ES2175129T3 - Adaptador generador de prueba de interfaz. - Google Patents

Adaptador generador de prueba de interfaz.

Info

Publication number
ES2175129T3
ES2175129T3 ES96932262T ES96932262T ES2175129T3 ES 2175129 T3 ES2175129 T3 ES 2175129T3 ES 96932262 T ES96932262 T ES 96932262T ES 96932262 T ES96932262 T ES 96932262T ES 2175129 T3 ES2175129 T3 ES 2175129T3
Authority
ES
Spain
Prior art keywords
interface
test
frame
unit
contact pads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES96932262T
Other languages
English (en)
Inventor
Melvin G Oster
Brian Fuchs
Kenneth Reid
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BAE Systems Aircraft Controls Inc
Original Assignee
BAE Systems Aircraft Controls Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BAE Systems Aircraft Controls Inc filed Critical BAE Systems Aircraft Controls Inc
Application granted granted Critical
Publication of ES2175129T3 publication Critical patent/ES2175129T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

SE DESCRIBE UN ADAPTADOR DE PRUEBA DE INTERFAZ GENERICA PARA CONEXION ENTRE UNA ESTACION DE PRUEBA Y UNA UNIDAD SOMETIDA A PRUEBA. EL ADAPTADOR DE PRUEBA DE LA INTERFAZ GENERICA INCLUYE UN BASTIDOR DE INTERFAZ Y UN CONJUNTO DE TARJETAS DE CIRCUITO INTERCAMBIABLES CONFIGURADAS PARA ENCAMINAR LAS SEÑALES ENTRE LA ESTACION DE PRUEBA Y LA UNIDAD EN PRUEBAS. EL BASTIDOR DE INTERFAZ INCLUYE UN PLANO DE INTERFAZ QUE TIENE UN CONJUNTO DE PATILLAS DE CONTACTO O SONDAS CON MUELLE Y EL GRUPO DE TARJETAS DE CIRCUITO TIENE UNA SERIE DE ZONAS TERMINALES DE CONTACTO, ALINEADAS PARA ACOPLARSE CON LAS PATILLAS DE CONTACTO. LAS CONEXIONES ELECTRICAS ENTRE LA ESTACION DE PRUEBAS Y LA UNIDAD EN PRUEBAS PUEDEN RECONFIGURARSE CON SOLO CAMBIAR EL GRUPO DE TARJETAS DE CIRCUITO INTERCAMBIABLES. SE PROPORCIONA UN BASTIDOR DE PRESION PARA SUJETAR DE FORMA SEGURA EL CONJUNTO DE TARJETAS DE CIRCUITO CONTRA EL PLANO DE INTERFAZ CON OBJETO DE PROPORCIONAR CONEXION ELECTRICA. UN MECANISMO DE LEVA Y RANURA ANGULAR DE LEVAACCIONADO POR UN BRAZO DE PALANCA TIRA DEL BASTIDOR DE PRESION HACIA EL BASTIDOR DE INTERFAZ.
ES96932262T 1995-12-15 1996-09-18 Adaptador generador de prueba de interfaz. Expired - Lifetime ES2175129T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/573,026 US5793218A (en) 1995-12-15 1995-12-15 Generic interface test adapter

Publications (1)

Publication Number Publication Date
ES2175129T3 true ES2175129T3 (es) 2002-11-16

Family

ID=24290357

Family Applications (1)

Application Number Title Priority Date Filing Date
ES96932262T Expired - Lifetime ES2175129T3 (es) 1995-12-15 1996-09-18 Adaptador generador de prueba de interfaz.

Country Status (11)

Country Link
US (1) US5793218A (es)
EP (1) EP0866977B1 (es)
KR (1) KR100479136B1 (es)
AU (1) AU7112896A (es)
DE (1) DE69621152T2 (es)
ES (1) ES2175129T3 (es)
HK (1) HK1011223A1 (es)
IN (1) IN189781B (es)
PT (1) PT866977E (es)
TW (1) TW312747B (es)
WO (1) WO1997022886A1 (es)

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US7162060B1 (en) 1999-08-09 2007-01-09 Cross Match Technologies Method, system, and computer program product for control of platen movement during a live scan
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WO2001011550A1 (en) * 1999-08-09 2001-02-15 Cross Match Technologties, Inc. Method, system, and computer program product for a gui to fingerprint scanner interface
US6658164B1 (en) 1999-08-09 2003-12-02 Cross Match Technologies, Inc. Calibration and correction in a fingerprint scanner
US6483932B1 (en) 1999-08-19 2002-11-19 Cross Match Technologies, Inc. Method and apparatus for rolled fingerprint capture
AU2178400A (en) 1999-10-22 2001-05-08 Cross Match Technologies, Inc. Adjustable, rotatable finger guide in a tenprint scanner with movable prism platen
DE60027207T2 (de) * 2000-08-18 2006-11-16 Cross Match Technologies, Inc., Palm Beach Gardens System und verfahren zum automatischen steuern eines fingerabdruckabtasters
US6611152B1 (en) 2000-10-31 2003-08-26 The Boeing Company Test adapter for configuring the electrical communication between a unit under test and an electronic test station and associated separator plate
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US6504730B1 (en) * 2001-07-23 2003-01-07 Hamilton Sundstrand Corporation Serviceable power modules for a power distribution assembly
US6841990B2 (en) * 2001-10-31 2005-01-11 Agilent Technologies, Inc. Mechanical interface for rapid replacement of RF fixture components
ATE406626T1 (de) 2002-01-17 2008-09-15 Cross Match Technologies Inc Fingerabdruck-workstation und verfahren
US6954260B2 (en) 2002-01-17 2005-10-11 Cross Match Technologies, Inc. Systems and methods for illuminating a platen in a print scanner
JP2003307552A (ja) * 2002-04-17 2003-10-31 Tokyo Electron Ltd 信号検出用接触体及び信号校正装置
AU2003254280A1 (en) * 2002-08-02 2004-02-23 Cross Match Technologies, Inc. System and method for counting ridges in a captured print image
US6906544B1 (en) * 2003-02-14 2005-06-14 Cisco Technology, Inc. Methods and apparatus for testing a circuit board using a surface mountable adaptor
US7164440B2 (en) * 2003-02-28 2007-01-16 Cross Match Technologies, Inc. Dynamic image adaptation method for adjusting the quality of digital prints
EP1612571A4 (en) * 2003-04-04 2010-03-03 Advantest Corp CONNECTION UNIT, TEST HEAD AND TEST UNIT
US7082676B2 (en) * 2003-08-05 2006-08-01 Qualitau, Inc. Electrostatic discharge (ESD) tool for electronic device under test (DUT) boards
US20050047631A1 (en) * 2003-08-26 2005-03-03 Cross Match Technologies, Inc. Method and apparatus for rolled fingerprint image capture with variable blending
TWI273248B (en) 2006-01-26 2007-02-11 Au Optronics Corp Universal probing apparatus for TFT array test
WO2008128286A1 (en) * 2007-04-18 2008-10-30 Tiip Pty Ltd Test instrument enclosure
US20080295090A1 (en) * 2007-05-24 2008-11-27 Lockheed Martin Corporation Software configuration manager
US7866784B2 (en) * 2008-08-19 2011-01-11 Silverbrook Research Pty Ltd Diagnostic probe assembly for printhead integrated circuitry
DE102012103893A1 (de) * 2012-05-03 2013-11-07 Turbodynamics Gmbh Modul zum Austauschen einer Schnittstelleneinheit in einem Testsystem zum Testen von Halbleiterelementen und Testsystem mit einem solchen Modul
FR2996367B1 (fr) * 2012-10-01 2014-10-03 Airbus Operations Sas Systeme de connexion pour connecter un equipement electronique, en particulier pour aeronef, a une unite de test.
CN106324460B (zh) * 2016-11-08 2024-03-22 沈小晴 一种可换针盘式通用测试机构
CN107608842B (zh) * 2017-10-31 2023-11-21 江苏特创科技有限公司 一种接口测试组件及接口测试装置
KR102107111B1 (ko) 2019-09-19 2020-05-06 한화시스템 주식회사 Lru 결합형 sru 시험 장치 및 방법
KR102466483B1 (ko) * 2021-12-20 2022-11-11 한화시스템 주식회사 다중 신호를 사용하는 sru를 위한 시험 장치 및 방법
CN116027124A (zh) * 2022-10-21 2023-04-28 深圳市朗科智能电气股份有限公司 一种可拆式模块化测试平台

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Also Published As

Publication number Publication date
EP0866977B1 (en) 2002-05-08
AU7112896A (en) 1997-07-14
TW312747B (es) 1997-08-11
WO1997022886A1 (en) 1997-06-26
EP0866977A1 (en) 1998-09-30
PT866977E (pt) 2002-09-30
IN189781B (es) 2003-04-19
DE69621152T2 (de) 2003-01-02
KR100479136B1 (ko) 2005-05-16
DE69621152D1 (de) 2002-06-13
KR20000064402A (ko) 2000-11-06
HK1011223A1 (en) 1999-07-09
US5793218A (en) 1998-08-11

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