1273248 九、發明說明： 【發明所屬之技術領域】 本發明是有關於一種電子元件系統測試之探針裝置， 且特別是有關於一種面板陣列測試之探針裝置。 【先前技術】 平面顯示器的應用擴及於文書處理器、桌上型個人電 腦、掌上型電視顯示器及類似的應用而快速擴張。特別是 液晶顯示器（Liquid Crystal Display : LCD)面板因為其製程 技術的成熟，所以廣泛運用於各種應用中。隨著製造技術 的進步，顯示器面板尺寸也發展出多種規格以符合不同使 用需求’因為液晶顯示器面板是由許多的液晶包及其它元 件所組成的，此外，較大的液晶顯示器面板具有較多的元 件。液晶顯示器面板中即使只有一個元件故障，整個液晶 顯示器面板就是失敗的。所以在封裝液晶顯示器面板之 刖，用以測試液晶顯示器面板的測試步驟是保證所製造液 晶顯示器品質的重要步驟。 傳統上，接觸式探針檢測模組被使用於測試顯示面 板，測試時，制探針模組上的探針對液晶顯示器面板上BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe device for testing an electronic component system, and more particularly to a probe device for panel array testing. [Prior Art] The application of flat panel displays has expanded rapidly with the spread of word processors, desktop personal computers, palm TV displays and the like. In particular, liquid crystal display (LCD) panels are widely used in various applications due to their mature process technology. With the advancement of manufacturing technology, display panel sizes have also been developed in various specifications to meet different usage requirements. Because liquid crystal display panels are composed of many liquid crystal packages and other components, in addition, larger liquid crystal display panels have more element. Even if only one component fails in the LCD panel, the entire LCD panel fails. Therefore, after packaging the liquid crystal display panel, the test procedure for testing the liquid crystal display panel is an important step to ensure the quality of the liquid crystal display. Traditionally, the contact probe detection module has been used to test the display panel. When testing, the probe on the probe module is placed on the LCD panel.
面板。panel.
試一種規格的液晶顯示器面板， 徵中’一個測試站只能測 而在測試站上用以測試的 1273248 探針測試模組是針對該尺寸的液晶顯示器所設計，如果生 產線改生產其他尺寸的液晶顯示器，就必須將所使用的探 針測試模組更換掉，以配合所製造的新尺寸之液晶顯示器 面板。 例如，多數習知的探針測試模組通常是製作出不同規 格的探針框架，使用於不同產品線之測試。每一特定框架 上探針數就對應著一特定尺寸規格之面板所具有的接觸墊 數目，探針框架就是將多個測試用探針整合在一體的單 元，以利於批量測試。 但針對開發出來的不同尺寸面板，若以此種方式執行 測试，由於不同尺寸規格之面板具有相異數目之接觸墊， 因此當一新產品規格被開發出來，就必須重新製作一符合 新尺寸規格之探針框架。因為一種特定規格的框架通常是 無法適用於其它產品，如此將造成額外的探針框架製作與 没汁費用，而且探針框架之製作乃至交期時間甚長。另外， 在更換產品線做測試時，更換探針框架的步驟也相當耗 時，種種原因造成產能及人力的浪費。 【發明内容】 因此本發明之一目的就是在提供一種電子元件系統測 試之探針裝置，用以方便測試不同尺寸規格之面板或電子 元件佈局。 本發明的另一目的是在提供一種電子元件系統測試之 探針裝置’以提供測試不同尺寸規格面板或電子元件佈局 之解決方案。 1273248 元件系統測試之 本發明的又一目的是在提供一種電子 探針裝置，節省成本、時間及人力之花費 根據本發明之上述目的，提出一種電子元件系統測試 之探針裝置。電子元件系統測試之探針裝置包括—探針單 70與一線路切換裝置，探針單元包含-支撐座與-第一數 目之探針，探針皆設置於支撐座上，用以對一面板陣列進 行測試。線路切換裝置用以使—第二數目之探針與一第三 數目之測試訊號源之間呈電性連接。其中第二數目小於第 -數目，第二數目不小於第三數目，且測試訊號源其中之 一電性連接於至少一探針。 依照本發明一較佳實施例，測試裝置用於面板陣列之 測試’線路切換裝置為—排線，包括—探針連接頭、訊號 源連接頭與-傳輸線路。探針連接頭包含第—數目之探針 端接腳’用以電連接於探針。訊號源連接頭包含第三數目 ^訊號源端接腳，用以電連接於測試訊號源。傳輸線路使 探針端接腳與訊號源端接腳依據一線路配置而呈電性連 接母一訊號源端插孔電連接至少一探針端插孔。 面板陣列測試裝置更包含一訊號源裝置，具有一訊號 源連結器。訊號源連結器具有第四數目之訊號源連結器接 腳母一號源連結器接腳作為一種測試訊號源，用以對應 也插置並電性連接於線路切換裝置之訊號源端接腳，以供 應測試訊號於探針單元。其中第四數目大於等於第三數目。 線路切換裝置亦可為一可插拔式軟性電路板，一端電 連接於探針，另一端電連接於測試訊號源。 當測試一特定尺寸規格之面板時，可先利用已設計好 1273248 而相對應之線路切換I置分別與探針單元以及訊號源插置 連接，再將探針單元上探針對準測試用之面板放置平台， 使面板之接觸墊與一部分之探針相接觸，而其它探針則不 與任何接觸墊接觸，如同—空職。藉由線路切換裝置之 線路配置’使得訊號源傳送至特定位置之探針上以執行測 試。 更換不同之規格面板時，只須將線路切換裝置拔除， 換上另一個具有不同線路配置設計之線路切換裝置，即可 進行測試。 由於預先設計多數探針於探針模組上，使探針單元涵 蓋一個以上尺寸規格之面板測試範圍，僅須更換線路切換 裝置即可切換不同產品線之測試，而線路切換裝置相較於 探針單元整體在設計製造上相當簡單快速，耗費成本也 低，並且在更換步驟上也較快速，對於產線生產時間的利 用也有相當大的助益。Try a liquid crystal display panel of a specification. The 1273248 probe test module that can only be tested at the test station and used for testing on the test station is designed for liquid crystal displays of this size. If the production line is changed to produce other sizes of liquid crystals. For the display, the probe test module used must be replaced to match the new size of the LCD panel. For example, most conventional probe test modules typically produce different gauge probe frames for testing on different product lines. The number of probes on each particular frame corresponds to the number of contact pads in a particular size panel. The probe frame is a unit that integrates multiple test probes into one unit for batch testing. However, for the different sizes of panels developed, if the panel is tested in this way, since the panels of different sizes have different numbers of contact pads, when a new product specification is developed, it is necessary to re-create a new size. Specifications of the probe frame. Because a specific specification frame is usually not suitable for other products, this will result in additional probe frame fabrication and no juice costs, and the probe frame will be manufactured and even delivered for a long time. In addition, when the product line is replaced for testing, the steps of replacing the probe frame are also quite time consuming, resulting in waste of productivity and manpower for various reasons. SUMMARY OF THE INVENTION It is therefore an object of the present invention to provide a probe device for testing electronic component systems for facilitating the testing of panels or electronic component layouts of different sizes. Another object of the present invention is to provide a probe device for electronic component system testing to provide a solution for testing the layout of panels or electronic components of different sizes. 1273248 Component System Test A further object of the present invention is to provide an electronic probe device that is cost effective, time consuming, and labor intensive. In accordance with the above objects of the present invention, a probe device for electronic component system testing is proposed. The probe device for the electronic component system test comprises a probe unit 70 and a line switching device, the probe unit comprises a support base and a first number of probes, and the probes are all disposed on the support base for a panel The array is tested. The line switching device is configured to electrically connect a second number of probes to a third number of test signal sources. The second number is less than the first number, the second number is not less than the third number, and one of the test signal sources is electrically connected to the at least one probe. In accordance with a preferred embodiment of the present invention, the test apparatus is used in the test of the panel array. The line switching device is a cable, including a probe connector, a signal source connector, and a transmission line. The probe connector includes a first number of probe termination pins for electrical connection to the probe. The signal source connector includes a third number of signal source terminals for electrically connecting to the test signal source. The transmission line is such that the probe terminal pin and the signal source terminal are electrically connected according to a line configuration, and the source terminal is electrically connected to at least one probe terminal jack. The panel array test device further includes a signal source device having a signal source connector. The signal source connector has a fourth number of signal source connector pins, and the source connector pin is used as a test signal source for correspondingly connecting and electrically connecting to the signal source terminal of the line switching device. To supply test signals to the probe unit. The fourth number is greater than or equal to the third number. The line switching device can also be a pluggable flexible circuit board having one end electrically connected to the probe and the other end electrically connected to the test signal source. When testing a panel of a specific size specification, you can first use the corresponding line switching I1 designed to connect with the probe unit and the signal source, and then align the probe on the probe unit with the test panel. The platform is placed such that the contact pads of the panel are in contact with a portion of the probe, while the other probes are not in contact with any of the contact pads, as if they were empty. The signal source is transmitted by the line configuration of the line switching device to the probe of the specific position to perform the test. When replacing different panel sizes, you only need to remove the line switching device and replace it with another line switching device with different line configuration design. Since most of the probes are pre-designed on the probe module so that the probe unit covers the panel test range of more than one size specification, the test of different product lines can be switched only by replacing the line switching device, and the line switching device is compared with the probe. The needle unit as a whole is relatively simple and fast in design and manufacture, low in cost and low in replacement steps, and also has considerable benefits for the production time of the production line.
【實施方式】 本發明揭露一種電子元件系統測試之探針裝置，提供 一共用之探針單元給不同尺寸規格之顯示面板執行測試步 驟，更換產品線作測試時僅須更換線路切換裝置，免除習 知須另外設計、製作、並更換探針框架之不方便以及大量 的成本耗費。為了使本發明之敘述更加詳盡與完備，可參 照下列描述並配合第1A圖與第1B圖之學示。 參照第1A圖，其繪示依照本發明電子元件系統測試之 探針裝置一較佳實施例的示意圖。本發明之電子元件系統 1273248 測試之探針裝置包括一探針單元11〇(繪示於第ib圖）以及 -線路切換裝^ 120。探針單a 110包含一支撐座，如框架 112,以及第一數目之探針114(繪示於第ib圖”所有探針 114綿密、小間距地設置於支撐座上，用以對電子元件系統 如面板陣列進行測試。 線路切換裝置120用以使一部份探針114，即第二數目 之捸針114’與第三數目之測試訊號源1〇4(繪示於第iB圖） 之間呈電性連接。上述之第二數目小於第一數目，而第二 數目不小於第三數目。實際使用探針裝置進行測試時，測 试訊號源104其中之一係電性連接於至少一探針114。第二 數目例如為第三數目之一整數倍數。 具體而言，線路切換裝置120具有第二數目之探針端 接腳124a以及第三數目之訊號源端接腳i26a，探針端接腳 124a用以電性連接於探針單元11〇之探針114，訊號源端 接腳126a用以電性連接於測試訊號源ι〇4。且上述接腳與 探針以及測試訊號源間之電性連接係為可抽拔分離。 於一較佳實施例中，電子元件系統測試之探針裝置包 括一訊號源裝置100、一線路切換裝置120以及一探針單元 u〇。訊號源裝置100用以供應測試訊號，包含一訊號源連 結器102。訊號源連結器1〇2具有第四數目之訊號源連結器 接腳102a於其上，每一訊號源連結器接腳102a代表一種 測試訊號源，提供一特定之測試訊號，但實際使用時並不 一定傳輸所有第四數目之訊號，可視測試需求而只利用一 部份之測試訊號。故第四數目係大於等於第三數目。本例 中訊號源裝置100更為一平台結構，作為待測面板16〇放 1273248 置之平台。 -楚二十單70 U〇包括一框架112、一探針連結11 118以及 一數目之探針114，所有探針114設置於框架112上， 用以對面&160陣列進行測試。本例中框架112為一四邊 木例如一方框，探針114係設置於框架112之框邊 ^。本發明之探針裝置中，域座並不限於上述實施例所 不之框架，例如亦可為一橫桿結構。 探針連結器118具有與探針U4相對應而相同數目的 探針連結器接腳118a，即第一數目個接腳U8a，每一接腳 118a分別對應地電性連接於個別之探針ιΐ4。本例中，所 有探針114與探針連結器接腳U8a係藉由一軟性電路板 116而對應地電性連接，探針連結器118則固設在框架ιΐ2 上。 線路切換裝置120為一排線，包括一探針連接頭124、 一訊號源連接頭120以及一傳輸線路122。線路切換裝置 120 —端為探針連接頭124,具有第二數目之探針端接腳 124a，用以插置而連接於探針單元n〇之探針連結器118。 藉由探針連結器接腳118a與探針端接腳124a之間的接 觸，使線路切換裝置120與探針114之間呈電性連接。 線路切換裝置120另一端為訊號源連接頭126,具有第 三數目之訊號源端接腳126a，用以插置而連接於訊號源裝 置120之訊號源連結器1〇2。藉由訊號源連結器接腳i〇2a 與訊號源端接腳126a之間的接觸，使線路切換裝置120與 測試訊號源104之間呈電性連接。 第三數目之訊號源端接腳126a透過傳輸線路122，與 1273248 之探針端接腳ma呈電性連接，將測試訊號源 發出的訊號自訊號源端接腳126a傳送到第二數目之探 針端接腳124a。由於傳輸線路122為—特定的=㈣^ 二因：：路切換裝置m成為探針114與測試訊號源1〇4 間之傳導途徑，而且所提供之傳導途徑係針對不同規格尺 寸之面板產品有不同之線路配線設計。 上述中線路切換裝置之型態並不限於 排線’亦可以例如為一可插拔之電路板或軟3,=設 计，其具有用以電連接於探針以及測試訊號源之探針端接 腳以及訊號源端接腳，亦可於本發明中發揮相同功能。另 外，實施例中線路切換裝置為具有插孔之連結器，即一母 插頭；’但亦可以是—公插頭，此種公插頭與母插頭之簡單 互換設計係屬熟知技藝者可㈣思及之變換，只要線路切 換裝置為可自探針單S以及訊號源裝置插拔抽換者，皆包 含在本發明之精神與範圍内。 以下將以一例說明本發明之電子元件系統測試之探針 裝，之運作過程。如第1B圖所示，當待測面板⑽已放置 K如訊號源裝置100之平台上，將框架112對準正 確方位放τ *探針114與待測面板⑽上的接觸墊162 接觸開始K時，啟動訊號源裝置⑽使測試訊號源⑽ 發出測4訊號’經過線路切換裝i 12G之連接線路將訊號 正„探針114、進而傳至接觸墊162上。更換產品線 執行測”式時’只須將前次使用的線路切換裝置120拔除， 更換另種規格的線路切換裝置，便完成更換測試規格之 步驟##乂於習知須將框架ιΐ2整體更換的方式，本發明 1273248 、^針:元通用式設計取代以相當簡便之更換步驟。[Embodiment] The present invention discloses a probe device for testing an electronic component system, which provides a common probe unit for performing test steps on display panels of different sizes, and only needs to replace the line switching device when replacing the product line for testing. It is inconvenient to design, manufacture, and replace the probe frame, as well as a large amount of cost. In order to make the description of the present invention more detailed and complete, reference is made to the following description and in conjunction with the teachings of Figures 1A and 1B. Referring to Figure 1A, there is shown a schematic diagram of a preferred embodiment of a probe device for testing an electronic component system in accordance with the present invention. The electronic component system of the present invention 1273248 tested probe device includes a probe unit 11 (shown in Figure ib) and a line switching device 120. The probe unit a 110 includes a support base, such as a frame 112, and a first number of probes 114 (shown in Figure ib). All of the probes 114 are disposed on the support base in a dense, small pitch for the electronic components. The system is tested as a panel array. The line switching device 120 is configured to enable a portion of the probes 114, that is, the second number of pins 114' and a third number of test signal sources 1 to 4 (shown in Figure iB). The second number is less than the first number, and the second number is not less than the third number. When the probe device is actually used for testing, one of the test signal sources 104 is electrically connected to at least one. The second number is, for example, an integer multiple of the third number. Specifically, the line switching device 120 has a second number of probe termination pins 124a and a third number of signal source termination pins i26a, probes The terminal pin 124a is electrically connected to the probe 114 of the probe unit 11 , and the signal source terminal 126 a is electrically connected to the test signal source ι 4 . The pin and the probe and the test signal source are connected. The electrical connection between the two is extractable and separable. In the embodiment, the probe device of the electronic component system test includes a signal source device 100, a line switching device 120, and a probe unit. The signal source device 100 is configured to supply a test signal, and includes a signal source connector 102. The signal source connector 1〇2 has a fourth number of signal source connector pins 102a thereon. Each of the signal source connector pins 102a represents a test signal source and provides a specific test signal, but in actual use It is not necessary to transmit all the fourth number of signals, and only a part of the test signals are used for visual testing needs. Therefore, the fourth number is greater than or equal to the third number. In this example, the signal source device 100 is more of a platform structure, as a test The panel 16 is placed on the platform of the 1273248. - The Chu 20 single 70 U includes a frame 112, a probe link 11 118, and a number of probes 114. All the probes 114 are disposed on the frame 112 for opposite & The 160 array is tested. In this example, the frame 112 is a four-sided wood such as a box, and the probe 114 is disposed at the frame edge of the frame 112. In the probe device of the present invention, the domain block is not limited to the above. The frame of the embodiment may be, for example, a crossbar structure. The probe connector 118 has the same number of probe connector pins 118a corresponding to the probe U4, that is, the first number of pins U8a, each Each of the pins 118a is electrically connected to the individual probes ι4. In this example, all of the probes 114 and the probe connector pins U8a are electrically connected correspondingly by a flexible circuit board 116. The connector 118 is fixed on the frame ι. The line switching device 120 is a line of wires, including a probe connector 124, a signal source connector 120, and a transmission line 122. The line switching device 120 is connected by a probe. The head 124 has a second number of probe termination pins 124a for insertion and connection to the probe connector 118 of the probe unit n〇. The line switching device 120 and the probe 114 are electrically connected by the contact between the probe connector pin 118a and the probe terminal pin 124a. The other end of the line switching device 120 is a signal source connector 126 having a third number of signal source terminals 126a for interposing and connecting to the signal source connector 1〇2 of the signal source device 120. The line switching device 120 and the test signal source 104 are electrically connected by the contact between the signal source connector pin i〇2a and the signal source terminal pin 126a. The third number of signal source terminals 126a are electrically connected to the probe terminal pin ma of the 1273248 through the transmission line 122, and the signal from the test signal source is transmitted from the signal source terminal pin 126a to the second number. Needle end pin 124a. Since the transmission line 122 is -specific = (four) ^ two factors: the path switching device m becomes a conduction path between the probe 114 and the test signal source 1 〇 4, and the conduction path provided is for panel products of different specifications and sizes. Different line wiring design. The type of the above-mentioned line switching device is not limited to the cable 'may also be a pluggable circuit board or a soft 3,= design, and has a probe end for electrically connecting to the probe and the test signal source. The pin and the signal source pin can also perform the same function in the present invention. In addition, in the embodiment, the line switching device is a connector with a jack, that is, a female plug; 'but can also be a male plug, and the simple interchange design of the male plug and the female plug is known to those skilled in the art. The conversion is as long as the line switching device is a pluggable single S and a signal source device, and is included in the spirit and scope of the present invention. The operation of the probe assembly for testing the electronic component system of the present invention will be described below by way of an example. As shown in FIG. 1B, when the panel to be tested (10) has been placed on the platform of the signal source device 100, the frame 112 is aligned with the correct orientation. The probe 114 is in contact with the contact pad 162 on the panel (10) to be tested. When the signal source device (10) is activated, the test signal source (10) sends a test signal 4. The connection line through the line switching device i 12G transmits the signal to the probe 114 and then to the contact pad 162. When the product line is replaced, the test is performed. 'It is only necessary to remove the previously used line switching device 120, replace the line switching device of another specification, and complete the step of replacing the test specification. ##乂 In the manner of the conventional replacement of the frame ιΐ2, the present invention 1273248, ^ Needle: The universal design replaces the fairly easy replacement procedure.
叫參考第3目，其㈣出線路切換裝置内部之線路 垃如圖中所不’訊號源連結器32〇上之訊號源連結器 =322a 322e數目為五個，表示有五種測試訊號被提供 ’作為測叙用。訊號自訊號源連結器接腳如卜3仏 =，經過線路切換裝置之線路配置謂而傳送至探針連結 益310上之探針連結器接腳312。圖例中可明顯看出，探針 連。器接腳312分置上下二列，每一種訊號經由線路配置 330而傳送到四個探針連結器接腳312，亦即會有四支探針 使用同一種測試訊號。 探針連結益310上其餘探針連結器接腳則因為線路配 置330之關係，並未與訊號源連結器接腳咖〜咖電性 連接’成為制測試裝置時之空腳彳p也就是說探針插座 接腳312雖已全部對應地插置在探針連接頭之探針端插孔 中仁並未因此而全部與測試訊號源電性連接，還須視線 路配置330而定，針對Μ面板尺寸設計會有不同的導通 當測試-特定規格面板時，空腳位處代表不會有電訊 號供應給對應該處之探針，因為依據面板之接觸墊設計結 果，該處探針不會有相對應接觸之接觸墊，因此不須要: 試訊號。總言t ’空腳位找置是由線路切換裝置之設 所決定。 參考第2圖，其繪示依照本發明一較佳實施例中探 之配置圖。若針對現有14吋、15吋、17吋、19吋之面板， 每-種尺寸規格的接觸塾數都不相同。面板上之接觸塾配 12 1273248 置係依據探針單元上所有探針位置202而設計，也就是不 ’那一種規格面板，其所有接觸墊皆設計位在探針單元中 多數探針之位置202上之其中一部份位置，以提供一正確 之探針對應接觸。 因此’探針數目之設計考量係為選取一適當數目，使 其/函蓋將來可能發展出的面板寸規格所對應的接觸墊數 目探針數目設計得越多越密，則可涵蓋的不同產品數也 相對較多。本例中探針之數目設計為四邊形框架上，一側 有1 〇〇支探針’探針間距則為1 〇mrn。然而探針保持等間 距之設計係為探針與面板設計方便之考慮，並非一定要符 合等間距’非等間距設計亦屬本發明之精神範圍内，此乃 熟習此項技藝者可輕易思及之變化。 探針裝置係可配合複數個基板使用，如面板基板，每 一基板上具有複數個接觸墊，每一接觸墊皆可對應至一探 針位置。 同時參考第1A圖與第2圖，以具有側邊長1000mm 之一母玻璃片為例說明。若設計探針間距為1〇ππη，且第一 與最末探針位置各與母玻璃片之邊緣相距一距離如5mm。 於框架112之一側設計有1〇〇支探針114平均分配於上， 而對應之探針連結器接腳118a亦具有1〇〇個。 若此母玻璃片係供製造成2x4塊面板160，如圖中所 示’左右二侧分置四塊面板160。並於框架112之兩侧設計 兩組探針連結器接腳，左側之探針連結器接腳係用以控制 位於圖式左側之四塊面板，而右側之探針連結器接腳U8a 則用以控制位於圖式右側之另四塊面板。 13 1273248 若每塊面板160需各自接收五種測試訊號，左側與右 側之線路切換裝置120之訊號源端接腳126a數量為第三數 目，此例中皆為五，分別接收來自訊號源裝置1〇〇之五種 測試訊號。 因此，左側之探針端接腳係為5 χ4個與同數目探針 114呈電性連接之接腳。同理，右侧之線路切換裝置 之訊號源端接腳也同樣數量為五，接收來自訊號源裝置i⑼ 之五種測試訊號’並各自傳送到右側之4塊面板160上。 而右側之探針端接腳124a亦同樣為5 X 4個，與5x4 個探針呈電性連接之接腳。若是母玻璃片係要製造成例如2 X ό塊面板，而每塊面板160要接收七種測試訊號，如此， 各側之訊號源知接腳126a數量為七個，而各側之探針端接 腳124a為7x6個與同數目探針114呈電性連接之接腳。 須特別注意的是，具有第四數目之訊號源連結器接腳 l〇2a實際使用時並不一定須傳送第四數目之測試訊號，視 使用需求而定，亦可提供小於第四數目之測試訊號。因此 第四數目係大於或等於第三數目。於上述之實施例中，係 以第四數目等於第三數目來示範說明。 視實際使用需求，訊號源數目例如為五個、七個、或 其它數目。如此，只要更換適用於不同尺寸或面板元件佈 局之線路切換裝置，即可適用於同一個探針單元。當每塊 面板上之元件佈局有變化之時，可以不用另行設計探針單 元’只要每塊面板上要接收測試訊號之接觸塾與探針單元 之探針具有對應之位置，即可適用於各種不同的面板尺寸 及元件佈局。 1273248 於上述實施例中，係以支樓座兩側之探針連結器接腳 來各自控制位於兩侧之面板’而於實際運用上，也可以設 料只配置單—探針連結器於—侧，來控制全部面板之測 忒，亦即將二側之探針整合設計為電性連接於 結器接腳’此時探針連結器接腳之數目為所有探針之總合。 由上述本發明較佳實施例可知，應用本發明具有下列 優點。藉由錦密的探針設計，並配合可插拔的線路切換裝 • 4 ’使同一探針單元可用以對不同尺寸規格之面板進行測 鲁 4。更換不同規格產品線執行測試時，只須簡單地將線路 切換裝置拔除更換，相較於習知的更換整個框架之方式， 節省相當多的更換時間與人工資源。 而且，針對不同或新開發出的產品規格，本發明只須 藉由設計或修改具有相對應線路配置之線路切換裝置即 可，在設計與裝置之設計、製作時間以及方便性，甚至在 耗費成本方面，都比再製作一新規格之探針框架有明顯效 盈’本發明的確提供一不可忽視之商業上價值。 鲁雖然本發明已以較佳實施例揭露如上，然其並非用以 限疋本發明，任何熟習此技藝者，在不脫離本發明之精神 和範圍内，當可作各種之更動與潤飾，因此本發明之保護 範圍當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 為讓本發明之上述和其他目的、特徵、優點與實施例 能更明顯易懂，所附圖式之詳細說明如下： 15 1273248 第1A圖係繪示依照本發明電子元件系統測試之探針 裝置一較佳實施例的示意圖。 第1Β圖係繪示依照本發明一較佳實施例中探針與接 觸墊接觸之示意圖。 第2圖係繪示依照本發明一較佳實施例中探針之配置 圖。 第3圖係繪示依照本發明一較佳實施例中線路切換裝 内部之線路配置示意圖。 【主要元件符號說明】 100 :訊號源裝置 102 :訊號源連結器 102a :訊號源連結器接腳 104 :測試訊號源 110 :探針單元 112 :框架 114 :探針 116 :軟性電路板 118 :探針連結器 118a :探針連結器接腳 120 :線路切換裝置 122 :傳輸線路 124 :探針連接頭 124a :探針端接腳 126 :訊號源連接頭 126a :訊號源端接腳 16 0 ·待測面板 162 :接觸墊 202 :探針位置 310 :探針連結器 312 :探針連結器接腳 320 :訊號源連結器 322a〜322e :訊號源連結器接 330 :線路配置 腳Referring to the third item, (4) the line inside the line switching device is not shown in the figure. The number of signal source connectors = 322a 322e on the signal source connector 32 is five, indicating that five test signals are provided. 'As a test. The signal source connector pin is transmitted to the probe connector pin 312 of the probe link 310 via the line configuration of the line switching device. It is evident in the legend that the probe is connected. The pins 312 are divided into two columns, each of which is transmitted via line configuration 330 to four probe connector pins 312, i.e., four probes use the same test signal. The other probe connector pins on the probe connection 310 are due to the relationship of the line configuration 330, and are not connected to the signal source connector to the coffee maker. Although the probe socket pins 312 are all correspondingly inserted into the probe end sockets of the probe connector, the terminals are not electrically connected to the test signal source, and must be determined according to the line configuration 330. The design will have different conduction. When testing - the specific specification panel, the empty pin position will not provide the signal signal to the corresponding probe, because the probe will not have phase according to the design of the contact pad of the panel. Corresponding to contact pads, so there is no need to: Test signal. In general, t ‘ empty pin finding is determined by the setting of the line switching device. Referring to Figure 2, there is shown a configuration diagram of a preferred embodiment of the present invention. For the existing 14吋, 15吋, 17吋, 19吋 panels, the contact number of each size is different. The contact pads 12 1273248 on the panel are designed according to all the probe positions 202 on the probe unit, that is, not the specification panel, all of which are designed to be located at the position of most probes in the probe unit 202 One of the parts is positioned to provide a correct probe for the corresponding contact. Therefore, the design of the number of probes is to select an appropriate number, so that the number of contact pads corresponding to the panel size specifications that may be developed in the future is designed to be more dense and dense, and different products can be covered. The number is also relatively large. In this example, the number of probes is designed as a quadrilateral frame with one 探针 probe on one side and the probe spacing is 1 〇mrn. However, the design of the probes to maintain the equal spacing is a convenient consideration for the design of the probe and the panel. It is not necessary to conform to the equidistant spacing. The non-equal spacing design is also within the spirit of the present invention, which can be easily considered by those skilled in the art. Change. The probe device can be used with a plurality of substrates, such as a panel substrate, each of which has a plurality of contact pads, each of which can correspond to a probe position. Referring to FIGS. 1A and 2, a mother glass sheet having a side length of 1000 mm is taken as an example. If the design probe spacing is 1 〇 ππη, and the first and last probe positions are each separated from the edge of the mother glass sheet by a distance such as 5 mm. One side of the frame 112 is designed to have an even number of probes 114 equally distributed thereon, and the corresponding probe connector pins 118a also have one. If the mother glass sheet is manufactured as a 2x4 panel 160, four panels 160 are placed on the left and right sides as shown in the figure. Two sets of probe connector pins are designed on both sides of the frame 112, the left probe connector pins are used to control the four panels on the left side of the drawing, and the right probe connector pins U8a are used. To control the other four panels on the right side of the drawing. 13 1273248 If each panel 160 needs to receive five kinds of test signals, the number of signal source pins 126a of the left and right line switching devices 120 is the third number, in this case, five, respectively, receiving the signal source device 1 Five test signals. Therefore, the probe end legs on the left side are 5 χ 4 pins that are electrically connected to the same number of probes 114. Similarly, the number of signal source pins of the line switching device on the right side is also five, receiving five test signals from the source device i (9) and transmitting them to the four panels 160 on the right side. The probe tip pin 124a on the right side is also 5 x 4 pins that are electrically connected to 5x4 probes. If the mother glass piece is to be fabricated, for example, as a 2 X block panel, and each panel 160 receives seven test signals, the number of signal source pins 126a on each side is seven, and the probe ends on each side. Pin 124a is a 7x6 pin that is electrically connected to the same number of probes 114. It should be noted that the fourth number of signal source connector pins 1〇2a does not necessarily need to transmit a fourth number of test signals when used. Depending on the usage requirements, less than the fourth number of tests may be provided. Signal. Therefore the fourth number is greater than or equal to the third number. In the above embodiments, the description is exemplified by the fourth number being equal to the third number. The number of signal sources is, for example, five, seven, or other numbers depending on actual usage requirements. In this way, the same probe unit can be applied by simply replacing the line switching device for different sizes or panel component layouts. When the layout of the components on each panel is changed, the probe unit may not be designed separately. As long as the contact 要 on each panel to receive the test signal has a corresponding position with the probe of the probe unit, it can be applied to various types. Different panel sizes and component layouts. 1273248 In the above embodiment, the probe connector pins on both sides of the branch base are used to control the panels on both sides respectively. In actual use, it is also possible to provide only a single-probe connector for the device. On the side, to control the measurement of all the panels, the probes on both sides are integrated to be electrically connected to the connector pins. At this time, the number of probe connector pins is the sum of all the probes. It will be apparent from the above-described preferred embodiments of the present invention that the application of the present invention has the following advantages. The same probe unit can be used to test panels of different sizes by means of a sleek probe design with a pluggable line switching device. When replacing the product line of different specifications, it is only necessary to simply remove and replace the line switching device, which saves a lot of replacement time and labor resources compared with the conventional method of replacing the entire frame. Moreover, for different or newly developed product specifications, the present invention can only be designed or modified with a line switching device having a corresponding line configuration, design, fabrication time, and convenience, even at a cost. On the one hand, it is obviously more effective than re-creating a new specification probe frame. The present invention does provide a commercial value that cannot be ignored. Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the scope of the present invention, and various modifications and refinements may be made without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS The above and other objects, features, advantages and embodiments of the present invention will become more <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; A schematic diagram of a preferred embodiment of a probe device for system testing. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic illustration of the contact of a probe with a contact pad in accordance with a preferred embodiment of the present invention. Figure 2 is a diagram showing the configuration of a probe in accordance with a preferred embodiment of the present invention. Figure 3 is a schematic diagram showing the arrangement of lines inside a line switching device in accordance with a preferred embodiment of the present invention. [Main component symbol description] 100: signal source device 102: signal source connector 102a: signal source connector pin 104: test signal source 110: probe unit 112: frame 114: probe 116: flexible circuit board 118: probe Needle connector 118a: probe connector pin 120: line switching device 122: transmission line 124: probe connector 124a: probe terminal pin 126: signal source connector 126a: signal source terminal pin 16 0 Test panel 162: contact pad 202: probe position 310: probe connector 312: probe connector pin 320: signal source connector 322a to 322e: signal source connector 330: line configuration pin