WO2008128286A1

WO2008128286A1 - Test instrument enclosure

Info

Publication number: WO2008128286A1
Application number: PCT/AU2008/000547
Authority: WO
Inventors: Peter Robert Baxter
Original assignee: Tiip Pty Ltd
Priority date: 2007-04-18
Filing date: 2008-04-18
Publication date: 2008-10-30

Abstract

An electronic test instrument enclosure (600) is disclosed that comprises: a chassis, at least one front panel (610, 620) attached to the chassis and adapted to be selectively disposed in an open or closed state relative to the chassis, and at least one input/output connector disposed behind said at least one front panel (610, 620) in a closed state and accessible when said at least one front panel (610, 620) is in an open state. The electronic test instrument enclosure (600) may further comprise at least one aperture for accommodating interconnection cables (652, 654, 662, 672, 674) coupled to the input/output connectors (842, 844, 852, 854) such that the cables (652, 654, 662, 672, 674) can pass through the at least one aperture when the at least one front panel (610, 620) is in a closed state.

Description

TEST INSTRUMENT ENCLOSURE Technical Field

The present invention relates generally to an enclosure for test instruments and more particularly to an enclosure for accommodating one or more electronic test instrument/s such as an oscilloscope, a logic analyzer or a spectrum analyzer.

Background

Conventional test instruments generally comprise a display device such as a cathode ray tube (CRT) or liquid crystal display (LCD) and a data entry device such as a keyboard or keypad on the front panel. Fig. 1 shows a front view of an oscilloscope test instrument 100 having a conventional front panel 110 layout comprising a display means 120 on the left and a control means 130 on the right. A number of input/output connectors 140 of the oscilloscope 100 are located on the front panel below the control means 130.

As electronic test instruments are generally single test instruments (e.g., an oscilloscope or a logic analyzer), between one and four input/output connectors (dependent on the number of channels) are generally sufficient. These are typically provided on the front panel, as shown in Fig. 1. Other less important input/output connectors may be mounted on the rear panel of the test instrument. Such rear panel mounted input/output connectors are generally inconvenient in that location of, and connection to, a connector frequently comprises a 'blind' operation on the part of a user. This may disadvantageously be the cause of connection to a wrong connector, which may result in damage to the test instrument. In certain conventional test instruments, such as the test instrument 200 shown in Fig. 2, the overall height of the test instrument 200 is increased to accommodate an additional front panel portion 220 that provides the additional input/output connectors 222, 224, 226, 227 and 228. Alternatively, or in addition to connectors 222, 224, 226, 227 and 228, input/output connectors 232, 234 and 236 may be provided on a side panel 230 of the test instrument 200.

However, two prevailing general trends in test instruments are those of small form factor size and minimal depth, both of which advantageously require less real estate on a test bench. Fig. 3a shows a test instrument 300 of small form factor size, that is, of a width about the size of two human hands 310 and 320 placed tip-to-tip. Fig. 3b shows a test instrument 350 having a reduced or minimal depth 360.

The present inventor, while seeking to accommodate multiple test instruments in a single case or enclosure, identified a need for more than four easily accessible input/output connectors. Accordingly, a need exists for a case or test instrument enclosure that can accommodate or provide multiple easily accessible input/output connectors without over-populating the front panel. It is desirable that such enclosure be of small form factor and minimal depth.

Summary

A first aspect of the present invention provides an electronic test instrument enclosure that comprises: a chassis, at least one front panel hingedly connected to the chassis such that the at least one front panel can be in an open or closed state relative to the chassis, and a recessed panel located behind the at least one front panel for accommodating input/output connectors. The input/output connectors are accessible when the at least one front panel is in an open state. The recessed panel may form part of the chassis.

Another aspect of the present invention provides an electronic test instrument enclosure, comprising: a chassis, at least one front panel attached to the chassis and adapted to be selectively disposed in an open or a closed state relative to the chassis, and at least one input/output connector disposed behind the at least one front panel in a closed state and accessible when the at least one front panel is in an open state. The at least one front panel may be adapted to slide and/or rotate relative to the chassis to selectively dispose said at least one front panel in an open or a closed state.

The foregoing electronic test instrument enclosures may further comprise at least one aperture for accommodating interconnection cables coupled to the input/output connectors such that the cables can pass through the at least one aperture when the at least one front panel is in a closed state. The interconnection cables may comprise cables for coupling a test instrument in the electronic test instrument enclosure to a circuit external to the electronic test instrument enclosure via the input/output connectors. The at least one aperture may be in the base of the chassis of the test instrument enclosure in the proximity of the at least one front panel such that the cables are able to enter/exit the electronic test instrument enclosure underneath the at least one front panel when in a closed state. Alternatively or additionally, the at least one aperture may comprise one or more apertures or slots in a side of the chassis such that the cables are able to enter/exit the electronic test instrument enclosure behind the at least one front panel when in a closed state. The at least one aperture may be located between the chassis and the at least one front panel. The electronic test instrument enclosure may comprise two front panels in a side-by-side arrangement. In this instance, one of the front panels may comprise a display means and the other front panel may comprise a control means.

The electronic test instrument enclosure may be mounted in a 19 inch rack. In this instance, cables coupled to the input/output connectors may conveniently be routed to the rear of the rack.

Brief Description of the Drawings

Fig. 1 is a front view of an oscilloscope test instrument enclosure having a conventional front panel layout;

Fig. 2 is a three-dimensional view of a test instrument enclosure having conventional front and side panel layouts; Fig. 3 a is a front view of a conventional test instrument enclosure;

Fig. 3b is a three-dimensional view of a conventional test instrument enclosure; A small number of embodiments are described hereinafter, by way of example only, with reference to the accompanying drawings in which:

Fig. 4a is a front view of a test instrument enclosure in accordance with an embodiment of the present invention;

Fig. 4b is a cross-sectional right side view of the test instrument enclosure of Fig. 4a taken along cross-section A - A;

Fig. 4c is a left side view of the test instrument enclosure of Fig. 4a; Fig. 4d is a another cross-sectional right side view of the test instrument enclosure of Fig. 4a taken along cross-section A - A;

Fig. 5 is a front view of another test instrument enclosure in accordance with an embodiment of the present invention; - A -

Figs. 6a, 6b and 6c are front views of another test instrument enclosure in accordance with an embodiment of the present invention;

Fig. 7 is a plan view of a test instrument enclosure in accordance with an embodiment of the present invention when mounted in a 19-inch rack; Fig. 8a is a front view of a test instrument in accordance with another embodiment of the present invention;

Fig. 8b is a cross-sectional right side view of the test instrument of Fig. 8a taken along cross-section B - B;

Figs. 9a, 9b and 9c are cross-sectional right side views of a test instrument enclosure in accordance with another embodiment of the present invention;

Fig. 10 is a cross-sectional right side view of a test instrument enclosure in accordance with another embodiment of the present invention; and

Fig. 11 is a cross-sectional right side view of a test instrument enclosure in accordance with another embodiment of the present invention.

Detailed Description

Embodiments of test instruments and/or enclosures for housing such test instruments are described hereinafter.

Figs. 4a to 4d show various views of a test instrument enclosure 400 having front panels 410 and 420.

Referring to Fig. 4a, the test instrument enclosure 400 is shown with front panels 410 and 420 in a closed state. Input/output connectors are mounted on a recessed panel (not shown in Fig. 4a) behind the front panels 410 and/or 420 to reduce the number of input/output connectors on the front panels 410 and 420 of the test instrument 400. An aperture 409 in the base of the chassis 405 of the test instrument enclosure 400 enables interconnection cables connected to the input/output connectors on the recessed panel to exit underneath the front panels 410 and 420, while the front panels 410 and 420 are in the closed state. The aperture 409 is, in this instance, a slot between the protruding portions 407 of the chassis 405 that protrude towards the front panels 410 and 420. The front panels 410 and 420 are hingedly connected to the chassis 405 such that the front panels 410 and 420 can be swung open upwardly as shown in Fig. 4c to provide access to the recessed panel.

The cross-sectional view of Fig. 4b (taken across cross-section A-A in Fig. 4a) shows a recessed panel 430 located in a cavity 435 behind the front panel 420, which is in the closed state. Input/output connectors 442 and 444 may be mounted on the recessed panel 430 and/or a printed circuit board (PCB) 450. The recessed panel 430 may form part of the chassis 405 of the test instrument enclosure or may comprise an independent panel that maybe attached to the chassis 405 (e.g., via screws or clips).

Fig. 4c shows the front panel 410 in the open state and the front panel 420 in the closed state, relative to the chassis 405 of the test instrument enclosure 400. The front panels 410 and 420 are shown hingedly connected to the top of the chassis 405 of the test instrument enclosure 400 such that the front panels 410 and 420 may be opened and closed by upward and downward rotation, as shown by the arrow 415. In other embodiments, the front panels 410 and 420 may alternately be hingedly attached to the sides or bottom of the chassis 405.

Fig. 4c further shows an aperture or slot 435 in the left side of the chassis 405 such that cables connected to the input/output connectors 442 and 444 may exit the test instrument enclosure 400 behind the front panels 410 and 420 when the front panels 410 and 420 are in a closed state. Although the aperture 435 is shown completely surrounded by the chassis 405, the aperture 435 may alternatively be located at the edge of the chassis 405. That is, only 3 of the 4 sides of the aperture 435 may be defined by the chassis 405, with the remaining side of the aperture 435 being defined by the front panel 410 when in a closed state.

Those skilled in the art will appreciate that any single or combination of apertures, including horizontal and/or vertically disposed apertures or slots, may be practiced to facilitate cable entry or exit when the front panel/s is/are in a closed state. For. example, an aperture may alternatively be provided on the right side of the test instrument enclosure 400 or in addition to the aperture 435 on the left side of the test enclosure 400. The cross-sectional view of Fig. 4d (taken across cross-section A-A in Fig. 4a) shows a recessed panel 430 located in a cavity 435 behind the front panel 420 in the closed state, similarly to Fig. 4b. However, an interconnection cable 460 connected to the input/output connector 444 is shown exiting through the aperture 409 in the base of the chassis 405 of the test instrument enclosure 400 while the front panel 420 is in the closed state.

Fig. 5 shows a test instrument 500 with front panels 510 and 520 both in an open state. Modules 545, 555 and 595 are shown plugged into connectors (not shown in Fig. 5) mounted on a recessed panel 530. Connectors 560, 570 and 580, which can accept additional modules, are also mounted on the recessed panel 530. The test instrument 500 may comprise apertures in its chassis, as described hereinbefore with reference to Figs. 4a to 4d, for entry/exit of interconnection cables connected to the input/output connectors 560, 670 and 580 and the modules 545, 555 and 595.

Figs. 6a, 6b and 6c are front views of a test instrument enclosure 600 housing multiple individual test instruments. Figs. 6a and 6b show a front panel 610 in the open state and a front panel 620 in the closed state. The front panels 610 and 620 are hingedly connected to the chassis of the test instrument enclosure 600 along the top of the test instrument enclosure 600. Groups 640, 650 and 660 of input/output connectors each relate to a separate test instrument housed in the test instrument enclosure 600. In Fig. 6b, interconnection cables 652 and 654 are shown connected to input/output connectors of test instrument 650 and interconnection cable 662 is shown connected to an input/output connector of test instrument 660. Interconnection cables 654 and 662 enter/exit the test instrument enclosure 600 via an aperture in the base of the test instrument enclosure 600 and interconnection cable 652 enters/exits the test instrument enclosure 600 via an aperture in the left side panel of the test instrument enclosure 600.

Fig. 6c is similar to Figs. 6a and 6b, but shows front panel 620 in an open state with interconnection cables 672 and 674, connected to input/output connectors of test instrument 670, entering/exiting the test instrument enclosure 600 through an aperture in the right side of the test instrument enclosure 600.

Fig. 7 is a plan view of a test instrument mounted in a 19-inch rack 700 in accordance with an embodiment of the present invention. Referring to Fig. 7, a test instrument enclosure 730 is mounted in a 19-inch rack 700 having left and right sides 710 and 720, respectively. The test instrument enclosure 730 may be substantially similar or identical to the test instrument enclosures 400 and 600 described hereinbefore with reference to Figs. 4 and 6, respectively, and comprises two front panels 740 and 750 shown in a closed state in Fig. 7. An interconnection cable 780 is shown connected to an input/output connector 770, which is mounted to a recessed panel 735 behind the front panels 740 and 750. The front panels 740 and 750 are hingedly connected to the chassis of the test instrument enclosure 710 such that the front panels 740 and 750 can be swung open to provide access to the recessed panel 735 for connecting and disconnecting the interconnection cable to/from the input/output connector 770.

The interconnection cable 780 enters/exits the test instrument enclosure 730 through an aperture or slot in the left side of the chassis of the test instrument 730, as described hereinbefore, such that the interconnection cable 780 can be conveniently routed to the rear of the 19-inch rack 700.

Those skilled in the relevant art will appreciate that electrical interconnection between the actual test instrument/s in the enclosure and the display and/or controls on the hinged front panel/s may be performed using any conventional method (e.g., twisted cables) such as that used for the display panels of laptop or notebook computers.

Figs. 8a and 8b show a front view and a cross-sectional right side view taken along cross-section B-B, respectively, of a test instrument 800 in accordance with another embodiment of the present invention.

Referring to Figs. 8a and 8b, the test instrument 800 is shown with the front panel 810 in an open state. Groups of input/output connectors 840, 850, 860 and 870 relating to individual test instruments are mounted on the recessed panel 830, which is located behind the front panel 810 (when in a closed state). The recessed panel 830 is substantially parallel to the front panel 810. Portions of the input/output connectors that protrude from the front of the recessed panel 830 are contained within the cavity 835 that is formed between the recessed panel 830 and the front panel 810, when in a closed state. The front panel 810 is adapted to be vertically raised relative to the chassis 805, thus providing access to the input/output connectors on the recessed panel 830, as shown in Figs. 8a and 8b. The test instrument 800 may comprise one or more apertures in its chassis 805, as described hereinbefore with reference to the embodiment shown in Figs. 4a to 4d, for entry/exit of interconnection cables connected to the input/output connectors mounted on the recessed panel 830.

The right-side view of Fig. 8b, as taken across cross-section B-B, shows input/output connectors 842 and 844 that relate to test instrument 840 and input/output connectors 852 and 854 that relate to test instrument 850. Fig. 8b also shows a portion of a connection cable 888 or wiring harness for electrically connecting display and controls (not shown in Fig. 8b but shown in Fig. 8a) mounted on the front panel 810 of the test instrument enclosure 800 to the test instrument/s 840, 850, 860 and 870 located in the test instrument enclosure 800. The connection cable 888 may, for example, comprise a conventional multi-core cable of round cross-section or a flat ribbon cable. A spring-loaded mechanism may be used to draw any slack or excess portion of the connecting cable 888 back into either the front panel 810 or an upper portion of the chassis 805 of the test instrument enclosure 800 during movement of the front panel 810 relative to the chassis 805.

Figs. 9a, 9b and 9c show cross-sectional right side views of a test instrument enclosure 900 in accordance with another embodiment of the present invention.

The test instrument enclosure 900 comprises a chassis 905, a front panel 910 and a recessed panel 930 on which input/output connectors 942 and 944 are mounted. The front panel is adapted to be disposed in an open or closed state relative to the chassis 905. A cavity 935 is formed between the recessed panel 930 and the front panel 910, when the front panel 910 is in a closed state relative to the chassis 905. A complementary shaft 950 and bush 960 (or bearing) arrangement enables the front panel 910 to be moved vertically in a sliding fashion relative to the chassis 905 to provide access to the input/output connectors 942 and 944. A rotating joint 970 enables the front panel 910 to be angularly rotated and/or displaced relative to the chassis 905 to provide access to the input/output connectors 942 and 944. Fig. 9a shows the front panel 905 in a closed state, thus obscuring access to the input/output connectors 942 and 944.

Fig. 9b shows the front panel 905 in a vertically raised open state, thus providing access to the input/output connectors 942 and 944.

5 Fig. 9c shows the front panel 905 in an angularly raised open state, thus providing access to the input/output connectors 942 and 944. The front panel 910 may be opened by pivoting about the centre of the rotating joint 970 as shown by the arrow 975.

Figs. 9a, 9b and 9c, as cross-sectional right side views, show a shaft 950o attached to the rear surface of the front panel 910 and adapted to slide vertically within a bush 960, which is attached to the chassis 905. Those skilled in the art will appreciate that multiple complementary shaft and bush arrangements may be practiced, hi a preferred embodiment, two such complementary shaft and bush arrangements are practiced with one such arrangement vertically positioned on eachs side of the front panel 910 and test instrument enclosure 900. The shafts may, for example, be of round or square cross-section. Similarly, multiple rotating joints 970 may be practiced. Alternatively, a single rotating joint extending along the length of the front panel 910 and top of the chassis 905 may be practiced.

Either or both of the complementary shaft and bush arrangement and rotatingo joint arrangement may be gear or motor assisted to provide smooth and/or assisted motion of the front panel relative to the chassis.

The test instrument enclosure 900 may comprise one or more apertures in its chassis 905, as described hereinbefore with reference to the embodiment shown in Figs. 4a to 4d, for entry/exit of interconnection cables connected to the input/output₅ connectors mounted on the recessed panel 930. Although not shown in Figs. 9a, 9b and 9c, those skilled in the art will appreciate that such an aperture may be provided in the base of the chassis 905.

Fig. 10 shows a cross-sectional right side view of a test instrument enclosure₀ 1000 according to another embodiment of the present invention.

The test instrument enclosure 1000 operates similarly to the test instrument enclosure 900 of Fig. 9 except that the shaft 1050 is attached to the chassis 1005 and the rotating joint 1070 is attached to the bottom of the front panel 1010. As the shaft 1050 is positioned within the cavity 1035, a spacer 1080 is used to suitably position the front panel 1010 relative to the chassis 1005. The front panel 1010 is shown in a closed state in Fig. 10 but may be disposed in an open state by vertically sliding the front panel 1010, which is attached to the bush 1060, up the shaft 1050. Alternatively and/or additionally, the front panel 1010 may be disposed in an open state by angularly rotating the front panel 1010 about the rotating joint 1070 in a downwards fashion (i.e., inversely to the test instrument enclosure 900 of Fig. 9). Those skilled in the art would appreciate that the front panel 1050 needs to be slightly raised on the shaft 1050 or sufficient clearance needs to be provided for the front panel 1010 to be angularly displaced or rotated relative to the base of the chassis 1005.

The test instrument enclosure 1000 may comprise one or more apertures in its chassis 1005, as described hereinbefore with reference to the embodiment shown in Figs. 4a to 4d, for entry/exit of interconnection cables connected to the input/output connectors mounted on the recessed panel 1030. Although not shown in Fig. 10, those skilled in the art will appreciate that such an aperture may be provided in the base of the chassis 1005.

In other respects, the test instrument enclosure 1000 of Fig. 10 is identical or substantially similar to the test instrument enclosure 900 of Fig 9.

Fig. 11 shows a cross-sectional right side view of a test instrument enclosure 1100 in accordance with another embodiment of the present invention. The test instrument enclosure 1100 operates similarly to the test instrument enclosure 1000 of Fig. 10 except that the shaft 1150 is attached to the chassis 1105 outside the cavity 1135. This obviates the need for a spacer such as the spacer 1080 in the embodiment of Fig. 10.

The test instrument enclosure 1100 may comprise one or more apertures in its chassis 1105, as described hereinbefore with reference to the embodiment shown in Figs. 4a to 4d, for entry/exit of interconnection cables connected to the input/output connectors mounted on the recessed panel 1130. Although not shown in Fig. 11, those skilled in the art will appreciate that such an aperture may be provided in the base of the chassis 1105. In other respects, the test instrument enclosure 1100 of Fig. 11 is identical or substantially similar to the test instrument enclosure 1000 of Fig 10.

In the embodiments shown in Figs. 9, 10 and 11, the front panels are adapted to slide up and down in a vertical plane. However, those skilled in the art will appreciate that the front panel may alternatively be adapted to slide up and down at an angle, thus providing a sloping front panel.

A mechanism may be provided in any of the embodiments described hereinbefore to optionally maintain the front panel in an open state relative to the chassis of the test instrument enclosure. Such a mechanism may employ a mechanical stop that is manually moved into position once the front panel is disposed in the open state or a spring arrangement to counter-balance the weight of the front panel. A catch mechanism may be provided to lock or secure the front panel in a closed state to. prevent damage, for example, during transportation of the test instrument enclosure.

Embodiments of test instruments and test instrument enclosures described hereinbefore advantageously enable interconnection cables to be connected and disconnected to input/output connectors of the test instruments in a convenient manner compared to existing arrangements. Mounting input/output connectors on or to a recessed panel located behind one or more movable or removable front panel/s and providing one or more apertures in the base or side panels of the test instrument enclosure for interconnection cables to pass through avoids the need for cables to be connected to the rear or sides of the test instrument and furthermore enables a test instrument having multiple input/output connectors to advantageously be of smaller footprint.

The foregoing description provides exemplary embodiments only, and is not intended to limit the scope, applicability or configurations of the present invention. Rather, the foregoing description of the exemplary embodiments provides those skilled in the art with enabling descriptions for implementing an embodiment of the invention. Various changes may be made in the function and arrangement of elements without departing from the spirit and scope of the invention as set forth in the claims hereinafter. For example, those skilled in the art will appreciate that numerous modifications may be made to the means shown and described in the foregoing embodiments for moving, sliding and/or rotating the front panel relative to the chassis of a test instrument enclosure. Other means may also be practiced to move, slide and/or rotate the front panel relative to the chassis of a test instrument enclosure.

Where specific features, elements and steps referred to herein have known equivalents in the art to which the invention relates, such known equivalents are deemed to be incorporated herein as if individually set forth. Furthermore, features, elements and steps referred to in respect of particular embodiments may optionally form part of any of the other embodiments unless stated to the contrary.

The term "comprising", as used herein, is intended to have an open-ended, non- exclusive meaning. For example, the term is intended to mean: "including principally, but not necessarily solely" and not to mean "consisting essentially of or "consisting only of. Variations of the term "comprising", such as "comprise", "comprises" and "is comprised of, have corresponding meanings.

Claims

1. An electronic test instrument enclosure, comprising: a chassis; at least one front panel hingedly connected to said chassis such that said at least one front panel can be in an open or closed state relative to said chassis; and a recessed panel located behind said at least one front panel for accommodating input/output connectors; wherein said input/output connectors are accessible when said at least one front panel is in an open state.

2. The electronic test instrument enclosure of claim 1, wherein said recessed panel forms part of said chassis.

3. The electronic test instrument enclosure of claim 1, further comprising at least one aperture in said chassis for accommodating interconnection cables coupled to said input/output connectors such that said cables can pass through said at least one aperture when said at least one front panel is in a closed state.

4. The electronic test instrument enclosure of claim 3, wherein said cables comprise interconnection cables for coupling a test instrument in said electronic test instrument enclosure to a circuit external to said electronic test instrument enclosure via said input/output connectors.

5. The electronic test instrument enclosure of claim 3, wherein said at least one aperture is in a base of said chassis such that said interconnection cables are able to enter/exit said electronic test instrument enclosure underneath said at least one front panel when in a closed state.

6. The electronic test instrument enclosure of claim 3, wherein said at least one aperture is in a side panel of said chassis such that said interconnection cables are able to enter/exit said electronic test instrument enclosure behind said at least one front panel when in a closed state.

7. The electronic test instrument enclosure of any one of claims 3 to 6, wherein said at least one aperture is disposed between said chassis and said at least one front panel

8. The electronic test instrument enclosure of any one of claims 1 to 6, comprising two front panels in a side-by-side arrangement.

9. The electronic test instrument enclosure of claim 8, wherein one of said front panels comprises a display means and the other of said front panels comprises a control means.

10. The electronic test instrument enclosure of any one of claims 1 to 9, having an electronic test instrument disposed therein.

11. The electronic test instrument enclosure of any one of claims 1 to 9, having a plurality of different electronic test instruments disposed therein.

12. The electronic test instrument enclosure of any one of claims 1 to 11, when mounted in a 19 inch rack.

13. The electronic test instrument enclosure of claim 6, when mounted in a 19 inch rack and said cables coupled to said input/output connectors are routed to the rear of said rack via said aperture.

14. An electronic test instrument enclosure, comprising: a chassis; at least one front panel attached to said chassis and adapted to be selectively disposed in an open or a closed state relative to said chassis; and at least one input/output connector disposed behind said at least one front panel in a closed state and accessible when said at least one front panel is in an open state.

15. The electronic test instrument enclosure of claim 14, wherein said at least one 5 front panel is adapted to slide relative to said chassis to selectively dispose said at least one front panel in an open or a closed state.

16. The electronic test instrument enclosure of claim 14, wherein said at least one front panel is adapted to rotate relative to said chassis to selectively dispose said at

IQ least one front panel in an open or a closed state.

17. The electronic test instrument enclosure of claim 14, wherein said at least one front panel is adapted to slide and rotate relative to said chassis to selectively dispose said at least one front panel in an open or a closed state.

I₅

18. The electronic test instrument enclosure of claim 14, further comprising a recessed panel located behind and substantially parallel to said at least one front panel, wherein said at least one input/output connector is mounted on said recessed panel. 0 19. The electronic test instrument enclosure of claim 14, further comprising at least one aperture in said chassis for accommodating interconnection cables coupled to said at least one input/output connector such that said cables can pass through said at least one aperture when said at least one front panel is in a closed state.

2₅

20. The electronic test instrument enclosure of claim 19, wherein said at least one aperture is in a base of said chassis such that said interconnection cables are able to enter/exit said electronic test instrument enclosure underneath said at least one front panel when in a closed state.

30 21. The electronic test instrument enclosure of claim 19, wherein said at least one aperture is in a side panel of said chassis such that said interconnection cables are able to enter/exit said electronic test instrument enclosure behind said at least one front panel when in a closed state.

22. The electronic test instrument enclosure of any one of claims 19 to 21, wherein said at least one aperture is disposed between said chassis and said at least one front panel.