TW200728731A - Universal probing apparatus for TFT array test - Google Patents

Universal probing apparatus for TFT array test

Info

Publication number
TW200728731A
TW200728731A TW095103212A TW95103212A TW200728731A TW 200728731 A TW200728731 A TW 200728731A TW 095103212 A TW095103212 A TW 095103212A TW 95103212 A TW95103212 A TW 95103212A TW 200728731 A TW200728731 A TW 200728731A
Authority
TW
Taiwan
Prior art keywords
probing apparatus
universal
tft array
array test
electronic devices
Prior art date
Application number
TW095103212A
Other languages
Chinese (zh)
Other versions
TWI273248B (en
Inventor
Chin-Liang Chang
Original Assignee
Au Optronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics Corp filed Critical Au Optronics Corp
Priority to TW095103212A priority Critical patent/TWI273248B/en
Priority to KR1020060028368A priority patent/KR100777267B1/en
Application granted granted Critical
Publication of TWI273248B publication Critical patent/TWI273248B/en
Publication of TW200728731A publication Critical patent/TW200728731A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A universal probing apparatus for electronic devices test system is provided. The probing apparatus is "universal" which means that it can be adapted for different panel sizes and device layouts. The probing apparatus includes a probe unit and a circuit-switching device. The probe unit includes a support base and probes mounted thereon for electronic devices testing. The circuit-switching device allows an electrical connection between the probes corresponding to different panels and signal sources.
TW095103212A 2006-01-26 2006-01-26 Universal probing apparatus for TFT array test TWI273248B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW095103212A TWI273248B (en) 2006-01-26 2006-01-26 Universal probing apparatus for TFT array test
KR1020060028368A KR100777267B1 (en) 2006-01-26 2006-03-29 Universal probing apparatus for tft array test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095103212A TWI273248B (en) 2006-01-26 2006-01-26 Universal probing apparatus for TFT array test

Publications (2)

Publication Number Publication Date
TWI273248B TWI273248B (en) 2007-02-11
TW200728731A true TW200728731A (en) 2007-08-01

Family

ID=38502710

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095103212A TWI273248B (en) 2006-01-26 2006-01-26 Universal probing apparatus for TFT array test

Country Status (2)

Country Link
KR (1) KR100777267B1 (en)
TW (1) TWI273248B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7589548B2 (en) * 2007-02-22 2009-09-15 Teradyne, Inc. Design-for-test micro probe
KR100805217B1 (en) * 2007-08-02 2008-02-21 주식회사 에이엠에스티 Probe card
CN114839802B (en) * 2022-05-25 2023-11-03 广东江粉高科技产业园有限公司 PAD signal testing device for testing small-damage efficient LCD

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5793218A (en) 1995-12-15 1998-08-11 Lear Astronics Corporation Generic interface test adapter
JP3206509B2 (en) 1997-08-22 2001-09-10 日本電気株式会社 Probe device for display panel
JP2001133501A (en) 1999-11-05 2001-05-18 Rohm Co Ltd Method of inspecting product
KR100771906B1 (en) * 2001-12-31 2007-11-01 엘지.필립스 엘시디 주식회사 Tester of liquid crystal display panel

Also Published As

Publication number Publication date
TWI273248B (en) 2007-02-11
KR20070078358A (en) 2007-07-31
KR100777267B1 (en) 2007-11-20

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees