KR100771906B1 - Tester of liquid crystal display panel - Google Patents

Abstract

The present invention relates to an inspection apparatus for a liquid crystal display panel, and an MPS (Mass Production System) inspection apparatus for a liquid crystal display panel according to the present invention includes a stage on which a thin film transistor array substrate to be inspected is placed, and a virtual liquid crystal panel is formed to form a thin film. A modulator for determining whether the transistor is substantially completed as a panel, a VIOS (voltage image optics system) for converting the electric signal checked by the modulator into an optical signal, and an optical signal from the VIOS. It is composed of a CCD that can be seen with the naked eye, the stage includes a plurality of pro portion formed on the outside of the stage to apply a signal to the test signal applying pad (pad) formed on the substrate, and connected to the pro portion to the substrate On models of MUX BOARD and LCD panel that apply the proper signal to the formed test pad It consists of the frame made of the profile parts la test signal to a switch that can be switched.

Description

Test equipment for liquid crystal display panel {TESTER OF LIQUID CRYSTAL DISPLAY PANEL}

1 is a schematic diagram showing a schematic structure of a conventional MPS inspection equipment.

FIG. 2 shows test pad positions corresponding to a 18.1 "panel on a 680x880 organic substrate. FIG.

3 shows test pad positions corresponding to a 20.1 "panel on a 680 x 880 organic substrate.

Figure 4 is a schematic diagram showing a schematic structure of the MPS inspection equipment of the present invention.

FIG. 5 is an enlarged view showing an enlarged pro part frame shown in FIG. 4; FIG.

FIG. 6 is a view for explaining the operation of the switch shown in FIG. 5; FIG.

*** Explanation of symbols for main parts of drawing ***

11: stage 12: modulator

13: VIOS 15: CCD

17: Pro part 20: unit panel

23: thin film transistor array substrate 31: gate line

32: data line 33: gate pad

41: mux board 42: switch

43: test pad

The present invention relates to an inspection apparatus for a liquid crystal display panel. In particular, the same MPS inspection apparatus is applied to models of different liquid crystal display devices by providing a signal change switch to an MPS inspection apparatus used in an inspection stage for testing a driving failure of a thin film transistor. It is to be used.
In general, a liquid crystal display device is a display device in which an image corresponding to a data signal is displayed by individually supplying data signals to liquid crystal cells arranged in a matrix and adjusting light transmittance of the liquid crystal cells.

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Accordingly, a liquid crystal display device includes: a liquid crystal panel in which liquid crystal cells forming a pixel unit are arranged in an active matrix form; A driver integrated circuit (IC) for driving the liquid crystal cells is provided.

At this time, the liquid crystal panel is arranged so that the common electrode is formed on one side of each inner side of the upper and lower substrates facing each other, and the pixel electrode is formed on the other side of the liquid crystal panel so as to face each other. An electric field is applied to the liquid crystal layer which is formed at the separation interval of the substrate. The pixel electrode is formed for each liquid crystal cell on the lower substrate, while the common electrode is integrally formed on the entire surface of the upper substrate.
In addition, a plurality of data lines for transmitting a data signal supplied from a data driver integrated circuit to the liquid crystal cells on the lower substrate of the liquid crystal panel, and are formed in a direction orthogonal to the data lines and supplied from a gate driver integrated circuit. A plurality of gate lines are formed to transmit the scan signal to the liquid crystal cells. In addition, one end of the data lines and the gate lines is provided with an input pad to which a data signal and a scanning signal supplied from the data driver integrated circuit and the gate driver integrated circuit are respectively applied, and the data lines and the gate lines intersect each other. Each unit defines liquid crystal cells. Liquid crystal cells are defined at each intersection of the data lines and the gate lines.

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In this case, the gate driver integrated circuit sequentially supplies scan signals to a plurality of gate lines, so that the liquid crystal cells arranged in a matrix form are sequentially selected one by one, and a data driver is provided in the selected one line of liquid crystal cells. The data signal is supplied from the integrated circuit.

Each liquid crystal cell is formed with a thin film transistor used as a switching element, and in liquid crystal cells in which a scan signal is supplied to a gate electrode of the thin film transistor through the gate line, a conductive channel is formed between the source and drain electrodes of the thin film transistor. In this case, as the data signal supplied to the source electrode of the thin film transistor through the data line is supplied to the pixel electrode via the drain electrode of the thin film transistor, the light transmittance of the corresponding liquid crystal cell is adjusted.

Here, in the upper and lower substrates constituting the liquid crystal panel, a plurality of unit panels are formed on a large glass mother substrate, and in general, four or six are simultaneously formed and then cut into individual unit panels to improve yield. .

In the liquid crystal display device as described above, when fabrication of the lower substrate on which the thin film transistor array is formed is completed, the array substrate of the thin film transistor is inspected before bonding to the upper substrate on which the color filter is formed.

In the inspection step of the thin film transistor array, a pattern inspection step, a review step, an MPS inspection step, and a repair step are performed in order.

First, in the pattern inspection step, the xenon-lamp is irradiated to the TFT array to distinguish the normal part from the defective part by the difference in brightness of the light reflected by the pixel of the TFT. The defective part sets the coordinates of the defect and conveys information about this defect coordinate in the next step.

After the pattern checking step, the mobile station moves to a review station. At the review station, the workers directly judge the type of the defect or whether the degree of the defect is likely to be repaired based on the coordinates of the defect detected by the pattern inspector. It even checks for defects that have occurred inside.

Next, as a mass production system (MPS) inspection step, an electrical failure of a panel is checked by applying an voltage to each panel through an MPS inspector to identify an array that is actually a failure when driving the thin film transistor.

Lastly, the repair is performed in the repair process step by checking a defect that can be repaired among the defects of the thin film transistor array checked through the review step and the MPS inspector with a reflective light source. The reflective light source used in the MPS is a halogen lamp.

The MPS inspection apparatus used in the MPS inspection step will be described in more detail. The MPS apparatus having the structure of FIG. 1 includes a stage 11 on which a thin film transistor array substrate (not shown) to be tested is mounted, and a virtual liquid crystal. A modulator 12 for determining whether the thin film transistor is driven when the thin film transistor is substantially completed by forming a panel, and a VIOS (voltage image optics system) for converting an electrical signal checked by the modulator 12 into an optical signal. (13) and a CCD (15) capable of visually checking the optical signal from the VIOS (13).

In addition, the stage 11 includes a plurality of pro units 17 formed outside the stage 11 and a plurality of pro units 17 so as to apply a signal to a test signal applying pad formed on a substrate. A pro part frame 19 is connected to apply a signal suitable for each pro part.

The signal applying pads formed on the substrate to be inspected through the MPS device configured as described above are set differently according to the model of the liquid crystal display.

2 illustrates the test pad locations corresponding to a 18.1 "panel on a 680 × 880 organic substrate.

As shown in the figure, four TFT thin-film array panels 20 are formed on the substrate 23, and the gate lines 31 and the data lines 32 are formed in a matrix on each panel. Near the intersection of the gate line 31 and the data line 32, a TFT serving as a switching element is formed. In addition, a gate pad 33 is formed at one end of the gate line to apply a signal to the gate line 31, and a data pad 34 is formed at one end of the data line 32.                         

Each data pad 34 is divided into an odd line and an even line. In addition, each of the data pads 34 includes an even line test pad DE and an odd line test pad DO that connect odd lines to odd lines and even lines to even lines. The test pad VCOM, the ground pad VGND, the dummy pad DUMMY, and the gate test pad GATE are formed in a line.

In addition, the test pads formed on the 20.1 "liquid crystal panel manufacturing substrate are four thin film transistor array panels 20 formed on the glass substrate as shown in FIG. 3, and each panel includes a gate line 31 and data. A line 32 is formed in a matrix, and a thin film transistor (TFT) serving as a switching element is formed near the intersection point of the gate line and the data line 32. Further, one end of the gate line 31 is formed. The gate pad 33 is formed at the side to apply a signal to the gate line, and the data pad 34 is formed at one end of the data line 32.

Each data pad 34 is divided into an odd line and an even line, and an even line test pad DE and an odd line test pad DO are formed to connect odd lines to odd lines and even lines to even lines. The dummy pad DUMMY and the ground pad VGND are disposed below. In addition, an even line test pad GE and an odd line test pad GO may be formed under the ground pad VGND in the same manner as the gate pad, by dividing the odd lines and the even lines.

However, as shown in Figs. 2 to 3, the test pads of the 18.1 "liquid crystal panel (FIG. 2) and the 20.1" liquid crystal panel (FIG. 3) are formed differently on a 680x880 organic substrate, You must use separate pro-frames, with the signals arranged for the model of each liquid crystal panel. In this case, the pro part frame is added, and the production part needs to be replaced in accordance with the model change of the liquid crystal panel along with the production cost of the additional part of the pro part frame.

Accordingly, the present invention has been made to solve the above-described problems, and an object of the present invention is to provide a single pro part frame without a separate pro part frame according to a model change by placing a switch for each model in the pro part frame. The present invention provides an MPS inspection device for a liquid crystal display panel that can improve productivity by allowing inspection of various models of liquid crystal display panels.

In order to achieve the above object, in the MPS inspection equipment of the liquid crystal display device for testing the driving failure of the completed thin film transistor array substrate constituting the liquid crystal panel, the present invention is to place the thin film transistor array substrate on the A stage; A mux board for applying a test signal to a test pad formed on the thin film transistor substrate and a switch for switching the test signal when a model of the liquid crystal panel is changed. Pro part frame; A modulator for determining whether to drive the thin film transistor array substrate; A voltage image optics system (VIOS) for converting the electrical signal checked by the modulator into an optical signal; It consists of a CCD which can visually confirm the optical signal from the said VIOS.
It is formed on the outside of the stage, and includes a pattern generator connected to the mux board.
It is preferable that the pro part connected to the pro part frame is formed at a position corresponding to the test pad formed on the substrate outside the stage. Preferably, the pro part is divided into two per test pad, one pro part applies the test pad signal, and the other pro part detects whether a signal is properly applied to the test pad.
The mux board preferably distributes a signal supplied from the pattern generator into a signal corresponding to each test pattern formed on the thin film transistor array substrate.

Hereinafter, with reference to the accompanying drawings will be described in detail with respect to the MPS inspection equipment of the liquid crystal display device of the present invention configured as described above.

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4 is a MPS inspection equipment of the liquid crystal display device according to the present invention.

As shown in the figure, the MPS inspection apparatus of the present invention is divided into a stage 11, a modulator 12, a VIOS 13, and a CCD 15 on which a thin film transistor array substrate 40 to be largely inspected is placed. Can be.

A liquid crystal and a color filter substrate are formed inside the modulator 12 to form an arbitrary liquid crystal panel when passing through the thin film transistor array substrate, thereby checking a driving failure of the thin film transistor array.

 The VIOS (voltage image optics system) 13 converts the electrical signal checked from the modulator 12 into an optical signal so that the viewer can visually check through the CCD 15.

A plurality of panels are formed on the substrate 40 to form test patterns 43 for driving the panels. Each panel 13 includes a matrix of gate lines 31 and data lines 32. A thin film transistor, which is formed in a phase and functions as a switching element, is formed near the intersection point of the gate line 31 and the data line 32. In addition, a gate pad 33 is formed at one end of the gate line to apply a signal to the gate line, and a data pad 34 is formed at one end of the data line 32.

In addition, the positions of the test pads 43 formed on the substrate are arranged differently according to the model of the liquid crystal panel, and the signals applied to the test pads are also different from each other.

The stage 11 is placed on the substrate 23 to be inspected, and a plurality of pro portions 17 formed on the side of the stage are disposed along the test pad 43 formed on the substrate 23. The pro part 17 is formed corresponding to the position of the test pad and is distributed two per test pad, one of which serves to apply a signal to the test pad and the other to properly apply the signal to the test pad. It acts as a detector to detect if it is.                     

In addition, a pro part frame 19 including a mux board 41 having a plurality of channels and a switch 42 capable of switching the channels according to a model of a liquid crystal panel is installed at one side of the stage part 11. It is.

FIG. 5 is an enlarged view of the pro part frame 19 shown in FIG. 4.

As shown in the figure, the pro part frame 19 includes a mux board 41 and a switch 42, and the mux board 41 has a plurality of channels in a 1: 1 correspondence with a test pad formed on a substrate. (CH1 to CH5) are formed, and are distributed for each channel so that a signal suitable for each test pad can be applied by the mux board 41. In this case, a signal distributed for each channel in the mux board 41 is supplied from a pattern generator (not shown) installed outside the stage unit 11. The switch 42 changes the position of the signal applied to the test pad by changing the channel.

6 is a view for explaining how the signal switching switch 42 installed in the pro part frame 19 operates according to the model of the liquid crystal panel.

As shown in the figure, conventionally, a 18.1 "liquid crystal panel model in which DE, DO, VCOM, VGND, DUMMY, and GATE test pads are arranged in a line is referred to as channel 1 (CH1) for DE and channel 2 (CH2) for DO. , 18.1 "mux board 19a configured to input signal from channel 3 (CH3) to VCOM, channel 5 (CH5) to VGND, and channel 4 (CH4) to GATE, DE, DO, DUMMY, VGND, GE , 20.1 "liquid crystal panel model with GO test pads arranged in a row, DE for channel 1 (CH1), DO for channel 2 (CH2), VGND for channel 5 (CH5), GE for channel 3 (CH3), GO There is a separate 20.1 "mux board 19b configured to input a signal from channel 4 (CH4), but the signal input to the 18.1" VCOM pad is the same as the signal input to the 20.1 "GE pad, The signal input to the 18.1 "GATE pad is the same as the signal input to the GO pad, so even if the model of the LCD panel is changed, 4 is when the interchangeable jugiman.

For example, if the LCD panel model is changed from 20.1 "to 18.1", the signal from channel 3 (VCOM) can be changed by changing the position of channel 3 (VCOM) and channel 4 (GATE) through a switch installed in the pro part frame. Is input to the GE pad, and the signal from channel 4 (GATE) is input to the GO pad. On the contrary, when the model of the liquid crystal panel is changed from 18.1 "to 20.1", the positions of the channel 3 (GE) and the channel 4 (GO) are changed so that the signal from the channel 3 (GE) is input to the VCOM pad and the channel 4 (GO) is changed. The signal from) is input to the GATE pad to change the position of the signal.

As described above, the present invention is to configure the switch separately in the pro part frame to switch the signal through the switch even if the model of the liquid crystal panel to change the appropriate pro part frame according to each model according to the liquid crystal panel model as described above You can prevent the hassle.

As described above, the present invention provides a switch for changing the position of the signal applied to the test pad in the probu frame, so that the inspection can be performed without replacing the probu frame according to the model change. Time can be saved, and the additional cost of the pro part frame according to the liquid crystal panel model can be reduced, thereby improving productivity.

Claims (6)

In the MPS inspection equipment of the liquid crystal display device for testing the driving failure of the completed thin film transistor array substrate constituting the liquid crystal panel, A stage on which the thin film transistor array substrate is placed; A mux board for applying a test signal to a test pad formed on the thin film transistor substrate and a switch for switching the test signal when a model of the liquid crystal panel is changed. Pro part frame; A modulator for determining whether to drive the thin film transistor array substrate; A voltage image optics system (VIOS) for converting the electrical signal checked by the modulator into an optical signal; MPS inspection equipment of the liquid crystal display device consisting of a CCD that can visually check the optical signal from the VIOS. The MPS inspection apparatus of claim 1, further comprising a pattern generator formed outside the stage and connected to the mux board. The method of claim 1, wherein the substrate A thin film transistor functioning as a switching element near the intersection of the gate line and the data line, the gate line and the data line, a gate pad for applying a signal to the gate line at one end of the gate line, and a data line At one end of the panel including a formed data pad, MPS inspection equipment of the liquid crystal display device, characterized in that the test pattern for driving the panel is formed. 4. The MPS inspection apparatus of claim 1, wherein a pro unit connected to the pro unit frame is formed at a position corresponding to the test pad formed on the substrate. 5. 5. The method of claim 4, wherein the pro part is divided into two per test pad, one pro part applies the test pad signal, and the other pro part detects whether the signal is properly applied to the test pad. MPS inspection equipment of the liquid crystal display device. The MPS inspection apparatus of claim 2, wherein the mux board distributes a signal supplied from the pattern generator into signals corresponding to respective test patterns formed on the thin film transistor array substrate.

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