (en) | 2001-04-26 | 2002-11-11 | Cross Match Technologies, Inc. | Silicone rubber surfaces for biometric print tir prisms |
| US6504730B1 (en) * | 2001-07-23 | 2003-01-07 | Hamilton Sundstrand Corporation | Serviceable power modules for a power distribution assembly |
| US6841990B2 (en) * | 2001-10-31 | 2005-01-11 | Agilent Technologies, Inc. | Mechanical interface for rapid replacement of RF fixture components |
| US6867850B2 (en) | 2002-01-17 | 2005-03-15 | Cross Match Technologies, Inc. | Light wedge for illuminating a platen in a print scanner |
| US6954260B2 (en) | 2002-01-17 | 2005-10-11 | Cross Match Technologies, Inc. | Systems and methods for illuminating a platen in a print scanner |
| WO2003063054A2 (en) | 2002-01-17 | 2003-07-31 | Cross Match Technologies, Inc. | Fingerprint workstation and methods |
| JP2003307552A (ja) * | 2002-04-17 | 2003-10-31 | Tokyo Electron Ltd | 信号検出用接触体及び信号校正装置 |
| US6944768B2 (en) | 2002-04-19 | 2005-09-13 | Cross Match Technologies, Inc. | System and methods for access control utilizing two factors to control access |
| US7079007B2 (en) | 2002-04-19 | 2006-07-18 | Cross Match Technologies, Inc. | Systems and methods utilizing biometric data |
| US7073711B2 (en) | 2002-04-19 | 2006-07-11 | Cross Match Technologies, Inc. | Mobile handheld code reader and print scanner system and method |
| US6996259B2 (en) | 2002-08-02 | 2006-02-07 | Cross Match Technologies, Inc. | System and method for counting ridges in a captured print image |
| US6906544B1 (en) * | 2003-02-14 | 2005-06-14 | Cisco Technology, Inc. | Methods and apparatus for testing a circuit board using a surface mountable adaptor |
| US7164440B2 (en) * | 2003-02-28 | 2007-01-16 | Cross Match Technologies, Inc. | Dynamic image adaptation method for adjusting the quality of digital prints |
| EP1612571A4 (en) * | 2003-04-04 | 2010-03-03 | Advantest Corp | CONNECTION UNIT, TEST HEAD AND TEST UNIT |
| US7277562B2 (en) | 2003-08-01 | 2007-10-02 | Cross Match Technologies, Inc. | Biometric imaging capture system and method |
| US7082676B2 (en) * | 2003-08-05 | 2006-08-01 | Qualitau, Inc. | Electrostatic discharge (ESD) tool for electronic device under test (DUT) boards |
| US20050047631A1 (en) * | 2003-08-26 | 2005-03-03 | Cross Match Technologies, Inc. | Method and apparatus for rolled fingerprint image capture with variable blending |
| TWI273248B (en) | 2006-01-26 | 2007-02-11 | Au Optronics Corp | Universal probing apparatus for TFT array test |
| WO2008128286A1 (en) * | 2007-04-18 | 2008-10-30 | Tiip Pty Ltd | Test instrument enclosure |
| US20080295090A1 (en) * | 2007-05-24 | 2008-11-27 | Lockheed Martin Corporation | Software configuration manager |
| US7866784B2 (en) * | 2008-08-19 | 2011-01-11 | Silverbrook Research Pty Ltd | Diagnostic probe assembly for printhead integrated circuitry |
| DE102012103893A1 (de) | 2012-05-03 | 2013-11-07 | Turbodynamics Gmbh | Modul zum Austauschen einer Schnittstelleneinheit in einem Testsystem zum Testen von Halbleiterelementen und Testsystem mit einem solchen Modul |
| FR2996367B1 (fr) | 2012-10-01 | 2014-10-03 | Airbus Operations Sas | Systeme de connexion pour connecter un equipement electronique, en particulier pour aeronef, a une unite de test. |
| CN106324460B (zh) * | 2016-11-08 | 2024-03-22 | 沈小晴 | 一种可换针盘式通用测试机构 |
| CN107608842B (zh) * | 2017-10-31 | 2023-11-21 | 江苏特创科技有限公司 | 一种接口测试组件及接口测试装置 |
| KR102107111B1 (ko) | 2019-09-19 | 2020-05-06 | 한화시스템 주식회사 | Lru 결합형 sru 시험 장치 및 방법 |
| KR102466483B1 (ko) * | 2021-12-20 | 2022-11-11 | 한화시스템 주식회사 | 다중 신호를 사용하는 sru를 위한 시험 장치 및 방법 |
| CN116027124A (zh) * | 2022-10-21 | 2023-04-28 | 深圳市朗科智能电气股份有限公司 | 一种可拆式模块化测试平台 |
| US12117481B2 (en) * | 2022-12-27 | 2024-10-15 | Intelligent Memory Limited | Autonomous detection of memory insertion into test equipment without requiring power to the tester unit |
Family Cites Families (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3654585A (en) * | 1970-03-11 | 1972-04-04 | Brooks Research And Mfg Inc | Coordinate conversion for the testing of printed circuit boards |
| US3751649A (en) * | 1971-05-17 | 1973-08-07 | Marcrodata Co | Memory system exerciser |
| US3854125A (en) * | 1971-06-15 | 1974-12-10 | Instrumentation Engineering | Automated diagnostic testing system |
| CA1038042A (en) * | 1975-03-03 | 1978-09-05 | Motorola | Programmable probe fixture and method of connecting units under test with test equipment |
| US4352061A (en) * | 1979-05-24 | 1982-09-28 | Fairchild Camera & Instrument Corp. | Universal test fixture employing interchangeable wired personalizers |
| DE3013215A1 (de) * | 1980-04-03 | 1981-10-15 | Luther & Maelzer Gmbh, 3050 Wunstorf | Adapter fuer ein selbstprogrammierbares leiterplattenpruefgeraet |
| US4354268A (en) * | 1980-04-03 | 1982-10-12 | Santek, Inc. | Intelligent test head for automatic test system |
| US4402055A (en) * | 1981-01-27 | 1983-08-30 | Westinghouse Electric Corp. | Automatic test system utilizing interchangeable test devices |
| DE3116079A1 (de) * | 1981-04-23 | 1982-11-11 | Robert Bosch Gmbh, 7000 Stuttgart | Pruefsystem |
| EP0115135A1 (en) * | 1982-12-27 | 1984-08-08 | Genrad, Inc. | Electrical test fixture for printed circuit boards and the like |
| US4590581A (en) * | 1983-05-09 | 1986-05-20 | Valid Logic Systems, Inc. | Method and apparatus for modeling systems of complex circuits |
| US4551675A (en) * | 1983-12-19 | 1985-11-05 | Ncr Corporation | Apparatus for testing printed circuit boards |
| DK291184D0 (da) * | 1984-06-13 | 1984-06-13 | Boeegh Petersen Allan | Fremgangsmaade og indretning til test af kredsloebsplader |
| JPS6125263A (ja) * | 1984-07-13 | 1986-02-04 | Sony Corp | 電子機器制御システム |
| US4724383A (en) * | 1985-05-03 | 1988-02-09 | Testsystems, Inc. | PC board test fixture |
| US4899306A (en) * | 1985-08-26 | 1990-02-06 | American Telephone And Telegraph Company, At&T Bell Laboratories | Test interface circuit which generates different interface control signals for different target computers responding to control signals from host computer |
| US4716500A (en) * | 1985-10-18 | 1987-12-29 | Tektronix, Inc. | Probe cable assembly |
| US4718064A (en) * | 1986-02-28 | 1988-01-05 | Western Digital Corporation | Automatic test system |
| US4901259A (en) * | 1988-08-15 | 1990-02-13 | Lsi Logic Corporation | Asic emulator |
| US5291129A (en) * | 1988-10-24 | 1994-03-01 | Nhk Spring Co., Ltd. | Contact probe |
| CN1045655A (zh) * | 1988-11-23 | 1990-09-26 | 约翰弗兰克制造公司 | 系统自动诊断的内核测试接口和方法 |
| US5036479A (en) * | 1989-04-20 | 1991-07-30 | Trw Inc. | Modular automated avionics test system |
| US5058110A (en) * | 1989-05-03 | 1991-10-15 | Ultra Network Technologies | Protocol processor |
| NL9001478A (nl) * | 1990-06-28 | 1992-01-16 | Philips Nv | Testinrichting voor electrische schakelingen op panelen. |
| US5103378A (en) * | 1990-09-21 | 1992-04-07 | Virginia Panel Corporation | Hinged interlocking receiver for mainframe card cage |
| US5196789A (en) * | 1991-01-28 | 1993-03-23 | Golden Joseph R | Coaxial spring contact probe |
| US5218302A (en) * | 1991-02-06 | 1993-06-08 | Sun Electric Corporation | Interface for coupling an analyzer to a distributorless ignition system |
| US5223788A (en) * | 1991-09-12 | 1993-06-29 | Grumman Aerospace Corporation | Functional avionic core tester |
| US5357519A (en) * | 1991-10-03 | 1994-10-18 | Apple Computer, Inc. | Diagnostic system |
| US5175493A (en) * | 1991-10-11 | 1992-12-29 | Interconnect Devices, Inc. | Shielded electrical contact spring probe assembly |
| US5406199A (en) * | 1993-07-28 | 1995-04-11 | At&T Corp. | Test fixture carrying a channel card for logic level translation |
-
1995
- 1995-12-15 US US08/573,026 patent/US5793218A/en not_active Expired - Fee Related
-
1996
- 1996-09-18 ES ES96932262T patent/ES2175129T3/es not_active Expired - Lifetime
- 1996-09-18 KR KR10-1998-0704459A patent/KR100479136B1/ko not_active Expired - Fee Related
- 1996-09-18 PT PT96932262T patent/PT866977E/pt unknown
- 1996-09-18 WO PCT/US1996/014949 patent/WO1997022886A1/en not_active Application Discontinuation
- 1996-09-18 DE DE69621152T patent/DE69621152T2/de not_active Expired - Fee Related
- 1996-09-18 EP EP96932262A patent/EP0866977B1/en not_active Expired - Lifetime
- 1996-09-18 AU AU71128/96A patent/AU7112896A/en not_active Abandoned
- 1996-09-30 IN IN1728CA1996 patent/IN189781B/en unknown
- 1996-12-13 TW TW085115431A patent/TW312747B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| DE69621152T2 (de) | 2003-01-02 |
| US5793218A (en) | 1998-08-11 |
| HK1011223A1 (en) | 1999-07-09 |
| KR100479136B1 (ko) | 2005-05-16 |
| EP0866977B1 (en) | 2002-05-08 |
| EP0866977A1 (en) | 1998-09-30 |
| AU7112896A (en) | 1997-07-14 |
| KR20000064402A (ko) | 2000-11-06 |
| DE69621152D1 (de) | 2002-06-13 |
| PT866977E (pt) | 2002-09-30 |
| WO1997022886A1 (en) | 1997-06-26 |
| IN189781B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 2003-04-19 |
| ES2175129T3 (es) | 2002-11-16 |
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